Works matching DE "FIELD effect transistor switches"
1
- International Journal of Electronics Letters, 2020, v. 8, n. 3, p. 304, doi. 10.1080/21681724.2019.1600729
- Shora, Aadil T.;
- Khanday, Farooq A.
- Article
2
- Instruments & Experimental Techniques, 2016, v. 59, n. 3, p. 351, doi. 10.1134/S0020441216020202
- Grekhov, I.;
- Zhmodikov, A.;
- Korotkov, S.;
- Prizhimnov, S.;
- Fomenko, Yu.
- Article
3
- Semiconductors, 2015, v. 49, n. 2, p. 224, doi. 10.1134/S1063782615020104
- Gulyaev, D.;
- Zhuravlev, K.;
- Bakarov, A.;
- Toropov, A.
- Article
4
- Semiconductors, 2015, v. 49, n. 2, p. 234, doi. 10.1134/S1063782615020086
- Galiev, G.;
- Vasil'evskii, I.;
- Klimov, E.;
- Klochkov, A.;
- Lavruhin, D.;
- Pushkarev, S.;
- Maltsev, P.
- Article
5
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3108, doi. 10.1007/s11664-015-3827-0
- Jain, F.;
- Chan, P.-Y.;
- Lingalugari, M.;
- Kondo, J.;
- Suarez, E.;
- Gogna, P.;
- Chandy, J.;
- Heller, E.
- Article
6
- Electric Machines & Control / Dianji Yu Kongzhi Xuebao, 2019, v. 23, n. 10, p. 1, doi. 10.15938/j.emc.2019.10.001
- Article
7
- Journal of Engineering (2314-4912), 2016, p. 1, doi. 10.1155/2016/7345232
- Hayashi, Yusuke;
- Matsugaki, Yoshikatsu;
- Ninomiya, Tamotsu
- Article
8
- Electronics & Electrical Engineering, 2018, v. 24, n. 3, p. 15, doi. 10.5755/j01.eie.24.3.20977
- Ghaderi, Davood;
- Celebi, Mehmet;
- Recep Minaz, Mehmet;
- Toren, Murat
- Article
9
- Scientific Reports, 2015, p. 16871, doi. 10.1038/srep16871
- Shen, Li-Fan;
- Yip, SenPo;
- Yang, Zai-xing;
- Fang, Ming;
- Hung, TakFu;
- Pun, Edwin Y.B.;
- Ho, Johnny C.
- Article
10
- Journal of Circuits, Systems & Computers, 2019, v. 28, n. 10, p. N.PAG, doi. 10.1142/S021812661950172X
- Bandali, Mehdi;
- Hassanzadeh, Alireza;
- Ghashghaie, Masoume;
- Hashemipour, Omid
- Article
11
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2015, v. 29, n. 16, p. -1, doi. 10.1142/S0217979215501076
- Belhadji, Youcef;
- Bouazza, Benyounes;
- Moulahcene, Fateh;
- Massoum, Nordine
- Article
12
- Journal of Integrated Circuits & Systems, 2019, v. 14, n. 2, p. 1, doi. 10.29292/jics.v14i2.34
- Salerno Galembeck, Egon Henrique;
- Flandre, Denis;
- Renaux, Christian;
- Pinillos Gimenez, Salvador
- Article
13
- Journal of Integrated Circuits & Systems, 2017, v. 12, n. 1, p. 33, doi. 10.29292/jics.v12i1.448
- Vono Peruzzi, Vinicius;
- Renaux, Christian;
- Flandre, Denis;
- Pinillos Gimenez, Salvador
- Article
14
- Journal of Experimental Nanoscience, 2015, v. 10, n. 14, p. 1057, doi. 10.1080/17458080.2014.953608
- Ravalia, Ashish;
- Vagadia, Megha;
- Solanki, P.S.;
- Asokan, K.;
- Kuberkar, D.G.
- Article
15
- International Journal of RF & Microwave Computer-Aided Engineering, 2020, v. 30, n. 7, p. 1, doi. 10.1002/mmce.22212
- Tao, Yuan;
- Hu, Zhi Fu;
- Fan, Yong
- Article
16
- International Journal of RF & Microwave Computer-Aided Engineering, 2019, v. 29, n. 6, p. N.PAG, doi. 10.1002/mmce.21690
- Tao, Yuan;
- Hu, Zhi Fu;
- Fan, Yong;
- Liu, Ya Nan;
- He, Mei Lin;
- Cheng, Yu Jian;
- Zhang, Bo
- Article
17
- Journal of Polytechnic, 2018, v. 21, n. 3, p. 693, doi. 10.2339/politeknik.389612
- DİNDAR, Salih;
- İSKENDER, İres
- Article
18
- Electronics (2079-9292), 2020, v. 9, n. 9, p. 1437, doi. 10.3390/electronics9091437
- Kim, Sang-Hun;
- Kim, Seok-Min;
- Park, Sungmin;
- Lee, Kyo-Beum
- Article
19
- Electronics (2079-9292), 2020, v. 9, n. 2, p. 270, doi. 10.3390/electronics9020270
- Tsao, Yi-Fan;
- Würfl, Joachim;
- Hsu, Heng-Tung
- Article
20
- Journal of Active & Passive Electronic Devices, 2017, v. 12, n. 1/2, p. 119
- VERMA, ARPANA;
- AKASHE, SHYAM
- Article
21
- Sensors (14248220), 2019, v. 19, n. 24, p. 5580, doi. 10.3390/s19245580
- Lee, Hyeyoung;
- Jeon, Jin-A;
- Kim, Jinyong;
- Lee, Hyunsu;
- Lee, Moo Hyun;
- Lee, Manwoo;
- Lee, Seungcheol;
- Park, Hwanbae;
- Song, Sukjune
- Article
22
- Advanced Functional Materials, 2017, v. 27, n. 2, p. n/a, doi. 10.1002/adfm.201603682
- Yu, Sanghyuck;
- Kim, Jin Sung;
- Jeon, Pyo Jin;
- Ahn, Jongtae;
- Park, Jae Chul;
- Im, Seongil
- Article
23
- IET Power Electronics (Wiley-Blackwell), 2020, v. 13, n. 7, p. 1364, doi. 10.1049/iet-pel.2019.0422
- Batard, Christophe;
- Ginot, Nicolas;
- Bouguet, Christophe
- Article
24
- IET Power Electronics (Wiley-Blackwell), 2020, v. 13, n. 4, p. 713, doi. 10.1049/iet-pel.2019.0614
- Alexandru, Cristina A.;
- Zhu, Dibin
- Article
25
- IET Power Electronics (Wiley-Blackwell), 2020, v. 13, n. 3, p. 463, doi. 10.1049/iet-pel.2019.0589
- Miryala, Vamshi Krishna;
- Hatua, Kamalesh
- Article
26
- IET Power Electronics (Wiley-Blackwell), 2018, v. 11, n. 4, p. 668, doi. 10.1049/iet-pel.2017.0403
- De Santi, Carlo;
- Meneghini, Matteo;
- Meneghesso, Gaudenzio;
- Zanoni, Enrico
- Article
27
- IET Power Electronics (Wiley-Blackwell), 2014, v. 7, n. 8, p. 2030, doi. 10.1049/iet-pel.2013.0786
- Wang Ying;
- Lan Hao;
- Dou Zheng;
- Hu Haifan
- Article
28
- Telkomnika, 2018, v. 16, n. 2, p. 889, doi. 10.12928/TELKOMNIKA.v16i2.9024
- Shashikumar, K.;
- Venkataseshaiah, C.;
- Sim, K. S.
- Article
29
- Microwave Journal, 2020, v. 63, n. 5, p. 82
- Koul, Shiban K.;
- Mahajan, Chaitanya;
- Poddar, Ajay K.;
- Rohde, Ulrich L.
- Article
30
- Electrical Engineering, 2020, v. 102, n. 4, p. 2435, doi. 10.1007/s00202-020-01040-4
- Pourfarzad, Hamed;
- Saremi, Mohammad;
- Jalilzadeh, Tohid
- Article
31
- Electrical Engineering, 2020, v. 102, n. 2, p. 811, doi. 10.1007/s00202-019-00904-8
- Premkumar, M.;
- Kumar, C.;
- Anbarasan, A.;
- Sowmya, R.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 14, p. 719, doi. 10.1049/el.2020.0969
- Kim, Younghwan;
- Jeon, Sanggeun
- Article
33
- Przegląd Elektrotechniczny, 2020, v. 96, n. 6, p. 93, doi. 10.15199/48.2020.06.17
- GRZEJSZCZAK, Piotr;
- CZAPLICKI, Adam;
- SZYMCZAK, Marek;
- BARLIK, Roman
- Article
34
- Przegląd Elektrotechniczny, 2019, v. 95, n. 8, p. 160, doi. 10.15199/48.2019.08.34
- NOWASZEWSKI, Krzysztof Cyprian;
- SIKORSKI, Andrzej
- Article
35
- Energies (19961073), 2020, v. 13, n. 15, p. 3960, doi. 10.3390/en13153960
- Premkumar, Manoharan;
- Subramaniam, Umashankar;
- Haes Alhelou, Hassan;
- Siano, Pierluigi
- Article
36
- Energies (19961073), 2020, v. 13, n. 10, p. 2445, doi. 10.3390/en13102445
- Article
37
- International Journal of Circuit Theory & Applications, 2016, v. 44, n. 2, p. 280, doi. 10.1002/cta.2076
- Hwu, K. I.;
- Jiang, W. Z.;
- Chien, J. Y.
- Article
38
- Technical Gazette / Tehnički Vjesnik, 2017, v. 24, n. 2, p. 397, doi. 10.17559/TV-20151020134629
- Can, Erol;
- Sayan, H. Hüseyin
- Article
39
- Technical Gazette / Tehnički Vjesnik, 2016, v. 23, n. 5, p. 1239, doi. 10.17559/TV-20150730222021
- Can, Erol;
- Sayan, H. Hüseyin
- Article
40
- Nature Nanotechnology, 2014, v. 9, n. 11, p. 875, doi. 10.1038/nnano.2014.257
- Article
41
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 4, p. 883, doi. 10.1002/pssa.201532547
- Kotani, Junji;
- Yamada, Atsushi;
- Ishiguro, Tetsuro;
- Tomabechi, Shuichi;
- Nakamura, Norikazu
- Article
42
- International Journal of High Speed Electronics & Systems, 2014, v. 23, n. 3/4, p. -1, doi. 10.1142/S0129156414500232
- Bonnaud, Olivier;
- Zhang, Peng;
- Jacques, Emmanuel;
- Rogel, Regis
- Article
43
- Journal of Low Temperature Physics, 2017, v. 188, n. 3/4, p. 67, doi. 10.1007/s10909-017-1781-3
- Article