Works matching DE "EXTENDED defects (Crystallography)"
1
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 4955, doi. 10.1007/s11664-018-6140-x
- Santos, Iván;
- Ruiz, Manuel;
- Aboy, María;
- Marqués, Luis A.;
- López, Pedro;
- Pelaz, Lourdes
- Article
2
- Crystals (2073-4352), 2018, v. 8, n. 2, p. 67, doi. 10.3390/cryst8020067
- Ferrari, Claudio;
- Ghica, Corneliu;
- Rotunno, Enzo
- Article
3
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 1, p. 136, doi. 10.1002/pssa.201300233
- Scheinemann, Artur;
- Schenk, Andreas
- Article
