Works matching DE "ETCHING reagents"
1
- Plasma Processes & Polymers, 2025, v. 22, n. 6, p. 1, doi. 10.1002/ppap.70012
- Wei, Jiachen;
- Woo, Byungjun;
- Lee, DaeKug;
- Jeong, Ki‐Hyeok;
- Kwon, Kwang‐Ho
- Article
2
- Surface Engineering, 2023, v. 39, n. 7-12, p. 823, doi. 10.1080/02670844.2023.2261675
- Krishnan, Akhil;
- Guruswamy, Aravindan;
- Bhargav, P. Balaji;
- Ramasamy, P.
- Article
3
- Angewandte Chemie, 2015, v. 127, n. 31, p. 9153, doi. 10.1002/ange.201503996
- Ham, Songyi;
- Jang, Hee-Jeong;
- Song, Yookyung;
- Shuford, Kevin L.;
- Park, Sungho
- Article
4
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12312, doi. 10.1007/s10854-016-5088-y
- Rathore, Neelam;
- Sarkar, Shaibal
- Article
5
- Journal of Solid State Electrochemistry, 2005, v. 9, n. 5, p. 398, doi. 10.1007/s10008-004-0636-4
- Kang Shi;
- Jing Tang;
- Li Zhang;
- Yong-liang Zhou;
- Dong-sheng Qu;
- Li-Ning Sun;
- Zhong-Qun Tian
- Article
6
- Inorganic Materials, 2016, v. 52, n. 10, p. 979, doi. 10.1134/S0020168516100010
- Abramova, E.;
- Khort, A.;
- Syrov, Yu.;
- Yakovenko, A.;
- Shvets, V.
- Article
7
- Inorganic Materials, 2012, v. 48, n. 2, p. 114, doi. 10.1134/S0020168512010153
- Tomashik, Z.;
- Chukhnenko, P.;
- Ivanits'ka, V.;
- Tomashik, V.;
- Okrepka, G.;
- Stratiichuk, I.
- Article
8
- Inorganic Materials, 2010, v. 46, n. 8, p. 812, doi. 10.1134/S0020168510080029
- Tomashik, Z. F.;
- Ivanits'ka, V. G.;
- Tomashik, V. N.;
- Shcherbak, L. P.;
- Franc, J.;
- Moravec, P.;
- Höschl, P.;
- Walter, J.
- Article
9
- Inorganic Materials, 2010, v. 46, n. 7, p. 714, doi. 10.1134/S0020168510070058
- Eminov, Sh. O.;
- Rajabli, A. A.;
- Ibragimov, T. I.
- Article
10
- Inorganic Materials, 2009, v. 45, n. 7, p. 731, doi. 10.1134/S002016850907005X
- Tomashik, Z.;
- Okrepka, G.;
- Tomashik, V.
- Article
11
- Inorganic Materials, 2008, v. 44, n. 12, p. 1278, doi. 10.1134/S0020168508120029
- Arbenina, V.;
- Marmalyuk, A.;
- Arbenin, D.;
- Budkin, I.;
- Govorkov, O.
- Article
12
- Doklady Chemistry, 2016, v. 470, n. 1, p. 252, doi. 10.1134/S0012500816090044
- Abramova, E.;
- Khort, A.;
- Gvelesiani, A.;
- Yakovenko, A.;
- Shvets, V.
- Article
13
- Doklady Chemistry, 2016, v. 467, n. 1, p. 61, doi. 10.1134/S0012500816030010
- Abramova, E.;
- Khort, A.;
- Tsygankov, V.;
- Yakovenko, A.;
- Shvets, V.
- Article
14
- Doklady Chemistry, 2015, v. 464, n. 1, p. 224, doi. 10.1134/S0012500815090025
- Abramova, E.;
- Khort, A.;
- Syrov, Yu.;
- Yakovenko, A.;
- Shvets, V.
- Article
15
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 853, doi. 10.1002/sdtp.10359
- Ochi, Mototaka;
- Morita, Shinya;
- Takanashi, Yasuyuki;
- Tao, Hiroaki;
- Goto, Hiroshi;
- Kugimiya, Toshihiro;
- Kanamaru, Moriyoshi
- Article
16
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 994, doi. 10.1002/j.2168-0159.2014.tb00258.x
- Park, Sang‐Hee Ko;
- Cho, Sung Haeng;
- Ryu, Minki;
- Kim, Heeok;
- Kwon, OhSang;
- Park, Eunsook;
- Yang, Jong‐Heon;
- Kim, Jong Woo;
- Hwang, Chi‐Sun;
- Lim, Sun Kwon
- Article
17
- Applied Nanoscience, 2023, v. 13, n. 10, p. 7047, doi. 10.1007/s13204-023-02870-x
- Malanych, Galyna;
- Tomashyk, Vasyl;
- Korchovyi, Andriy;
- Sabov, Tomash
- Article
18
- Applied Nanoscience, 2023, v. 13, n. 7, p. 5165, doi. 10.1007/s13204-022-02719-9
- Malanych, Galyna;
- Tomashyk, Vasyl;
- Korchovyi, Andriy;
- Chayka, Mykola
- Article
19
- Applied Nanoscience, 2022, v. 12, n. 3, p. 603, doi. 10.1007/s13204-021-01716-8
- Chayka, Mykola;
- Tomashyk, Zinaida;
- Tomashyk, Vasyl;
- Malanych, Galyna;
- Korchovyi, Andriy
- Article
20
- Physica Status Solidi - Rapid Research Letters, 2015, v. 9, n. 8, p. 448, doi. 10.1002/pssr.201510219
- Kafle, Bishal;
- Mannan, Abdul;
- Freund, Timo;
- Clochard, LaurENt;
- Duffy, Edward;
- Hofmann, Marc;
- RENtsch, JochEN;
- Preu, Ralf
- Article
21
- Transactions of the Institute of Metal Finishing, 2016, v. 94, n. 6, p. 322, doi. 10.1080/00202967.2016.1223805
- Nomura, T.;
- Nakagawa, H.;
- Tashiro, K.;
- Umeda, Y.;
- Honma, H.;
- Takai, O.
- Article
22
- Metallurgist, 2007, v. 51, n. 3-4, p. 186, doi. 10.1007/s11015-007-0034-0
- Article
23
- Journal of Dental Materials & Techniques, 2021, v. 10, n. 1, p. 34
- Mohammadipour, Hamideh sadat;
- Akbari, Majid;
- Bagheri, Hossein;
- Malekmohammadi, Mohammadtaghi;
- Karimian, Elnaz;
- Sekandari, Salehe
- Article
24
- Journal of Dental School, Shahid Beheshti University of Medical Sciences, 2014, v. 32, n. 1, p. 9
- Panahandeh, Narges;
- Iravani, Maryam;
- Halalizadeh, Zari
- Article
25
- Applied Physics A: Materials Science & Processing, 2007, v. 88, n. 4, p. 711, doi. 10.1007/s00339-007-4032-7
- Kumar, P.;
- Kanakaraju, S.;
- DeVoe, D.L.
- Article
26
- Applied Physics A: Materials Science & Processing, 2005, v. 80, n. 2, p. 405, doi. 10.1007/s00339-003-2372-5
- Choi, H. W.;
- Liu, C.;
- Cheong, M. G.;
- Zhang, J.;
- Chua, S. J.
- Article
27
- Advanced Energy Materials, 2020, v. 10, n. 36, p. 1, doi. 10.1002/aenm.202001791
- Li, Xinliang;
- Li, Mian;
- Yang, Qi;
- Liang, Guojin;
- Huang, Zhaodong;
- Ma, Longtao;
- Wang, Donghong;
- Mo, Funian;
- Dong, Binbin;
- Huang, Qing;
- Zhi, Chunyi
- Article
28
- Journal of International Oral Health, 2013, v. 5, n. 3, p. 73
- Krishnakanth Reddy, D.;
- Kishore, M. S. V.;
- Safeena, Safeena
- Article
29
- European Journal of Oral Sciences, 2004, v. 112, n. 4, p. 384, doi. 10.1111/j.1600-0722.2004.00148.x
- Yanagida, Hiroaki;
- Taira, Yohsuke;
- Atsuta, Mitsuru
- Article
30
- European Journal of Oral Sciences, 2004, v. 112, n. 1, p. 95, doi. 10.1111/j.0909-8836.2004.00090.x
- Taira, Yohsuke;
- Yanagida, Hiroaki;
- Matsumura, Hideo;
- Atsuta, Mitsuru
- Article
31
- Plasma Chemistry & Plasma Processing, 2014, v. 34, n. 3, p. 363, doi. 10.1007/s11090-013-9491-3
- Article
32
- Semiconductors, 2018, v. 52, n. 13, p. 1775, doi. 10.1134/S1063782618130092
- Kudryashov, D. A.;
- Gudovskikh, A. S.;
- Baranov, A. I.
- Article
33
- Semiconductors, 2015, v. 49, n. 4, p. 551, doi. 10.1134/S1063782615040041
- Astrova, E.;
- Parfeneva, A.;
- Li, G.;
- Zharova, Yu.
- Article
34
- Semiconductors, 2014, v. 48, n. 8, p. 1103, doi. 10.1134/S1063782614080181
- Mamutin, V.;
- Ilyinskaya, N.;
- Bedarev, D.;
- Levin, R.;
- Pushnyi, B.
- Article
35
- Journal of Electronic Materials, 2023, v. 52, n. 11, p. 7337, doi. 10.1007/s11664-023-10671-9
- Tetyorkin, V.;
- Tsybrii, Z.;
- Tkachuk, A.;
- Vuichyk, M.;
- Svezhentsova, K.;
- Yevmenova, A.;
- Dmytruk, N.
- Article
36
- Journal of Electronic Materials, 2016, v. 45, n. 5, p. 2615, doi. 10.1007/s11664-016-4434-4
- Cao, Dao;
- Anh, Cao;
- Ngan, Luong
- Article
37
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3059, doi. 10.1007/s11664-013-2625-9
- Ivanits'ka, V.;
- Moravec, P.;
- Tomashik, V.;
- Mašek, K.;
- Tomashik, Z.;
- Franc, J.;
- Grill, R.;
- Höschl, P.
- Article
38
- Journal of Electronic Materials, 2010, v. 39, n. 10, p. 2203, doi. 10.1007/s11664-010-1242-0
- Kutty, M. N.;
- Plis, E.;
- Khoshakhlagh, A.;
- Myers, S.;
- Gautam, N.;
- Smolev, S.;
- Sharma, Y. D.;
- Dawson, R.;
- Krishna, S.;
- Lee, S. J.;
- Noh, S. K.
- Article
39
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1516, doi. 10.1007/s11664-010-1287-0
- Goncalves, L. M.;
- Alpuim, P.;
- Correia, J. H.
- Article
40
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1637, doi. 10.1007/s11664-009-0692-8
- Tomashik, Z. F.;
- Tomashik, V. M.;
- Stratiychuk, I. B.;
- Okrepka, G. M.;
- Hnativ, I. I.;
- Moravec, P.;
- Höschl, P.;
- Bok, J.
- Article
41
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1645, doi. 10.1007/s11664-009-0787-2
- Moravec, P.;
- Ivanits'ka, V.G.;
- Franc, J.;
- Tomashik, Z. F.;
- Tomashik, V. M.;
- Mašek, K.;
- Feychuk, P. I.;
- Shcherbak, L. P.;
- Höschl, P.;
- Grill, R.;
- Walter, J.
- Article
42
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1471, doi. 10.1007/s11664-008-0494-4
- KIRAN, R.;
- SPORKEN, R.;
- CASSELMAN, T. N.;
- EMELIE, P. Y.;
- KODAMA, R.;
- CHANG, Y.;
- AQARIDEN, F.;
- VELICU, S.;
- ZHAO, J.;
- SIVANANTHAN, S.
- Article
43
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1241, doi. 10.1007/s11664-008-0465-9
- YANG, J. R.;
- CAO, X. L.;
- WEI, Y. F.;
- HE, L.
- Article
44
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1247, doi. 10.1007/s11664-008-0460-1
- JAIME-VASQUEZ, M.;
- MARTINKA, M.;
- STOLTZ, A. J.;
- JACOBS, R. N.;
- BENSON, J. D.;
- ALMEIDA, L. A.;
- MARKUNAS, J. K.
- Article
45
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1225, doi. 10.1007/s11664-008-0467-7
- STOLTZ, A. J.;
- BENSON, J. D.;
- SMITH, P. J.
- Article
46
- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1077, doi. 10.1007/s11664-007-0176-7
- Badano, G.;
- Million, A.;
- Canava, B.;
- Tran-Van, P.;
- Etcheberry, A.
- Article
47
- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 993, doi. 10.1007/s11664-007-0159-8
- Mallick, Shubhrangshu;
- Kiran, Rajni;
- Ghosh, Siddhartha;
- Velicu, Silviu;
- Sivananthan, Sivalingam
- Article
48
- Chemistry - A European Journal, 2014, v. 20, n. 10, p. 2723, doi. 10.1002/chem.201303970
- Cai, Tao;
- Zhang, Bin;
- Chen, Yu;
- Wang, Cheng;
- Zhu, Chun Xiang;
- Neoh, Koon‐Gee;
- Kang, En‐Tang
- Article
49
- Journal of Materials Science: Materials in Medicine, 2007, v. 18, n. 10, p. 2003, doi. 10.1007/s10856-007-3121-7
- de Souza-Zaroni, Wanessa Christine;
- Delfino, Carina Sinclér;
- Ciccone-Nogueira, Juliane Cristina;
- Palma-Dibb, Regina Guenka;
- Corona, Silmara Aparecida Milori
- Article
50
- International Journal of Advanced Manufacturing Technology, 2017, v. 93, n. 9-12, p. 3693, doi. 10.1007/s00170-017-0436-5
- Zhang, P.;
- Freyberg, A.;
- Fischer, A.
- Article