Works about ETCHING
1
- Chemistry - A European Journal, 2025, v. 31, n. 36, p. 1, doi. 10.1002/chem.202500758
- Li, Meixuan;
- Zhang, Xinyao;
- Ni, Bing;
- Yue, Wenbo
- Article
2
- Nanomaterials (2079-4991), 2025, v. 15, n. 12, p. 947, doi. 10.3390/nano15120947
- Zhang, Ke;
- Yu, Yunchu;
- Zhu, Nanfei;
- Zhang, Senlin;
- Sun, Jie;
- Ding, Shijin;
- Zhang, David Wei
- Article
3
- Micromachines, 2025, v. 16, n. 6, p. 710, doi. 10.3390/mi16060710
- Hsieh, Chi-Hsiang;
- Cheng, Chiao-Yang;
- Hsiao, Yi-Kai;
- Wang, Zi-Hao;
- Tu, Chang-Ching;
- Chen, Chao-Chang Arthur;
- Lee, Po-Tsung;
- Kuo, Hao-Chung
- Article
4
- Dutch Crossing, 2011, v. 35, n. 3, p. 249, doi. 10.1179/155909011X13124528227507
- Article
5
- Dutch Crossing, 2011, v. 35, n. 2, p. 127, doi. 10.1179/155909011X13033128278551
- Article
6
- Dutch Crossing, 2010, v. 34, n. 2, p. 138, doi. 10.1179/030965610X12726397286205
- Article
7
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 815, doi. 10.1142/S0219581X06005200
- TANAKA, HIROFUMI;
- WEISS, PAUL S.;
- HORN, MARK W.
- Article
8
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 567, doi. 10.1142/S0219581X05003590
- TEO, SELIN H. G.;
- LIU, A. Q.;
- SIA, G. L.;
- LU, C.;
- SINGH, J.;
- YU, M. B.
- Article
9
- International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 1, doi. 10.1142/S0219581X04001444
- Chehovskiy, A. V.;
- Prinz, V. Ya.
- Article
10
- International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 81, doi. 10.1142/S0219581X04001845
- Gavrilin, E. Yu.;
- Gorbatov, Yu. B.;
- Starkov, V. V.;
- Vyatkin, A. F.
- Article
11
- Particle & Particle Systems Characterization, 2024, v. 41, n. 3, p. 1, doi. 10.1002/ppsc.202300109
- Tang, Yue‐Feng;
- Zhao, Meng‐Yun;
- Han, Guo‐Zhi
- Article
12
- Particle & Particle Systems Characterization, 2020, v. 37, n. 5, p. 1, doi. 10.1002/ppsc.202000027
- Tavakkoli Yaraki, Mohammad;
- Daqiqeh Rezaei, Soroosh;
- Middha, Eshu;
- Tan, Yen Nee
- Article
13
- Journal of Separation Science, 2015, v. 38, n. 9, p. 1618, doi. 10.1002/jssc.201401445
- Murakami, Jillian N.;
- Thurbide, Kevin B.
- Article
14
- Advanced Functional Materials, 2016, v. 26, n. 32, p. 5827, doi. 10.1002/adfm.201601193
- Hu, Ming;
- Ju, Yi;
- Liang, Kang;
- Suma, Tomoya;
- Cui, Jiwei;
- Caruso, Frank
- Article
15
- Advanced Functional Materials, 2016, v. 26, n. 17, p. 2929, doi. 10.1002/adfm.201505153
- Azeredo, Bruno P.;
- Lin, Yu‐Wei;
- Avagyan, Arik;
- Sivaguru, Mayandi;
- Hsu, Keng;
- Ferreira, Placid
- Article
16
- Advanced Functional Materials, 2015, v. 25, n. 7, p. 1137, doi. 10.1002/adfm.201403414
- Alhmoud, Hashim;
- Delalat, Bahman;
- Elnathan, Roey;
- Cifuentes‐Rius, Anna;
- Chaix, Arnaud;
- Rogers, Mary‐Louise;
- Durand, Jean‐Olivier;
- Voelcker, Nicolas H.
- Article
17
- Advanced Functional Materials, 2014, v. 24, n. 19, p. 2801, doi. 10.1002/adfm.201302812
- Okada, Kenji;
- Tokudome, Yasuaki;
- Makiura, Rie;
- Konstas, Kristina;
- Malfatti, Luca;
- Innocenzi, Plinio;
- Ogawa, Hiroki;
- Kanaya, Toshiji;
- Falcaro, Paolo;
- Takahashi, Masahide
- Article
18
- Advanced Functional Materials, 2014, v. 24, n. 16, p. 2412, doi. 10.1002/adfm.201470104
- ElAfandy, Rami T.;
- Majid, Mohammed A.;
- Ng, Tien Khee;
- Zhao, Lan;
- Cha, Dongkyu;
- Ooi, Boon S.
- Article
19
- Advanced Functional Materials, 2014, v. 24, n. 13, p. 1949, doi. 10.1002/adfm.201303180
- Moon, Taeho;
- Chen, Lin;
- Choi, Shinhyun;
- Kim, Chunjoong;
- Lu, Wei
- Article
20
- Advanced Functional Materials, 2014, v. 23, n. 36, p. 4529, doi. 10.1002/adfm.201203885
- Kraus, Tobias;
- Brodoceanu, Daniel;
- Pazos‐Perez, Nicolas;
- Fery, Andreas
- Article
21
- Advanced Functional Materials, 2014, v. 24, n. 1, p. 105, doi. 10.1002/adfm.201470005
- Yeom, Junghoon;
- Ratchford, Daniel;
- Field, Christopher R.;
- Brintlinger, Todd H.;
- Pehrsson, Pehr E.
- Article
22
- Advanced Functional Materials, 2014, v. 24, n. 1, p. 106, doi. 10.1002/adfm.201301094
- Yeom, Junghoon;
- Ratchford, Daniel;
- Field, Christopher R.;
- Brintlinger, Todd H.;
- Pehrsson, Pehr E.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 171, doi. 10.1007/s10854-007-9565-1
- Avella, Manuel;
- Jiménez, Juan;
- Pommereau, Frédéric;
- Landesman, Jean-Pieere;
- Rhallabi, Ahmed
- Article
24
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 957, doi. 10.1007/s10854-007-9425-z
- Mansu Kim;
- Nam-Ki Min;
- Alexander Efremov;
- Hyun Woo Lee;
- Chi-Sun Park;
- Kwang-Ho Kwon
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 237, doi. 10.1007/s10854-007-9261-1
- Mukherjee, S.;
- Jain, S.;
- Zhao, F.;
- Kar, J. P.;
- Li, D.;
- Shi, Z.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 627, doi. 10.1007/s10854-006-9058-7
- Lee, Yueh;
- Ou, Bin;
- Chiu, Yi
- Article
27
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 5, p. 535
- Article
28
- Wind Energy, 2016, v. 19, n. 10, p. 1903, doi. 10.1002/we.1958
- Bruce, T.;
- Long, H.;
- Slatter, T.;
- Dwyer‐Joyce, R.S.
- Article
29
- 2019
- Hauwiller, Matthew R.;
- Frechette, Layne;
- Jones, Matthew R.;
- Ondry, Justin;
- Geissler, Phillip;
- Alivisatos, A. Paul
- Abstract
30
- Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1389, doi. 10.1017/S1431927612013554
- Bonyár, Attila;
- Szabó, Peter J.
- Article
31
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 816, doi. 10.1017/S1431927612000475
- Wright, Gus A.;
- Costa, Lino;
- Terekhov, Alexander;
- Jowhar, Dawit;
- Hofmeister, William;
- Janetopoulos, Christopher
- Article
32
- Microscopy & Microanalysis, 2011, v. 17, n. 2, p. 284, doi. 10.1017/S1431927610094353
- Nadagouda, Mallikarjuna N.;
- White, Colin;
- Lytle, Darren
- Article
33
- Al-Mustansiriyah Journal of Science, 2023, v. 34, n. 2, p. 113, doi. 10.23851/mjs.v34i2.1223
- Urabe, Aliyaa A.;
- Nayef, Uday M.;
- Kamel, Randa
- Article
37
- Journal of Clinical Medicine, 2024, v. 13, n. 9, p. 2474, doi. 10.3390/jcm13092474
- Comba, Allegra;
- Baldi, Andrea;
- Pucci, Riccardo;
- Rolando, Chiara;
- Alovisi, Mario;
- Pasqualini, Damiano;
- Scotti, Nicola
- Article
38
- Journal of Test & Measurement Technology, 2022, v. 36, n. 6, p. 537, doi. 10.3969/j.issn.1671-7449.2022.06.012
- Article
39
- Journal of Test & Measurement Technology, 2022, v. 36, n. 2, p. 160, doi. 10.3969/j.issn.1671-7449.2022.02.012
- Article
40
- Journal of Aesthetics & Art Criticism, 2022, v. 80, n. 1, p. 31, doi. 10.1093/jaac/kpab059
- Article
41
- Ferroelectrics, 2009, v. 384, n. 1, p. 39, doi. 10.1080/00150190902892741
- XUE-YANG;
- DONG-PYO KIM;
- GWAN-HA KIM;
- JONG-CHANG WOO;
- DOO-SEUNG UM;
- CHANG-IL KIM
- Article
42
- Ferroelectrics, 2009, v. 384, n. 1, p. 47, doi. 10.1080/00150190902892766
- JONG-CHANG WOO;
- GWAN-HA KIM;
- DONG-PYO KIM;
- DOO-SEUNG UM;
- CHANG-IL KIM
- Article
43
- Ferroelectrics, 2008, v. 374, n. 1, p. 110, doi. 10.1080/00150190802427234
- Azanova, I. S.;
- Shevtsov, D. I.;
- Zhundrikov, A. V.;
- Kichigin, V. I.;
- Petukhov, I. V.;
- Volyntsev, A. B.
- Article
44
- Ferroelectrics, 2006, v. 340, n. 1, p. 121, doi. 10.1080/00150190600889163
- Terabe, K.;
- Liu, X. Y.;
- Li, X. J.;
- Kitamura, K.
- Article
45
- Plasma Physics Reports, 2022, v. 48, n. 6, p. 638, doi. 10.1134/S1063780X22600517
- Shustin, E. G.;
- Kolodko, D. V.;
- Luzanov, V. A.;
- Mirgorodskaya, E. N.;
- Sorokin, I. A.;
- Tarakanov, V. P.;
- Temiryazeva, M. P.;
- Frolov, E. S.
- Article
46
- Plasma Physics Reports, 2022, v. 48, n. 1, p. 69, doi. 10.1134/S1063780X22010019
- Article
47
- Plasma Physics Reports, 2010, v. 36, n. 10, p. 891, doi. 10.1134/S1063780X10100065
- Palov, A. P.;
- Mankelevich, Yu. A.;
- Rakhimova, T. V.;
- Shamiryan, D.
- Article
48
- Sensors & Materials, 2019, v. 31, n. 6, Part 2, p. 1957, doi. 10.18494/SAM.2019.2334
- Yasuo Terasawa;
- Hiroyuki Tashiro;
- Yukari Nakano;
- Jun Ohta
- Article
49
- Sensors & Materials, 2017, v. 29, n. 3, p. 217, doi. 10.18494/SAM.2017.1444
- Gang Han;
- Yuki Murata;
- Yuto Minami;
- Masayuki Sohgawa;
- Takashi Abe
- Article
50
- Analytical Letters, 2015, v. 48, n. 14, p. 2223, doi. 10.1080/00032719.2015.1025276
- Chen, Anyi;
- Cheng, Huiling;
- Qin, Benkui;
- Xu, Yanqun;
- Li, Ruidang;
- Tai, Zhigang
- Article