Works matching DE "ELLIPSOMETRY"

Results: 996

Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.

Published in:

Journal of Materials Science, 2025, v. 60, n. 27, p. 11435, doi. 10.1007/s10853-025-11140-w

By:

Isik, Mehmet;
Gasanly, Nizami M.

Publication type:

Article

Ultrafast Exciton and Charge Carrier Dynamics in Monolayer MoS2 Measured with Time‐Resolved Spectroscopic Ellipsometry.

Published in:

Physica Status Solidi (B), 2025, v. 262, n. 7, p. 1, doi. 10.1002/pssb.70003

By:

Krätschmer, Lucas;
Slimi, Younes;
Trefflich, Lukas;
Espinoza, Shirley;
Rebarz, Mateusz;
Vazquez‐Miranda, Saul;
Seyfarth, Jakob;
Pflug, Theo;
Olbrich, Markus;
Stiehm, Noah;
Hähnlein, Bernd;
Sturm, Chris;
Horn, Alexander;
Andreasson, Jakob;
Grundmann, Marius;
Krischok, Stefan;
Schmidt‐Grund, Rüdiger

Publication type:

Article

Ultrafast Exciton and Charge Carrier Dynamics in Monolayer MoS2 Measured with Time‐Resolved Spectroscopic Ellipsometry.

Published in:

Physica Status Solidi (B), 2025, v. 262, n. 7, p. 1, doi. 10.1002/pssb.70003

By:

Krätschmer, Lucas;
Slimi, Younes;
Trefflich, Lukas;
Espinoza, Shirley;
Rebarz, Mateusz;
Vazquez‐Miranda, Saul;
Seyfarth, Jakob;
Pflug, Theo;
Olbrich, Markus;
Stiehm, Noah;
Hähnlein, Bernd;
Sturm, Chris;
Horn, Alexander;
Andreasson, Jakob;
Grundmann, Marius;
Krischok, Stefan;
Schmidt‐Grund, Rüdiger

Publication type:

Article

Optical and Electronic Analysis of Pure and Fe-Doped ZnO Thin Films Using Spectroscopic Ellipsometry and Kramers–Kronig Method.

Published in:

International Journal of Nanoscience, 2019, v. 18, n. 1, p. N.PAG, doi. 10.1142/S0219581X18500138

By:

Aghgonbad, Maryam Motallebi;
Sedghi, Hassan

Publication type:

Article

Structural, Dielectric and Magnetic Properties of Bi2Fe4O9 Thin Film by RF Magnetron Sputtering.

Published in:

International Journal of Nanoscience, 2015, v. 14, n. 5/6, p. 1550024-1, doi. 10.1142/S0219581X15500246

By:

Santhiya, M.;
Pugazhvadivu, K. S.;
Tamilarasan, K.

Publication type:

Article

SPECTROSCOPIC ELLIPSOMETRIC STUDIES ON THE OPTICAL PROPERTIES OF PHOSPHORUS DOPED NANOCRYSTALLINE NiO THIN FILMS.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 985, doi. 10.1142/S0219581X11008678

By:

DAS, N. S.;
CHATTOPADHYAY, K. K.;
SAHA, B.;
THAPA, R.

Publication type:

Article

OPTICAL PROPERTIES AND VISIBLE ROOM TEMPERATURE PHOTOLUMINESCENCE OF AMORPHOUS SILICON RICH SILICON NITRIDE IN SiO2/SiNX QUANTUM WELL STRUCTURES.

Published in:

International Journal of Nanoscience, 2010, v. 9, n. 4, p. 321, doi. 10.1142/S0219581X10006892

By:

KAMYAB, LOBNA;
RUSLI;
YU, MINGBIN;
HE, LINING;
DUA, MANIK

Publication type:

Article

NITRIDATION OF SILICON WITH AMMONIA AND NITROGEN.

Published in:

International Journal of Nanoscience, 2010, v. 9, n. 3, p. 169, doi. 10.1142/S0219581X10006582

By:

CHAUSTOWSKI, RENE;
WANG, YONG;
ZOU, JIN;
HAN, JISHENG;
DIMITRIJEV, SIMA

Publication type:

Article

THERMAL STABILITY STUDY OF TANTALUM NITRIDE THIN FILMS BY SPECTROSCOPIC ELLIPSOMETRY.

Published in:

International Journal of Nanoscience, 2004, v. 3, n. 4/5, p. 489, doi. 10.1142/S0219581X04002292

By:

Xie, H.;
Tan, B. H.;
Collier, P. A.;
Ng, F. L.

Publication type:

Article

Spectroscopic Evaluation of Mixing and Crystallinity of Fullerenes in Bulk Heterojunctions.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 44, p. 6972, doi. 10.1002/adfm.201401626

By:

Guilbert, Anne A. Y.;
Schmidt, Malte;
Bruno, Annalisa;
Yao, Jizhong;
King, Simon;
Tuladhar, Sachetan M.;
Kirchartz, Thomas;
Alonso, M. Isabel;
Goñi, Alejandro R.;
Stingelin, Natalie;
Haque, Saif A.;
Campoy‐Quiles, Mariano;
Nelson, Jenny

Publication type:

Article

Impact of Substrate and Processing on Confinement of Nafion Thin Films.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 30, p. 4763, doi. 10.1002/adfm.201304311

By:

Kusoglu, Ahmet;
Kushner, Douglas;
Paul, Devproshad K.;
Karan, Kunal;
Hickner, Michael A.;
Weber, Adam Z.

Publication type:

Article

Reversible Amorphous-to-Amorphous Transitions in Chalcogenide Films: Correlating Changes in Structure and Optical Properties.

Published in:

Advanced Functional Materials, 2013, v. 23, n. 16, p. 2052, doi. 10.1002/adfm.201202461

By:

Kalyva, Maria;
Orava, Jiri;
Siokou, Angeliki;
Pavlista, Martin;
Wagner, Tomas;
Yannopoulos, Spyros N.

Publication type:

Article

Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 451, doi. 10.1007/s10854-008-9668-3

By:

Mistrik, J.;
Cechalova, B.;
Studynka, J.;
Cech, V.

Publication type:

Article

Spectroscopic ellipsometry study of In2O3 thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 71, doi. 10.1007/s10854-007-9447-6

By:

Miao, L.;
Tanemura, S.;
Cao, Y. G.;
Xu, G.

Publication type:

Article

1D-photonic crystals prepared from the amorphous chalcogenide films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 346, doi. 10.1007/s10854-008-9619-z

By:

Kohoutek, Tomas;
Orava, Jiri;
Wagner, Tomas;
Hrdlicka, Martin;
Vlcek, Milan;
Frumar, Miloslav

Publication type:

Article

Characterization of poly(vinylidene fluoride-trifluoroethylene) 50/50 copolymer films as a gate dielectric.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 45, doi. 10.1007/s10854-007-9266-9

By:

Wi, Soojin;
Senthilkumar, N.;
Rhee, Shi-Woo

Publication type:

Article

Optical properties and electronic energy-band structure of CdIn2Te4.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 347, doi. 10.1007/s10854-007-9244-2

By:

Ozaki, Shunji;
Take, Yoshinari;
Adachi, Sadao

Publication type:

Article

Thickness-dependent optical properties of ZnO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 343, doi. 10.1007/s10854-007-9243-3

By:

Miao, L.;
Tanemura, S.;
Tanemura, M.;
Lau, S. P.;
Tay, B. K.

Publication type:

Article

Crystallization of thin-film Si monitored in real time by in-situ spectroscopic techniques.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 309, doi. 10.1007/s10854-007-9222-8

By:

Stradins, P.;
Teplin, C. W.;
Young, D. L.;
Yan, Y.;
Branz, H. M.;
Wang, Q.

Publication type:

Article

Optical properties of nanocrystalline diamond films from mid-infrared to ultraviolet using reflectometry and ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 37, doi. 10.1007/s10854-007-9175-y

By:

Hu, Z. G.;
Prunici, P.;
Hess, P.;
Chen, K. H.

Publication type:

Article

Antimicrobial efficacy of N-halamine coatings prepared via dip and spray layer-by-layer deposition.

Published in:

Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2015, v. 96, p. 12, doi. 10.1016/j.fbp.2015.06.002

By:

Denis-Rohr, Anna;
Bastarrachea, Luis J.;
Goddard, Julie M.

Publication type:

Article

Phase-Spectral Ellipsometry Method for Nondestructive Control of the Chemical Composition of thin Metal-Oxide Heterostructures.

Published in:

Measurement Techniques, 2022, v. 65, n. 8, p. 608, doi. 10.1007/s11018-023-02128-6

By:

Tyurin, D. N.;
Kotenev, V. A.

Publication type:

Article

Ellipsometric Technique for Estimating the Thickness Nonuniformity of Thin-Film Coatings.

Published in:

Measurement Techniques, 2014, v. 56, n. 11, p. 1224, doi. 10.1007/s11018-014-0358-7

By:

Baturin, A.;
Bormashov, V.;
Gavrilenko, V.;
Zablotskii, A.;
Zaitsev, S.;
Kuzin, A.;
Todua, P.;
Filippov, M.

Publication type:

Article

Study of Ferroelectric Bi3.25La0.75Ti3O12 Thin Films Deposited by Sol-Gel Method.

Published in:

Ferroelectrics, 2010, v. 397, n. 1, p. 112, doi. 10.1080/00150193.2010.484748

By:

Khachane, M.;
Chevallier, V.;
Gavarri, J. R.;
Muller, Ch.;
Turquat, C.;
Elaatmani, M.;
Zegzouti, A.;
Luk'yanchuk, I. A.

Publication type:

Article

Optical Properties of BST Thin Films by Spectroscopic Ellipsometry and Optical Reflectivity.

Published in:

Ferroelectrics, 2008, v. 370, n. 1, p. 126, doi. 10.1080/00150190802384476

By:

Chvostová, D.;
Železný, V.;
Pajasová, L.;
Šimek, D.;
Jelínek, M.;
Matěj, Z.

Publication type:

Article

Spectroscopic Ellipsometry Studies of Ferroelectric SbSexS1—xI Crystals.

Published in:

Ferroelectrics, 2008, v. 366, n. 1, p. 45, doi. 10.1080/00150190802363124

By:

AUDZIJONIS, A.;
RÈZA, A.;
ŽALTAUSKAS, R.;
ŽIGAS, L.;
SEREIKA, R.;
PAŠKEVIČ, Č.;
PAULIUKAS, A.

Publication type:

Article

Electrical and Infrared Optical Properties of Ba0.70Sr0.30TiO3 Thin Films Prepared by a Sol-Gel Process.

Published in:

Ferroelectrics, 2007, v. 357, n. 1, p. 148, doi. 10.1080/00150190701542729

By:

Xu, Jinbao;
Zhai, Jiwei;
Yao, Xi

Publication type:

Article

Tunability and Optical Properties of Paraelectric BaZr0.30Ti0.70O3 Thin Films Grown by a Sol-Gel Process.

Published in:

Ferroelectrics, 2007, v. 357, n. 1, p. 166, doi. 10.1080/00150190701542802

By:

Jinbao Xu;
Jiwei Zhai;
Xi Yao

Publication type:

Article

Optical Properties of Li Doped KTaO3 Using Spectroscopic Ellipsometer.

Published in:

Ferroelectrics, 2007, v. 355, n. 1, p. 171, doi. 10.1080/00150190701519263

By:

Yokota, Hiroko;
Teyssier, Jeremie;
Dantec, Ronan Le;
Uesu, Yoshiaki;
Bouillot, Jacques

Publication type:

Article

Effect of Polymer Stabilization on Molecular Reorientational Motion of Ferroelectric Liquid Crystals.

Published in:

Ferroelectrics, 2007, v. 355, n. 1, p. 176, doi. 10.1080/00150190701519354

By:

Furue, Hirokazu;
Hiyama, Yoshiro;
Hatano, Jun

Publication type:

Article

Temperature Stability of the Electro-Optic Response of Highly Fluorinated Side Chain Organic Copolymers.

Published in:

Ferroelectrics, 2007, v. 352, n. 1, p. 35, doi. 10.1080/00150190701354901

By:

Belardini, A.;
Michelotti, F.;
Rousseau, A.;
Ratsimihety, A.

Publication type:

Article

Ferroelectric Thin Films: Deposition, Advanced Film Characterization and Novel Device Concepts.

Published in:

Ferroelectrics, 2006, v. 335, n. 1, p. 137, doi. 10.1080/00150190600689712

By:

Suchaneck, G.;
Gerlach, G.

Publication type:

Article

Ba x Sr 1 - x TiO 3 Thin Films Deposited by RF Hollow Cathode Plasma Jet Technique.

Published in:

Ferroelectrics, 2005, v. 317, n. 1, p. 1, doi. 10.1080/00150190590963327

By:

Hubička, Z.;
OlejnÍček, J.;
Čada, M.;
Virostko, P.;
ŠÍchová, H.;
Deyneka, A.;
JastrabÍk, L.;
Chvostová, D.;
ŠÍcha, M.

Publication type:

Article

Deposition of PZT Thin Films on Polymer Substrate by Means of Low Pressure Plasma Jet System.

Published in:

Ferroelectrics, 2005, v. 316, n. 1, p. 157, doi. 10.1080/00150190590963291

By:

Deyneka, A.;
Hubicka, Z.;
Jastrabik, L.;
Cada, M.;
Virostko, P.;
Olejnicek, J.;
Suchaneck, G.;
Gerlach, G.

Publication type:

Article

Ellipsometry of High Temperature Phase Transitions in PZT and (ZnLi)O Films.

Published in:

Ferroelectrics, 2004, v. 298, n. 1, p. 55, doi. 10.1080/00150190490423200

By:

Deyneka, A.;
Suchaneck, G.;
Hubicka, Z.;
Jastranik, L.;
Gerlach, G.

Publication type:

Article

Experimental Determination of the Electro-Optic Coefficients in BaTiO 3 :Rh at 633 nm and 850 nm.

Published in:

Ferroelectrics, 2003, v. 296, n. 1, p. 47, doi. 10.1080/00150190390238937

By:

Maillard, A.;
Bahsine, S.;
Kugel, G.;
Rytz, D.;
Klein, R. S.

Publication type:

Article

High-Temperature Phases in PZT Ferroelectric Films.

Published in:

Ferroelectrics, 2003, v. 293, n. 1, p. 111, doi. 10.1080/00150190390238270

By:

Deyneka, A.;
Suchaneck, G.;
Jastrabik, L.;
Gerlach, 0.

Publication type:

Article

Determination of the Optical Properties of Sol-Gel-Derived Pb(Zr x Ti (1 - x ) )O 3 Thin Films by Spectroscopic Ellipsometry.

Published in:

Ferroelectrics, 2003, v. 287, n. 1, p. 35, doi. 10.1080/00150190390201298

By:

Shenohong Yang;
Dang Mo;
Xinggui Tang

Publication type:

Article

Cloud-based Optical Characterization of Hard Disk Drive Recording Heads.

Published in:

Sensors & Materials, 2018, v. 30, n. 10, p. 2235, doi. 10.18494/SAM.2018.1850

By:

Weerayuth Khunrattanasiri;
Anchyza Yokpradit;
Siridech Boonsang;
Teerawat Tongloy

Publication type:

Article

Equations of State and the ellipsometry diagnostics.

Published in:: Laser & Particle Beams, 2009, v. 27, n. 1, p. 79, doi. 10.1017/S0263034609000111
Publication type:: Article

Can the narrow red bands of dragonflies be used to perceive wing interference patterns?

Published in:

Ecology & Evolution (20457758), 2018, v. 8, n. 11, p. 5369, doi. 10.1002/ece3.4054

By:

Brydegaard, Mikkel;
Jansson, Samuel;
Schulz, Marcus;
Runemark, Anna

Publication type:

Article

Determination of the electrostatic potential distribution in Pt/Fe:SrTiO3/ Nb:SrTiO3 thin-film structures by electron holography.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep06975

By:

Marchewka, Astrid;
Cooper, David;
Lenser, Christian;
Menzel, Stephan;
Du, Hongchu;
Dittmann, Regina;
Dunin-Borkowski, Rafal E.;
Waser, Rainer

Publication type:

Article

Analysis of interactions between SNARE proteins using imaging ellipsometer coupled with microfluidic array.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep05341

By:

Cai Qi;
Hong Zhang;
Li Liu;
Yinke Yang;
Tengfei Kang;
Wenxin Hao;
Gang Jin;
Taijiao Jiang

Publication type:

Article

Understanding Light Harvesting in Radial Junction Amorphous Silicon Thin Film Solar Cells.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep04357

By:

Linwei Yu;
Misra, Soumyadeep;
Junzhuan Wang;
Shengyi Qian;
Foldyna, Martin;
Jun Xu;
Yi Shi;
Johnson, Erik;
Cabarrocas, Pere Roca i

Publication type:

Article

Understanding Light Harvesting in Radial Junction Amorphous Silicon Thin Film Solar Cells.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep04357

By:

Linwei Yu;
Soumyadeep Misra;
Junzhuan Wang;
Shengyi Qian;
Martin Foldyna;
Jun Xu;
Yi Shi;
Erik Johnson;
Pere Roca i Cabarrocas

Publication type:

Article

Optical Characterization of SnO2 Thin Film Using Variable Angle Spectroscopic Ellipsometry for Solar Cell Applications.

Published in:

Journal of Nano- & Electronic Physics, 2023, v. 15, n. 3, p. 1, doi. 10.21272/jnep.15(3).03034

By:

Bounegab, A.;
Boulesbaa, M.

Publication type:

Article

Angular Ellipsometry of Porous Silicon Surface Layers.

Published in:

Journal of Nano- & Electronic Physics, 2020, v. 12, n. 3, p. 1, doi. 10.21272/jnep.12(3).03024

By:

Poperenko, L. V.;
Rozouvan, S. G.;
Yurgelevych, I. V.;
Lishchuk, P. O.

Publication type:

Article

Crystalline Volume Fraction Effect on the Electronic Properties of Hydrogenated Microcrystalline Silicon μc-Si:H Investigated by Ellipsometry and AMPS-1D Simulation.

Published in:

Journal of Nano- & Electronic Physics, 2019, v. 11, n. 1, p. 1, doi. 10.21272/jnep.11(1).01014

By:

Benhabara, H.;
Sib, J. D.;
Bouhekka, A.;
Chahi, M.;
Benlakhel, D.;
Kebbab, A.;
Bouizem, Y.;
Chahed, L.

Publication type:

Article

Spectroscopic Ellipsometry Studies and Temperature Behaviour of the Dielectric Function of TlInS2 Layered Crystal.

Published in:

Journal of Nano- & Electronic Physics, 2017, v. 9, n. 5, p. 1, doi. 10.21272/jnep.9(5).05025

By:

Gomonnai, O. O.;
Gordan, O.;
Guranich, P. P.;
Huranich, P.;
Slivka, A. G.;
Gomonnai, A. V.;
Zahn, D. R. T.

Publication type:

Article

Multiangular and Spectral Ellipsometry for Semiconductor Nanostructures Classification.

Published in:

Journal of Nano- & Electronic Physics, 2014, v. 6, n. 2, p. 02002-1

By:

Goloborodko, A. A.;
Epov, M. V.;
Robur, L. Y.;
Rodionova, T. V.

Publication type:

Article