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Dielectric Response of Different Alcohols in Water-Rich Binary Mixtures from THz Ellipsometry.
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- International Journal of Molecular Sciences, 2024, v. 25, n. 8, p. 4240, doi. 10.3390/ijms25084240
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- Article
A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.
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- Experimental Mechanics, 2024, v. 64, n. 3, p. 341, doi. 10.1007/s11340-023-01026-w
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- Article
Deterministic reflection contrast ellipsometry for thick multilayer two-dimensional heterostructures.
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- Nanophotonics (21928606), 2024, v. 13, n. 8, p. 1417, doi. 10.1515/nanoph-2023-0753
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Generic characterization method for nano-gratings using deep-neural-network-assisted ellipsometry.
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- Nanophotonics (21928606), 2024, v. 13, n. 7, p. 1181, doi. 10.1515/nanoph-2023-0798
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- Article
Atomic force microscopy and ellipsometry investigations of rare earth oxide Dy<sub>2</sub>O<sub>3</sub> nano-layer processed by electron beam evaporation on n-GaAs substrate.
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- Optical & Quantum Electronics, 2024, v. 56, n. 3, p. 1, doi. 10.1007/s11082-023-05866-7
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- Article
Regime Map of the Effective Medium Approximation Modelling of Micro-Rough Surfaces in Ellipsometry.
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- Sensors (14248220), 2024, v. 24, n. 4, p. 1242, doi. 10.3390/s24041242
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- Article
Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO 2 Substrates Determined via Spectroscopic Ellipsometry.
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- Coatings (2079-6412), 2024, v. 14, n. 2, p. 166, doi. 10.3390/coatings14020166
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Real-time spectroscopic ellipsometry of plasmonic nanoparticle growth in polyvinyl alcohol thin films.
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- Journal of Nanoparticle Research, 2024, v. 26, n. 2, p. 1, doi. 10.1007/s11051-024-05937-0
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- Article
Optical constants of exoplanet haze analogs from 0.3 to 30 µm: Comparative sensitivity between spectrophotometry and ellipsometry.
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- Astronomy & Astrophysics / Astronomie et Astrophysique, 2024, v. 682, p. 1, doi. 10.1051/0004-6361/202346820
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- Article
Performance of machine learning algorithms in spectroscopic ellipsometry data analysis of ZnTiO<sub>3</sub> nanocomposite.
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- Scientific Reports, 2024, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-50620-4
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- Article
Ultrathin Film Hydrogels with Controlled Swelling and Viscoelastic Properties Deposited by Nanosecond Pulsed Plasma Induced‐Polymerization.
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- Advanced Materials Interfaces, 2024, v. 11, n. 2, p. 1, doi. 10.1002/admi.202300644
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- Article
Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity.
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- Coatings (2079-6412), 2024, v. 14, n. 1, p. 5, doi. 10.3390/coatings14010005
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- Article
Atomic Layer Deposition for Tailoring Tamm Plasmon-Polariton with Ultra-High Accuracy.
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- Coatings (2079-6412), 2024, v. 14, n. 1, p. 33, doi. 10.3390/coatings14010033
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- Article
Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy.
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- Physics of Metals & Metallography, 2023, v. 124, n. 14, p. 1654, doi. 10.1134/S0031918X23601385
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Spectroscopic ellipsometry modelling of Cr<sup>+</sup> implanted copper oxide thin films.
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- Scientific Reports, 2023, p. 1, doi. 10.1038/s41598-023-49133-x
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- Article
Variable Angle Spectroscopic Ellipsometry Characterization of DMOAP-Functionalized Graphene Oxide Films.
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- Coatings (2079-6412), 2023, v. 13, n. 12, p. 2066, doi. 10.3390/coatings13122066
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- Article
Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach.
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- Journal of Applied Spectroscopy, 2023, v. 90, n. 5, p. 1092, doi. 10.1007/s10812-023-01637-0
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- Article
Spectroscopic Ellipsometry Study of Thermally Evaporated Tin Telluride (SnTe) Thin Films.
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- Journal of Electronic Materials, 2023, v. 52, n. 11, p. 7132, doi. 10.1007/s11664-023-10635-z
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Polymer-Embedding Germanium Nanostrip Waveguide of High Polarization Extinction.
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- Polymers (20734360), 2023, v. 15, n. 20, p. 4093, doi. 10.3390/polym15204093
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First Experimental Evidence of Amorphous Tin Oxide Formation in Lead‐Free Perovskites by Spectroscopic Ellipsometry.
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- Solar RRL, 2023, v. 7, n. 20, p. 1, doi. 10.1002/solr.202300610
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- Article
Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers.
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- Polymers (20734360), 2023, v. 15, n. 18, p. 3752, doi. 10.3390/polym15183752
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- Article
Study of Tunable Dielectric Permittivity of PBDB-T-2CL Polymer in Ternary Organic Blend Thin Films Using Spectroscopic Ellipsometry.
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- Polymers (20734360), 2023, v. 15, n. 18, p. 3771, doi. 10.3390/polym15183771
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Investigation of dual intrinsic a-Si:H films for crystalline silicon surface passivation by spectroscopic ellipsometry: application in silicon heterojunction solar cells.
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- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 8, p. 1, doi. 10.1007/s00339-023-06854-0
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In Situ Monitoring of Aptamer–Protein Binding on a ZnO Surface Using Spectroscopic Ellipsometry.
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- Sensors (14248220), 2023, v. 23, n. 14, p. 6353, doi. 10.3390/s23146353
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- Article
Rebuttal on the "comment paper referring to spectroscopic ellipsometry and solar cell performance of Cs‑doped MA<sub>0.05</sub>FA<sub>0.95</sub>Pb(I<sub>0.98</sub>Br<sub>0.02</sub>)<sub>3</sub> triple cation perovskite thin films for solar cell applications)" by M. A. Ebdah
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- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 7, p. 1, doi. 10.1007/s00339-023-06706-x
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- Article
Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu 3 N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber.
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- Coatings (2079-6412), 2023, v. 13, n. 7, p. 1148, doi. 10.3390/coatings13071148
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- Article
Optical Properties of Ferroelectric Films Hf<sub>x</sub>Zr<sub>y</sub>O<sub>2</sub> and La:Hf<sub>x</sub>Zr<sub>y</sub>O<sub>2</sub> according to Ellipsometry Data.
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- Optics & Spectroscopy, 2023, v. 131, n. 7, p. 550, doi. 10.1134/S0030400X23050107
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- Article
Investigation of Electrochromic, Combinatorial TiO 2 -SnO 2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models.
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- Materials (1996-1944), 2023, v. 16, n. 12, p. 4204, doi. 10.3390/ma16124204
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- Article
Comment on "Spectroscopic ellipsometry and solar cell performance of Cs-doped MA<sub>0.05</sub>FA<sub>0.95</sub>Pb(I<sub>0.98</sub>Br<sub>0.02</sub>)<sub>3</sub> triple cation perovskite thin films for solar cell applications" by A. M. El-naggar et al. (Applied Physics A (2022) 128:378)
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- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 6, p. 1, doi. 10.1007/s00339-023-06691-1
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- Article
Spectroscopic ellipsometry studies of optical properties of TlIn(S<sub>0.25</sub>Se<sub>0.75</sub>)<sub>2</sub> crystal.
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- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 6, p. 1, doi. 10.1007/s00339-023-06729-4
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- Article
Tunable Encapsulation and Doping of Monolayer MoS<sub>2</sub> by In Situ Probing of Excitonic Properties During Atomic Layer Deposition.
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- Advanced Materials Interfaces, 2023, v. 10, n. 15, p. 1, doi. 10.1002/admi.202202429
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- Article
Tunable Encapsulation and Doping of Monolayer MoS<sub>2</sub> by In Situ Probing of Excitonic Properties During Atomic Layer Deposition.
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- Advanced Materials Interfaces, 2023, v. 10, n. 15, p. 1, doi. 10.1002/admi.202202429
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- Article
Absorption edge characteristics of β-Ga2O3 single crystal.
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- Modern Physics Letters B, 2023, v. 37, n. 14, p. 1, doi. 10.1142/S0217984923500306
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- Article
Large‐Scale Formation of Uniform Porous Ge Nanostructures with Tunable Physical Properties.
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- Advanced Materials Interfaces, 2023, v. 10, n. 14, p. 1, doi. 10.1002/admi.202202495
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- Article
Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 873, doi. 10.3390/coatings13050873
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- Article
Oxides Film Formed on Fe- and Ni-Based Alloys: An Ellipsometry Insight.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 882, doi. 10.3390/coatings13050882
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- Article
Optimization of Bulk Heterojunction Photovoltaic Structures with Heterocyclic Derivatives.
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- Crystals (2073-4352), 2023, v. 13, n. 5, p. 734, doi. 10.3390/cryst13050734
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- Article
Optical Characterization of SnO2 Thin Film Using Variable Angle Spectroscopic Ellipsometry for Solar Cell Applications.
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- Journal of Nano- & Electronic Physics, 2023, v. 15, n. 3, p. 1, doi. 10.21272/jnep.15(3).03034
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Nondestructive monitoring of annealing and chemical–mechanical planarization behavior using ellipsometry and deep learning.
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- Microsystems & Nanoengineering, 2023, v. 9, n. 1, p. 1, doi. 10.1038/s41378-023-00529-9
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- Article
Ellipsometry Characterisation for the Cd 1-x Zn x Te 1-y Se y Semiconductor Used in X-ray and Gamma Radiation Detectors.
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- Crystals (2073-4352), 2023, v. 13, n. 4, p. 693, doi. 10.3390/cryst13040693
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- Article
Ellipsometry study of optical properties and dielectric response of SnS<sub>2</sub> and GaS crystals.
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- Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 9, p. 1, doi. 10.1007/s10854-023-10170-x
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A comparative study on the structural and spectroscopic ellipsometry characterizations of (Co, Ni)-doped SnO<sub>2</sub> nanostructured films spin-coated on glass substrates.
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- Bulletin of Materials Science, 2023, v. 46, n. 1, p. 1, doi. 10.1007/s12034-022-02814-1
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Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers.
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- Journal of the European Optical Society, 2023, v. 19, n. 1, p. 1, doi. 10.1051/jeos/2023018
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Ellipsometry study on silicon nitride film with uneven thickness distribution by plasma-enhanced chemical vapor deposition.
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- Optical & Quantum Electronics, 2023, v. 55, n. 3, p. 1, doi. 10.1007/s11082-022-04270-x
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Probing the Molecular Dynamics of Aqueous Binary Solutions with THz Time-Domain Ellipsometry.
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- Sensors (14248220), 2023, v. 23, n. 4, p. 2292, doi. 10.3390/s23042292
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Defocus Effect Correction for Back Focal Plane Ellipsometry for Antivibration Measurement of Thin Films.
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- Applied Sciences (2076-3417), 2023, v. 13, n. 3, p. 1738, doi. 10.3390/app13031738
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Investigations of Optical Functions and Optical Transitions of 2D Semiconductors by Spectroscopic Ellipsometry and DFT.
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- Nanomaterials (2079-4991), 2023, v. 13, n. 1, p. 196, doi. 10.3390/nano13010196
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Investigation of Dielectric Functions of a Layer of Ag Nanoparticles on Silicon Using Spectro-Ellipsometry and Spectrophotometry.
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- Optics & Spectroscopy, 2023, v. 131, n. 1, p. 48, doi. 10.1134/S0030400X23030177
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- Article
Charge Transfer Control of Emergent Magnetism at SrMnO<sub>3</sub>/LaMnO<sub>3</sub> Interfaces.
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- Advanced Materials Interfaces, 2022, v. 9, n. 34, p. 1, doi. 10.1002/admi.202201282
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- Article
Spectroscopic Ellipsometry Studies on Solution-Processed OLED Devices: Optical Properties and Interfacial Layers.
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- Materials (1996-1944), 2022, v. 15, n. 24, p. 9077, doi. 10.3390/ma15249077
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- Article