Works matching DE "ELLIPSOMETRY"

Results: 993

Characterizing resists and films with VUV spectroscopic ellipsometry.

Published in:

Solid State Technology, 2001, v. 44, n. 7, p. 165

By:

Boher, Pierre;
Evrard, Patrick;
Piel, Jean Philippe;
Defranoux, Christophe;
Stehle, Jean Louis

Publication type:

Article

Successful ellipsometry at 157nm.

Published in:

Solid State Technology, 2000, v. 43, n. 5, p. 36

By:

Burggraaf, Pieter

Publication type:

Article

Meeting the challenges of thin ONO measurement.

Published in:

Solid State Technology, 1999, v. 42, n. 9, p. S9

By:

Ying, Jin;
Sin, Chiew

Publication type:

Article

A novel pretreatment for thin-film measurements.

Published in:

Solid State Technology, 1999, v. 42, n. 9, p. 83

By:

Danel, Adrien;
Tardif, Francois

Publication type:

Article

Spectroscopic ellipsometry for polymer thin films.

Published in:

Solid State Technology, 1998, v. 41, n. 10, p. 101

By:

Hilfiker, James N.;
Synowicki, Ron A.

Publication type:

Article

Characterization of UV Irradiated Space Application Polymers by Spectroscopic Ellipsometry.

Published in:

Polymer Engineering & Science, 2000, v. 40, n. 2, p. 300, doi. 10.1002/pen.11163

By:

Bungay, Corey L.;
Tiwald, Thomas E.

Publication type:

Article

Synthesis of Well-Defined Polymer Brushes from Silicon Wafers via Surface-Initiated seATRP.

Published in:

Macromolecular Chemistry & Physics, 2017, v. 218, n. 11, p. n/a, doi. 10.1002/macp.201700106

By:

Chmielarz, Paweł;
Krys, Pawel;
Wang, Zongyu;
Wang, Yi;
Matyjaszewski, Krzysztof

Publication type:

Article

Size Impact of Ordered P3HT Nanofibers on Optical Anisotropy.

Published in:

Macromolecular Chemistry & Physics, 2016, v. 217, n. 9, p. 1089, doi. 10.1002/macp.201500516

By:

Lobov, Gleb S.;
Zhao, Yichen;
Marinins, Aleksandrs;
Yan, Min;
Li, Jiantong;
Sugunan, Abhilash;
Thylén, Lars;
Wosinski, Lech;
Östling, Mikael;
Toprak, Muhammet S.;
Popov, Sergei

Publication type:

Article

Probing the Surface Swelling in Ultra-Thin Supported Polystyrene Films During Case II Diffusion of n-Hexane.

Published in:

Macromolecular Chemistry & Physics, 2013, v. 214, n. 21, p. 2480, doi. 10.1002/macp.201300371

By:

Ogieglo, Wojciech;
Wormeester, Herbert;
Wessling, Matthias;
Benes, Nieck E.

Publication type:

Article

One-Step Hierarchical Assembly of Spheres-in-Lamellae Nanostructures from Solvent-Annealed Thin Films of Binary Diblock Copolymer Micelles.

Published in:

Advanced Functional Materials, 2017, v. 27, n. 17, p. n/a, doi. 10.1002/adfm.201606715

By:

Kim, Se Hee;
Char, Kookheon;
Yoo, Seong Il;
Sohn, Byeong‐Hyeok

Publication type:

Article

Spectroscopic Evaluation of Mixing and Crystallinity of Fullerenes in Bulk Heterojunctions.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 44, p. 6972, doi. 10.1002/adfm.201401626

By:

Guilbert, Anne A. Y.;
Schmidt, Malte;
Bruno, Annalisa;
Yao, Jizhong;
King, Simon;
Tuladhar, Sachetan M.;
Kirchartz, Thomas;
Alonso, M. Isabel;
Goñi, Alejandro R.;
Stingelin, Natalie;
Haque, Saif A.;
Campoy‐Quiles, Mariano;
Nelson, Jenny

Publication type:

Article

Impact of Substrate and Processing on Confinement of Nafion Thin Films.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 30, p. 4763, doi. 10.1002/adfm.201304311

By:

Kusoglu, Ahmet;
Kushner, Douglas;
Paul, Devproshad K.;
Karan, Kunal;
Hickner, Michael A.;
Weber, Adam Z.

Publication type:

Article

Reversible Amorphous-to-Amorphous Transitions in Chalcogenide Films: Correlating Changes in Structure and Optical Properties.

Published in:

Advanced Functional Materials, 2013, v. 23, n. 16, p. 2052, doi. 10.1002/adfm.201202461

By:

Kalyva, Maria;
Orava, Jiri;
Siokou, Angeliki;
Pavlista, Martin;
Wagner, Tomas;
Yannopoulos, Spyros N.

Publication type:

Article

Ellipsometry study of optical properties and dielectric response of SnS2 and GaS crystals.

Published in:

Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 9, p. 1, doi. 10.1007/s10854-023-10170-x

By:

Li, Fangxin;
Lian, Jie;
Wei, Mingyang;
Wang, Yueming;
Xu, Zhen;
Zhou, Xiang'an;
Han, Yating

Publication type:

Article

TD-DFT and optical properties of 9,9-dioctyl-9Hfluorene-based oligomer in a thin film and design of DFB laser using ellipsometry studies.

Published in:

Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 29, p. 22913, doi. 10.1007/s10854-022-09060-5

By:

Aljaafreh, Mamduh J.;
Osman, M. M.;
Prasad, Saradh;
AlSalhi, Mohamad S.;
Aldaghri, Osamah;
Tarawneh, Mou'ad A.

Publication type:

Article

Spectroscopic ellipsometry study of Bi12TiO20 single crystals.

Published in:

Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 6, p. 7019, doi. 10.1007/s10854-021-05411-w

By:

Isik, M.;
Gasanly, N. M.;
Darvishov, N. H.;
Bagiev, V. E.

Publication type:

Article

Spectroscopic ellipsometry to precisely estimate the thickness for optimizing the performance of three-layer broadband transparent electrodes.

Published in:

Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 5, p. 5690, doi. 10.1007/s10854-021-05290-1

By:

Lin, Keh-Moh;
Shinde, Swapnil

Publication type:

Article

Composition-sensitive growth kinetics and dispersive optical properties of thin HfxTi1−xO2 (0 ≤ x ≤ 1) films prepared by the ALD method.

Published in:

Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 1, p. 812, doi. 10.1007/s10854-018-0351-z

By:

Atuchin, V. V.;
Lebedev, M. S.;
Korolkov, I. V.;
Kruchinin, V. N.;
Maksimovskii, E. A.;
Trubin, S. V.

Publication type:

Article

Oxidation mode on charge transfer mechanism in formation of Mn-Co-Ni-O spinel films by RF sputtering.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13659, doi. 10.1007/s10854-017-7208-8

By:

Shi, Qin;
Ren, Wei;
Kong, Wenwen;
Wang, Lei;
Ma, Chao;
Xu, Jinbao;
Chang, Aimin;
Jiang, Chunqi

Publication type:

Article

Evolution of nanostructure in hydrogenated amorphous silicon thin films with substrate temperature studied by Raman mapping, Raman scattering and spectroscopic ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 12, p. 8885, doi. 10.1007/s10854-017-6618-y

By:

Madaka, Ramakrishna;
Kanneboina, Venkanna;
Agarwal, Pratima

Publication type:

Article

Optoelectronic and photocatalytic properties of in situ platinum-doped TiO films deposited by means of pulsed laser ablation technique.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3317, doi. 10.1007/s10854-016-5925-z

By:

Trabelsi, K.;
Hajjaji, A.;
Ka, I.;
Gaidi, M.;
Bessais, B.;
El Khakani, M.

Publication type:

Article

Optical and electrical properties of synthesized reactive rf sputter deposited boron-rich and boron-doped diamond-like carbon thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1695, doi. 10.1007/s10854-016-5715-7

By:

Ahmad, A.

Publication type:

Article

Structural, morphological and spectroscopic ellipsometry studies on sputter deposited SbS thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9710, doi. 10.1007/s10854-016-5033-0

By:

Medina-Montes, M.;
Montiel-González, Z.;
Paraguay-Delgado, F.;
Mathews, N.;
Mathew, X.

Publication type:

Article

Transparent conductive ZnO thin films grown by chemical spray pyrolysis: the effect of Mg.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 8, p. 8478, doi. 10.1007/s10854-016-4862-1

By:

Kurtaran, S.;
Aldag, S.;
Ofofoglu, G.;
Akyuz, I.;
Atay, F.

Publication type:

Article

Borosilicate glass nanolayer as a spin-on dopant source: FTIR and spectroscopic ellipsometry investigations.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6292, doi. 10.1007/s10854-016-4561-y

By:

Perova, T.;
Nolan-Jones, M.;
McGilp, J.;
Gamble, H.

Publication type:

Article

Assessment of refractive index changes by spectral reflectance in the first stages of AlGaN layer growth using SiN treatment.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6336, doi. 10.1007/s10854-016-4568-4

By:

Benzarti, Z.;
Khelifi, M.;
Khalfallah, A.;
El Jani, B.

Publication type:

Article

Effect of substrate temperature and post-deposition annealing on intrinsic a-SiO:H film for n-Cz-Si wafer passivation.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4659, doi. 10.1007/s10854-016-4344-5

By:

He, Yuping;
Huang, Haibin;
Zhou, Lang;
Yue, Zhihao;
Yuan, Jiren

Publication type:

Article

Enhancement in the physical properties of spray deposited nanostructured ternary PbMgS thin films towards optoelectronic applications.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5070, doi. 10.1007/s10854-016-4396-6

By:

Rajashree, C.;
Balu, A.;
Nagarethinam, V.

Publication type:

Article

Lutentium incorporation influence on ZnO thin films coated via a sol-gel route: spin coating technique.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5089, doi. 10.1007/s10854-016-4399-3

By:

Turgut, G.;
Duman, S.;
Ozcelik, F.;
Gurbulak, B.;
Doğan, S.

Publication type:

Article

Structural modification and piezoelectric properties in BiNaTiO-BaTiO-SrTiO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 215, doi. 10.1007/s10854-015-3740-6

By:

Li, Wei;
Li, Peng;
Zeng, Huarong;
Hao, Jigong;
Yue, Zhenxing;
Zhai, Jiwei

Publication type:

Article

Optical properties of ZnS/Ag/ZnS transparent conductive sandwich structures investigated by spectroscopic ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 4085, doi. 10.1007/s10854-015-2948-9

By:

Zolanvari, A.;
Norouzi, R.;
Sadeghi, H.

Publication type:

Article

Effect of Cr doping on the structure, optical and magnetic properties of multiferroic BiFeO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1215, doi. 10.1007/s10854-011-0575-7

By:

Deng, Huan;
Deng, Hongmei;
Yang, Pingxiong;
Chu, Junhao

Publication type:

Article

Optical, structural and surface characterization of CdO:Mg films.

Published in:

Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 5, p. 492, doi. 10.1007/s10854-010-0166-z

By:

Atay, F.;
Akyuz, I.;
Kose, S.;
Ketenci, E.;
Bilgin, V.

Publication type:

Article

Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 451, doi. 10.1007/s10854-008-9668-3

By:

Mistrik, J.;
Cechalova, B.;
Studynka, J.;
Cech, V.

Publication type:

Article

Spectroscopic ellipsometry study of In2O3 thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 71, doi. 10.1007/s10854-007-9447-6

By:

Miao, L.;
Tanemura, S.;
Cao, Y. G.;
Xu, G.

Publication type:

Article

1D-photonic crystals prepared from the amorphous chalcogenide films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 346, doi. 10.1007/s10854-008-9619-z

By:

Kohoutek, Tomas;
Orava, Jiri;
Wagner, Tomas;
Hrdlicka, Martin;
Vlcek, Milan;
Frumar, Miloslav

Publication type:

Article

Characterization of poly(vinylidene fluoride-trifluoroethylene) 50/50 copolymer films as a gate dielectric.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 45, doi. 10.1007/s10854-007-9266-9

By:

Wi, Soojin;
Senthilkumar, N.;
Rhee, Shi-Woo

Publication type:

Article

Optical properties and electronic energy-band structure of CdIn2Te4.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 347, doi. 10.1007/s10854-007-9244-2

By:

Ozaki, Shunji;
Take, Yoshinari;
Adachi, Sadao

Publication type:

Article

Thickness-dependent optical properties of ZnO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 343, doi. 10.1007/s10854-007-9243-3

By:

Miao, L.;
Tanemura, S.;
Tanemura, M.;
Lau, S. P.;
Tay, B. K.

Publication type:

Article

Crystallization of thin-film Si monitored in real time by in-situ spectroscopic techniques.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 309, doi. 10.1007/s10854-007-9222-8

By:

Stradins, P.;
Teplin, C. W.;
Young, D. L.;
Yan, Y.;
Branz, H. M.;
Wang, Q.

Publication type:

Article

Optical properties of nanocrystalline diamond films from mid-infrared to ultraviolet using reflectometry and ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 37, doi. 10.1007/s10854-007-9175-y

By:

Hu, Z. G.;
Prunici, P.;
Hess, P.;
Chen, K. H.

Publication type:

Article

Poly(ethyleneimine) microcapsules: glutaraldehyde-mediated assembly and the influence of molecular weight on their properties.

Published in:

Polymers for Advanced Technologies, 2008, v. 19, n. 7, p. 817, doi. 10.1002/pat.1040

By:

Tong, Weijun;
Gao, Changyou;
Möhwald, Helmuth

Publication type:

Article

Synthesis and characterization of surface-initiated polymer brushes on silicon substrates by reversible addition fragmentation chain transfer polymerization.

Published in:

Polymers for Advanced Technologies, 2008, v. 19, n. 4, p. 285, doi. 10.1002/pat.1008

By:

Wang, Li-Ping;
Wang, Yun-Pu;
Yuan, Kun;
Lei, Zi-Qiang

Publication type:

Article

Optical constants of exoplanet haze analogs from 0.3 to 30 µm: Comparative sensitivity between spectrophotometry and ellipsometry.

Published in:

Astronomy & Astrophysics / Astronomie et Astrophysique, 2024, v. 682, p. 1, doi. 10.1051/0004-6361/202346820

By:

Drant, T.;
Garcia-Caurel, E.;
Perrin, Z.;
Sciamma-O'Brien, E.;
Carrasco, N.;
Vettier, L.;
Gautier, T.;
Brubach, J.-B.;
Roy, P.;
Kitzmann, D.;
Heng, K.

Publication type:

Article

The optical properties of Al-8 at.% Ce alloy in the liquid, amorphous, and crystalline states.

Published in:

High Temperature, 2009, v. 47, n. 3, p. 331, doi. 10.1134/S0018151X09030055

By:

Akashev, L.;
Sidorov, V.

Publication type:

Article

Broadband optical properties of monolayer and bulk MoS2.

Published in:

NPJ 2D Materials & Applications, 2020, v. 4, n. 1, p. 1, doi. 10.1038/s41699-020-0155-x

By:

Ermolaev, Georgy A.;
Stebunov, Yury V.;
Vyshnevyy, Andrey A.;
Tatarkin, Dmitry E.;
Yakubovsky, Dmitry I.;
Novikov, Sergey M.;
Baranov, Denis G.;
Shegai, Timur;
Nikitin, Alexey Y.;
Arsenin, Aleksey V.;
Volkov, Valentyn S.

Publication type:

Article

Atypical retardation pattern in measurements of scanning laser polarimetry and its relating factors.

Published in:

Eye (0950-222X), 2009, v. 23, n. 9, p. 1796, doi. 10.1038/eye.2008.365

By:

Yanagisawa, M.;
Tomidokoro, A.;
Saito, H.;
Mayama, C.;
Aihara, M.;
Tomita, G.;
Shoji, N.;
Araie, M.

Publication type:

Article

Spectro-ellipsometric Characterization and Gaseous Occlusion of Fullerene C60 Crystals.

Published in:

Fullerenes, Nanotubes & Carbon Nanostructures, 2003, v. 11, n. 1, p. 15, doi. 10.1081/FST-120018669

By:

Matsumoto, K.;
Maeda, H.;
Postava, K.;
Takahashi, K.;
Aoyama, M.;
Yamaguchi, T.;
Pistora, J.

Publication type:

Article

Real-time, label-free characterization of oligosaccharide-binding proteins using carbohydrate microarrays and an ellipsometry-based biosensor.

Published in:

Instrumentation Science & Technology, 2017, v. 45, n. 5, p. 506, doi. 10.1080/10739149.2016.1278017

By:

Sun, Yung-Shin;
Zhu, X. D.

Publication type:

Article

EFFECT OF SURFACE ENERGY ON THE GROWTH OF DIAMOND-LIKE CARBON/AMORPHOUS SILICON FILMS ON VARIOUS SUBSTRATES.

Published in:

Instrumentation Science & Technology, 2013, v. 41, n. 3, p. 213, doi. 10.1080/10739149.2012.751604

By:

Srisang, C.;
Asanithi, P.;
Limsuwan, S.;
Pokaipisit, A.;
Limsuwan, P.

Publication type:

Article