Works matching DE "ELLIPSOMETERS"

Results: 25

Optical properties of zinc borotellurite glass system doped with erbium and erbium nanoparticles for photonic applications.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 5, p. 4318, doi. 10.1007/s10854-016-6056-2

By:

Azlan, M.;
Halimah, M.;
El-Mallawany, R.;
Faznny, M.;
Eevon, C.

Publication type:

Article

Influence of Bi concentration on structural and optical properties of Bi doped p-type ZnO thin films prepared by sol-gel method.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2360, doi. 10.1007/s10854-015-4033-9

By:

Singh, Brijesh;
Tripathi, Shweta

Publication type:

Article

Measurement of refractive indices of tunicates' tunics: light reflection of the transparent integuments in an ascidian Rhopalaea sp. and a salp Thetys vagina.

Published in:

Zoological Letters, 2017, v. 3, p. 1, doi. 10.1186/s40851-017-0067-6

By:

Hiroshi Kakiuchida;
Daisuke Sakai;
Jun Nishikawa;
Euichi Hirose

Publication type:

Article

Optical properties of single-crystal Gd3Ga5O12 from the infrared to ultraviolet.

Published in:

Physica Status Solidi (B), 2015, v. 252, n. 10, p. 2191, doi. 10.1002/pssb.201552115

By:

Ghimire, Kiran;
Haneef, Hamna F.;
Collins, Robert W.;
Podraza, Nikolas J.

Publication type:

Article

Phase-based method in heterodyne-modulated ellipsometer.

Published in:

Applied Physics B: Lasers & Optics, 2013, v. 113, n. 4, p. 537, doi. 10.1007/s00340-013-5503-5

By:

Tsai, Hsiu-An;
Lo, Yu-Lung

Publication type:

Article

Optical properties and bandgap evolution of ALD HfSiO films.

Published in:

Nanoscale Research Letters, 2015, v. 10, n. 1, p. 1, doi. 10.1186/s11671-014-0724-z

By:

Yang, Wen;
Fronk, Michael;
Geng, Yang;
Chen, Lin;
Sun, Qing-Qing;
Gordan, Ovidiu;
zhou, Peng;
Zahn, Dietrich;
Zhang, David

Publication type:

Article

Optical properties and bandgap evolution of ALD HfSiO films.

Published in:

Nanoscale Research Letters, 2015, v. 10, n. 1, p. 1, doi. 10.1186/s11671-014-0724-z

By:

Yang, Wen;
Fronk, Michael;
Geng, Yang;
Chen, Lin;
Sun, Qing-Qing;
Gordan, Ovidiu;
zhou, Peng;
Zahn, Dietrich;
Zhang, David

Publication type:

Article

CORRIGENDUM: Analysis of interactions between SNARE proteins using imaging ellipsometer coupled with microfluidic array.

Published in:: 2014
Publication type:: Correction Notice

Thickness dependent optical properties of titanium oxide thin films.

Published in:

Applied Physics A: Materials Science & Processing, 2013, v. 113, n. 3, p. 557, doi. 10.1007/s00339-013-7591-9

By:

Xu, Zi-Jie;
Zhang, Fan;
Zhang, Rong-Jun;
Yu, Xiang;
Zhang, Dong-Xu;
Wang, Zi-Yi;
Zheng, Yu-Xiang;
Wang, Song-You;
Zhao, Hai-Bin;
Chen, Liang-Yao

Publication type:

Article

Genotypic and phenotypic patterns of antimicrobial susceptibility of Helicobacter pylori strains among Egyptian patients.

Published in:

Egyptian Journal of Medical Human Genetics, 2013, v. 14, n. 3, p. 235, doi. 10.1016/j.ejmhg.2013.03.004

By:

Fathi, Marwa S.;
EL-Folly, Runia Fouad;
Hassan, Rania Ahmed;
El-Arab, Mohammed Ezz

Publication type:

Article

Enhancement of Growth of MOF MIL-68(Al) Thin Films on Porous Alumina Tubes Using Different Linking Agents.

Published in:

European Journal of Inorganic Chemistry, 2017, v. 2017, n. 19, p. 2532, doi. 10.1002/ejic.201700302

By:

Perea‐Cachero, Adelaida;
Calvo, Pablo;
Romero, Enrique;
Téllez, Carlos;
Coronas, Joaquín

Publication type:

Article

Determination of the thickness and optical constants of nanofilms produced by the thermal oxidation of InP with VO, VO + PbO, and NiO + PbO chemical stimulator layers grown by magnetron sputtering.

Published in:

Inorganic Materials, 2013, v. 49, n. 10, p. 963, doi. 10.1134/S0020168513100075

By:

Mittova, I.;
Shvets, V.;
Tomina, E.;
Samsonov, A.;
Sladkopevtsev, B.;
Tret'yakov, N.

Publication type:

Article

Dielectric Function of Native Oxide on Ion-Implanted GaAs.

Published in:

Acta Physica Polonica: A, 2013, v. 123, n. 5, p. 956, doi. 10.12693/APhysPolA.123.956

By:

KULIK, M.;
RZODKIEWICZ, W.;
GLUBA, Ł;
KOBZEV, A. P.

Publication type:

Article

Scanning Ellipsometer Using a Fixed Phase Retarder and Rotating Polarizer and Analyzer.

Published in:

Acta Physica Polonica: A, 2013, v. 123, n. 2, p. 184, doi. 10.12693/APhysPolA.123.183

By:

TAYA, S. A.;
EL-AGEZ, T. M.

Publication type:

Article

Evolution of the electronic structure and optical spectra of intermetallides DyNiCu under changes of concentration.

Published in:

Optics & Spectroscopy, 2015, v. 118, n. 3, p. 357, doi. 10.1134/S0030400X15030169

By:

Knyazev, Yu.;
Lukoyanov, A.;
Kuz'min, Yu.;
Kuchin, A.

Publication type:

Article

Mirrors in optical schemes of ellipsometers.

Published in:

Optics & Spectroscopy, 2014, v. 117, n. 5, p. 844, doi. 10.1134/S0030400X14100075

By:

Gurevich, A.;
Nestoklon, M.

Publication type:

Article

A Fast and Facile Fabrication of PTFE Based Superhydrophobic and Ultra Wideband Angle Insensitive Anti‐Reflection Coatings.

Published in:

Physica Status Solidi - Rapid Research Letters, 2018, v. 12, n. 6, p. 1, doi. 10.1002/pssr.201800041

By:

Misal, Jitendra S.;
Shinde, Deepak D.;
De, Rajnarayan;
Rao, K. Divakar;
Polaki, Shyam R.;
Singh, Ranveer;
Som, Tapobrata;
Sahoo, Naba K.

Publication type:

Article

Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration.

Published in:

Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 12, p. n/a, doi. 10.1002/pssa.201700480

By:

Subedi, Indra;
Silverman, Timothy J;
Deceglie, Michael G.;
Podraza, Nikolas J.

Publication type:

Article

HORIBA SCIENTIFIC INTRODUCES UVISEL PLUS.

Published in:

2018

By:

Wagner, Larry

Publication type:

Product Review

Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1:1.

Published in:

Optical & Quantum Electronics, 2015, v. 47, n. 7, p. 2039, doi. 10.1007/s11082-014-0077-y

By:

Alkanoo, Anas;
Taya, Sofyan;
El-Agez, Taher

Publication type:

Article

A spectroscopic ellipsometer using rotating polarizer and analyzer at a speed ratio 1:1 and a compensator.

Published in:

Optical & Quantum Electronics, 2014, v. 46, n. 7, p. 883, doi. 10.1007/s11082-013-9799-5

By:

Taya, Sofyan;
El-Agez, Taher;
Alkanoo, Anas

Publication type:

Article

Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy.

Published in:

Instruments & Experimental Techniques, 2016, v. 59, n. 6, p. 857, doi. 10.1134/S0020441216060099

By:

Shvets, V.;
Azarov, I.;
Spesivtsev, E.;
Rykhlitskii, S.;
Yakushev, M.;
Marin, D.;
Mikhailov, N.;
Kuzmin, V.;
Remesnik, V.;
Dvoretsky, S.

Publication type:

Article

LED magneto-optical ellipsometer with the switching of orthogonal polarization states.

Published in:

Instruments & Experimental Techniques, 2016, v. 59, n. 5, p. 707, doi. 10.1134/S0020441216040084

By:

Kovalev, V.;
Rukovishnikov, A.;
Rossukanyi, N.;
Kovalev, S.;
Amelichev, V.;
Kostyuk, D.;
Vasil'ev, D.;
Orlov, E.

Publication type:

Article

A terahertz ellipsometer.

Published in:

Instruments & Experimental Techniques, 2015, v. 58, n. 3, p. 381, doi. 10.1134/S0020441215030033

By:

Azarov, I.;
Shvets, V.;
Prokopiev, V.;
Dulin, S.;
Rykhlitskii, S.;
Choporova, Yu.;
Knyazev, B.;
Kruchinin, V.;
Kruchinina, M.

Publication type:

Article

An LED multichannel spectral ellipsometer with binary modulation of the polarization state.

Published in:

Instruments & Experimental Techniques, 2014, v. 57, n. 5, p. 607, doi. 10.1134/S002044121405008X

By:

Kovalev, V.;
Rukovishnikov, A.;
Kovalev, S.

Publication type:

Article