Works about ELECTROOPTICS
1
- Crystal Research & Technology, 2025, v. 60, n. 6, p. 1, doi. 10.1002/crat.202400276
- Khusayfan, Najla. M.;
- Qasrawi, A.F.;
- Khanfar, Hazem K.;
- Alharbi, Seham R.
- Article
2
- Soft Materials, 2018, v. 16, n. 2, p. 71, doi. 10.1080/1539445X.2017.1280507
- Park, Hong-Gyu;
- Mun, Hyo Young;
- Jeong, Hae-Chang;
- Oh, Byeong-Yun;
- Han, Jeong-Min;
- Seo, Dae-Shik
- Article
3
- Soft Materials, 2013, v. 11, n. 3, p. 305, doi. 10.1080/1539445X.2012.654582
- Singh, DharmendraPratap;
- Yadav, SatyaPrakash;
- Tripathi, PankajKumar;
- Tripathi, Prachi;
- Manohar, Rajiv;
- Sharma, PrashantKumar;
- Pandey, AvinashChandra
- Article
4
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12180, doi. 10.1007/s10854-019-01576-7
- Huo, Fuyang;
- Zhang, Hua;
- Chen, Zhuo;
- Qiu, Ling;
- Liu, Jialei;
- Bo, Shuhui;
- Kityk, I. V.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2577, doi. 10.1007/s10854-017-8181-y
- Guo, Li;
- Guo, Zupeng;
- Li, Xiaobing
- Article
6
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5154, doi. 10.1007/s10854-016-6171-0
- Kumar, M.;
- Kanagadurai, R.;
- Chithra, S.;
- Tamilselvan, S.;
- Potheher, I.;
- Vimalan, M.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 4931, doi. 10.1007/s10854-016-6142-5
- Zhou, Jian;
- Wang, Min;
- Fedorchuk, A.;
- Kityk, I.;
- Liu, Jialei
- Article
8
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12719, doi. 10.1007/s10854-016-5406-4
- Maharani, N.;
- Vetha Potheher, I.;
- Vimalan, M.;
- Cyrac Peter, A.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5006, doi. 10.1007/s10854-016-4387-7
- Maharani, N.;
- Cyrac Peter, A.;
- Gopinath, S.;
- Tamilselvan, S.;
- Vimalan, M.;
- Vetha Potheher, I.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2654, doi. 10.1007/s10854-015-2740-x
- Kuznik, W.;
- Majchrowski, A.;
- Wojciechowski, A.;
- Jaroszewicz, L.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1460, doi. 10.1007/s10854-014-1752-2
- Ozga, K.;
- Fedorchuk, A.;
- Lakshminarayana, G.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1182, doi. 10.1007/s10854-011-0569-5
- Liu, Jialei;
- Xu, Huajun;
- Liu, Xinhou;
- Zhen, Zhen;
- Kuznik, W.;
- Kityk, I.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 3, p. 712, doi. 10.1007/s10854-011-0477-8
- Abbasov, Mikail;
- Carlisle, Gene
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 7, p. 726, doi. 10.1007/s10854-009-9985-1
- Majchrowski, A.;
- Ebothe, J.;
- Sanetra, J.;
- Ozga, K.;
- Kityk, I. V.;
- Reshak, A. H.;
- Lukasiewicz, T.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 3, doi. 10.1007/s10854-007-9418-y
- Jones, R.;
- Park, H. D.;
- Fang, A. W.;
- Bowers, J. E.;
- Cohen, O.;
- Raday, O.;
- Paniccia, M. J.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 821, doi. 10.1007/s10854-007-9482-3
- Monroy, Eva;
- Guillot, Fabien;
- Leconte, Sylvain;
- Nevou, Laurent;
- Doyennette, Laetitia;
- Tchernycheva, Maria;
- Julien, Francois H.;
- Baumann, Esther;
- Giorgetta, Fabrizio R.;
- Hofstetter, Daniel
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 434, doi. 10.1007/s10854-007-9356-8
- Fuks-Janczarek, I.;
- Miedziński, R.;
- Gondek, E.;
- Szlachcic, P.;
- Kityk, I. V.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 5, p. 519, doi. 10.1007/s10854-006-9075-6
- I. Fuks-Janczarek;
- I. Kityk;
- R. MiedziÅski;
- E. Gondek;
- J. Ebothe;
- L. Nzoghe-Mendome;
- A. Danel
- Article
19
- Journal of Materials Science Letters, 2003, v. 22, n. 15, p. 1095, doi. 10.1023/A:1024990925626
- Article
20
- Microwave & Optical Technology Letters, 1988, v. 1, n. 8, p. 290, doi. 10.1002/mop.4650010805
- Article
21
- Measurement Techniques, 2023, v. 66, n. 1, p. 1, doi. 10.1007/s11018-023-02182-0
- Osipenko, G. V.;
- Aleynikov, M. S.;
- Sukhoverskaya, A. G.
- Article
22
- Measurement Techniques, 2009, v. 52, n. 12, p. 1319, doi. 10.1007/s11018-010-9440-y
- Kulesh, V. P.;
- Moskalik, L. M.;
- Sharov, A. A.
- Article
23
- Inorganic Materials, 2011, v. 47, n. 2, p. 163, doi. 10.1134/S0020168511020142
- Popov, P.;
- Moiseev, N.;
- Kokh, A.;
- Kokh, K.
- Article
24
- Advanced Electronic Materials, 2019, v. 5, n. 6, p. N.PAG, doi. 10.1002/aelm.201900005
- Zhang, Yin;
- Qi, Dongxia;
- Li, Jianing;
- Han, Liu;
- Tian, Fanghua;
- Gu, Songlin;
- Gao, Lumei;
- Zhou, Chao;
- Song, Xiaoping;
- Zeng, Hao;
- Yang, Sen
- Article
25
- Crystallography Reports, 2007, v. 52, n. 5, p. 870, doi. 10.1134/S1063774507050161
- Geras'kin, V. V.;
- Klyukhina, Yu. V.;
- Buzanov, O. A.;
- Petrakov, V. S.
- Article
26
- Crystallography Reports, 2007, v. 52, n. 4, p. 701, doi. 10.1134/S1063774507040190
- Savchenko, A.;
- Tarasenko, S.
- Article
27
- Crystallography Reports, 2006, v. 51, n. 6, p. 1030, doi. 10.1134/S1063774506060149
- Pozhidaev, E. P.;
- Chigrinov, V. G.
- Article
28
- Crystallography Reports, 2005, v. 50, n. 4, p. 654, doi. 10.1134/1.1996741
- Article
29
- Crystallography Reports, 2004, v. 49, n. 2, p. 215, doi. 10.1134/1.1690419
- Puzikov, V. M.;
- Zagoruiko, Yu. A.;
- Fedorenko, O. A.;
- Kovalenko, N. O.
- Article
30
- Crystallography Reports, 2003, v. 48, n. 1, p. 124, doi. 10.1134/1.1541754
- Article
31
- SID Symposium Digest of Technical Papers, 2016, v. 47, n. 1, p. 1628, doi. 10.1002/sdtp.11044
- Shiyanovskii, Sergij V.;
- Iadlovska, Olena;
- Xiang, Jie;
- Lavrentovich, Oleg D.
- Article
32
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1463, doi. 10.1002/j.2168-0159.2014.tb00387.x
- Kobayashi, Shunsuke;
- Takeuchi, Kiyofumi;
- Kaneoya, Masakazu;
- Kotani, Kunihiko;
- Takatsu, Haruyoshi
- Article
33
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 555, doi. 10.1002/j.2168-0159.2014.tb00145.x
- White, Timothy J.;
- Lee, Kyung Min;
- McConney, Michael E.;
- Tondiglia, Vincent P.;
- Natarajan, Lalgudi V.;
- Bunning, Timothy J.
- Article
34
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1492, doi. 10.1002/j.2168-0159.2014.tb00396.x
- Varanytsia, Andrii;
- Chien, Liang‐Chy
- Article
35
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1392, doi. 10.1002/j.2168-0159.2014.tb00367.x
- Chen, Yuan;
- Yan, Jin;
- Schadt, Martin;
- Liu, Shih‐Hsien;
- Cheng, Kung‐Lung;
- Shiu, Jyh‐Wen;
- Wu, Shin‐Tson
- Article
36
- 2013
- Zhu, Ji-Liang;
- Ni, Shui-Bin;
- Chen, Chao Ping;
- Lu, Jian-Gang;
- Su, Yikai;
- Song, Xiao-Long;
- Chen, Chao-Yuan
- Other
37
- 2013
- Tanaka, Chihiro;
- Ikeda, Kojiro;
- Tanaka, Toshihiko;
- Furutani, Naosuke;
- Suzuki, Daichi;
- Ohira, Hirofumi;
- Matsushima, Toshiharu;
- Nakamura, Akio;
- Tsubokura, Nobuo;
- Yamada, Kazuyuki;
- Nakamura, Keita;
- Shimizu, Koji;
- Sekime, Tomoaki;
- Kasai, Taiki;
- Takizawa, Keiji;
- Nakajima, Yoshiharu;
- Ito, Tomoyuki
- Other
38
- 2013
- Park, No Hyun;
- Park, Hye Ryung;
- Nayek, Prasenjit;
- Kundu, Sudarshan;
- Lee, Myong Hoon;
- Lee, Seung Hee;
- Park, Heung Shik;
- Lee, Hyeok Jin;
- Kim, Hee Seop
- Other
39
- 2013
- Hwang, Jeoung-Yeon;
- Park, Junge Kyu;
- Choi, Jong Sun;
- Kim, Hyungtak;
- Kim, Jae-Hoon;
- Yu, Chang-Jae
- Other
40
- 2013
- Hong, Young Bum;
- Lee, Byeong Hoon;
- Lee, Jun Hee;
- Choi, Young Eun;
- Singh, Jay;
- Wu, Yan;
- Lee, Myong-Hoon;
- Lee, Seung Hee;
- Song, Won II
- Other
41
- 2013
- Altazin, Stéphane;
- Perucco, Benjamin;
- Pagan, Nicolò;
- Lapagna, Kevin;
- Lanz, Thomas;
- Knaack, Reto;
- Knapp, Evelyne;
- Ruhstaller, Beat
- Other
42
- 2013
- Yu, Seung Hun;
- Choi, Yoonseuk;
- Kwon, Jin Hyuk;
- Gwag, Jin Seog
- Other
43
- European Physical Journal D (EPJ D), 2008, v. 47, n. 1, p. 111, doi. 10.1140/epjd/e2007-00284-4
- Demura, A. V.;
- Demchenko, G. V.;
- Nikolić, D.
- Article
44
- European Physical Journal D (EPJ D), 2005, v. 36, n. 3, p. 261, doi. 10.1140/epjd/e2005-00243-1
- Bielsa, F.;
- Battesti, R.;
- Robilliard, C.;
- Bialolenker, G.;
- Bailly, G.;
- Trénec, G.;
- Rizzo, A.;
- Rizzo, C.
- Article
45
- European Physical Journal D (EPJ D), 2004, v. 28, n. 2, p. 273, doi. 10.1140/epjd/e2003-00309-0
- Shevchenko, A.;
- Lindvall, T.;
- Tittonen, I.;
- Kaivola, M.
- Article
46
- European Physical Journal D (EPJ D), 2003, v. 25, n. 2, p. 103, doi. 10.1140/epjd/e2003-00236-0
- Kondo, T.;
- Angom, D.;
- Endo, I.;
- Fukumi, A.;
- Horiguchi, T.;
- Iinuma, M.;
- Takahashi, T.
- Article
47
- 2003
- Eschner, Jürgen;
- Gatti, Alessandra;
- Maître, Agnès;
- Morigi, Giovanna
- Editorial
48
- European Physical Journal D (EPJ D), 2003, v. 22, n. 3, p. 441, doi. 10.1140/epjd/e2003-00049-1
- Hoyuelos, M.;
- Oppo, G.-L.;
- Colet, P.;
- San Miguel, M.
- Article
49
- European Physical Journal D (EPJ D), 2003, v. 22, n. 3, p. 355, doi. 10.1140/epjd/e2003-00050-8
- Ellmann, H.;
- Jersblad, J.;
- Kastberg, A.
- Article
50
- European Physical Journal D (EPJ D), 2003, v. 22, n. 3, p. 347, doi. 10.1140/epjd/e2003-00047-3
- Article