Works matching DE "ELECTRONICS periodicals"
1
- Advanced Electronic Materials, 2019, v. 5, n. 5, p. N.PAG, doi. 10.1002/aelm.201970027
- Tanaka, Masaki;
- Noda, Hiroki;
- Nakanotani, Hajime;
- Adachi, Chihaya
- Article
2
- Advanced Electronic Materials, 2019, v. 5, n. 5, p. N.PAG, doi. 10.1002/aelm.201970026
- Yao, Yao;
- Huang, Xinnan;
- Peng, Songang;
- Zhang, Dayong;
- Shi, Jingyuan;
- Yu, Guanghui;
- Liu, Qi;
- Jin, Zhi
- Article
3
- Advanced Electronic Materials, 2019, v. 5, n. 5, p. N.PAG, doi. 10.1002/aelm.201970024
- Mao, Huiwu;
- Zhou, Zhe;
- Wang, Xiangjing;
- Ban, Chaoyi;
- Ding, Yamei;
- Sun, Tao;
- Yin, Yuhang;
- Liu, Zhengdong;
- Liu, Juqing;
- Huang, Wei
- Article
4
- Advanced Electronic Materials, 2019, v. 5, n. 5, p. N.PAG, doi. 10.1002/aelm.201970023
- Chen, Zhipeng;
- Ye, Rui;
- Lee, Weihsien;
- Jin, Dianwen;
- Zhang, Yuanxi;
- Jiang, Liyuan;
- Yang, Yilin;
- Ren, Lei;
- Jiang, Lelun
- Article
5
- 2013
- Shirokov, E.;
- Chugunov, Yu.
- Correction Notice
7
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 639, doi. 10.1007/s10836-014-5498-9
- Article
9
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 1, doi. 10.1007/s10836-009-5132-4
- Article
10
- IUP Journal of Electrical & Electronics Engineering, 2018, v. 11, n. 1, p. 7
- Article
12
- Builder: The Magazine of the National Association of Home Builders, 2012, v. 35, n. 11, p. 32
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2661, doi. 10.1007/s11664-012-2236-x
- Sivananthan, S.;
- Dhar, N.;
- Anter, Y.
- Article
14
- 2011
- Caldwell, Joshua;
- Phillips, Jamie;
- Xing, Grace
- Editorial
15
- 2011
- Lajn, A.;
- Schmidt, M.;
- Wenckstern, H.;
- Grundmann, M.
- Correction Notice
16
- IETE Technical Review, 2019, v. 36, n. 1, p. 1, doi. 10.1080/02564602.2019.1580418
- Article
17
- International Electronic Journal of Elementary Education, 2019, v. 11, n. 5, p. 545
- Article
18
- Journal of Electromagnetic Waves & Applications, 2014, v. 28, n. 11, p. 1397, doi. 10.1080/09205071.2014.922448
- Article
19
- Journal of Electromagnetic Waves & Applications, 2013, v. 27, n. 18, p. ebi, doi. 10.1080/09205071.2013.861132
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 3, doi. 10.1049/el.2013.4009
- Clarricoats, Peter;
- Ash, Eric
- Article
22
- Electronics & Communications in Japan, 2019, v. 102, n. 1, p. 1, doi. 10.1002/ecj.12096
- Article
23
- Electronics & Communications in Japan, 2018, v. 101, n. 12, p. 1, doi. 10.1002/ecj.12009
- Article
24
- Electronics & Communications in Japan, 2018, v. 101, n. 11, p. 1, doi. 10.1002/ecj.12008
- Article
25
- Electronics & Communications in Japan, 2018, v. 101, n. 7, p. 1, doi. 10.1002/ecj.12004
- Article
26
- Electronics & Communications in Japan, 2018, v. 101, n. 5, p. 1, doi. 10.1002/ecj.12002
- Article
27
- Electronics & Communications in Japan, 2018, v. 101, n. 3, p. 1, doi. 10.1002/ecj.12000
- Article
28
- Electronics & Communications in Japan, 2016, v. 99, n. 10, p. 1, doi. 10.1002/ecj.11800
- Article
29
- Electronics & Communications in Japan, 2016, v. 99, n. 9, p. 1, doi. 10.1002/ecj.11799
- Article
30
- Electronics & Communications in Japan, 2016, v. 99, n. 7, p. 1, doi. 10.1002/ecj.11797
- Article
31
- IETE Journal of Research, 2018, v. 64, n. 3, p. 307, doi. 10.1080/03772063.2018.1488429
- Article
32
- Revista EIA, 2012, n. 17, p. 7
- Article
33
- Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, 2009, v. 50, n. 3/4, p. 118
- Article
34
- Electronics / Elektronika (1450-5843), 2017, v. 21, n. 2, p. 51
- Article
35
- Electronic Journal of Information Systems Evaluation, 2016, v. 19, n. 1, p. 1
- Article
36
- Electronic Journal of Information Systems Evaluation, 2012, v. 15, n. 1, p. 1
- Castelnovo, Walter;
- Ferrari, Elena
- Article
37
- Fluctuation & Noise Letters, 2011, v. 10, n. 4, p. 417, doi. 10.1142/S0219477511000727
- Bezrukov, S. M.;
- Vandamme, L. K. J.;
- Kish, L. B.
- Article
40
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010, v. 13, n. 4, p. 448
- Article
41
- IET Power Electronics (Wiley-Blackwell), 2015, v. 8, n. 6, p. 1081, doi. 10.1049/iet-pel.2015.0253
- Article
42
- IET Power Electronics (Wiley-Blackwell), 2015, v. 8, n. 2, p. 319, doi. 10.1049/iet-pel.2014.0868
- Article
43
- IET Power Electronics (Wiley-Blackwell), 2014, v. 7, n. 6, p. 1435, doi. 10.1049/iet-pel.2013.0747
- Article
44
- IET Power Electronics (Wiley-Blackwell), 2014, v. 7, n. 5, p. 1321, doi. 10.1049/iet-pel.2013.0943
- Article
45
- Energy Harvesting & Systems, 2016, v. 3, n. 4, p. i, doi. 10.1515/ehs-2016-frontmatter4
- Article
46
- Acta Technica Napocensis. Electronica-Telecomunicatii, 2012, v. 53, n. 1, p. 52
- Article
47
- Insight: Non-Destructive Testing & Condition Monitoring, 2013, v. 55, n. 12, p. 693
- Article
48
- Active & Passive Electronic Components, 2013, p. 1, doi. 10.1155/2013/596065
- Kuan-Wei Lee;
- Edward Yi Chang;
- Yeong-Her Wang;
- Pei-Wen Li;
- Yasuyuki Miyamoto
- Article
49
- International Journal of Circuit Theory & Applications, 2016, v. 44, n. 1, p. 3, doi. 10.1002/cta.2130
- Article
50
- Robotica, 2011, v. 29, n. 1, p. f1, doi. 10.1017/S0263574710000810
- Article