Works matching DE "ELECTRONICS packaging"
1
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 1, p. 172, doi. 10.1007/s10854-012-0720-y
- Zhang, Liang;
- Han, Ji-guang;
- He, Cheng-wen;
- Guo, Yong-huan
- Article
2
- Progress in Electromagnetics Research, 2013, v. 141, p. 201, doi. 10.2528/pier13040214
- Sung-Mao Wu;
- Ren-Fang Hsu;
- Po-Hui Yu
- Article
3
- Journal of Microelectronic & Electronic Packaging, 2017, v. 14, n. 3, p. 108, doi. 10.4071/imaps.460769
- Iyer, Rajiv L.;
- Santos, Daryl L.
- Article
4
- Journal of Microelectronic & Electronic Packaging, 2013, v. 10, n. 2, p. 59, doi. 10.4071/imaps.373
- Satoshi Tanimoto;
- Kohei Matsui;
- Yusuke Zushi;
- Shinji Sato;
- Yoshinori MurakamiA;
- Masato Takamori;
- Takashi Iseki
- Article
5
- Journal of Microelectronic & Electronic Packaging, 2013, v. 10, n. 2, p. 54, doi. 10.4071/imaps.371
- Faqir, M.;
- Pomeroy, J. W.;
- Batten, T.;
- Mrotzek, T.;
- Knippscheer, S.;
- Vendier, O.;
- Rochette, S.;
- Massiot, M.;
- Letteron, L.;
- Desmarres, J. M.;
- Courtade, F.;
- Kuball, M.
- Article
6
- Journal of Microelectronic & Electronic Packaging, 2010, v. 7, n. 1, p. 16, doi. 10.4071/1551-4897-7.1.16
- Article
7
- International Materials Reviews, 2018, v. 63, n. 1, p. 1, doi. 10.1080/09506608.2017.1296605
- Razeeb, Kafil M.;
- Dalton, Eric;
- Cross, Graham Lawerence William;
- Robinson, Anthony James
- Article
8
- Advanced Engineering Materials, 2018, v. 20, n. 12, p. N.PAG, doi. 10.1002/adem.201800421
- Stein, Stefan;
- Schaumberger, Kerstin;
- Frick, Thomas;
- Roth, Stephan;
- Schmidt, Michael
- Article
9
- Fibers, 2019, v. 7, n. 2, p. 12, doi. 10.3390/fib7020012
- Nashed, Mohamad-Nour;
- Hardy, Dorothy Anne;
- Hughes-Riley, Theodore;
- Dias, Tilak
- Article
10
- Heat Transfer Engineering, 2005, v. 26, n. 10, p. 8, doi. 10.1080/01457630500248513
- vargas, J.V. C.;
- Ordonez, J.C.;
- Zamfirescu, C.;
- Campos, M.C.;
- Bejan, A.
- Article
11
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2008, v. 22, n. 31/32, p. 6265, doi. 10.1142/S0217979208051893
- XU, JIN-QUAN;
- ZHENG, HUIMIAO;
- ZHU, HONGLAI
- Article
12
- Microwave Journal, 2008, v. 51, n. 7, p. 202
- Article
13
- JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2010, v. 62, n. 6, p. 88, doi. 10.1007/s11837-010-0095-6
- Agarwal, Mansi;
- Kumar, Vinod;
- Malladi, S. R. K.;
- Balasubramaniam, R.;
- Balani, Kantesh
- Article
14
- Integrated Ferroelectrics, 2005, v. 69, n. 1, p. 341, doi. 10.1080/10584580590899306
- Yi Yang;
- Tian-Ling Ren;
- Yi-Ping Zhu;
- Xiao-Ming Wu;
- Ning-Xin Zhang;
- Li-Tian Liu
- Article
15
- Heat Transfer Engineering, 2018, v. 39, n. 4, p. 353, doi. 10.1080/01457632.2017.1305834
- Baïri, Abderrahmane;
- Haddad, Oriana;
- Guinart, Jean-Pascal;
- Adeyeye, Kemi;
- Alilat, Nacim
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 1, p. 64, doi. 10.1007/s11664-016-4854-1
- Falakzaadeh, F.;
- Mehryar, R.
- Article
17
- Journal of Electronic Materials, 2007, v. 36, n. 9, p. 1129, doi. 10.1007/s11664-007-0186-5
- Yanghua Xia;
- Chuanyan Lu;
- Xiaoming Xie
- Article
18
- Journal of Electronic Materials, 2006, v. 35, n. 3, p. 411, doi. 10.1007/BF02690527
- Ahn, Do H.;
- Jihye Lee;
- Yoo, Choong D.;
- Yong-Seog Kim
- Article
19
- Quality & Reliability Engineering International, 1995, v. 11, n. 5, p. 389
- Article
21
- Quality & Reliability Engineering International, 1991, v. 7, n. 3, p. 189
- Article