Works matching DE "ELECTRONICS conventions"
1
- 2013
- Dai, Jiyan;
- Auciello, Orlando;
- Chan, Helen
- Editorial
2
- Integrated Ferroelectrics, 2007, v. 92, n. 1, p. 1, doi. 10.1080/10584580701743902
- Gregg, J. M.;
- Scott, J. F.
- Article
3
- International Journal of High Speed Electronics & Systems, 2016, v. 25, n. 1/2, p. -1, doi. 10.1142/S0129156416020018
- Article
4
- Health Care Financing Review, 1992, v. 13, n. 4, p. 204
- Article
5
- Proceedings of the Estonian Academy of Sciences, Engineering, 2001, v. 7, n. 4, p. 251, doi. 10.3176/eng.2001.4.01
- Article
8
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
- Article
9
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 109, doi. 10.1007/s10836-016-5575-3
- Article
10
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 337, doi. 10.1007/s10836-015-5539-z
- Article
11
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
- Article
12
- Journal of Electronic Testing, 2014, v. 30, n. 1, p. 7, doi. 10.1007/s10836-014-5434-z
- Article
13
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 455, doi. 10.1007/s10836-013-5395-7
- Article
23
- Microwave Journal, 2012, v. 55, n. 11, p. 20
- Article
28
- Microwave Journal, 2009, v. 52, n. 5, p. 24
- SAAD, TED;
- HOWE JR., HARLAN;
- STAECKER, PETER;
- THOREN, GLEN;
- SCHINDLER, FRED
- Article
29
- Microwave Journal, 2008, v. 51, n. 12, p. 19
- Article
30
- Microwave Journal, 2008, v. 51, n. 12, p. 20
- Article
35
- Microwave Journal, 2007, v. 50, n. 9, p. 22
- Article
38
- Microwave Journal, 2002, v. 45, n. 10, p. 15
- Article
39
- Ferroelectrics, 2008, v. 372, n. 1, p. 5, doi. 10.1080/00150190802435526
- Luk'yanchuk, Igor;
- Mezzane, Daoud
- Article
46
- Chemistry & Industry, 2008, n. 13, p. 14
- Article