Works about ELECTRONIC probes

Results: 949

Non-conventional pressure estimates by using transmission electron microscopy coupled with energy-dispersive spectroscopy (TEM-EDS): testing on submicrometer white mica from low-grade metapelites.

Published in:

European Journal of Minerology, 2025, v. 37, n. 3, p. 343, doi. 10.5194/ejm-37-343-2025

By:

Sanità, Edoardo;
Di Rosa, Maria;
Mugnaioli, Enrico

Publication type:

Article

The Distribution of Major and Trace Elements Across a Garnet Population From the Kalak Nappe Complex (Finnmark, Scandinavian Caledonides): Evidence for Size‐Dependent Growth and Compositional Equilibration in the Garnet Zone.

Published in:

Journal of Metamorphic Geology, 2025, v. 43, n. 6, p. 613, doi. 10.1111/jmg.12820

By:

Yogi, M. T. A. G.;
Gaidies, F.;
Heldwein, O. K. A.;
Rice, A. H. N.

Publication type:

Article

Probing Below the Surface of Mars.

Published in:: Technology Teacher, 2000, v. 59, n. 5, p. 20
Publication type:: Article

Effect of Presenting Baseline Probes During or After Emergent Relations Tests on Equivalence Class Formation.

Published in:

Psychological Record, 2019, v. 69, n. 2, p. 193, doi. 10.1007/s40732-018-0326-8

By:

Ayres-Pereira, Vanessa;
Arntzen, Erik

Publication type:

Article

NANOPATTERNING OF SILICON-BASED NANOSTRUCTURES BY AFM PROBE.

Published in:

International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 75, doi. 10.1142/S0219581X04001833

By:

Sheglov, D. V.;
Nastaushev, Yu. V.;
Latyshev, A. V.;
Aseev, A. L.

Publication type:

Article

Systematic comparison of a new generation of columns packed with sub-2 μm superficially porous particles.

Published in:

Journal of Separation Science, 2014, v. 37, n. 3, p. 189, doi. 10.1002/jssc.201301110

By:

Bobály, Balázs;
Guillarme, Davy;
Fekete, Szabolcs

Publication type:

Article

Polymer Fiber Probes Enable Optical Control of Spinal Cord and Muscle Function In Vivo.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 42, p. 6594, doi. 10.1002/adfm.201401266

By:

Lu, Chi;
Froriep, Ulrich P.;
Koppes, Ryan A.;
Canales, Andres;
Caggiano, Vittorio;
Selvidge, Jennifer;
Bizzi, Emilio;
Anikeeva, Polina

Publication type:

Article

Properties of the doped polycrystalline silicon as site material for the micromachined silicon neural probe.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 2, p. 131, doi. 10.1023/A:1021866920811

By:

Seung Jae Oh;
Jong Keun Song;
Soon Kwan An;
Sung June Kim

Publication type:

Article

Optimizing microbial electrolysis cell performance: strategies to mitigate electron mediator degradation on membranes.

Published in:

Biotechnology Letters, 2024, v. 46, n. 6, p. 1027, doi. 10.1007/s10529-024-03533-9

By:

Zhao, Shuo;
Zeng, Yu;
Li, Ying;
Wang, Zhen;
Chen, Li;
Chen, Kequan

Publication type:

Article

Strategies to Find Where's Waldo (Wally) in Biology using 4D STEM.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.900

By:

Kim, Judy S;
Huang, Chen;
Liberti, Emanuela;
Gallagher-Jones, Marcus;
Caffrey, Brian J;
Pedrazo-Tardajos, Adrián;
Boyce, Mark;
Wang, Peng;
Kirkland, Angus I

Publication type:

Article

Solid State Phase Transformations in Materials for Carbon Capture and Conversion Revealed using Electrothermal S/TEM Specimen Holders.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.823

By:

Bowman, William;
Wardini, Jenna L;
Martinez, Jenny

Publication type:

Article

Wavefront Shaping With a 48-Element Programmable Phase Plate for Electrons.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.767

By:

Béché, Armand;
Yu, Chu-Ping;
Ibañez, Francisco Vega;
Verbeeck, Jo

Publication type:

Article

Atomic Engineering: Electron Microscope as a Manufacturing Tool.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.757

By:

Su, Cong

Publication type:

Article

Imaging and Analysis of Quantum Materials, Developments in Workflow and Infrastructure.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.756

By:

Bell, David C;
Auslender, Avi;
Akey, Austin;
Zhou, Shu Yang Frank;
Chen, Alan;
Checkelsky, Joseph

Publication type:

Article

Non-destructive Imaging of Polar Domains and Crystallographic Symmetry in The Scanning Electron Microscope.

Published in:

2024

By:

Ngo, Ann;
Jagadish, Koushik;
Avishai, Amir;
Chae, Hyun Uk;
Ramesh, Maya;
Kumarasubramanian, Harish;
Kapadia, Rehan;
Schlom, Darrell G;
Ravichandran, Jayakanth;
Shao, Yu-Tsun

Publication type:

Editorial

Defect Imaging of Nickel-Based Superalloy in the SEM Utilizing Tilt-Free EBSD.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.268

By:

Veghte, Daniel P;
Egan, Ashton J;
Mills, Michael J

Publication type:

Article

Real-Time Point of Interest Segmentation for Electron Microscopy Images via Machine Learning.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.215

By:

Lin, Michael;
Nahas, Yousra;
Sergei, Prokhorenko;
Das, Sujit;
Xu, Ruijuan;
Hwang, Harold Y;
Ramesh, Ramamoorthy;
Bellaiche, Laurent;
Muller, David A;
Shao, Yu-Tsun;
Wei, Donglai

Publication type:

Article

Atomic Lock-on: In Situ Picometer Precise Beam Placement in the Scanning Transmission Electron Microscope.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.193

By:

Roccapriore, Kevin M;
Ross, Frances M;
Klein, Julian

Publication type:

Article

Enhancing Resolution in STEM EELS Hyperspectral Data through Rigid Image Registration.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.127

By:

Huang, Yifeng;
Yan, Xingxu;
Aoki, Toshihiro;
Gadre, Chaitanya A;
Pan, Xiaoqing

Publication type:

Article

Crystal Structure Elucidation with the MerlinEM Hybrid Pixel Direct Electron Detector.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.1097

By:

Mangan, Gearóid Liam;
Krajňák, Matúš;
Stewart, Andy

Publication type:

Article

Adapting Conventional SEM and STEM Instruments for Acquisition of Electron-Beam Induced Current (EBIC) Images.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.067

By:

Camino, F E;
Han, M G;
Pofelski, A;
Rua, A;
Kisslinger, K;
Hayes, D C;
Alban, J;
Agrawal, R

Publication type:

Article

Cathodoluminescence Imaging and Spectrometry of a Jadeite Microbeam Reference Crystal: Detection of Ce<sup>3+</sup>.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.012

By:

Lam, Thomas;
Lowers, Heather A;
Wight, Scott A;
Vicenzi, Edward P

Publication type:

Article

Electron Probe Phase using Defocus in Scanning Electron Microscopy.

Published in:

2023

By:

Kamal, Surya;
Hailstone, Richard K

Publication type:

Abstract

Electron Probe Interactions in Single Species-Terminated MXenes.

Published in:

2023

By:

Vargas, Francisco Lagunas;
Klie, Robert F

Publication type:

Abstract

Experimental and Simulation Methods in Scanning Electron Nanobeam Diffraction.

Published in:

Microscopy & Microanalysis, 2019, p. 2320, doi. 10.1017/S1431927618012084

By:

Ophus, Colin;
Bustillo, Karen;
Pekin, Thomas C;
Pryor Jr., AJ;
Miao, Jianwei;
Shevitski, Brian;
Aloni, Shaul;
Ercius, Peter;
Ciston, Jim;
Minor, Andrew M

Publication type:

Article

Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses.

Published in:

Microscopy & Microanalysis, 2019, p. 2068, doi. 10.1017/S1431927618010826

By:

Hughes, Ery C;
Ben Buse;
Kearns, Stuart L;
Blundy, Jon D

Publication type:

Article

Electron Probes for Ultrafast Dynamics at the Nanoscale.

Published in:

Microscopy & Microanalysis, 2019, p. 1854, doi. 10.1017/S1431927618009753

By:

Filippetto, D.;
Ji, F.;
Minor, A.;
Durham, D.;
Wang, X.;
Centurion, M.;
Riminucci, F.;
Slaughter, D.

Publication type:

Article

Comparing Quantitative Results of Zeta Factor Method using Various Values of Ionization Cross-sections.

Published in:

2019

By:

Morita, Masaki;
Onishi, Ichiro

Publication type:

Abstract

X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM.

Published in:

2019

By:

Sagar, James;
Wood, Dylan;
Pinard, Philippe;
Howe, Jane;
Holland, James;
Burgess, Simon;
Statham, Peter

Publication type:

Abstract

Visualizing Astigmatism in the SEM Electron Probe.

Published in:

2019

By:

Nevins, Mandy C.;
Zotta, Matthew D.;
Hailstone, Richard K.;
Lifshin, Eric

Publication type:

Abstract

Sample Thickness Limitations in Defocused Electron Probe Ptychography.

Published in:

Microscopy & Microanalysis, 2019, p. 188, doi. 10.1017/S1431927618001435

By:

Blackburn, Arthur M.;
Frencken, Adriaan

Publication type:

Article

Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector.

Published in:

Microscopy & Microanalysis, 2019, p. 186, doi. 10.1017/S1431927618001423

By:

Allen, Christopher S.;
Song, Jiamei;
Danaie, Mohsen;
Wang, Peng;
Kirkland, Angus I.

Publication type:

Article

Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM.

Published in:

Microscopy & Microanalysis, 2019, p. 118, doi. 10.1017/S1431927618001083

By:

Ishikawa, Ryo;
Shibata, Naoya;
Ikuhara, Yuichi

Publication type:

Article

Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy.

Published in:

Microscopy & Microanalysis, 2019, p. 98, doi. 10.1017/S1431927618000983

By:

Idrobo, Juan Carlos;
Lupini, Andrew R.;
Feng, Tianli;
Unocic, Raymond R.;
Walden, Franklin S.;
Gardiner, Daniel S.;
Lovejoy, Tracy C.;
Dellby, Niklas;
Pantelides, Sokrates T.;
Krivanek, Ondrej L.

Publication type:

Article

Neuron–Glial Interactions in the Developing Cerebellum.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 742, doi. 10.1017/S1431927612000256

By:

Dunaevsky, Anna

Publication type:

Article

Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe.

Published in:

2011

By:

Rossouw, D;
Couillard, M;
Vickery, J;
Kumacheva, E;
Botton, G

Publication type:

Abstract

The Legacy of Raimond Castaing: A Perspective at 60 Years.

Published in:

2011

By:

Carpenter, P;
Vicenzi, E;
Gauvin, R;
Fournelle, J

Publication type:

Abstract

Using DTSA-II to Simulate and Interpret Energy Dispersive Spectra from Particles.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 3, p. 248, doi. 10.1017/S1431927610000243

By:

Ritchie, Nicholas W. M.

Publication type:

Article

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 2, p. 183, doi. 10.1017/S1431927610000085

By:

Jianguo Wen;
Mabon, James;
Changhui Lei;
Burdin, Steve;
Sammann, Ernie;
Petrov, Ivan;
Shah, Amish B.;
Chobpattana, Varistha;
Jiong Zhang;
Ke Ran;
Jan-Min Zuo;
Mishina, Satoshi;
Aoki, Toshihiro

Publication type:

Article

Effect of the phosphate/calcium molar ratio on fouling deposits generated by the processing of a whey protein isolate in a plate heat exchanger.

Published in:

Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2020, v. 121, p. 154, doi. 10.1016/j.fbp.2020.02.005

By:

Blanpain-Avet, P.;
André, C.;
Azevedo-Scudeller, L.;
Croguennec, T.;
Jimenez, M.;
Bellayer, S.;
Six, T.;
Martins, G. A. S.;
Delaplace, G.

Publication type:

Article

Some special features of using DGS (AVG) diagrams during ultrasonic testing of welded joints.

Published in:

Russian Journal of Nondestructive Testing, 2009, v. 45, n. 7, p. 445, doi. 10.1134/S1061830909070018

By:

Ushakov, V.;
Davydov, D.;
Mikhalev, V.;
Muravskaya, I.

Publication type:

Article

Calculation of echo signals from a flat-bottom hole for normal probes.

Published in:

Russian Journal of Nondestructive Testing, 2007, v. 43, n. 11, p. 724, doi. 10.1134/S1061830907110034

By:

Danilov, V.

Publication type:

Article

Fundamentals of electromagnetic-acoustic-transformation thickness measurements with attachable probes: 1. Direct electromagnetic-acoustic transformation in a normal polarizing field.

Published in:

Russian Journal of Nondestructive Testing, 2006, v. 42, n. 10, p. 667, doi. 10.1134/S1061830906100068

By:

Muzhitskii, V.;
Remezov, V.;
Komarov, V.

Publication type:

Article

DGS diagrams used for tuning the sensitivity of the echo-pulse method of ultrasonic testing of railway rolling stock’s wheel-pair axles.

Published in:

Russian Journal of Nondestructive Testing, 2006, v. 42, n. 4, p. 219, doi. 10.1134/S1061830906040012

By:

Danilov, V.;
Samokhvalov, V.

Publication type:

Article

Phased Gratings Used in the Automated System of Ultrasonic Inspection of Disks.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 9, p. 555, doi. 10.1007/s11181-006-0001-z

By:

P'yankov, V.;
Mikhailov, I.

Publication type:

Article

Effect of the Size of a Flat-Bottom Hole in a Cylindrical Specimen on the Bottom-Signal Level.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 9, p. 561, doi. 10.1007/s11181-006-0002-y

By:

Danilov, V.

Publication type:

Article

Specific Features of Excitation and Propagation of Longitudinal and Transverse Subsurface Waves in Solids: I. Waves in Objects with a Free Plane Boundary.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 9, p. 567, doi. 10.1007/s11181-006-0003-x

By:

Baev, A.;
Asadchaya, M.

Publication type:

Article

Specific Features of Excitation and Propagation of Longitudinal and Transverse Subsurface Waves in Solids: II. Effects of Some Boundary Conditions on Formation of Acoustic Fields.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 9, p. 577, doi. 10.1007/s11181-006-0004-9

By:

Baev, A.;
Asadchaya, M.

Publication type:

Article

Calculation of the Ultrasonic Field of a Probe in the Pulsed Mode.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 7, p. 413, doi. 10.1007/s11181-005-0185-7

By:

Barkhatov, V.

Publication type:

Article

An Estimate of the Effective Size of a Normal Probe's Piezoelectric Plate.

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 6, p. 340, doi. 10.1007/s11181-005-0174-x

By:

Danilov, V.

Publication type:

Article