Works matching DE "ELECTRONIC design automation"
1
- IETE Journal of Research, 2025, v. 71, n. 4, p. 1199, doi. 10.1080/03772063.2025.2450037
- Sarkar, Sutapa;
- Chatterjee, Mourjya;
- Sen, Soumya
- Article
2
- Chemistry - A European Journal, 2022, v. 28, n. 60, p. 1, doi. 10.1002/chem.202201552
- Mariñas, Víctor;
- Platzer, Benedikt;
- Labella, Jorge;
- Caroleo, Fabrizio;
- Nardis, Sara;
- Paolesse, Roberto;
- Guldi, Dirk M.;
- Torres, Tomás
- Article
3
- Wireless Personal Communications, 2024, v. 136, n. 3, p. 1811, doi. 10.1007/s11277-024-11362-2
- Sivaranjani, P.;
- Sasikala, S.;
- Lavanya, A.;
- Keerthana, M.
- Article
4
- Chips, 2024, v. 3, n. 4, p. 311, doi. 10.3390/chips3040016
- Bepary, Md Kawser;
- Zhang, Tao;
- Farahmandi, Farimah;
- Tehranipoor, Mark
- Article
5
- International Journal of Electronics Letters, 2022, v. 10, n. 3, p. 296, doi. 10.1080/21681724.2021.1914183
- Parekh, Prashil;
- Mehta, Samidh;
- Mane, Pravin
- Article
6
- Applied Nanoscience, 2023, v. 13, n. 3, p. 1819, doi. 10.1007/s13204-021-02173-z
- Karimullah, Shaik;
- Vishnuvardhan, D.
- Article
7
- Applied Nanoscience, 2018, v. 8, n. 1/2, p. 89, doi. 10.1007/s13204-018-0653-8
- Naqvi, Syed Rameez;
- Akram, Tallha;
- Iqbal, Saba;
- Haider, Sajjad Ali;
- Kamran, Muhammad;
- Muhammad, Nazeer
- Article
8
- IUP Journal of Telecommunications, 2015, v. 7, n. 1, p. 15
- Mishra, Ashish;
- Dave, Devang;
- Mittal, Vishal;
- Raju, Kota Solomon
- Article
10
- Information (2078-2489), 2023, v. 14, n. 12, p. 656, doi. 10.3390/info14120656
- Zargari, Amir Hosein Afandizadeh;
- AshrafiAmiri, Marzieh;
- Seo, Minjun;
- Pudukotai Dinakarrao, Sai Manoj;
- Fouda, Mohammed E.;
- Kurdahi, Fadi
- Article
11
- Progress in Electromagnetics Research Letters, 2023, v. 113, p. 43, doi. 10.2528/pierl23081405
- Article
12
- Neural Computing & Applications, 2023, v. 35, n. 16, p. 12145, doi. 10.1007/s00521-023-08346-x
- Said, Anwar;
- Shabbir, Mudassir;
- Broll, Brian;
- Abbas, Waseem;
- Völgyesi, Peter;
- Koutsoukos, Xenofon
- Article
13
- EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 26
- Hapke, Friedrich;
- Reese, Michael;
- Rivers, Jason
- Article
14
- International Journal of Simulation: Systems, Science & Technology, 2012, v. 13, n. 3A, p. 51
- Abidin, Anas Zainal;
- Mutalib Al Junid, Syed Abdul;
- Mohd Sharif, Khairul Khaizi;
- Othman, Zulkifli;
- Haron, Muhammad Adib
- Article
15
- Research Technology Management, 2019, v. 62, n. 6, p. 60, doi. 10.1080/08956308.2019.1661160
- Article
16
- Software & Systems Modeling, 2023, v. 22, n. 4, p. 1369, doi. 10.1007/s10270-023-01091-8
- Bucchiarone, Antonio;
- Savary-Leblanc, Maxime;
- Le Pallec, Xavier;
- Cicchetti, Antonio;
- Gérard, Sébastien;
- Bassanelli, Simone;
- Gini, Federica;
- Marconi, Annapaola
- Article
17
- Optical & Quantum Electronics, 2023, v. 55, n. 12, p. 1, doi. 10.1007/s11082-023-05335-1
- Anandan, Sangeetha;
- Vani, Divya;
- Gupta, Pooja;
- Krishnan, Prabu
- Article
18
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 423, doi. 10.1007/s10836-019-05815-x
- Article
19
- Journal of Electronic Testing, 2019, v. 35, n. 3, p. 271, doi. 10.1007/s10836-019-05804-0
- Article
20
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 129, doi. 10.1007/s10836-019-05789-w
- Article
23
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 673, doi. 10.1007/s10836-014-5482-4
- Lien, Wei-Cheng;
- Lee, Kuen-Jong;
- Hsieh, Tong-Yu;
- Chakrabarty, Krishnendu
- Article
24
- 2013
- Ray, Sandip;
- Bhadra, Jay;
- Abadir, Magdy;
- Wang, Li-C
- Editorial
25
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 775, doi. 10.1007/s10836-012-5340-1
- Article
26
- Mathematical Modelling of Engineering Problems, 2023, v. 10, n. 3, p. 951, doi. 10.18280/mmep.100327
- Khan, Imran Ahmad;
- Shahid, Maseera;
- Keshari, Jaishanker Prasad;
- Rai, Amrita
- Article
27
- Periodica Polytechnica: Electrical Engineering & Computer Science, 2020, v. 64, n. 3, p. 286, doi. 10.3311/PPee.14894
- Article
28
- Intel Technology Journal, 2014, v. 18, n. 3, p. 98
- Thiele, Lars;
- Wirth, Thomas;
- Olbrich, Michael;
- Schierl, Thomas;
- Haustein, Thomas;
- Frascolla, Valerio
- Article
29
- Computers (2073-431X), 2024, v. 13, n. 1, p. 9, doi. 10.3390/computers13010009
- Franck, Lucas Daudt;
- Ginja, Gabriel Augusto;
- Carmo, João Paulo;
- Afonso, José A.;
- Luppe, Maximiliam
- Article
30
- International Journal of Science, Innovation & New Technology, 2012, p. 1
- Article
31
- Expert Systems, 2022, v. 39, n. 7, p. 1, doi. 10.1111/exsy.12979
- Ziegler Haselein, Bruno;
- da Silva, Jonny Carlos
- Article
32
- Advanced Energy Materials, 2023, v. 13, n. 39, p. 1, doi. 10.1002/aenm.202301860
- Zhang, Qing;
- Wang, Yuru;
- Wei, Bingqing
- Article
33
- IUP Journal of Electrical & Electronics Engineering, 2021, v. 14, n. 4, p. 27
- Article
34
- IUP Journal of Electrical & Electronics Engineering, 2012, v. 5, n. 4, p. 7
- Dahiya, Seema;
- Yadav, Rekha;
- Malik, D. S.
- Article
35
- Journal of Electrical & Computer Engineering, 2012, p. 1, doi. 10.1155/2012/358281
- Deming Chen;
- Kiyoung Choi;
- Coussy, Philippe;
- Yuan Xie;
- Zhiru Zhang
- Article
36
- EE: Evaluation Engineering, 2019, v. 58, n. 3, p. 23
- Article
37
- EE: Evaluation Engineering, 2016, v. 55, n. 5, p. 20
- Article
40
- DYNA - Ingeniería e Industria, 2014, v. 89, n. 2, p. 211, doi. 10.6036/5840
- Suárez-Marcelo, José Ignacio;
- MarcosHernández, Alfonso;
- Jaramillo-Morán, Miguel Ángel;
- Periáñez-Torvisco, Abel;
- Martínez de Salazar Martínez, Enrique
- Article
41
- Tudományos és Műszaki Tájékoztatás, 2013, v. 60, n. 5, p. 203
- Article
42
- Journal of Heuristics, 2015, v. 21, n. 6, p. 719, doi. 10.1007/s10732-015-9297-y
- Soto, María;
- Rossi, André;
- Sevaux, Marc
- Article
43
- Journal of Heuristics, 2012, v. 18, n. 1, p. 149, doi. 10.1007/s10732-011-9165-3
- Soto, María;
- Rossi, André;
- Sevaux, Marc
- Article
44
- Scientometrics, 2022, v. 127, n. 10, p. 5661, doi. 10.1007/s11192-022-04481-9
- Curiac, Christian-Daniel;
- Doboli, Alex
- Article
45
- IETE Technical Review, 2019, v. 36, n. 6, p. 580, doi. 10.1080/02564602.2018.1531733
- Saurabh, Sneh;
- Shah, Hitarth;
- Singh, Shivendra
- Article
46
- IETE Technical Review, 2016, v. 33, n. 4, p. 345, doi. 10.1080/02564602.2015.1099056
- Sehgal, Naresh;
- Acken, John M.;
- Sohoni, Sohum
- Article
47
- Journal of Measurement Science & Instrumentation, 2023, v. 14, n. 2, p. 156, doi. 10.3969/j.issn.1674-8042.2023.02.004
- ZHANG Pingping;
- LI Jinming
- Article
48
- Industrial & Corporate Change, 2013, v. 22, n. 1, p. 131, doi. 10.1093/icc/dts049
- Gans, Joshua S.;
- Persson, Lars
- Article
49
- Computers, Materials & Continua, 2022, v. 70, n. 3, p. 4545, doi. 10.32604/cmc.2022.020483
- Peng Gao;
- Perkowski, Marek;
- Yiwei Li;
- Xiaoyu Song
- Article
50
- Radioengineering, 2013, v. 22, n. 3, p. 714
- ALUIGI, Luca;
- ALIMENTI, Federico;
- PEPE, Domenico;
- ROSELLI, Luca;
- ZITO, Domenico
- Article