Works matching DE "ELECTRONIC circuits testing"

Results: 61

Advancing Radio Testing Methodology via Formal Notations.

Published in:

Wireless Personal Communications, 2010, v. 53, n. 3, p. 409, doi. 10.1007/s11277-010-9954-2

By:

Poncela, J.;
Entrambasaguas, J. T.;
Aguayo-Torres, M. C.

Publication type:

Article

Delay testable logical circuit design.

Published in:

Russian Physics Journal, 2013, v. 55, n. 11, p. 1370, doi. 10.1007/s11182-013-9969-8

By:

Matrosova, A.;
Nikolaeva, E.;
Rumyantseva, E.

Publication type:

Article

Test Vector Optimization Using Pocofan-Poframe Partitioning.

Published in:

Computers, Materials & Continua, 2018, v. 54, n. 3, p. 251, doi. 10.3970/cmc.2018.054.251

By:

PattunnaRajam, P.;
korah, Reeba;
Kalavathy, G. Maria

Publication type:

Article

MIL-M-38510 Merged with MIL-I-38535.

Published in:: Quality & Reliability Engineering International, 1993, v. 9, n. 5, p. 460
Publication type:: Article

A COMPARATIVE RELIABILITY ASSESSMENT OF 750nm, 1060nm AND 1300nm HIGH POWER SURFACE LIGHT EMIFFING DIODES.

Published in:

Quality & Reliability Engineering International, 1993, v. 9, n. 2, p. 143, doi. 10.1002/qre.4680090212

By:

Lindsay, C. E.

Publication type:

Article

USING SNEAK CIRCUIT ANALYSIS IN AEROSPACE PRODUCT ASSURANCE.

Published in:

Quality & Reliability Engineering International, 1993, v. 9, n. 2, p. 137, doi. 10.1002/qre.4680090211

By:

Deckers, Jürgen;
Schäbe, Hendrik

Publication type:

Article

A COMPUTER-CONTROLLED ENVIRONMENTAL TEST SYSTEM FOR HIGH PIN-COUNT INTEGRATED CIRCUIT PACKAGES.

Published in:

Quality & Reliability Engineering International, 1993, v. 9, n. 2, p. 95, doi. 10.1002/qre.4680090206

By:

Barrett, John;
Donavan, John Ó.;
Hayes, Thomas;
Mathúna, Seán C. Ó.

Publication type:

Article

GaAs MMIC RELIABILITY STUDIES.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 295, doi. 10.1002/qre.4680080320

By:

Anderson, W. T.;
Roussos, J. A.;
Christianson, K. A.

Publication type:

Article

USE OF A CMOS STATIC MEMORY ARRAY AS A TECHNOLOGY TEST VEHICLE.

Published in:

Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 219, doi. 10.1002/qre.4680080309

By:

D. Schmitt-Landsiedel, Y.;
Winnerl, J.;
Neuendorf, G.;
Kölzer, J.

Publication type:

Article

CNN-Based Fault Localization Method Using Memory-Updated Patterns for Integration Test in an HiL Environment.

Published in:

Applied Sciences (2076-3417), 2019, v. 9, n. 14, p. 2799, doi. 10.3390/app9142799

By:

Choi, Ki-Yong;
Lee, Jung-Won

Publication type:

Article

High-Speed Cyclic Bend Tests and Board-Level Drop Tests for Evaluating the Robustness of Solder Joints in Printed Circuit Board Assemblies.

Published in:

Journal of Electronic Materials, 2009, v. 38, n. 6, p. 884, doi. 10.1007/s11664-008-0610-5

By:

Wong, E. H.;
Seah, S. K. W.;
Selvanayagam, C. S.;
Rajoo, R.;
Driel, W. D.;
Caers, J. F. J. M.;
Zhao, X. J.;
Owens, N.;
Leoni, M.;
Tan, L. C.;
Lai, Y. -S.;
Yeh, C. -L.

Publication type:

Article

Test Technology Newsletter February 2020.

Published in:: Journal of Electronic Testing, 2020, v. 36, n. 1, p. 7, doi. 10.1007/s10836-020-05860-x
Publication type:: Article

Guest Editorial.

Published in:

2019

By:

Basu, Kanad;
Chen, Mingsong;
Parekhji, Rubin

Publication type:

Editorial

An Integrated on-Silicon Verification Method for FPGA Overlays.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 2, p. 173, doi. 10.1007/s10836-019-05786-z

By:

Kourfali, Alexandra;
Fricke, Florian;
Huebner, Michael;
Stroobandt, Dirk

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2019, v. 35, n. 1, p. 7, doi. 10.1007/s10836-018-05770-z
Publication type:: Article

Test Technology Newsletter.

Published in:: 2018
Publication type:: Proceeding

Automation of Test Program Synthesis for Processor Post-silicon Validation.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 1, p. 83, doi. 10.1007/s10836-018-5709-x

By:

Suryasarman, Vasudevan Madampu;
Biswas, Santosh;
Sahu, Aryabartta

Publication type:

Article

NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 1, p. 27, doi. 10.1007/s10836-018-5707-z

By:

Yu, Yang;
Liang, Jie;
Yang, Zhiming;
Peng, Xiyuan

Publication type:

Article

Exploring System Availability During Software-Based Self-Testing of Multi-core CPUs.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 1, p. 67, doi. 10.1007/s10836-018-5706-0

By:

Skitsas, Michael A.;
Nicopoulos, Chrysostomos A.;
Michael, Maria K.

Publication type:

Article

A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSO.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 5, p. 531, doi. 10.1007/s10836-016-5616-y

By:

Zhang, Chaolong;
He, Yigang;
Yuan, Lifen;
He, Wei;
Xiang, Sheng;
Li, Zhigang

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2015, v. 31, n. 2, p. 125, doi. 10.1007/s10836-015-5521-9
Publication type:: Article

Iterative Antirandom Testing.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 301, doi. 10.1007/s10836-011-5272-1

By:

Mrozek, Ireneusz;
Yarmolik, Vyacheslav

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2013, v. 29, n. 5, p. 619, doi. 10.1007/s10836-013-5412-x
Publication type:: Article

Challenges for Semiconductor Test Engineering: A Review Paper.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 365, doi. 10.1007/s10836-011-5276-x

By:

Vock, Stefan;
Escalona, Omar;
Turner, Colin;
Owens, Frank

Publication type:

Article

On the Use of Static Temperature Measurements as Process Variation Observable.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 5, p. 685, doi. 10.1007/s10836-012-5298-z

By:

Gómez, Didac;
Altet, Josep;
Mateo, Diego

Publication type:

Article

Built-in Self Test of RF Subsystems with Integrated Detectors.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 5, p. 557, doi. 10.1007/s10836-012-5315-2

By:

Zhang, Chaoming;
Gharpurey, Ranjit;
Abraham, Jacob

Publication type:

Article

A New Optimal Test Node Selection Method for Analog Circuit.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 279, doi. 10.1007/s10836-011-5274-z

By:

Luo, Hui;
Wang, Youren;
Lin, Hua;
Jiang, Yuanyuan

Publication type:

Article

IC Immunity Modeling Process Validation Using On-Chip Measurements.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 339, doi. 10.1007/s10836-012-5294-3

By:

Ben Dhia, S.;
Boyer, A.;
Vrignon, B.;
Deobarro, M.

Publication type:

Article

Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits.

Published in:

2012

By:

Marinissen, Erik;
Zorian, Yervant

Publication type:

Editorial

Editorial.

Published in:

2012

By:

Agrawal, Vishwani

Publication type:

Editorial

Functional Verification of DMA Controllers.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 505, doi. 10.1007/s10836-011-5219-6

By:

Grosso, Michelangelo;
Perez Holguin, Wilson;
Ravotto, Danilo;
Sanchez, Ernesto;
Reorda, Matteo;
Tonda, Alberto;
Medina, Jaime

Publication type:

Article

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 465, doi. 10.1007/s10836-011-5221-z

By:

Subrahmaniyan Radhakrishnan, Gurusubrahmaniyan;
Ozev, Sule

Publication type:

Article

An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 477, doi. 10.1007/s10836-011-5232-9

By:

Sun, Haijun;
Zeng, Yongjia;
Li, Pu;
Lei, Shaochong;
Shao, Zhibiao

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2011, v. 27, n. 4, p. 427, doi. 10.1007/s10836-011-5236-5
Publication type:: Article

Test Data Compression Using Selective Sparse Storage.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 565, doi. 10.1007/s10836-011-5234-7

By:

Zhang, Ling;
Kuang, Ji-shun;
You, Zhi-qiang

Publication type:

Article

Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADCs.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 441, doi. 10.1007/s10836-011-5231-x

By:

Huang, Xuan-Lun;
Kang, Ping-Ying;
Yu, Yuan-Chi;
Huang, Jiun-Lang

Publication type:

Article

An Output Response Analyzer Circuit for ADC Built-in Self-Test.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 455, doi. 10.1007/s10836-011-5235-6

By:

Ting, Hsin-Wen

Publication type:

Article

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 19, doi. 10.1007/s10836-010-5178-3

By:

Malandruccolo, Vezio;
Ciappa, Mauro;
Rothleitner, Hubert;
Fichtner, Wolfgang

Publication type:

Article

Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 9, doi. 10.1007/s10836-010-5186-3

By:

Nummer, Muhammad;
Sachdev, Manoj

Publication type:

Article

Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 57, doi. 10.1007/s10836-010-5180-9

By:

Al-Gayem, Qais;
Liu, Hongyuan;
Richardson, Andrew;
Burd, Nick

Publication type:

Article

Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 43, doi. 10.1007/s10836-010-5185-4

By:

Bin Zhou;
Li-yi Xiao;
Yi-Zheng Ye;
Xin-Chun Wu

Publication type:

Article

A Design of Linearity Built-in Self-Test for Current-Steering DAC.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 85, doi. 10.1007/s10836-010-5187-2

By:

Hsin-Wen Ting;
Soon-Jyh Chang;
Su-Ling Huang

Publication type:

Article

Masking of X-Values by Use of a Hierarchically Configurable Register.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 31, doi. 10.1007/s10836-010-5179-2

By:

Rabenalt, Thomas;
Goessel, Michael;
Leininger, Andreas

Publication type:

Article

GÜÇ KATSAYISI DÜZELTİM DEVRELERİNDE ORTALAMA AKIM KONTROL TEKNİĞİ VE SAYISAL SİNYAL İŞLEMCİSİ KULLANARAK YENİ BİR YÖNTEMİN UYGULANMASI.

Published in:

Journal of the Faculty of Engineering & Architecture of Gazi University / Gazi Üniversitesi Mühendislik Mimarlık Fakültesi Dergisi,, 2011, v. 26, n. 1, p. 193

By:

KARAARSLAN, Ahmet;
İSKENDER, İres

Publication type:

Article

Design of a Passive, Broadband Equalizer for a SLED.

Published in:

Microwave Journal, 2012, v. 55, n. 10, p. 88

By:

BRINTON, CHRIS;
WHARTON, MATTHEW;
KATZ, ALLEN

Publication type:

Article

1 kW PULSE POWER AMPLIFIER FOR ISM BAND.

Published in:: Microwave Journal, 2008, v. 51, n. 12, p. 96
Publication type:: Article

Approaching Board Test Nonintrusively.

Published in:

EE: Evaluation Engineering, 2009, v. 48, n. 12, p. 23

By:

Sguigna, Alan

Publication type:

Article

Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data Fusion.

Published in:

Circuits, Systems & Signal Processing, 2013, v. 32, n. 2, p. 525, doi. 10.1007/s00034-012-9487-x

By:

Peng, Minfang;
Tse, Chi;
Shen, Meie;
Xie, Kai

Publication type:

Article

Noise on Vcc for Serial Data Communications.

Published in:

Microwave Journal, 2014, v. 57, n. 6, p. 100

By:

Penso, Vitali

Publication type:

Article

60 GHz duplexer design using dual-mode SIW filters with single-sided transmission zeros.

Published in:

Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 21, p. 1529, doi. 10.1049/el.2014.1288

By:

Desong Wang;
Kuo-Sheng Chin;
Wenquan Che;
Chih-Chun Chang;
Yafen Wu

Publication type:

Article