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Works matching DE "ELECTRONIC circuit testing equipment industry"

Results: 3

Coupling superconducting qubits via a cavity bus.
Published in:
Nature, 2007, v. 449, n. 7161, p. 443, doi. 10.1038/nature06184
By:
- Majer, J.;
- Chow, J. M.;
- Gambetta, J. M.;
- Koch, Jens;
- Johnson, B. R.;
- Schreier, J. A.;
- Frunzio, L.;
- Schuster, D. I.;
- Houck, A. A.;
- Wallraff, A.;
- Blais, A.;
- Devoret, M. H.;
- Girvin, S. M.;
- Schoelkopf, R. J.
Publication type:
Article
Ultrasonic introscopy of welds of products in the nuclear industry.
Published in:
Russian Journal of Nondestructive Testing, 2009, v. 45, n. 8, p. 570, doi. 10.1134/S1061830909080099
By:
- Pronyakin, V.;
- Sorokin, Yu.;
- Panchenko, Yu.;
- Vasil’ev, M.;
- Ivanenko, P.
Publication type:
Article
A Methodology for Calculating the Undetectable Double-Faults in Self-Checking Circuits.
Published in:
Journal of Circuits, Systems & Computers, 2003, v. 12, n. 1, p. 75, doi. 10.1142/S0218126603000854
By:
- Nikolaidis, S.;
- Karaolis, E.;
- Kakarountas, A.;
- Papadomanolakis, K.;
- Goutis, C. E.
Publication type:
Article