Works matching DE "ELECTRONIC appliance testing"

Results: 143

The development of the physical fundamentals of contact soldering as a factor for reducing the number of defects in electronic devices.

Published in:

Russian Journal of Nondestructive Testing, 2013, v. 49, n. 3, p. 178, doi. 10.1134/S1061830913030078

By:

Shtennikov, V.;
Budai, B.

Publication type:

Article

Induction ultrasonic piezoelectric transducers: Theoretical analysis of the operation of a piezoelectric transducer.

Published in:

Russian Journal of Nondestructive Testing, 2009, v. 45, n. 4, p. 267, doi. 10.1134/S106183090904007X

By:

Glagolev, A.

Publication type:

Article

Why Does a “Surplus” Pulse Appear?

Published in:

Russian Journal of Nondestructive Testing, 2005, v. 41, n. 4, p. 266, doi. 10.1007/s11181-005-0161-2

By:

Ermolov, M.;
Ermolov, I.

Publication type:

Article

High performance current and spin diode of atomic carbon chain between transversely symmetric ribbon electrodes.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep06157

By:

Yao-Jun Dong;
Xue-Feng Wang;
Shuo-Wang Yang;
Xue-Mei Wu

Publication type:

Article

High Speed All Optical Nyquist Signal Generation and Full-band Coherent Detection.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep06156

By:

Junwen Zhang;
Jianjun Yu;
Yuan Fang;
Nan Chi

Publication type:

Article

The influence of pelagic habitat selection and interspecific competition on productivity of juvenile walleye pollock ( Theragra chalcogramma) and capelin ( Mallotus villosus) in the Gulf of Alaska.

Published in:

Fisheries Oceanography, 2010, v. 19, n. 4, p. 262, doi. 10.1111/j.1365-2419.2010.00542.x

By:

LOGERWELL, ELIZABETH A.;
DUFFY-ANDERSON, JANET;
WILSON, MATTHEW;
MCKELVEY, DENISE

Publication type:

Article

ESD Association ESD Handbook Available.

Published in:: Quality & Reliability Engineering International, 1995, v. 11, n. 6, p. 458
Publication type:: Article

QUALITY AND 1/f NOISE OF ELECTRONIC COMPONENTS.

Published in:

Quality & Reliability Engineering International, 1995, v. 11, n. 3, p. 165, doi. 10.1002/qre.4680110305

By:

Konczakowska, AliCja

Publication type:

Article

Rules for Component and Assessment Specifications Published.

Published in:: Quality & Reliability Engineering International, 1994, v. 10, n. 6, p. 487
Publication type:: Article

Phased Array Radar Condition Monitoring.

Published in:: Quality & Reliability Engineering International, 1993, v. 9, n. 3, p. 230
Publication type:: Article

EOS/ESD Association Approves Three Standards.

Published in:: Quality & Reliability Engineering International, 1993, v. 9, n. 3, p. 227
Publication type:: Article

New From RAC.

Published in:: Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 310
Publication type:: Article

APPLICATION OF WEIBULL PROPORTIONAL HAZARDS MODELLING TO BAD-AS-OLD FAILURE DATA.

Published in:

Quality & Reliability Engineering International, 1991, v. 7, n. 3, p. 149, doi. 10.1002/qre.4680070306

By:

Love, C. E.;
Guo, R.

Publication type:

Article

Sensor and Numerical Simulator Evaluation for Porous Medium Desiccation and Rewetting at the Intermediate Laboratory Scale.

Published in:

Vadose Zone Journal, 2012, v. 11, n. 1, p. 23, doi. 10.2136/vzj2011.0089

By:

Oostrom, M.;
Wietsma, T. W.;
Strickland, C. E.;
Freedman, V. L.;
Truex, M. J.

Publication type:

Article

Electric Probe Measurements of the Poloidal Velocity in the Scrape-Off Layer of ASDEX Upgrade.

Published in:

Contributions to Plasma Physics, 2014, v. 54, n. 3, p. 273, doi. 10.1002/ctpp.201410078

By:

Mehlmann, F.;
Costea, S.;
Schrittwieser, R.;
Naulin, V.;
Rasmussen, J. J.;
Müller, H. W.;
Nielsen, A. H.;
Vianello, N.;
Carralero, D.;
Rohde, V.;
Lux, C.;
Ionita, C.;
ASDEX Up-grade Team

Publication type:

Article

Handheld Digital TV Performance Evaluation Method.

Published in:

International Journal of Digital Multimedia Broadcasting, 2008, p. 1, doi. 10.1155/2008/243937

By:

Bedicks Jr., Gunnar;
Yamada, Fujio;
Sukys, Francisco;
Akamine, Cristiano;
Raunheitte, Luis Tadeu;
Horta, Edson L.

Publication type:

Article

A New Approach for Multi-Emitter Test Signal Generation.

Published in:

EE: Evaluation Engineering, 2013, v. 52, n. 12, p. 20

By:

Jue, Greg

Publication type:

Article

EE PRODUCTS PICKS.

Published in:: 2012
Publication type:: Product Review

From Testing ADCs to Detecting Donkeys.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 7, p. 22

By:

Nelson, Rick;
Lecklider, Tom

Publication type:

Article

Getting Help in Achieving Compliance.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 5, p. 26

By:

Nelson, Rick

Publication type:

Article

Distance-to-Fault Is Spelled TDR or VNA.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 4, p. 24

By:

Lecklider, Tom

Publication type:

Article

PXI Matures.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 4, p. 12

By:

Lecklider, Tom

Publication type:

Article

Phase Coherent Signal Testing.

Published in:

EE: Evaluation Engineering, 2009, v. 48, n. 3, p. 24

By:

Stallings, Justin

Publication type:

Article

Tackling Next-Generation RF SOC Test.

Published in:

EE: Evaluation Engineering, 2008, v. 47, n. 10, p. 12

By:

Burke, Ron

Publication type:

Article

Eight Hints for Better Scope Probing.

Published in:

EE: Evaluation Engineering, 2008, v. 47, n. 1, p. 12

By:

Jae-Yong Chang

Publication type:

Article

Analog Signal Generators Updated.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 44

By:

Lecklider, Tom

Publication type:

Article

Implementing Change On the Test Floor.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 5, p. 16

By:

VanNewkirk, John

Publication type:

Article

Stimulating the Pulse of Today's Electronics.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 5, p. 32

By:

Lecklider, Tom

Publication type:

Article

Bridging the Gap Between Instruments And Devices Under Test.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 3, p. 58

By:

Beaver, Patrick

Publication type:

Article

Acoustic Solution for Bonded Wafer Voids.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 60

By:

Adams, Tom

Publication type:

Article

Testing Written Very Small.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 52

By:

Lecklider, Tom

Publication type:

Article

Understanding the Role Precision Plays in HALT.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 42

By:

Kalal, Ted;
Levin, Mark

Publication type:

Article

Managing Electronics Validation Testing.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 36

By:

Porter, Alexander J.

Publication type:

Article

Generators Offer Low Phase Noise and Fast Switching.

Published in:: EE: Evaluation Engineering, 2006, v. 45, n. 8, p. 10
Publication type:: Article

Technology Provides Immunity To Wafer Probing Systems.

Published in:: 2005
Publication type:: Product Review

Low Sensitivity Third Order Lowpass Butterworth Filter Using CFA.

Published in:

Journal of Active & Passive Electronic Devices, 2010, v. 5, n. 3/4, p. 321

By:

Nandi, R.;
Kar, Mousiki;
Das, Soumik

Publication type:

Article

DDS Based Standalone Generator Prototype Parameters Evaluation.

Published in:

Measurements, 2007, v. 40, n. 2, p. 8

By:

Svilainis, L.;
Motiejūnas, G.;
Ibenskis, E.

Publication type:

Article

Atomic-level observation with three-dimensional atom probe of the solute behaviour in neutron-, ion- or electron-irradiated ferritic alloys.

Published in:

Philosophical Magazine, 2005, v. 85, n. 4-7, p. 429, doi. 10.1080/02678370412331320233

By:

Pareige, P.;
Radiguet, B.;
Krummeich-Brangier, R.;
Barbu, A.;
Zabusov, O.;
Kozodaev, M.

Publication type:

Article

Atom probe tomography of radiation-sensitive KS-01 weld.

Published in:

Philosophical Magazine, 2005, v. 85, n. 4-7, p. 401, doi. 10.1080/0267837041233132060

By:

Miller, M.K.;
Russell, K.F.;
Sokolov, M.A.;
R.K.Nanstad

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
Publication type:: Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2016, v. 32, n. 5, p. 507, doi. 10.1007/s10836-016-5612-2
Publication type:: Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2013, v. 29, n. 2, p. 123, doi. 10.1007/s10836-013-5366-z
Publication type:: Article

On Chip Signal Generators for Low Overhead ADC BIST.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 5, p. 615, doi. 10.1007/s10836-012-5320-5

By:

Duan, Jingbo;
Vasan, Bharath;
Zhao, Chen;
Chen, Degang;
Geiger, Randall

Publication type:

Article

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 551, doi. 10.1007/s10836-011-5220-0

By:

Gonçalves, Luiz;
Bosa, Jefferson;
Balen, Tiago;
Lubaszewski, Marcelo;
Schneider, Eduardo;
Henriques, Renato

Publication type:

Article

Disturbance of measurement probe for exposure assessment of a base station antenna near a ground plane.

Published in:

Microwave & Optical Technology Letters, 2006, v. 48, n. 8, p. 1610, doi. 10.1002/mop.21694

By:

Joseph, Wout;
Roelens, Laurens;
Martens, Luc

Publication type:

Article

EM-properties measurement of concave-surface coating materials using a modified open-ended coaxial probe.

Published in:

Microwave & Optical Technology Letters, 2000, v. 27, n. 4, p. 278, doi. 10.1002/1098-2760(20001120)27:4<278::AID-MOP19>3.0.CO;2-Y

By:

Hassan, Abdul-Kadum A.;
Xu, Deming;
Maode, Niu;
Zhang, Yu Jian

Publication type:

Article

A HIGH FREQUENCY PULSE GENERATOR FOR INJURING TISSUE WITHIN THE SANDISON-CLARK RABBIT EAR CHAMBER.

Published in:

Australian Journal of Experimental Biology & Medical Science, 1959, v. 37, n. 6, p. 593, doi. 10.1038/icb.1959.61

By:

Buckley, I. K.;
Semkiw, J.

Publication type:

Article

Recommended Practice.

Published in:: 2014
Publication type:: Product Review

New ESD standard and influence on test equipment requirements.

Published in:

Turkish Journal of Electrical Engineering & Computer Sciences, 2009, v. 17, n. 3, p. 337, doi. 10.3906/elk-0908-180

By:

WRIGHT, Nicholas

Publication type:

Article

In vitro assessment of the accuracy of three electronic apex locators.

Published in:

Paediatria Croatica, 2014, v. 58, n. 2, p. 107, doi. 10.13112/pc.627

By:

Matijević, Jurica;
Ljubičić, Anita;
Švegar, Domagoj;
Verzak, Željko;
Krmek, Silvana Jukić;
Karlović, Zoran;
Paris, Simeon

Publication type:

Article