Works matching DE "ELECTRON mean free path"
1
- Semiconductors, 2017, v. 51, n. 10, p. 1321, doi. 10.1134/S1063782617100062
- Bondarenko, V.;
- Filimonov, A.
- Article
2
- Applied Physics A: Materials Science & Processing, 2014, v. 117, n. 4, p. 1615, doi. 10.1007/s00339-014-8588-8
- Article
3
- Radiation & Environmental Biophysics, 2014, v. 53, n. 2, p. 427, doi. 10.1007/s00411-014-0518-9
- Article
4
- Plasma Physics Reports, 2013, v. 39, n. 9, p. 698, doi. 10.1134/S1063780X13090018
- Brantov, A.;
- Bychenkov, V.
- Article
5
- Digest Journal of Nanomaterials & Biostructures (DJNB), 2018, v. 13, n. 1, p. 1
- SAYYED, M. I.;
- DONG, M. G.;
- ZAID, M. H. M.;
- MATORI, K. A.;
- SIDEK, H. A. A.;
- SINGH, V.P.
- Article
6
- Pramana: Journal of Physics, 2019, v. 92, n. 2, p. 1, doi. 10.1007/s12043-018-1675-1
- Article
7
- Surface & Interface Analysis: SIA, 2018, v. 50, n. 10, p. 939, doi. 10.1002/sia.6510
- Aouina, Nabila Yasmina;
- Chaoui, Zine‐El‐Abidine
- Article
8
- Surface & Interface Analysis: SIA, 2017, v. 49, n. 4, p. 238, doi. 10.1002/sia.6123
- Shinotsuka, H.;
- Da, B.;
- Tanuma, S.;
- Yoshikawa, H.;
- Powell, C. J.;
- Penn, D. R.
- Article
9
- Entropy, 2015, v. 17, n. 8, p. 5157, doi. 10.3390/e17085157
- Cimmelli, Vito Antonio;
- Carlomagno, Isabella;
- Sellitto, Antonio
- Article
10
- IET Microwaves, Antennas & Propagation (Wiley-Blackwell), 2017, v. 11, n. 10, p. 1424, doi. 10.1049/iet-map.2016.0497
- Jinrong Su;
- Xinwei Chen;
- Liping Han;
- Rongcao Yang;
- Wenmei Zhang
- Article
11
- Nondestructive Testing & Evaluation, 2013, v. 28, n. 3, p. 226, doi. 10.1080/10589759.2012.740043
- Moksin, M.M.;
- Haydari, M.;
- Husin, M.S.;
- Yahya, N.;
- Azmi, B.Z.
- Article
12
- Journal of Nano- & Electronic Physics, 2016, v. 8, n. 1, p. 1, doi. 10.21272/jnep.8(1).01001
- Bhattacharya, S.;
- Das, D.;
- Rahaman, H.
- Article
13
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 1, p. 01029-1
- Tyschenko, K. V.;
- Pazukha, I. M.;
- Shabelnyk, T. M.;
- Protsenko, I. Yu.
- Article