Works about ELECTRON emission
1
- Instruments & Experimental Techniques, 2025, v. 68, n. 2, p. 187, doi. 10.1134/S0020441225700320
- Grishkov, A. A.;
- Vorobyov, M. S.;
- Doroshkevich, S. Yu.;
- Koval, N. N.
- Article
2
- Inorganics, 2025, v. 13, n. 6, p. 201, doi. 10.3390/inorganics13060201
- Article
3
- International Journal of Nanoscience, 2007, v. 6, n. 2, p. 85, doi. 10.1142/S0219581X07004328
- ROCHET, FRANÇOIS;
- BOURNEL, FABRICE;
- CARNIATO, STEPHANE;
- DUFOUR, GEORGES;
- GALLET, JEAN-JACQUES;
- ILAKOVAC, VITA;
- LE GUEN, KARINE;
- RANGAN, SYLVIE;
- KUBSKY, STEPHAN;
- SIROTTI, FAUSTO
- Article
4
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 715, doi. 10.1142/S0219581X06005042
- JIHOON OH;
- SUNYOUNG CHANG;
- SEUNGKWANG ROH;
- JIYOUNG JANG;
- WHIKUN YI
- Article
5
- Particle & Particle Systems Characterization, 2022, v. 39, n. 11, p. 1, doi. 10.1002/ppsc.202200136
- Hepperle, Philine;
- Baek, Woon Yong;
- Nettelbeck, Heidi;
- Rabus, Hans
- Article
6
- Advanced Functional Materials, 2014, v. 24, n. 28, p. 4466, doi. 10.1002/adfm.201304233
- Lenser, Christian;
- Patt, Marten;
- Menzel, Stephan;
- Köhl, Annemarie;
- Wiemann, Carsten;
- Schneider, Claus M.;
- Waser, Rainer;
- Dittmann, Regina
- Article
7
- Advanced Functional Materials, 2014, v. 23, n. 39, p. 4914, doi. 10.1002/adfm.201300547
- Park, Young‐Seo;
- Lee, Sunghun;
- Kim, Kwon‐Hyeon;
- Kim, Sei‐Yong;
- Lee, Jeong‐Hwan;
- Kim, Jang‐Joo
- Article
8
- Journal of Thermal Analysis & Calorimetry, 2006, v. 86, n. 1, p. 115, doi. 10.1007/s10973-006-7585-3
- Kowalska, E.;
- Kowalczyk, P.;
- Radomska, J.;
- Czerwosz, E.;
- Wronka, H.;
- Bystrzejewski, M.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 926, doi. 10.1007/s10854-009-0019-9
- Wen-Ching Shih;
- Jian-Min Jeng;
- Jyi-Tsong Lo;
- Huang-Chin Chen;
- I-Nan Lin
- Article
10
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 407, doi. 10.1007/s10854-008-9646-9
- Hung-Hsin Chen;
- Wu-Yih Uen;
- Chien-Te Ku;
- Shan-Ming Lan;
- Tsun-Neng Yang;
- Zhen-Yu Li;
- Chin-Chen Chiang
- Article
11
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 286, doi. 10.1007/s10854-008-9583-7
- Vasiliu, C.;
- Epurescu, G.;
- Niciu, H.;
- Dumitrescu, O.;
- Negrila, C.;
- Elisa, M.;
- Filipescu, M.;
- Dinescu, M.;
- Grigorescu, C. E. A.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 855, doi. 10.1007/s10854-007-9520-1
- Liday, J.;
- Hotový, I.;
- Sitter, H.;
- Vogrinčič, P.;
- Vincze, A.;
- Vávra, I.;
- Šatka, A.;
- Ecke, G.;
- Bonanni, A.;
- Breza, J.;
- Simbrunner, C.;
- Plochberger, B.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 493, doi. 10.1007/s10854-008-9604-6
- Basu, P. K.;
- Saha, N.;
- Maji, S.;
- Saha, H.;
- Basu, Sukumar
- Article
14
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 893, doi. 10.1007/s10854-007-9125-8
- Jihoon Oh;
- Sunyoung Chang;
- Jiyoung Jang;
- Seungkwang Roh;
- Jaehong Park;
- Jungwoo Lee;
- Daewon Sohn;
- Whikun Yi;
- Yeongri Jung;
- Sung-Jin Kim
- Article
15
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.1092
- Abbasi, Mozhdeh;
- Schmid, Maximilian;
- Mafodda, Alessia;
- Aschauer, Stefan
- Article
16
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.097
- Donovan, John;
- Jokubauskas, Petras;
- Ritchie, Nicholas;
- Fournelle, John;
- Ducharme, Andrew
- Article
17
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.089
- Wuhrer, Richard;
- Moran, Ken;
- Matthews, Michael
- Article
18
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.037
- Maillet, Jean-Baptiste;
- Costa, Gerald Da;
- Bacchi, Christian;
- Vurpillot, François
- Article
19
- 2023
- Hubbard, William A;
- Chan, Ho Leung;
- Regan, B C
- Abstract
20
- 2019
- Sekiguchi, Takashi;
- Agemura, Toshihide;
- Yao, Yuanzhao
- Abstract
21
- Microscopy & Microanalysis, 2019, p. 126, doi. 10.1017/S1431927618001125
- House, Stephen D.;
- Schamp, C. Tom;
- Yang, Judith C.
- Article
22
- 2010
- Mackie, W. A.;
- Magera, G. G.;
- Fast, C. L.
- Abstract
23
- Microscopy & Microanalysis, 2010, v. 16, n. 3, p. 282, doi. 10.1017/S1431927610000115
- Wong, K. C.;
- Haslauer, C. M.;
- Anantharamaiah, N.;
- Pourdeyhimi, B.;
- Batchelor, A. D.;
- Griffis, D. P.
- Article
24
- Microscopy & Microanalysis, 2009, v. 15, n. 4, p. 314, doi. 10.1017/S1431927609090254
- Article
25
- Microscopy & Microanalysis, 2004, v. 10, n. 6, p. 764, doi. 10.1017/s1431927604040735
- H.-J. Fitting;
- E. Schreiber;
- I.A. Glavatskikh
- Article
26
- Microscopy & Microanalysis, 2004, v. 10, n. 6, p. 670, doi. 10.1017/s1431927604040619
- Article
27
- Communications in Mathematical Physics, 2004, v. 252, n. 1-3, p. 415, doi. 10.1007/s00220-004-1180-x
- Fröhlich, J.;
- Griesemer, M.;
- Schlein, B.
- Article
28
- Applied Microbiology & Biotechnology, 2013, v. 97, n. 2, p. 681, doi. 10.1007/s00253-012-3979-2
- Wang, Jianzhi;
- Zhao, Guanghui;
- Li, Yanfeng;
- Liu, Xiao;
- Hou, Pingping
- Article
29
- Measurement Techniques, 2018, v. 61, n. 1, p. 42, doi. 10.1007/s11018-018-1385-6
- Viazava, K. A.;
- Kasparov, K. N.;
- Penyazkov, O. G.
- Article
30
- Measurement Techniques, 2009, v. 52, n. 1, p. 33, doi. 10.1007/s11018-009-9215-5
- S. Bereznitskii;
- D. Bogachenko;
- I. Gaydaenko;
- O. Egorov;
- V. Kolesnikov;
- V. Turov
- Article
31
- Measurement Techniques, 2008, v. 51, n. 10, p. 1116, doi. 10.1007/s11018-009-9171-0
- Article
32
- Universe (2218-1997), 2024, v. 10, n. 12, p. 442, doi. 10.3390/universe10120442
- Niţescu, Ovidiu;
- Ghinescu, Stefan;
- Šimkovic, Fedor
- Article
33
- Universe (2218-1997), 2024, v. 10, n. 7, p. 279, doi. 10.3390/universe10070279
- Chang, Che-Jui;
- Kiang, Jean-Fu
- Article
34
- Universe (2218-1997), 2023, v. 9, n. 8, p. 369, doi. 10.3390/universe9080369
- Suchkov, Sergey I.;
- Arkhangelskaja, Irina V.;
- Arkhangelskiy, Andrey I.;
- Bakaldin, Aleksey V.;
- Chernysheva, Irina V.;
- Galper, Arkady M.;
- Dalkarov, Oleg D.;
- Egorov, Andrey E.;
- Kheymits, Maxim D.;
- Korotkov, Mikhail G.;
- Leonov, Aleksey A.;
- Leonova, Svetlana A.;
- Malinin, Alexandr G.;
- Mikhailov, Vladimir V.;
- Minaev, Pavel Yu;
- Pappe, Nikolay Yu.;
- Razumeyko, Mikhail V.;
- Topchiev, Nikolay P.;
- Yurkin, Yuri T.
- Article
35
- Universe (2218-1997), 2023, v. 9, n. 8, p. 357, doi. 10.3390/universe9080357
- Anagnostopoulos, Georgios C.;
- Marhavilas, Panagiotis K.;
- Vassiliadis, Efthymios;
- Sarris, Emmanuel T.
- Article
36
- Instruments (2410-390X), 2023, v. 7, n. 4, p. 52, doi. 10.3390/instruments7040052
- Frazzitta, Andrea;
- Bacci, Alberto;
- Carbone, Arianna;
- Cianchi, Alessandro;
- Curcio, Alessandro;
- Drebot, Illya;
- Ferrario, Massimo;
- Petrillo, Vittoria;
- Conti, Marcello Rossetti;
- Samsam, Sanae;
- Serafini, Luca;
- Rossi, Andrea Renato
- Article
37
- Instruments (2410-390X), 2023, v. 7, n. 4, p. 47, doi. 10.3390/instruments7040047
- Li, Yiming;
- Mann, Joshua;
- Rosenzweig, James
- Article
38
- Journal of Industrial Microbiology & Biotechnology, 2008, v. 35, n. 7, p. 751, doi. 10.1007/s10295-008-0343-8
- Raulio, Mari;
- Järn, Mikael;
- Ahola, Juhana;
- Peltonen, Jouko;
- Rosenholm, Jarl B.;
- Tervakangas, Sanna;
- Kolehmainen, Jukka;
- Ruokolainen, Timo;
- Narko, Pekka;
- Salkinoja-Salonen, Mirja
- Article
39
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2023, v. 45, n. 9, p. 1041, doi. 10.15407/mfint.45.09.1041
- Yakymchuk, M. M.;
- Mykhailova, H. Yu.;
- Galstian, I. Ye.;
- Gerasymov, O. Yu.;
- Shatnii, T. D.;
- Rud, M. O.;
- Len, E. G.
- Article
40
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2021, v. 43, n. 12, p. 1707, doi. 10.15407/mfint.43.12.1707
- Сидорченко, І. М.;
- Шевченко, М. Я.;
- Цапко, Є. А.;
- Галстян, І. Є.;
- Михайлова, Г. Ю.;
- Лень, Є. Г.
- Article
41
- Global Journal of Environmental Science & Management (GJESM), 2025, v. 11, n. 2, p. 443, doi. 10.22034/gjesm.2025.02.05
- Sukamto;
- Sutanto, K. D.;
- Noveriza, R.;
- Hardiyanti, S.;
- Djiwanti, S. R.;
- Wiratno;
- Manohara, D.;
- Rahardjo, I. B.;
- Harni, R.;
- Amaria, W.;
- Supriadi
- Article
42
- Ferroelectrics, 2009, v. 391, n. 1, p. 22, doi. 10.1080/00150190903001078
- KOZAKOV, A. T.;
- SAKHNENKO, V. P.;
- PANCHENKO, E. M.;
- NIKOLSKII, A. V.;
- SMOTRAKOV, V. G.;
- EREMKIN, V. V.
- Article
43
- Ferroelectrics, 2007, v. 360, n. 1, p. 1, doi. 10.1080/00150190701515840
- Article
44
- Ferroelectrics, 2007, v. 360, n. 1, p. 124, doi. 10.1080/00150190701517671
- Rogazinskaya, O. V.;
- Milovidova, S. D.;
- Sidorkin, A. S.;
- Plaksitsky, A. B.;
- Goliandrin, Yu. V.;
- Ponomareva, N. Yu.
- Article
45
- Ferroelectrics, 2007, v. 360, n. 1, p. 128, doi. 10.1080/00150190701517697
- Rogazinskaya, O. V.;
- Milovidova, S. D.;
- Sidorkin, A. S.;
- Plaksitsky, A. B.;
- Ponomareva, N. Yu.
- Article
46
- Ferroelectrics, 2007, v. 353, n. 1, p. 225, doi. 10.1080/00150190701368182
- Solnyshkin, A. V.;
- Suchaneck, G.;
- Kislova, I. L.;
- Gerlach, G.
- Article
47
- Ferroelectrics, 2006, v. 334, n. 1, p. 181, doi. 10.1080/00150190600695164
- Rogazinskaya, O. V.;
- Milovidova, S. D.;
- Sidorkin, A. A.;
- Plaksitskii, A. B.;
- Sidorkin, V. A.;
- Demesh, K. K.
- Article
48
- Ferroelectrics, 2004, v. 302, n. 1, p. 341, doi. 10.1080/00150190490456664
- Rogazinskaya, O.V.;
- Milovidova, S.D.;
- Sidorkin, V.A.;
- Plaksitskii, A.B.
- Article
49
- Ferroelectrics, 2004, v. 302, n. 1, p. 257, doi. 10.1080/00150190490456114
- Sidorkin, A.A.;
- Rogazinskaya, O.V.;
- Milovidova, S.D.;
- Sidorkin, V.A.
- Article
50
- Ferroelectrics, 2004, v. 302, n. 1, p. 249, doi. 10.1080/00150190490456105
- Sidorkin, A.S.;
- Sidorkin, V.A.
- Article
