Works matching DE "ELECTRON beam lithography"
1
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-07428-1
- Pellegrini, Paloma E. S.;
- De-Moraes, Luana;
- Poma, Freddy Jara;
- Nista, Silvia Vaz Guerra;
- Cioldin, Frederico H.;
- Hernández-Figueroa, Hugo Enrique;
- Moshkalev, Stanislav
- Article
2
- Micromachines, 2025, v. 16, n. 6, p. 667, doi. 10.3390/mi16060667
- Cheng, Xiuyan;
- Liang, Di;
- Jiang, Miao;
- Sha, Yufei;
- Liu, Xiaonan;
- Liu, Jinlai;
- Cao, Qingchen;
- Shi, Jiangliu
- Article
3
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 935, doi. 10.1142/S0219581X11008757
- VIJAYKUMAR, T.;
- KURRA, NARENDRA;
- KULKARNI, G. U.
- Article
4
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 699, doi. 10.1142/S0219581X11008939
- BHUVANA, T.;
- KULKARNI, G. U.
- Article
5
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 815, doi. 10.1142/S0219581X06005200
- TANAKA, HIROFUMI;
- WEISS, PAUL S.;
- HORN, MARK W.
- Article
6
- International Journal of Nanoscience, 2006, v. 5, n. 4/5, p. 559, doi. 10.1142/S0219581X06004796
- CHEN, A.;
- WANG, B. Z.;
- CHUA, S. J.;
- WILHELMI, O.;
- MAHMOOD, SHAHRAIN B.;
- SAW, B. T.;
- KONG, J. R.;
- MOSER, H. O.
- Article
7
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 587, doi. 10.1142/S0219581X05003486
- NARAYANAN, T. V.;
- SOHAN SINGH;
- TANOTO, HENDRIX;
- MY THE;
- SOON FATT YOON
- Article
8
- International Journal of Nanoscience, 2003, v. 2, n. 6, p. 495, doi. 10.1142/S0219581X03001607
- Baksheyev, D.G.;
- Bykov, A.A.;
- Tkachenko, V.A.;
- Tkachenko, O.A.;
- Litvin, L.V.;
- Latyshev, A.V.;
- Aseev, A.L.;
- Estibals, O.;
- Portal, J.-C.
- Article
9
- Electroanalysis, 2016, v. 28, n. 12, p. 3039, doi. 10.1002/elan.201600303
- Robinson, Jendai E.;
- Heineman, William R.;
- Sagle, Laura B.;
- Meyyappan, M.;
- Koehne, Jessica E.
- Article
10
- Annalen der Physik, 2020, v. 532, n. 8, p. 1, doi. 10.1002/andp.202000273
- Zhang, Jinzhong;
- Jalil, Abdur Rehman;
- Tse, Pok‐Lam;
- Kölzer, Jonas;
- Rosenbach, Daniel;
- Valencia, Helen;
- Luysberg, Martina;
- Mikulics, Martin;
- Panaitov, Gregory;
- Grützmacher, Detlev;
- Hu, Zhigao;
- Lu, Jia Grace;
- Schäpers, Thomas
- Article
11
- Annalen der Physik, 2018, v. 530, n. 3, p. 1, doi. 10.1002/andp.201700418
- Sun, Shang;
- Zhou, Zhenxing;
- Zhang, Chen;
- Yang, Wenhong;
- Song, Qinghai;
- Xiao, Shumin
- Article
12
- Advanced Functional Materials, 2014, v. 24, n. 43, p. 6797, doi. 10.1002/adfm.201401559
- Geldmeier, Jeffrey;
- König, Tobias;
- Mahmoud, Mahmoud A.;
- El‐Sayed, Mostafa A.;
- Tsukruk, Vladimir V.
- Article
13
- Advanced Functional Materials, 2014, v. 24, n. 24, p. 3692, doi. 10.1002/adfm.201304047
- de la Rica, Roberto;
- Bat, Erhan;
- Herpoldt, Karla L.;
- Xie, Hai‐nan;
- Bertazzo, Sergio;
- Maynard, Heather D.;
- Stevens, Molly M.
- Article
14
- Microscopy & Microanalysis, 2019, p. 610, doi. 10.1017/S1431927619003787
- Zeng, Yitian;
- Madsen, Steven;
- Yankovich, Andrew;
- Olsson, Eva;
- Sinclair, Robert
- Article
15
- 2019
- Kellogg, William;
- Myers, Benjamin D.;
- Hujsak, Karl;
- Dravid, Vinayak P.
- Abstract
16
- Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1220, doi. 10.1017/S1431927612013414
- Demers, Hendrix;
- Poirier-Demers, Nicolas;
- Phillips, Matthew R.;
- de Jonge, Niels;
- Drouin, Dominique
- Article
17
- Ferroelectrics, 2009, v. 383, n. 1, p. 84, doi. 10.1080/00150190902876405
- FUJII, TADASHI;
- HIRABAYASHI, SUGURE;
- ADACHI, MASATOSHI
- Article
18
- Ferroelectrics, 2008, v. 362, n. 1, p. 105, doi. 10.1080/00150190802006731
- Salut, R.;
- Gariglio, S.;
- Daniau, W.;
- Majjad, H.;
- Triscone, G.;
- Triscone, J. -M.;
- Ballandras, S.
- Article
19
- Sensors & Materials, 2019, v. 31, n. 8, Part 2, p. 2511, doi. 10.18494/SAM.2019.2443
- Akio Higo;
- Tomoki Sawamura;
- Makoto Fujiwara;
- Eric Lebrasseur;
- Ayako Mizushima;
- Etsuko Ota;
- Yoshio Mita
- Article
20
- Electronics (2079-9292), 2024, v. 13, n. 13, p. 2490, doi. 10.3390/electronics13132490
- Lee, Hsin-Jung;
- Lee, Cheng-Che;
- Pan, Hong-Ru;
- Kuan, Chieh-Hsiung
- Article
21
- Electronics (2079-9292), 2022, v. 11, n. 5, p. 752, doi. 10.3390/electronics11050752
- Planillo, Jordan;
- Alves, Fabio
- Article
22
- ChemistryOpen, 2024, v. 13, n. 11, p. 1, doi. 10.1002/open.202400179
- Mielewczyk, Lukas;
- Galle, Lydia;
- Niese, Nick;
- Grothe, Julia;
- Kaskel, Stefan
- Article
23
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-98611-x
- Inomata, Naoki;
- Takahashi, Tomotsugu;
- Sakai, Yuki;
- Okatani, Taiyu;
- Kanamori, Yoshiaki
- Article
24
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep07267
- Ye, Fan;
- Burns, Michael J.;
- Naughton, Michael J.
- Article
25
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05257
- Kasture, Sachin;
- Ravishankar, Ajith P.;
- Yallapragada, V. J.;
- Patil, Raj;
- Valappil, Nikesh V.;
- Mulay, Gajendra;
- Gopal Achanta, Venu
- Article
26
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04270
- Gadalla, M. N.;
- Abdel-Rahman, M.;
- Shamim, Atif
- Article
27
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep01948
- W. G. Wang;
- Pearse, A.;
- M. Li;
- Hageman, S.;
- A. X. Chen;
- F. Q. Zhu;
- C. L. Chien
- Article
28
- Modern Physics Letters B, 2021, v. 35, n. 8, p. N.PAG, doi. 10.1142/S021798492150144X
- Dong, Yunhui;
- He, Wei;
- Zhang, Wen;
- Dong, Mingli
- Article
29
- International Journal of High Speed Electronics & Systems, 2006, v. 16, n. 2, p. 693, doi. 10.1142/S0129156406003941
- Article
30
- Microchimica Acta, 2009, v. 164, n. 3/4, p. 307, doi. 10.1007/s00604-008-0075-5
- Kojima, Ryu;
- Mawatari, Kazuma;
- Renberg, Björn;
- Tsukahara, Takehiko;
- Kitamori, Takehiko
- Article
31
- Gold Bulletin, 2013, v. 46, n. 4, p. 283, doi. 10.1007/s13404-013-0127-4
- Bouvrée, A.;
- D'Orlando, A.;
- Makiabadi, T.;
- Martin, S.;
- Louarn, G.;
- Mevellec, J. Y.;
- Humbert, B.
- Article
32
- Canadian Journal of Chemistry, 2006, v. 84, n. 10, p. 1254, doi. 10.1139/V06-089
- Article
33
- Journal of Electronic Materials, 2023, v. 52, n. 11, p. 7763, doi. 10.1007/s11664-023-10694-2
- Nie, Weican;
- Wang, Fang;
- Kong, Deqing;
- Yang, Zuodong;
- Han, Yemei;
- Han, Xu;
- Shan, Xin;
- Lin, Xin;
- Chen, Gang;
- Dun, Hongyu;
- Zhang, Kailiang
- Article
34
- Chemistry - A European Journal, 2021, v. 27, n. 52, p. 13094, doi. 10.1002/chem.202102909
- Chen, Xin;
- Kohring, Malte;
- Assebban, M'hamed;
- Tywoniuk, Bartłomiej;
- Bartlam, Cian;
- Moses Badlyan, Narine;
- Maultzsch, Janina;
- Duesberg, Georg S.;
- Weber, Heiko B.;
- Knirsch, Kathrin C.;
- Hirsch, Andreas
- Article
35
- Chemistry - A European Journal, 2021, v. 27, n. 52, p. 13117, doi. 10.1002/chem.202102021
- Chen, Xin;
- Kohring, Malte;
- Assebban, M'hamed;
- Tywoniuk, Bartłomiej;
- Bartlam, Cian;
- Moses Badlyan, Narine;
- Maultzsch, Janina;
- Duesberg, Georg S.;
- Weber, Heiko B.;
- Knirsch, Kathrin C.;
- Hirsch, Andreas
- Article
36
- Journal of Materials Science, 2015, v. 50, n. 20, p. 6601, doi. 10.1007/s10853-015-9203-x
- Bryche, Jean-François;
- Gillibert, Raymond;
- Barbillon, Grégory;
- Sarkar, Mitradeep;
- Coutrot, Anne-Lise;
- Hamouda, Frédéric;
- Aassime, Abdelhanin;
- Moreau, Julien;
- Lamy de la Chapelle, Marc;
- Bartenlian, Bernard;
- Canva, Michael
- Article
37
- Journal of Materials Science, 2007, v. 42, n. 12, p. 4428, doi. 10.1007/s10853-006-0651-1
- Article
38
- Nature, 2008, v. 454, n. 7204, p. 585, doi. 10.1038/454585a
- Article
39
- Nature, 2007, v. 446, n. 7138, p. 937, doi. 10.1038/446937b
- Article
40
- Nature, 2007, v. 446, n. 7138, p. 940, doi. 10.1038/446940a
- Article
41
- Nature, 2006, v. 444, n. 7116, p. 187, doi. 10.1038/nature05276
- Meschke, Matthias;
- Guichard, Wiebke;
- Pekola, Jukka P.
- Article
42
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 197, doi. 10.1093/jmicro/dfp060
- Tamura, Keiji;
- Okayama, Shigeo;
- Shimizu, Ryuichi
- Article
43
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 25, p. 1355, doi. 10.1049/el.2019.2714
- Kaifei Dong;
- Fang Wang;
- Meng Deng;
- Shuo Yan;
- Kailiang Zhang
- Article
44
- ChemElectroChem, 2024, v. 11, n. 16, p. 1, doi. 10.1002/celc.202400352
- Niu, Baokang;
- Wang, Ningyu;
- Shen, Ruizhao;
- Liao, Xiaobin;
- Mai, Liqiang
- Article
45
- ChemElectroChem, 2018, v. 5, n. 18, p. 2620, doi. 10.1002/celc.201800723
- Brites Helú, Mariela A.;
- Fernandez, Wanda V.;
- Fernández, José L.
- Article
46
- Sensors & Materials, 2020, v. 32, n. 12, Part 2, p. 4121, doi. 10.18494/SAM.2020.2874
- Toshihiro Takeshita;
- Takahiro Yamashita;
- Yusuke Takei;
- Takeshi Kobayashi
- Article
47
- Nano Convergence, 2023, v. 10, n. 1, p. 1, doi. 10.1186/s40580-023-00358-6
- Tao, Wei;
- Laible, Florian;
- Hmima, Abdelhamid;
- Maurer, Thomas;
- Fleischer, Monika
- Article
48
- Bayero Journal of Pure & Applied Sciences, 2022, p. 576, doi. 10.4314/bajopas.v13i1.86S
- Article
49
- Crystals (2073-4352), 2024, v. 14, n. 1, p. 58, doi. 10.3390/cryst14010058
- Crisan, Ovidiu;
- Crisan, Alina Daniela
- Article
50
- Crystals (2073-4352), 2019, v. 9, n. 10, p. 515, doi. 10.3390/cryst9100515
- Suwannasopon, Satayu;
- Meyer, Fabian;
- Schlickriede, Christian;
- Chaisakul, Papichaya;
- T-Thienprasert, Jiraroj;
- Limtrakul, Jumras;
- Zentgraf, Thomas;
- Chattham, Nattaporn
- Article