Microstructure Evolution of Ruthenium During Vacuum Hot Pressing.
- Published in:
- Johnson Matthey Technology Review, 2021, v. 65, n. 4, p. 584, doi. 10.1595/205651321X16123456338021
- By:
- Publication type:
- Article
Works matching DE "ELECTRON backscattering"
Results: 1205
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2
Characterization of CuO‐Doped SnO<sub>2</sub> Thin Films Prepared by Sol–Gel and Dip‐Coating: A Multi‐Analytical Approach.
- Published in:
- Surface & Interface Analysis: SIA, 2025, v. 57, n. 8, p. 600, doi. 10.1002/sia.7418
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- Publication type:
- Article
3
Effect of Internal Curing as Mitigation to Minimize Alkali-Silica Reaction Damage.
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- ACI Materials Journal, 2017, v. 114, n. 3, p. 417, doi. 10.14359/51689562
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- Publication type:
- Article
4
Raman and RBS Analysis of Silicon Ion Implanted Gallium Arsenide.
- Published in:
- International Journal of Nanoscience, 2022, v. 21, n. 1, p. 1, doi. 10.1142/S0219581X22500028
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- Publication type:
- Article
5
Porous Gold with a Nested-Network Architecture and Ultrafine Structure.
- Published in:
- Advanced Functional Materials, 2015, v. 25, n. 17, p. 2530, doi. 10.1002/adfm.201404544
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- Publication type:
- Article
6
Crystallographic texture of drawn gold bonding wires using electron backscattered diffraction (EBSD).
- Published in:
- Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1373, doi. 10.1023/A:1025751714880
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- Publication type:
- Article
7
Exploring the Use of Electron Rutherford Backscattering for the Detection and Quantification of Light Elements in Scanning Electron Microscope (SEM).
- Published in:
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.099
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- Publication type:
- Article
8
Enhanced Electron Backscatter Correction for Electron Probe Microanalysis.
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- 2024
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- Publication type:
- Correction Notice
9
An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds.
- Published in:
- Microscopy & Microanalysis, 2023, v. 29, n. 4, p. 1436, doi. 10.1093/micmic/ozad069
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- Publication type:
- Article
10
EDS Chemical Mapping by Unmixing of Spectral Imaging Data.
- Published in:
- 2023
- By:
- Publication type:
- Abstract
11
Focused Beams for Use in EBSD and TKD.
- Published in:
- 2023
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- Publication type:
- Abstract
12
PyEBSDIndex: Indexing Electron Backscattered Diffraction Patterns on the GPU.
- Published in:
- 2023
- By:
- Publication type:
- Abstract
13
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM.
- Published in:
- 2023
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- Publication type:
- Abstract
14
High Throughput Automatic Elemental Analysis System Using Conventional SEM-EDS.
- Published in:
- 2019
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- Publication type:
- Abstract
15
Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps.
- Published in:
- Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 111, doi. 10.1017/S1431927612014055
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- Publication type:
- Article
16
Electron Microscopy Characterization of Ni-Cr-B-Si-C Laser Deposited Coatings.
- Published in:
- Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 120, doi. 10.1017/S1431927612013839
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- Publication type:
- Article
17
Application of Electron Backscatter Diffraction for Crystallographic Characterization of Tin Whiskers.
- Published in:
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 876, doi. 10.1017/S143192761200044X
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- Publication type:
- Article
18
EBSD Microstructural Characterization of Various Alloy 82H GTA Weld Configurations: Butt Joints, Build-ups, and Overlays.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
19
Niobium Grain Strain Investigation Using Electron Backscattered Diffraction (EBSD).
- Published in:
- 2012
- By:
- Publication type:
- Abstract
20
The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
21
Tutorial: A guide to EBSD for in-situ studies.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
22
Electron Backscattered Diffraction and Transmission Electron Microscopy Analysis of Ribbon Silicon.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
23
Characterization of Alloy 82H GTA Welds for SCC Studies and Structural Analyses.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
24
Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric Materials.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
25
Dynamical Simulation of Electron Backscatter Diffraction (EBSD) Patterns of Imperfect Crystals.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
26
Developments in EBSD Pattern Background Removal, Band Detection and Indexing for Improved Data Quality and Ease of Use.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
27
What BSE Electrons can tell us. From ECCI via RBS to Low Loss BSE imaging.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
28
Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI).
- Published in:
- 2012
- By:
- Publication type:
- Abstract
29
Electron Backscatter Diffraction (EBSD) Characterization of Uranium and Uranium Alloys.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
30
Metallographic Preparation of Zr-alloys for Examination of Zr-Hydrides using Selective Angle Backscatter Detection.
- Published in:
- 2012
- By:
- Publication type:
- Abstract
31
Spatial Resolution Optimization of Backscattered Electron Images Using Monte Carlo Simulation.
- Published in:
- Microscopy & Microanalysis, 2012, v. 18, n. 3, p. 628, doi. 10.1017/S1431927612000207
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- Publication type:
- Article
32
Dependence of the Electron Beam Energy and Types of Surface to Determine EBSD Indexing Reliability in Yttria-Stabilized Zirconia.
- Published in:
- Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 371, doi. 10.1017/S1431927611012815
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- Publication type:
- Article
33
Closed-Cell Foam Skin Thickness Measurement Using a Scanning Electron Microscope.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 772, doi. 10.1017/S1431927611000420
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- Publication type:
- Article
34
Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 728, doi. 10.1017/S1431927611000523
- By:
- Publication type:
- Article
35
High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
36
Chemical and Structural Analysis in 3D: Combining μ-XRF, EDS, and EBSD Data Sets.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
37
Digital BSE Imaging on SEMs.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
38
Influence of Backscattered Electron Imaging Geometry on Channeling Contrast of Dislocations.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
39
Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. S2, p. 904, doi. 10.1017/S1431927611005393
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- Publication type:
- Article
40
The Contrast Mechanisms of LL-BSE Electrons in FE-SEM Characterization of Polymer, Single Proteins, and Oxidization States of Elements.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. S2, p. 902, doi. 10.1017/S1431927611005381
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- Publication type:
- Article
41
Unconventional Imaging with Backscattered Electrons.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. S2, p. 900, doi. 10.1017/S143192761100537X
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- Publication type:
- Article
42
Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
43
ASTM Grain Size by EBSD - A New Standard.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
44
Exploring Innovative and Challenging Applications of EBSD in the Geological and Biological Sciences.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
45
Characterization of Retained Austenite and Carbides in Stainless Steel by Combined EBSD, EDS, and XRD.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
46
Electron Backscattering Diffraction (EBSD) as a Tool to Evaluate the Topotactic and Epitactic Growth of Minerals: The Example of the Magnetite and Hematite.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
47
Preparation of Materials for EBSD using an Adjustable Broad Beam Ion Source.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
48
Advanced Sample Preparation Techniques Using Broad Ar Ion Beam for Optimum EBSD Acquisition.
- Published in:
- 2011
- By:
- Publication type:
- Abstract
49
Introduction to a Special Issue on Electron Backscatter Diffraction.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 3, p. 315, doi. 10.1017/S1431927611000614
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- Publication type:
- Article
50
An Open-Source Engine for the Processing of Electron Backscatter Patterns: EBSD-Image.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 3, p. 374, doi. 10.1017/S1431927611000456
- By:
- Publication type:
- Article