Works matching DE "ELECTROABSORPTION"
1
- Photonics, 2017, v. 4, n. 1, p. 9, doi. 10.3390/photonics4010009
- Karinou, Fotini;
- Stojanovic, Nebojsa;
- Prodaniuc, Cristian;
- Qiang Zhang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 285, doi. 10.1049/el.2016.4174
- Mekonnen, K. A.;
- van Zantvoort, J. H. C.;
- Tessema, N. M.;
- Cao, Z.;
- Tangdiongga, E.;
- Koonen, A. M. J.
- Article
3
- Crystallography Reports, 2018, v. 63, n. 6, p. 977, doi. 10.1134/S106377451805005X
- Blinov, L. M.;
- Lazarev, V. V.;
- Yudin, S. G.;
- Artemov, V. V.;
- Gorkunov, M. V.;
- Palto, S. P.
- Article
4
- Crystallography Reports, 2016, v. 61, n. 5, p. 866, doi. 10.1134/S1063774516050047
- Blinov, L.;
- Lazarev, V.;
- Yudin, S.
- Article
5
- Crystallography Reports, 2013, v. 58, n. 6, p. 906, doi. 10.1134/S1063774513060060
- Blinov, L. M.;
- Lazarev, V. V.;
- Yudin, S. G.
- Article
6
- Nanoscale Research Letters, 2014, v. 9, n. 1, p. 1, doi. 10.1186/1556-276X-9-131
- Kouhi, Mohammad;
- Vahedi, Ali;
- Akbarzadeh, Abolfazl;
- Hanifehpour, Younes;
- Joo, Sang
- Article
7
- Nanoscale Research Letters, 2013, v. 8, n. 2, p. 1, doi. 10.1186/1556-276X-8-59
- Shuh Ying Lee;
- Soon Fatt Yoon;
- Ngo, Andrew C. Y.;
- Guo, Tina
- Article
8
- Russian Journal of General Chemistry, 2018, v. 88, n. 1, p. 86, doi. 10.1134/S1070363218010139
- Article
9
- Optica Applicata, 2016, v. 46, n. 3, p. 347, doi. 10.5277/oa160302
- CHIH-LUNG TSENG;
- YA-WEN LIN;
- PO-JUI CHING;
- YUANG-TUNG CHENG;
- JAU-JI JOU;
- CHENG-KUANG LIU
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 637, doi. 10.1049/el.2015.4441
- Naughton, A.;
- Lai, C. P.;
- Talli, G.;
- Vaernewyck, R.;
- Yin, X.;
- Bauwelinck, J.;
- Qiu, X. Z.;
- Maxwell, G.;
- Smith, D. W.;
- Borghesani, A.;
- Cronin, R.;
- Grobe, K.;
- Eiselt, M.;
- Parsons, N.;
- Kehayas, E.;
- Townsend, P. D.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 7, p. 533, doi. 10.1049/el.2013.4276
- Kanazawa, S.;
- Fujisawa, T.;
- Ohki, A.;
- Takahata, K.;
- Sanjoh, H.;
- Iga, R.;
- Ishii, H.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3662
- Dalir, H.;
- Takahashi, Y.;
- Koyama, F.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 3, p. 74, doi. 10.1049/el.2012.4148
- Fujisawa, T.;
- Kanazawa, S.;
- Kobayashi, W.;
- Takahata, K.;
- Ohki, A.;
- Iga, R.;
- Ishii, H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 57, doi. 10.1049/el.2012.3728
- Kayastha, M. S.;
- Sapkota, D. P.;
- Takahashi, M.;
- Wakita, K.
- Article
15
- Acta Physica Polonica: A, 2013, v. 123, n. 2, p. 415, doi. 10.12693/APhysPolA.123.415
- Article
16
- Plasmonics, 2017, v. 12, n. 2, p. 383, doi. 10.1007/s11468-016-0275-5
- Zamani, N.;
- Keshavarz, A.;
- Nadgaran, H.
- Article
17
- Plasmonics, 2016, v. 11, n. 4, p. 1087, doi. 10.1007/s11468-015-0146-5
- Jin, Lin;
- Chen, Qin;
- Liu, Wanwan;
- Song, Shichao
- Article
18
- Optics & Spectroscopy, 2016, v. 120, n. 2, p. 300, doi. 10.1134/S0030400X1602003X
- Blinov, L.;
- Lazarev, V.;
- Yudin, S.;
- Palto, S.
- Article
19
- Journal of Sensors, 2016, p. 1, doi. 10.1155/2016/8243269
- Iribas, H.;
- Urricelqui, J.;
- Mariñelarena, J.;
- Sagues, M.;
- Loayssa, A.
- Article
20
- EE: Evaluation Engineering, 2015, v. 54, n. 5, p. 6
- Article
21
- Advanced Materials Interfaces, 2016, v. 3, n. 4, p. n/a, doi. 10.1002/admi.201500422
- Singh, Chetan R.;
- Li, Cheng;
- Mueller, Christian J.;
- Hüttner, Sven;
- Thelakkat, Mukundan
- Article
22
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 4, p. 970, doi. 10.1002/pssa.201532568
- Theurer, M.;
- Przyrembel, G.;
- Sigmund, A.;
- Molzow, W.‐D.;
- Troppenz, U.;
- Möhrle, M.
- Article
23
- Surface Review & Letters, 2013, v. 20, n. 6, p. -1, doi. 10.1142/S0218625X13300050
- HUANG, WEI;
- ZHANG, YIMIN;
- BAO, SHENXU;
- SONG, SHAOXIAN
- Article
24
- Physica Status Solidi (B), 2018, v. 255, n. 4, p. 1, doi. 10.1002/pssb.201700470
- Vinasco, Juan Alejandro;
- Londoño, Mauricio Alejandro;
- Restrepo, Ricardo León;
- Mora‐ramos, Miguel Eduardo;
- Feddi, El Mustapha;
- Radu, Adrian;
- Kasapoglu, Esin;
- Morales, Alvaro Luis;
- Duque, Carlos Alberto
- Article
25
- ETRI Journal, 2013, v. 35, n. 3, p. 459, doi. 10.4218/etrij.13.0112.0305
- Oh Kee Kwon;
- Yong Soon Beak;
- Yun C. Chung;
- Hyung-Moo Park
- Article
26
- ETRI Journal, 2013, v. 35, n. 2, p. 245, doi. 10.4218/etrij.13.0112.0441
- Kim, Jongdeog;
- Lee, Jong Jin;
- Lee, Seihyoung;
- Kim, Young-Sun
- Article