Works about ELECTRICAL engineering materials
1
- Journal of Electronic Materials, 2025, v. 54, n. 8, p. 6433, doi. 10.1007/s11664-025-12024-0
- Cao, Lihua;
- Lin, Xinyan;
- Cao, Jiaxin;
- Peng, Guixiang;
- zhang, Yang;
- Zhang, Shunhua;
- Ma, Yongli;
- Zhu, Jianbin;
- Zhang, Wenhua;
- Xia, Fei;
- Xu, Zhiyong;
- Hou, Xue
- Article
2
- Applied Microscopy, 2025, v. 55, n. 1, p. 1, doi. 10.1186/s42649-025-00109-3
- Gopal, Neeruganti Obularajugari;
- Basha, Mahammad Hussain;
- Pravakar, Ojha;
- Kumar, Yedurupaka Madhav
- Article
3
- Journal of Polymers & the Environment, 2025, v. 33, n. 7, p. 3124, doi. 10.1007/s10924-025-03599-0
- Katyal, Moniya;
- Singh, Rakshanda;
- Sharma, Anurekha;
- Gupta, Ranjan;
- Aggarwal, Neeraj K.;
- Yadav, Anita
- Article
4
- Johnson Matthey Technology Review, 2021, v. 65, n. 4, p. 504, doi. 10.1595/205651321X16300573825500
- Article
5
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-61293-0
- Zhang, Yiyan;
- Zhao, Tianyu;
- Deng, Yuming;
- Liu, Xinyue;
- Zhang, Xiaorong;
- Zhu, Tong;
- Ågren, Hans;
- Chen, Guanying
- Article
6
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-61128-y
- Tong, Hongbo;
- Tan, Shan;
- Zhang, Yongshuai;
- He, Yuru;
- Ding, Chao;
- Zhang, Hongchao;
- He, Jinhua;
- Cao, Jun;
- Liu, Hai;
- Li, Yali;
- Kang, Jikai;
- Xu, Xinxing;
- Chen, Chen;
- Chen, Yao;
- Sun, Feilong;
- Feng, Bowen;
- Sun, Heng;
- Jiang, Xian;
- Yu, Long;
- Li, Jinyu
- Article
7
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-61081-w
- Sun, Yinqing;
- Li, Faming;
- Zhang, Hao;
- Liu, Wenzhu;
- Wang, Zenghui;
- Mao, Lin;
- Li, Qian;
- He, Youlin;
- Yang, Tian;
- Sun, Xianggang;
- Qian, Yicheng;
- Ma, Yinyi;
- Zhang, Liping;
- Du, Junlin;
- Shi, Jianhua;
- Wang, Guangyuan;
- Han, Anjun;
- Wang, Na;
- Meng, Fanying;
- Liu, Zhengxin
- Article
8
- Inorganic Materials, 2024, v. 60, n. 15, p. 1585, doi. 10.1134/S0020168525700384
- Ekimov, E. A.;
- Sidorov, V. A.;
- Karabutov, A. A.;
- Shiryaev, A. A.;
- Drozdova, E. I.;
- Lukina, I. N.;
- Chernogorova, O. P.
- Article
9
- Optical & Quantum Electronics, 2025, v. 57, n. 6, p. 1, doi. 10.1007/s11082-025-08280-3
- Zebach, Mohammed;
- Abderrahmane, hemmani;
- Khachab, Hamid
- Article
10
- Optical & Quantum Electronics, 2025, v. 57, n. 6, p. 1, doi. 10.1007/s11082-025-08280-3
- Zebach, Mohammed;
- Abderrahmane, hemmani;
- Khachab, Hamid
- Article
11
- Optical & Quantum Electronics, 2025, v. 57, n. 6, p. 1, doi. 10.1007/s11082-025-08241-w
- Jana, Abir;
- Kumari, Komal;
- Gupta, Bhaskar;
- Sarkar, Subir Kumar
- Article
12
- Electrical Engineering, 2025, v. 107, n. 6, p. 7657, doi. 10.1007/s00202-024-02941-4
- Najim, Abdelhafid;
- Moulaoui, Lhouceine;
- Laassouli, Abdelmounaim;
- Bajjou, Omar;
- Rahmani, Khalid
- Article
13
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4695, doi. 10.1002/adfm.201504908
- Park, Won‐Tae;
- Kim, Gyoungsik;
- Yang, Changduk;
- Liu, Chuan;
- Noh, Yong‐Young
- Article
14
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4680, doi. 10.1002/adfm.201600612
- Kong, Desheng;
- Pfattner, Raphael;
- Chortos, Alex;
- Lu, Chien;
- Hinckley, Allison C.;
- Wang, Chao;
- Lee, Wen‐Ya;
- Chung, Jong Won;
- Bao, Zhenan
- Article
15
- Advanced Functional Materials, 2016, v. 26, n. 18, p. 3021, doi. 10.1002/adfm.201600179
- Nonoguchi, Yoshiyuki;
- Nakano, Motohiro;
- Murayama, Tomoko;
- Hagino, Harutoshi;
- Hama, Shota;
- Miyazaki, Koji;
- Matsubara, Ryosuke;
- Nakamura, Masakazu;
- Kawai, Tsuyoshi
- Article
16
- Advanced Functional Materials, 2016, v. 26, n. 6, p. 955, doi. 10.1002/adfm.201503940
- Zeumault, Andre;
- Subramanian, Vivek
- Article
17
- Advanced Functional Materials, 2014, v. 24, n. 22, p. 3324, doi. 10.1002/adfm.201303374
- Senanayak, Satyaprasad P.;
- Narayan, K. S.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 514, doi. 10.1007/s10854-009-9948-6
- Feng Chen;
- Jinrong Cheng;
- Shenwen Yu;
- Zhongyan Meng
- Article
19
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 416, doi. 10.1007/s10854-009-9935-y
- Xiao Lou;
- Wenjian Weng;
- Kui Cheng;
- Chenlu Song;
- Piyi Du;
- Ge Shen;
- Gaorong Han
- Article
20
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 3, p. 291, doi. 10.1007/s10854-009-9907-2
- Article
21
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1090, doi. 10.1007/s10854-008-9832-9
- Ying Yuan;
- Shuren Zhang;
- Xiaohua Zhou
- Article
22
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1106, doi. 10.1007/s10854-008-9834-7
- Shuwang Ma;
- Guixia Dong;
- Zhimin Yang;
- Jun Du
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1123, doi. 10.1007/s10854-008-9837-4
- Bo Li;
- Xiaohua Zhou;
- Shuren Zhang;
- Hongmei Jiang
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1135, doi. 10.1007/s10854-008-9839-2
- Haikui Zhu;
- Hongqing Zhou;
- Min Liu;
- Pengfei Wei;
- Guijun Xu;
- Ge Ning
- Article
25
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 23, doi. 10.1007/s10854-007-9424-0
- Bozsoki, Peter;
- Hoyer, Walter;
- Kira, Mackillo;
- Varga, Imre;
- Thomas, Peter;
- Koch, Stephan W.;
- Schomerus, Henning
- Article
26
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 355, doi. 10.1007/s10854-008-9621-5
- Jun Jie Wang;
- Wen-Hsi Lee;
- Jia Chung Ho;
- Tang Shiang Hu
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 915, doi. 10.1007/s10854-008-9713-2
- Wu, Mo;
- Alivov, Y. I.;
- Morkoç, Hadis
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 902, doi. 10.1007/s10854-008-9679-0
- Tyagi, Hitender Kumar;
- George, P. J.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 863, doi. 10.1007/s10854-007-9526-8
- Zhiguo Wang;
- Xiaotao Zu;
- Li Yang;
- Fei Gao;
- Weber, William J.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 894, doi. 10.1007/s10854-008-9623-3
- Article
31
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 810, doi. 10.1007/s10854-007-9454-7
- Matsuura, Hideharu;
- Takahashi, Miyuki;
- Nagata, Shunji;
- Taniguchi, Kazuo
- Article
32
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 720, doi. 10.1007/s10854-007-9390-6
- Article
33
- Journal of Materials Science Letters, 2003, v. 22, n. 21, p. 1491, doi. 10.1023/A:1026194929224
- Yao, Jianxi;
- Zhao, Gaoling;
- Han, Gaorong
- Article
34
- Journal of Materials Science Letters, 2003, v. 22, n. 15, p. 1077, doi. 10.1023/A:1024930706970
- Han, H.;
- Wang, M.;
- Xu, X. H.;
- Wang, Z.;
- Lv, Y. Q.
- Article
35
- Cellulose, 2025, v. 32, n. 8, p. 4763, doi. 10.1007/s10570-025-06559-y
- Jankowska, Iga;
- Bielejewski, Michał;
- Ławniczak, Paweł;
- Pankiewicz, Radosław;
- Brus, Jiri;
- Tritt-Goc, Jadwiga
- Article
36
- Cellulose, 2025, v. 32, n. 3, p. 1667, doi. 10.1007/s10570-025-06371-8
- Khadka, Ashwin;
- Samuel, Edmund;
- Joshi, Bhavana;
- Pradhan, Shrayas;
- Lim, Woojin;
- Aldalbahi, Ali;
- Periyasami, Govindasami;
- Yoon, Sam S.
- Article
37
- Russian Journal of Nondestructive Testing, 2007, v. 43, n. 2, p. 95, doi. 10.1134/S1061830907020040
- Fursa, T. V.;
- Surzhikov, A. P.;
- Osipov, K. Yu.
- Article
38
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 10, p. 640, doi. 10.1007/s11181-006-0015-6
- Article
39
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 11, p. 768, doi. 10.1007/s11181-005-0056-2
- Sokolov, B.;
- Dragoshanskii, Yu.;
- Matveeva, V.;
- Tsyrlin, M.;
- Mineev, F.;
- Puzhevich, R.
- Article
40
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 4, p. 269, doi. 10.1023/B:RUNT.0000043677.36615.e2
- Article
41
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 8, p. 615, doi. 10.1023/B:RUNT.0000016388.74217.9a
- Lobanov, M. L.;
- Sysolyatina, I. P.;
- Chistyakov, V. K.;
- Gobov, Yu. L.;
- Gorkunov, E. S.;
- Zadvorkin, S. M.;
- Korzunin, G. S.;
- Lavrent'ev, A. G.;
- Perov, D. V.;
- Rinkevich, A. B.;
- Sandovskii, V. A.
- Article
42
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 7, p. 559, doi. 10.1023/B:RUNT.0000012796.17990.ab
- Article
43
- Measurement Techniques, 2008, v. 51, n. 2, p. 213, doi. 10.1007/s11018-008-9000-x
- Article
44
- Energy Informatics, 2025, v. 8, n. 1, p. 1, doi. 10.1186/s42162-025-00482-z
- Guo, Xinyu;
- Gu, Faying;
- Liu, Hongxu;
- Yu, Yongcheng;
- Li, Runjie;
- Wang, Juan
- Article
45
- Ferroelectrics, 2009, v. 391, n. 1, p. 9, doi. 10.1080/00150190903256441
- Article
46
- Ferroelectrics, 2009, v. 387, n. 1, p. 91, doi. 10.1080/00150190902966537
- Article
47
- Ferroelectrics, 2009, v. 384, n. 1, p. 174, doi. 10.1080/00150190902881470
- JAITANONG, N.;
- YIMNIRUN, R.;
- CHAIPANICH, A.
- Article
48
- Ferroelectrics, 2008, v. 375, n. 1, p. 1, doi. 10.1080/00150190802437738
- Petzelt, J.;
- Glogarová, M.
- Article
49
- Ferroelectrics, 2008, v. 371, n. 1, p. 21, doi. 10.1080/00150190802384963
- Dambekalne, M.;
- Antonova, M.;
- Kalnberga, M.;
- Livinsh, M.;
- Bormanis, K.;
- Sternberg, A.
- Article
50
- Ferroelectrics, 2008, v. 371, n. 1, p. 48, doi. 10.1080/00150190802385101
- Abdelkafi, Z.;
- Abdelmoula, N.;
- Khemakhem, H.;
- Simon, A.;
- Maglione, M.
- Article