Works about ELECTRICAL conductors
1
- Journal of Electromagnetic Waves & Applications, 2025, v. 39, n. 11, p. 1256, doi. 10.1080/09205071.2025.2502770
- Bezhanov, Stanislav;
- Uryupin, Sergey
- Article
2
- Frequenz, 2025, v. 79, n. 7/8, p. 327, doi. 10.1515/freq-2024-0062
- Mariadhason, Ribitha Elizabeth;
- Muniyappan, Vadivel
- Article
3
- Sensors (14248220), 2025, v. 25, n. 12, p. 3774, doi. 10.3390/s25123774
- Chiu, Chien-Ching;
- Chen, Po-Hsiang;
- Chang, Yen-Chen;
- Jiang, Hao
- Article
4
- NPJ Materials Degradation, 2025, v. 9, n. 1, p. 1, doi. 10.1038/s41529-025-00629-z
- Ziegelwanger, T.;
- Reisinger, M.;
- Petersmann, M.;
- Van Petegem, S.;
- Rodriguez-Lamas, R.;
- Todt, J.;
- Meindlhumer, M.;
- Keckes, J.;
- Yildirim, C.
- Article
5
- Innovation, 2005, v. 5, n. 2, p. 28
- Article
6
- Electroanalysis, 2017, v. 29, n. 3, p. 652, doi. 10.1002/elan.201600502
- Liu, Zhuangzhuang;
- Zhou, Lei;
- Chen, Qi;
- Zhou, Wen;
- Liu, Ying
- Article
7
- Electroanalysis, 2017, v. 29, n. 3, p. 880, doi. 10.1002/elan.201600591
- Mettakoonpitak, Jaruwan;
- Mehaffy, John;
- Volckens, John;
- Henry, Charles S.
- Article
8
- Electroanalysis, 2017, v. 29, n. 3, p. 907, doi. 10.1002/elan.201600665
- Silva, Tiago Almeida;
- Zanin, Hudson;
- Corat, Evaldo José;
- Fatibello‐Filho, Orlando
- Article
9
- Electroanalysis, 2016, v. 28, n. 5, p. 1035, doi. 10.1002/elan.201500619
- Neto, Sakae Y.;
- Viégas, Helmara D. C.;
- Almeida, Joseany M. S.;
- Cavalheiro, Eder T. G.;
- Araújo, Antonio S.;
- Marques, Edmar P.;
- Marques, Aldaléa L. B.
- Article
10
- Electroanalysis, 2016, v. 28, n. 5, p. 1068, doi. 10.1002/elan.201501034
- Angel Montiel, Miguel;
- Iniesta, Jesus;
- Gross, Andrew J.;
- Thiemann, Thies;
- Marken, Frank
- Article
11
- Electroanalysis, 2016, v. 28, n. 5, p. 936, doi. 10.1002/elan.201500618
- Wang, Jianmei;
- Xu, Yuanhong;
- Liu, Mengli;
- Niu, Fushuang;
- Liu, Jingquan
- Article
12
- Electroanalysis, 2016, v. 28, n. 5, p. 904, doi. 10.1002/elan.201500635
- Article
13
- Electroanalysis, 2016, v. 28, n. 5, p. 1044, doi. 10.1002/elan.201500637
- Malha, Seif Islam Rabie;
- Lahcen, Abdellatif Ait;
- Arduini, Fabiana;
- Ourari, Ali;
- Amine, Aziz
- Article
14
- Electroanalysis, 2015, v. 27, n. 1, p. 67, doi. 10.1002/elan.201400349
- Guziejewski, Dariusz;
- Mirceski, Valentin;
- Jadresko, Dijana
- Article
15
- Electroanalysis, 2015, v. 27, n. 1, p. 118, doi. 10.1002/elan.201400456
- Hasan, Kamrul;
- Reddy, Kesava Vijalapuram Raghava;
- Eßmann, Vera;
- Górecki, Kamil;
- Conghaile, Peter Ó;
- Schuhmann, Wolfgang;
- Leech, Dónal;
- Hägerhäll, Cecilia;
- Gorton, Lo
- Article
16
- Electroanalysis, 2015, v. 27, n. 1, p. 253, doi. 10.1002/elan.201400424
- Tchekwagep, Patrick Marcel Seumo;
- Nanseu‐Njiki, Charles Péguy;
- Ngameni, Emmanuel;
- Danielsson, Ravi;
- Arnebrant, Thomas;
- Ruzgas, Tautgirdas
- Article
17
- Electroanalysis, 2015, v. 27, n. 1, p. 84, doi. 10.1002/elan.201400373
- Mefteh, Wahid Ben;
- Touzi, Hassen;
- Bessueille, François;
- Chevalier, Yves;
- Kalfat, Rafik;
- Jaffrezic‐Renault, Nicole
- Article
18
- Electroanalysis, 2014, v. 26, n. 6, p. 1182, doi. 10.1002/elan.201400097
- Barfidokht, Abbas;
- Gooding, J. Justin
- Article
19
- Electroanalysis, 2014, v. 26, n. 1, p. 139, doi. 10.1002/elan.201300128
- Yang, Xiaoyang;
- Li, Xiaomeng;
- Ma, Xiao;
- Jia, Li;
- Zhu, Liande
- Article
20
- Electroanalysis, 2013, v. 25, n. 6, p. 1547, doi. 10.1002/elan.201300101
- Kawde, Abdel ‐ Nasser;
- Morsy, Mohamed A.;
- Odewunmi, NurudeEN;
- Mahfouz, Wael
- Article
21
- Electroanalysis, 2013, v. 25, n. 6, p. 1381, doi. 10.1002/elan.201300002
- Temerk, Yassein M.;
- Ibrahim, Mohamed S.;
- Kotb, Mohammed;
- Schuhmann, Wolfgang
- Article
22
- Electroanalysis, 2013, v. 25, n. 6, p. 1529, doi. 10.1002/elan.201300006
- Dejmkova, Hana;
- Houskova, Lucie;
- Barek, Jiri;
- Zima, Jiri
- Article
23
- Electroanalysis, 2013, v. 25, n. 6, p. 1369, doi. 10.1002/elan.201300030
- Cernat, Andreea;
- Griveau, Sophie;
- Richard, Cyrille;
- Bedioui, Fethi;
- Săndulescu, Robert
- Article
24
- Annalen der Physik, 2022, v. 534, n. 9, p. 1, doi. 10.1002/andp.202200109
- Qu, Jia;
- Pan, Hao;
- Zhang, Hai‐feng
- Article
25
- Advanced Functional Materials, 2016, v. 26, n. 22, p. 4026, doi. 10.1002/adfm.201503898
- Abedini‐Nassab, Roozbeh;
- Joh, Daniel Y.;
- Triggiano, Melissa A.;
- Baker, Cody;
- Chilkoti, Ashutosh;
- Murdoch, David M.;
- Yellen, Benjamin B.
- Article
26
- Advanced Functional Materials, 2016, v. 26, n. 21, p. 3703, doi. 10.1002/adfm.201600264
- Dong, Shengyang;
- Shen, Laifa;
- Li, Hongsen;
- Pang, Gang;
- Dou, Hui;
- Zhang, Xiaogang
- Article
27
- Advanced Functional Materials, 2016, v. 26, n. 6, p. 833, doi. 10.1002/adfm.201503705
- Schneider, Julian;
- Rohner, Patrik;
- Thureja, Deepankur;
- Schmid, Martin;
- Galliker, Patrick;
- Poulikakos, Dimos
- Article
28
- Advanced Functional Materials, 2016, v. 26, n. 6, p. 903, doi. 10.1002/adfm.201504307
- Kim, Sung‐Kon;
- Cho, Jiung;
- Moore, Jeffrey S.;
- Park, Ho Seok;
- Braun, Paul V.
- Article
29
- Advanced Functional Materials, 2015, v. 25, n. 39, p. 6165, doi. 10.1002/adfm.201502966
- Xiao, Miao;
- Kong, Tao;
- Wang, Wei;
- Song, Qin;
- Zhang, Dong;
- Ma, Qinqin;
- Cheng, Guosheng
- Article
30
- Advanced Functional Materials, 2015, v. 25, n. 25, p. 3888, doi. 10.1002/adfm.201500677
- Choi, Dong Yun;
- Oh, Yong Suk;
- Han, Donggeon;
- Yoo, Seunghyup;
- Sung, Hyung Jin;
- Kim, Sang Soo
- Article
31
- Advanced Functional Materials, 2015, v. 25, n. 2, p. 169, doi. 10.1002/adfm.201570009
- Blanchard, Didier;
- Nale, Angeloclaudio;
- Sveinbjörnsson, Dadi;
- Eggenhuisen, Tamara M.;
- Verkuijlen, Margriet H. W.;
- Suwarno;
- Vegge, Tejs;
- Kentgens, Arno P. M.;
- de Jongh, Petra E.
- Article
32
- Advanced Functional Materials, 2014, v. 24, n. 48, p. 7580, doi. 10.1002/adfm.201402547
- Jurewicz, Izabela;
- Fahimi, Azin;
- Lyons, Phillip E.;
- Smith, Ronan J.;
- Cann, Maria;
- Large, Matthew L.;
- Tian, Mingwen;
- Coleman, Jonathan N.;
- Dalton, Alan B.
- Article
33
- Advanced Functional Materials, 2014, v. 24, n. 45, p. 7187, doi. 10.1002/adfm.201401282
- Lee, Sunghwan;
- Paine, David C.;
- Gleason, Karen K.
- Article
34
- Advanced Functional Materials, 2014, v. 24, n. 36, p. 5671, doi. 10.1002/adfm.201400972
- Lee, Phillip;
- Ham, Jooyeun;
- Lee, Jinhwan;
- Hong, Sukjoon;
- Han, Seungyong;
- Suh, Young Duk;
- Lee, Sang Eon;
- Yeo, Junyeob;
- Lee, Seung Seob;
- Lee, Dongjin;
- Ko, Seung Hwan
- Article
35
- Advanced Functional Materials, 2014, v. 24, n. 28, p. 4442, doi. 10.1002/adfm.201304237
- Wan, Albert;
- Jiang, Li;
- Sangeeth, C. S. Suchand;
- Nijhuis, Christian A.
- Article
36
- Advanced Functional Materials, 2014, v. 24, n. 24, p. 3661, doi. 10.1002/adfm.201303716
- Lekawa‐Raus, Agnieszka;
- Patmore, Jeff;
- Kurzepa, Lukasz;
- Bulmer, John;
- Koziol, Krzysztof
- Article
37
- Advanced Functional Materials, 2014, v. 23, n. 42, p. 5292, doi. 10.1002/adfm.201203589
- Kramer, Rebecca K.;
- Majidi, Carmel;
- Wood, Robert J.
- Article
38
- Advanced Functional Materials, 2013, v. 23, n. 29, p. 3675, doi. 10.1002/adfm.201203418
- Zhang, Guoge;
- Li, Wenfang;
- Xie, Keyu;
- Yu, Fei;
- Huang, Haitao
- Article
39
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 195, doi. 10.1007/s10854-007-9536-6
- Kong, D. L. H.;
- Travis, A. R. L.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1100, doi. 10.1007/s10854-007-9475-2
- Prasanth, N. P.;
- Varghese, Justin M.;
- Prasad, K.;
- Krishnan, Bindu;
- Seema, A.;
- Dayas, K. R.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 111, doi. 10.1007/s10854-007-9516-x
- Wosinski, Tadeusz;
- Figielski, Tadeusz;
- Morawski, Andrzej;
- Makosa, Andrzej;
- Osinniy, Viktor;
- Wrobel, Jerzy;
- Sadowski, Janusz
- Article
42
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 338, doi. 10.1007/s10854-008-9575-7
- Altieri-Weimar, Paola;
- Jaeger, Arndt;
- Lutz, Thomas;
- Stauss, Peter;
- Streubel, Klaus;
- Thonke, Klaus;
- Sauer, Rolf
- Article
43
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 1005, doi. 10.1007/s10854-007-9441-z
- Behera, Banarji;
- Nayak, P.;
- Choudhary, R. N. P.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 1023, doi. 10.1007/s10854-007-9542-8
- Article
45
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 952, doi. 10.1007/s10854-007-9421-3
- Article
46
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 371, doi. 10.1007/s10854-007-9239-z
- Salavcova, Linda;
- Ondracek, Frantisek;
- Spirkova, Jarmila;
- Mika, Martin
- Article
47
- Journal of Materials Science Letters, 2003, v. 22, n. 8, p. 629, doi. 10.1023/A:1023314916525
- Masaki, N.;
- Uchida, S.;
- Sato, T.
- Article
48
- 2023
- Tsarfati, Yael;
- Bustillo, Karen C;
- Savitzky, Benjamin H;
- Ophus, Colin;
- McCulloch, Iain;
- Salleo, Alberto;
- Minor, Andrew M
- Abstract
49
- Microscopy & Microanalysis, 2019, p. 1726, doi. 10.1017/S143192761800911X
- Cuadros-Lugo, E.;
- Estrada-Guel, I.;
- Herrera-Ramírez, M.;
- López-Meléndez, C.;
- Carreño-Gallardo, C.
- Article
50
- Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 71, doi. 10.1017/S1431927612013013
- Landa-Cánovas, Á. R.;
- Vila, Eladio;
- Hernández-Velasco, Jorge;
- Galy, Jean;
- Castro, Alicia
- Article