Works matching DE "ELECTRIC resistance"
1
- Macromolecular Symposia, 2025, v. 414, n. 3, p. 1, doi. 10.1002/masy.70027
- Vertuccio, Luigi;
- Aliberti, Francesca;
- Longo, Raffaele;
- Guadagno, Liberata
- Article
2
- Journal of Applied Polymer Science, 2025, v. 142, n. 20, p. 1, doi. 10.1002/app.56894
- Chen, Qian;
- Jiang, Jianrong;
- Lin, Jialiang;
- Wang, Xinyu;
- Chen, Kai;
- Huang, Xiaoyan;
- Huang, Jianzi;
- Wang, Chaogang;
- Hu, Zhangli;
- Xu, Hong
- Article
3
- Clinical Respiratory Journal, 2025, v. 19, n. 5, p. 1, doi. 10.1111/crj.70084
- Wennberg, Pär;
- Sundberg, Bengt;
- Westerdahl, Elisabeth
- Article
4
- 2025
- Almutary, Abdulmajeed G.;
- Alnuqaydan, Abdullah M.;
- Almatroodi, Saleh A.;
- Bakshi, Hamid A.;
- Chellappan, Dinesh Kumar;
- Tambuwala, Murtaza M.
- Correction Notice
5
- Revista Cubana de Física, 2018, v. 35, n. 1E, p. E44
- Article
6
- Pertanika Journal of Social Sciences & Humanities, 2017, v. 25 S, p. 81
- Abdullah, Nazlinda;
- Noranee, Shereen;
- Khamis, Mohd Rahim
- Article
7
- Journal of Electronic Materials, 2024, v. 53, n. 11, p. 7065, doi. 10.1007/s11664-024-11402-4
- Chen, J. L.;
- Wang, S. B.;
- Ren, J.;
- Huang, M. L.
- Article
8
- Surface Engineering, 2019, v. 35, n. 11, p. 970, doi. 10.1080/02670844.2019.1584959
- Sahoo, Baidehish;
- Narsimhachary, Damanapeta;
- Paul, Jinu
- Article
9
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12351, doi. 10.1007/s10854-019-01593-6
- Azadfalah, Marziyeh;
- Sedghi, Arman;
- Hosseini, Hadi
- Article
10
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 11, p. 10886, doi. 10.1007/s10854-019-01433-7
- Raskar, Nita D.;
- Dake, Dnyaneshwar V.;
- Mane, Vijay A.;
- Stathatos, Elias;
- Deshpande, Uday;
- Dole, Babasaheb
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 13, p. 11478, doi. 10.1007/s10854-018-9242-6
- Vovk, R. V.;
- Khadzhai, G. Ya.;
- Prikhna, T. A.;
- Gevorkyan, E. S.;
- Kislitsa, M. V.;
- Soloviev, A. L.;
- Goulatis, I. L.;
- Chroneos, A.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 7, p. 6119, doi. 10.1007/s10854-018-8588-0
- Xie, Peitao;
- Fan, Runhua;
- Zhang, Zidong;
- Li, Bao-Wen;
- Chen, Min;
- Liu, Yao
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 6, p. 5025, doi. 10.1007/s10854-017-8464-3
- Zhu, Q. S.;
- Gao, F.;
- Ma, H. C.;
- Liu, Z. Q.;
- Guo, J. D.;
- Zhang, L.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 22, p. 17063, doi. 10.1007/s10854-017-7632-9
- Article
15
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16467, doi. 10.1007/s10854-017-7558-2
- Myung, Woo-Ram;
- Kim, Kyung-Yeol;
- Kim, Yongil;
- Jung, Seung-Boo
- Article
16
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 12891, doi. 10.1007/s10854-017-7119-8
- Doroftei, C.;
- Leontie, L.;
- Popa, A.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3481, doi. 10.1007/s10854-015-4181-y
- Adel, Chihi;
- Fethi, Boujmil;
- Brahim, Bessais
- Article
18
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3488, doi. 10.1007/s10854-015-4182-x
- Kannan, V.;
- Kim, Hyun-Seok;
- Park, Hyun-Chang
- Article
19
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3785, doi. 10.1007/s10854-015-4223-5
- Sarma, S.;
- Mothudi, B.;
- Dhlamini, M.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5226, doi. 10.1007/s10854-014-2292-5
- Vovk, R.;
- Vovk, N.;
- Khadzhai, G.;
- Dobrovolskiy, O.;
- Nazyrov, Z.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 10, p. 4306, doi. 10.1007/s10854-014-2165-y
- Sun, Bai;
- Zhao, Wenxi;
- Liu, Yonghong;
- Chen, Peng
- Article
22
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1341, doi. 10.1007/s10854-014-1732-6
- Zhou, Guoyun;
- Chen, Chia-Yun;
- Lin, Ziyin;
- Li, Liyi;
- Tao, Zhihua;
- He, Wei;
- Wong, Ching
- Article
23
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 1823, doi. 10.1007/s10854-012-1019-8
- da Silva, Marcelo;
- Scalvi, Luis;
- Dall'Antonia, Luiz;
- dos Santos, Dayse
- Article
24
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 2091, doi. 10.1007/s10854-013-1063-z
- Rubinger, C.;
- Junqueira, V.;
- Ribeiro, G.;
- Rubinger, R.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 1941, doi. 10.1007/s10854-012-1038-5
- Guo, Dongyun;
- Ito, Akihiko;
- Goto, Takashi;
- Tu, Rong;
- Wang, Chuanbin;
- Shen, Qiang;
- Zhang, Lianmeng
- Article
26
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 4, p. 1389, doi. 10.1007/s10854-012-0943-y
- Thanh, T.;
- Phong, P.;
- Manh, D.;
- Khien, N.;
- Hong, L.;
- Phan, T.;
- Yu, S.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 3, p. 875, doi. 10.1007/s10854-012-0842-2
- Thongbai, Prasit;
- Vangchangyia, Somsack;
- Swatsitang, Ekaphan;
- Amornkitbamrung, Vittaya;
- Yamwong, Teerapon;
- Maensiri, Santi
- Article
28
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 4, p. 1141, doi. 10.1007/s10854-012-0896-1
- Yadav, Rashmi;
- Shelke, Vilas
- Article
29
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 12, p. 1737, doi. 10.1007/s10854-011-0354-5
- Zhou, Xing;
- Zhao, Guizhe;
- Niu, Huijun;
- Liu, Yaqing
- Article
30
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 9, p. 1400, doi. 10.1007/s10854-011-0320-2
- Seghier, D.;
- Gislason, H. P.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 9, p. 1415, doi. 10.1007/s10854-011-0323-z
- Vishwas, M.;
- Narasimha Rao, K.;
- Phani, A. R.;
- Arjuna Gowda, K. V.;
- Chakradhar, R. P. S.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 735, doi. 10.1007/s10854-010-0202-z
- Li-Ngee Ho;
- Teng Wu;
- Nishikawa, Hiroshi;
- Takemoto, Tadashi;
- Miyake, Koichi;
- Fujita, Masakazu;
- Ota, Koyu
- Article
33
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 3, p. 292, doi. 10.1007/s10854-010-0131-x
- Ning Zhang;
- Yaowu Shi;
- Fu Guo;
- Yongping Lei;
- Zhidong Xia;
- Zhenhua Chen;
- Li Tian
- Article
34
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 1, p. 20, doi. 10.1007/s10854-010-0076-0
- Vovk, R. V.;
- Zavgorodniy, A. A.;
- Obolenskii, M. A.;
- Goulatis, I. L.;
- Chroneos, A.;
- Simoes, V. M. Pinto
- Article
35
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 1, p. 33, doi. 10.1007/s10854-009-9865-8
- Hua Wang;
- Jiwen Xu;
- Mingfang Ren;
- Ling Yang
- Article
36
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 1, p. 53, doi. 10.1007/s10854-009-9868-5
- Yamanaka, Kimihiro;
- Ooyoshi, Takafumi;
- Nejime, Takayuki
- Article
37
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1100, doi. 10.1007/s10854-007-9475-2
- Prasanth, N. P.;
- Varghese, Justin M.;
- Prasad, K.;
- Krishnan, Bindu;
- Seema, A.;
- Dayas, K. R.
- Article
38
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 793, doi. 10.1007/s10854-007-9417-z
- Lebedev, Alexander Alexandrovich;
- Abramov, P. L.;
- Agrinskaya, N. V.;
- Kozub, V. I.;
- Kuznetsov, A. N.;
- Lebedev, S. P.;
- Oganesyan, G. A.;
- Sorokin, L. M.;
- Chernyaev, A. V.;
- Shamshur, D. V.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 883, doi. 10.1007/s10854-006-9108-1
- Ying Luo;
- Xinyu Liu;
- Xvqiong Li;
- Jun Cheng
- Article
40
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 4, p. 385, doi. 10.1007/s10854-006-9040-4
- Article
41
- Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1347, doi. 10.1023/A:1025787328084
- Article
42
- Journal of Materials Science Letters, 2003, v. 22, n. 7, p. 527, doi. 10.1023/A:1022990420545
- Article
43
- Cellulose, 2021, v. 28, n. 9, p. 5881, doi. 10.1007/s10570-021-03882-y
- Wang, Li;
- He, Duoduo;
- Li, Junrong;
- He, Beihai;
- Qian, Liying
- Article
44
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 4, p. 759, doi. 10.1007/s10008-010-1143-4
- Guoping Wang;
- Hong Li;
- Qingtang Zhang;
- Zuolong Yu;
- Meizheng Qu
- Article
45
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 3, p. 479, doi. 10.1007/s10008-010-1104-y
- Article
46
- Journal of Solid State Electrochemistry, 2010, v. 14, n. 2, p. 225, doi. 10.1007/s10008-009-0836-z
- Article
47
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 5, p. 733, doi. 10.1007/s10008-008-0603-6
- Article
48
- Eco-Industry Science & Phosphorus Fluorine Engineering, 2025, v. 40, n. 4, p. 100
- Article
49
- Strength of Materials, 2011, v. 43, n. 1, p. 73, doi. 10.1007/s11223-011-9269-x
- Shvets', V.;
- Muzyka, M.;
- Makovets'kyi, I.;
- Bulakh, P.
- Article
50
- Strength of Materials, 2006, v. 38, n. 1, p. 84, doi. 10.1007/s11223-006-0019-4
- Stepanov, G.;
- Babutskii, A.;
- Mameev, I.;
- Olisov, A.
- Article