Works matching DE "ELECTRIC properties of single crystals"
1
- Advanced Functional Materials, 2016, v. 26, n. 33, p. 6084, doi. 10.1002/adfm.201601346
- Gong, Fan;
- Luo, Wenjin;
- Wang, Jianlu;
- Wang, Peng;
- Fang, Hehai;
- Zheng, Dingshan;
- Guo, Nan;
- Wang, Jingli;
- Luo, Man;
- Ho, Johnny C.;
- Chen, Xiaoshuang;
- Lu, Wei;
- Liao, Lei;
- Hu, Weida
- Article
2
- Journal of Materials Science, 2014, v. 49, n. 10, p. 3598, doi. 10.1007/s10853-013-7858-8
- Arunkumar, A.;
- Ramasamy, P.;
- Vishnu, K.;
- Jayaraj, M.
- Article
3
- Journal of Materials Science, 2013, v. 48, n. 15, p. 5157, doi. 10.1007/s10853-013-7301-1
- Reshak, A.;
- Kamarudin, H.;
- Kityk, I.;
- Auluck, S.
- Article
4
- Journal of Materials Science, 2013, v. 48, n. 7, p. 2823, doi. 10.1007/s10853-012-6880-6
- Moser, D.;
- Garnier, M.;
- Karvonen, L.;
- Shkabko, A.;
- Aebi, P.;
- Weidenkaff, A.
- Article
5
- Crystals (2073-4352), 2015, v. 5, n. 2, p. 172, doi. 10.3390/cryst5020172
- Xiaobing Li;
- Chao Chen;
- Hao Deng;
- Haiwu Zhang;
- Di Lin;
- Xiangyong Zhao;
- Haosu Luo
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2662, doi. 10.1007/s11664-016-4865-y
- Deng, Shuping;
- Liu, Hongxia;
- Li, Decong;
- Wang, Jinsong;
- Cheng, Feng;
- Shen, Lanxian;
- Deng, Shukang
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2867, doi. 10.1007/s11664-016-5014-3
- Liu, Hong-xia;
- Deng, Shu-ping;
- Shen, Lan-xian;
- Wang, Jin-song;
- Cheng, Feng;
- Deng, Shu-kang
- Article
8
- Journal of Electronic Materials, 2016, v. 45, n. 11, p. 5904, doi. 10.1007/s11664-016-4798-5
- Article
9
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3795, doi. 10.1007/s11664-015-3850-1
- Tian, Xiao;
- Yang, Xin;
- Wang, Peng
- Article
10
- Journal of Electronic Materials, 2013, v. 42, n. 7, p. 2356, doi. 10.1007/s11664-012-2455-1
- Landschreiber, Bernadette;
- Güneş, Ekrem;
- Homm, Gert;
- Will, Christian;
- Tomeš, Petr;
- Rohner, Christian;
- Sesselmann, Andreas;
- Klar, Peter;
- Paschen, Silke;
- Müller, Eckhard;
- Schlecht, Sabine
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2317, doi. 10.1007/s11664-012-2143-1
- Drasar, C.;
- Ruleova, P.;
- Benes, L.;
- Lostak, P.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 18905, doi. 10.1007/s10854-018-9888-0
- Mahendra, K.;
- Nayak, Kavya K.;
- Fernandes, Brian Jeevan;
- Udayashankar, N. K.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 16004, doi. 10.1007/s10854-018-9686-8
- He, Aiguo;
- Xi, Zengzhe;
- Li, Xiaojuan;
- Long, Wei;
- Zhang, Tingting;
- Fang, Pinyang;
- Zhang, Jin
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 10893, doi. 10.1007/s10854-017-6868-8
- Article
15
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5089, doi. 10.1007/s10854-016-6222-6
- Priyadharshini, A.;
- Kalainathan, S.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12719, doi. 10.1007/s10854-016-5406-4
- Maharani, N.;
- Vetha Potheher, I.;
- Vimalan, M.;
- Cyrac Peter, A.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4223, doi. 10.1007/s10854-016-4286-y
- Xi, Zengzhe;
- Han, Amin;
- Fang, Pinyang;
- Long, Wei;
- Li, Xiaojuan;
- Bu, Qianqian
- Article
18
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3282, doi. 10.1007/s10854-015-2828-3
- Hu, Wanhui;
- Xi, Zengzhe;
- Fang, Pinyang;
- Long, Wei;
- Li, Xiaojuan;
- Bu, Qianqian
- Article
19
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5226, doi. 10.1007/s10854-014-2292-5
- Vovk, R.;
- Vovk, N.;
- Khadzhai, G.;
- Dobrovolskiy, O.;
- Nazyrov, Z.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 12, p. 2289, doi. 10.1007/s10854-012-0820-8
- Wang, H.;
- Cai, K.;
- Chen, S.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1255, doi. 10.1007/s10854-011-0582-8
- Vovk, R.;
- Obolenskii, M.;
- Nazyrov, Z.;
- Goulatis, I.;
- Chroneos, A.;
- Pinto Simoes, V.
- Article
22
- Crystallography Reports, 2017, v. 62, n. 3, p. 441, doi. 10.1134/S1063774517030130
- Lomako, I.;
- Mantytskaya, O.
- Article
23
- Crystallography Reports, 2016, v. 61, n. 3, p. 466, doi. 10.1134/S1063774516020255
- Article
24
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 7, p. 558, doi. 10.1002/pssr.201600143
- Wang, Huizhen;
- Deng, Dongmei;
- Zhang, Zeyu;
- Xu, Kai;
- Pan, Qunfeng;
- Lin, Xian;
- Yan, Long;
- Cao, Shixun;
- Cheng, Zhenxiang;
- Jin, Zuanming;
- Ma, Guohong
- Article
25
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 3, p. 279, doi. 10.1002/pssr.201308255
- Zhao, K. Y.;
- ZENg, H. R.;
- Zhang, X. W.;
- Xu, K. Q.;
- Yu, H. Z.;
- Li, G. R.;
- Luo, H. S.
- Article
26
- Journal of Superconductivity & Novel Magnetism, 2017, v. 30, n. 3, p. 763, doi. 10.1007/s10948-016-3644-6
- Giorgio, C.;
- Putilov, A.;
- Trainer, D.;
- Volkova, O.;
- Vasiliev, A.;
- Chareev, D.;
- Karapetrov, G.;
- Zasadzinski, J.;
- Iavarone, M.
- Article
27
- Journal of Superconductivity & Novel Magnetism, 2015, v. 28, n. 10, p. 2893, doi. 10.1007/s10948-015-3173-8
- Maheshwari, P.;
- Jha, Rajveer;
- Gahtori, Bhasker;
- Awana, V.
- Article
28
- Journal of Superconductivity & Novel Magnetism, 2015, v. 28, n. 2, p. 407, doi. 10.1007/s10948-014-2724-8
- Peña, J.;
- Freitas, O.;
- Pureur, P.
- Article
29
- Journal of Superconductivity & Novel Magnetism, 2013, v. 26, n. 5, p. 1669, doi. 10.1007/s10948-012-1860-2
- Leroux, Maxime;
- Rodière, Pierre;
- Opagiste, Christine
- Article
30
- Metallurgical & Materials Transactions. Part A, 2014, v. 45, n. 4, p. 1903, doi. 10.1007/s11661-013-2178-9
- Article
31
- JETP Letters, 2017, v. 105, n. 3, p. 189, doi. 10.1134/S0021364017030146
- Zalesskii, V.;
- Polushina, A.;
- Obozova, E.;
- Dmitriev, A.;
- Syrnikov, P.;
- Lushnikov, S.
- Article
32
- Semiconductors, 2018, v. 52, n. 3, p. 278, doi. 10.1134/S106378261803017X
- Morozova, N. K.;
- Miroshnikov, B. N.
- Article
33
- Semiconductors, 2015, v. 49, n. 10, p. 1276, doi. 10.1134/S106378261510005X
- Bodnar, I.;
- Trukhanov, S.;
- Barugu, T.
- Article
34
- Semiconductors, 2014, v. 48, n. 2, p. 139, doi. 10.1134/S1063782614020031
- Bagiyeva, G.;
- Abdinova, G.;
- Mustafayev, N.;
- Abdinov, D.
- Article
35
- Semiconductors, 2014, v. 48, n. 2, p. 204, doi. 10.1134/S1063782614020201
- Niftiev, N.;
- Tagiev, O.;
- Muradov, M.;
- Mamedov, F.
- Article
36
- Semiconductors, 2012, v. 46, n. 6, p. 730, doi. 10.1134/S1063782612060024
- Abdinov, A.;
- Babaeva, R.;
- Rzayev, R.
- Article
37
- Semiconductors, 2012, v. 46, n. 6, p. 701, doi. 10.1134/S1063782612060231
- Tagiev, B.;
- Tagiev, O.;
- Asadullayeva, S.;
- Eyyubov, Q.
- Article
38
- Semiconductors, 2012, v. 46, n. 4, p. 430, doi. 10.1134/S1063782612040082
- Article
39
- Journal of Thermal Analysis & Calorimetry, 2015, v. 119, n. 1, p. 785, doi. 10.1007/s10973-014-4146-z
- Anitha, B.;
- Rathakrishnan, S.;
- Malliga, P.;
- Joseph Arul Pragasam, A.
- Article
40
- 2015
- Anitha, B.;
- Rathakrishnan, S.;
- Malliga, P.;
- Joseph Arul Pragasam, A.
- Erratum
41
- PIERS Proceedings, 2014, p. 2035
- Bing Mei;
- Huai-Wu Zhang;
- Qing-Hui Yang;
- Shu-Chen Jin;
- Xiao-Jie Tian;
- Ying-Heng Rao
- Article
42
- International Journal of Optics, 2012, p. 1, doi. 10.1155/2012/826763
- Kanagathara, N.;
- Anbalagan, G.
- Article
43
- Integrated Ferroelectrics, 2015, v. 165, n. 1, p. 1, doi. 10.1080/10584587.2015.1062337
- Charoen-In, Urit;
- Ritjareonwattu, Supachai;
- Pairwatthanaphaisan, Pisit;
- Manyum, Prapun
- Article
44
- Integrated Ferroelectrics, 2013, v. 140, n. 1, p. 155, doi. 10.1080/10584587.2012.741898
- Yue, Zengji;
- Wang, Xiaolin;
- Dou, Shixue
- Article
45
- Acta Physica Polonica: A, 2014, v. 126, n. 1, p. 310, doi. 10.12693/APhysPolA.126.310
- FIKÁČEK, J.;
- PRCHAL, J.;
- SECHOVSKÝ, V.
- Article
46
- Acta Physica Polonica: A, 2013, v. 124, n. 5, p. 830, doi. 10.12693/APhysPolA.124.830
- TORO«, B.;
- NOWAK, M.;
- GRABOWSKI, A.;
- KĘPI«S, M.
- Article
47
- 2012
- Wieteska, K.;
- Wierzchowski, W.;
- Malinowska, A.;
- Turczyński, S.;
- Lefeld-Sosnowska, M.;
- Pawlak, D. A.;
- Łukasiewicz, T.;
- Paulmann, C.
- Proceeding
48
- 2012
- Bezusyy, V. L.;
- Gawryluk, D. J.;
- Berkowski, M.;
- Cieplak, M. Z.
- Proceeding
49
- Archives of Metallurgy & Materials, 2015, v. 60, n. 2, p. 1051, doi. 10.1515/amm-2015-0258
- Myronchuk, G.L.;
- Zamurueva, O.V.;
- Oźga, K.;
- Szota, M.;
- El-Naggar, A.M.;
- Alzayed, N.S.;
- Piskach, L.V.;
- Parasyuk, O.V.;
- Albassam, A.A.;
- Fedorchuk, A.O.;
- Kityk, I.V.
- Article
50
- 2016
- Han, Zhiyue;
- Zhang, Yinghao;
- Yao, Qian;
- Du, Zhiming;
- He, Chunlin;
- Zhang, Jingchang
- Other