Works matching DE "ELECTRIC properties of metallic films"
1
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5403, doi. 10.1007/s10854-016-4441-5
- Huang, Lu;
- Qu, Xingling;
- Yang, Weiguang;
- Li, Dongmei;
- Jin, Jing;
- Wang, Linjun;
- Ding, Weizhong;
- Shi, Weimin
- Article
2
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 3, p. 1784, doi. 10.1007/s10854-014-2610-y
- Zhang, Tian-Fu;
- Tang, Xin-Gui;
- Liu, Qiu-Xiang;
- Jiang, Yan-Ping;
- Xiong, De-Ping;
- Feng, Zu-Yong;
- Cheng, Tie-Dong
- Article
3
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 3, p. 1908, doi. 10.1007/s10854-014-2628-1
- Ghediya, Prashant;
- Chaudhuri, Tapas
- Article
4
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 217, doi. 10.1007/s10854-014-2386-0
- Cao, Gang;
- Wu, Shihua;
- Shi, Feng
- Article
5
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 250, doi. 10.1007/s10854-014-2392-2
- Li, Tse-Chang;
- Lin, Jen-Fin
- Article
6
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 288, doi. 10.1007/s10854-014-2397-x
- Li, Lingxia;
- Xu, Dan;
- Zhang, Ning;
- Yu, Shihui;
- Dong, Helei;
- Jin, Yuxin
- Article
7
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 369, doi. 10.1007/s10854-014-2409-x
- Wang, Hongguang;
- Xiong, Xinqian;
- Xu, Jinbao;
- Wang, Lei;
- Bian, Liang;
- Ren, Wei;
- Chang, Aimin
- Article
8
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 1112, doi. 10.1007/s10854-013-1696-y
- Lu, Ting;
- Zhu, Kongjun;
- Liu, Jinsong;
- Wang, Jing;
- Qiu, Jinhao
- Article
9
- Modern Physics Letters B, 2013, v. 27, n. 21, p. 1350152-1, doi. 10.1142/S0217984913501522
- MOUSAVI, M.;
- KOMPANY, A.;
- SHAHTAHMASEBI, N.;
- BAGHERI-MOHAGHEGHI, M.-M.
- Article
10
- Materials Science (0137-1339), 2005, v. 23, n. 1, p. 91
- Kościelska, Barbara;
- Murawski, Leon;
- Wicikowski, Leszek
- Article
11
- Optical & Quantum Electronics, 2019, v. 51, n. 1, p. 1, doi. 10.1007/s11082-018-1698-3
- Chang, Chia-Wei;
- Hon, Min-Hsiung;
- Leu, Ing-Chi
- Article
12
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 4, p. 471, doi. 10.1007/s003390100787
- Shim, K.-H.;
- Paek, M.C.;
- Lee, B.T.;
- Kim, C.;
- Kang, J.Y.
- Article
13
- International Journal of Microwave Science & Technology, 2011, v. 2011, p. 1, doi. 10.1155/2011/468074
- Delprat, Sébastien L.;
- JaeHo Oh;
- Feng Xu;
- Lin Li;
- Djoumessi, Erick E.;
- Ismail, Marwa;
- Chaker, Mohamed;
- Ke Wu
- Article
14
- Semiconductors, 2011, v. 45, n. 13, p. 1694, doi. 10.1134/S1063782611130203
- Usanov, D.;
- Skripal', Al.;
- Skripal', An.;
- Abramov, A.;
- Bogolyubov, A.;
- Bakouei, Ali
- Article
15
- Semiconductors, 2001, v. 35, n. 11, p. 1252, doi. 10.1134/1.1418066
- Article
16
- Journal of Electronic Materials, 2016, v. 45, n. 3, p. 1377, doi. 10.1007/s11664-015-4039-3
- Fujimoto, Yuta;
- Uenuma, Mutsunori;
- Ishikawa, Yasuaki;
- Uraoka, Yukiharu
- Article
17
- Technical Physics, 2017, v. 62, n. 12, p. 1766, doi. 10.1134/S1063784217120143
- Kuznetsova, I. A.;
- Savenko, O. V.;
- Yushkanov, A. A.
- Article
18
- Applied Physics A: Materials Science & Processing, 2015, v. 120, n. 4, p. 1635, doi. 10.1007/s00339-015-9375-x
- Wang, Jinzhao;
- Ni, Dongfang;
- Zhang, Tianjin;
- Wang, Duofa;
- Liang, Kun
- Article
19
- Applied Physics A: Materials Science & Processing, 2012, v. 108, n. 3, p. 693, doi. 10.1007/s00339-012-6952-0
- Article
20
- Applied Physics A: Materials Science & Processing, 2012, v. 108, n. 1, p. 229, doi. 10.1007/s00339-012-6881-y
- Huang, X.;
- Lai, P.;
- Sin, Johnny
- Article
21
- Applied Physics A: Materials Science & Processing, 2012, v. 107, n. 2, p. 293, doi. 10.1007/s00339-012-6851-4
- Gallach, D.;
- Torres-Costa, V.;
- García-Pelayo, L.;
- Climent-Font, A.;
- Martín-Palma, R.;
- Barreiros-das-Santos, M.;
- Sporer, C.;
- Samitier, J.;
- Manso, M.
- Article
22
- Applied Physics A: Materials Science & Processing, 2012, v. 107, n. 2, p. 393, doi. 10.1007/s00339-012-6785-x
- Joshi, B.;
- Ghosh, S.;
- Srivastava, P.;
- Kumar, P.;
- Kanjilal, D.
- Article
23
- Applied Physics A: Materials Science & Processing, 2012, v. 107, n. 2, p. 469, doi. 10.1007/s00339-012-6764-2
- Giuffrida, L.;
- Torrisi, L.;
- Rosinski, M.;
- Caridi, F.;
- Cutroneo, M.
- Article
24
- Applied Physics A: Materials Science & Processing, 2011, v. 102, n. 4, p. 827, doi. 10.1007/s00339-011-6266-7
- Lee, Min;
- Kim, Kyung;
- Song, Seul;
- Rha, Sang;
- Seok, Jun;
- Jung, Ji;
- Kim, Gun;
- Yoon, Jung;
- Hwang, Cheol
- Article
25
- Journal of Radioanalytical & Nuclear Chemistry, 2012, v. 292, n. 3, p. 973, doi. 10.1007/s10967-012-1670-9
- Kuruc, Jozef;
- Strišovská, Jana;
- Galanda, Dušan;
- Dulanská, Silvia;
- Mátel, Ľubomír;
- Jerigová, Monika;
- Velič, Dušan
- Article
26
- Journal of Ovonic Research, 2013, v. 9, n. 3, p. 81
- KRISHNAMOORTHI, S. R.;
- VENKATESH, K. S.;
- ILANGOVAN, RAJANGAM
- Article
27
- Journal of Ovonic Research, 2013, v. 9, n. 3, p. 73
- NHO, P. V.;
- THUAN, D. D.;
- NGAN, P. H.
- Article
28
- Bulletin of Materials Science, 2012, v. 35, n. 4, p. 505, doi. 10.1007/s12034-012-0344-0
- SUBRAMANIAN, B;
- PRABAKARAN, K;
- JAYACHANDRAN, M
- Article
29
- Physics & Chemistry of Liquids, 2012, v. 50, n. 5/6, p. 661, doi. 10.1080/00319104.2012.663496
- Tsierkezos, NikosG.;
- Ritter, Uwe
- Article
30
- Journal of Nanoparticle Research, 2012, v. 14, n. 2, p. 1, doi. 10.1007/s11051-011-0672-9
- Mougenot, M.;
- Andreazza, P.;
- Andreazza-Vignolle, C.;
- Escalier, R.;
- Sauvage, Th.;
- Lyon, O.;
- Brault, P.
- Article
31
- Russian Physics Journal, 2018, v. 60, n. 10, p. 1674, doi. 10.1007/s11182-018-1267-z
- Titkov, A.;
- Gadirov, R.;
- Nikonov, S.;
- Odod, A.;
- Solodova, T.;
- Kurtсevich, A.;
- Kopylova, T.;
- Yukhin, Yu.;
- Lyakhov, N.
- Article
32
- Journal of Materials Science, 1999, v. 34, n. 20, p. 5055, doi. 10.1023/A:1004748714098
- Jinhui Cho;
- Rakhwan Kim;
- Kyoung-Woo Lee;
- Choongyong Son;
- Geun-Young Yeom;
- Hee Jae Kim;
- Jung-Yeul Kim;
- Jong-Wan Park
- Article
33
- Crystal Research & Technology, 2009, v. 44, n. 10, p. 1115
- B. Freitag;
- D. Gerthsen;
- K. S. Ilin;
- M. Siegel
- Article
34
- Crystal Research & Technology, 2009, v. 44, n. 9, p. 989, doi. 10.1002/crat.200900073
- Article
35
- Journal of Applied Electrochemistry, 2016, v. 46, n. 7, p. 769, doi. 10.1007/s10800-016-0967-8
- Hreid, Tubshin;
- O'Mullane, Anthony;
- Spratt, Henry;
- Will, Geoffrey;
- Wang, Hongxia
- Article
36
- Chemical Engineering Communications, 2012, v. 199, n. 8, p. 1063, doi. 10.1080/00986445.2011.647137
- Jeon, HyoSang;
- Kim, Jaehoon;
- Kim, Honggon;
- Lee, SangDeuk;
- Min, ByoungKoun
- Article
37
- JETP Letters, 1997, v. 66, n. 3, p. 175, doi. 10.1134/1.567498
- Article
38
- International Journal of Photoenergy, 2011, p. 1, doi. 10.1155/2011/314702
- Irfan;
- So, Franky;
- Yongli Gao
- Article
39
- Materials Technology, 2015, v. 30, n. A1, p. A24, doi. 10.1179/1753555714Y.0000000242
- Xu, D.;
- He, K.;
- Yu, R. H.;
- Tong, Y.;
- Qi, J. P.;
- Sun, X. J.;
- Yang, Y. T.;
- Xu, H. X.;
- Yuan, H. M.;
- Ma, J.
- Article
40
- Journal of Experimental & Theoretical Physics, 2007, v. 104, n. 2, p. 254, doi. 10.1134/S1063776107020100
- Article
41
- Journal of Materials Science, 2015, v. 50, n. 5, p. 2122, doi. 10.1007/s10853-014-8774-2
- Gomes, Tiago;
- Oliveira, Rafael;
- Lopes, Élder;
- Santos Klem, Maykel;
- Silva Agostini, Deuber;
- Constantino, Carlos;
- Alves, Neri
- Article
42
- Journal of Materials Science, 2013, v. 48, n. 10, p. 3789, doi. 10.1007/s10853-013-7179-y
- Zhu, Yuankun;
- Mendelsberg, Rueben;
- Zhu, Jiaqi;
- Han, Jiecai;
- Anders, André
- Article
43
- Journal of Materials Science, 2013, v. 48, n. 10, p. 3760, doi. 10.1007/s10853-013-7175-2
- Jung, Youngsoo;
- Stevens, Erica;
- Ding, Bo;
- Kim, Sun-Dong;
- Woo, Sang-Kuk;
- Lee, Jung-Kun
- Article
44
- Journal of Materials Science, 2013, v. 48, n. 3, p. 1225, doi. 10.1007/s10853-012-6863-7
- Chen, Yu-Yun;
- Hsu, Jin-Cherng;
- Lee, Chun-Yi;
- Wang, Paul
- Article
45
- JETP Letters, 2006, v. 84, n. 6, p. 329, doi. 10.1134/S0021364006180111
- Gorbunov, A. V.;
- Timofeev, V. B.
- Article
46
- Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 1, p. 1, doi. 10.1002/pssa.201700396
- Wu, Zhipeng;
- Zhu, Jun;
- Zhou, Yunxia;
- Liu, Xingpeng
- Article
47
- Nature Chemistry, 2012, v. 4, n. 6, p. 485, doi. 10.1038/nchem.1332
- Faramarzi, Vina;
- Niess, Frédéric;
- Moulin, Emilie;
- Maaloum, Mounir;
- Dayen, Jean-François;
- Beaufrand, Jean-Baptiste;
- Zanettini, Silvia;
- Doudin, Bernard;
- Giuseppone, Nicolas
- Article
48
- Journal of Low Temperature Physics, 2012, v. 167, n. 5/6, p. 898, doi. 10.1007/s10909-012-0499-5
- Probst, P.;
- Scheuring, A.;
- Hofherr, M.;
- Wünsch, S.;
- Il'in, K.;
- Semenov, A.;
- Hübers, H.-W.;
- Judin, V.;
- Müller, A.-S.;
- Hänisch, J.;
- Holzapfel, B.;
- Siegel, M.
- Article
49
- Plasmonics, 2018, v. 13, n. 5, p. 1631, doi. 10.1007/s11468-017-0672-4
- Article
50
- Plasmonics, 2014, v. 9, n. 4, p. 781, doi. 10.1007/s11468-013-9660-5
- Bauch, Martin;
- Toma, Koji;
- Toma, Mana;
- Zhang, Qingwen;
- Dostalek, Jakub
- Article