Works matching DE "ELECTRIC network analyzers"
1
- Measurement Techniques, 2016, v. 59, n. 7, p. 765, doi. 10.1007/s11018-016-1044-8
- Savin, A.;
- Guba, V.;
- Bykova, O.
- Article
2
- Eastern-European Journal of Enterprise Technologies, 2013, v. 4, n. 9, p. 8
- Article
3
- Journal of Engineering (2314-4912), 2016, p. 1, doi. 10.1155/2016/2863508
- Khanna, Puneet;
- Sharma, Amar;
- Shinghal, Kshitij;
- Kumar, Arun
- Article
5
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 10
- Article
6
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 6
- Article
9
- EE: Evaluation Engineering, 2017, v. 56, n. 8, p. 24
- Article
14
- EE: Evaluation Engineering, 2014, v. 53, n. 6, p. 32
- Article
15
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 24
- Article
16
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 8
- Article
17
- EE: Evaluation Engineering, 2011, v. 50, n. 1, p. 8
- Article
19
- EE: Evaluation Engineering, 2009, v. 48, n. 4, p. 18
- Article
21
- EE: Evaluation Engineering, 2006, v. 45, n. 11, p. 12
- Article
22
- EE: Evaluation Engineering, 2006, v. 45, n. 10, p. 20
- Article
23
- Electronics & Electrical Engineering, 2013, v. 19, n. 6, p. 13, doi. 10.5755/j01.eee.19.6.4554
- Liu Yujun;
- Xu Qingshan;
- Chen Kai;
- Xu Xiaohui
- Article
24
- Electronics & Electrical Engineering, 2008, n. 82, p. 69
- Kácsor, G.;
- Špánik, P.;
- Dudrík, J.;
- Luft, M.;
- Szychta, E.
- Article
25
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 369, doi. 10.1007/s11664-013-2867-6
- Yang, Jie;
- Jiao, Xiangquan;
- Zhang, Rui;
- Zhong, Hui;
- Shi, Yu;
- Du, Bo
- Article
26
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1168, doi. 10.1007/s10854-016-5642-7
- Zhao, Shuang;
- Zheng, Ji;
- Shi, Biao;
- He, Lihua;
- Liu, Zhongyi
- Article
27
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12701, doi. 10.1007/s10854-016-5404-6
- Ozturk, Turgut;
- Uluer, İhsan;
- Ünal, İlhami
- Article
28
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4963, doi. 10.1007/s10854-015-3008-1
- Wang, Yang;
- Zuo, Ruzhong;
- Zhang, Jian;
- Qi, Shishun;
- Zhang, Tianwen
- Article
29
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 1127, doi. 10.1007/s10854-013-1699-8
- Unnimaya, A.;
- Suresh, E.;
- Dhanya, J.;
- Ratheesh, R.
- Article
30
- Microwave & Optical Technology Letters, 2010, v. 52, n. 2, p. 487, doi. 10.1002/mop.24919
- Article
31
- Microwave & Optical Technology Letters, 2009, v. 51, n. 10, p. 2464, doi. 10.1002/mop.24624
- Article
32
- Microwave & Optical Technology Letters, 2008, v. 50, n. 2, p. 287, doi. 10.1002/mop.23083
- Sokoll, Thorsten;
- Jacob, Arne F.
- Article
33
- Microwave & Optical Technology Letters, 2008, v. 50, n. 2, p. 422, doi. 10.1002/mop.23115
- Menon, Rajesh;
- Thomas, Rinku M.;
- John, Honey;
- Joseph, Rani;
- Mathew, K. T.
- Article
34
- Microwave & Optical Technology Letters, 2008, v. 50, n. 2, p. 445, doi. 10.1002/mop.23123
- Article
35
- Microwave & Optical Technology Letters, 2007, v. 49, n. 8, p. 1964, doi. 10.1002/mop.22611
- Terhzaz, Jaouad;
- Ammor, Hassan;
- Assir, Abdelhadi;
- Mamouni, Ahmed
- Article
36
- Microwave & Optical Technology Letters, 2005, v. 46, n. 5, p. 473, doi. 10.1002/mop.21021
- Radkovskaya, A.;
- Shamonin, M.;
- Stevens, C. J.;
- Faulkner, G.;
- Edwards, D. J.;
- Shamonina, E.;
- Solymar, L.
- Article
37
- Microwave & Optical Technology Letters, 2005, v. 45, n. 5, p. 438, doi. 10.1002/mop.20847
- Ning Hua Zhu;
- Chao Liu;
- Pun, Edwin Y. B.;
- Po-Sheun Chung
- Article
38
- Microwave & Optical Technology Letters, 2004, v. 40, n. 6, p. 444, doi. 10.1002/mop.20001
- Chahine, S. Abou;
- Huyart, B.
- Article
39
- Microwave & Optical Technology Letters, 2000, v. 24, n. 1, p. 63, doi. 10.1002/(SICI)1098-2760(20000105)24:1<63::AID-MOP18>3.0.CO;2-2
- Boulejfen, N.;
- Kouki, A. B.;
- Ghannouchi, F. M.
- Article
40
- Microwave & Optical Technology Letters, 1995, v. 9, n. 5, p. 266, doi. 10.1002/mop.4650090512
- Yeo, S. P.;
- Cheng, M.;
- Bannister, D. J.;
- Ide, J. P.
- Article
41
- Microwave & Optical Technology Letters, 1995, v. 8, n. 2, p. 84, doi. 10.1002/mop.4650080209
- Abou Chahine, S.;
- Huyart, B.;
- Bergeault, E.;
- Jallet, L.
- Article
42
- Turkish Journal of Electrical Engineering & Computer Sciences, 2017, v. 25, n. 5, p. 3868, doi. 10.3906/elk-1607-190
- PADAVALA, Akhendra Kumar;
- NISTALA, Bheema Rao
- Article
43
- Journal of Digital Forensics, Security & Law, 2015, v. 10, n. 4, p. 59
- Article
44
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 4, p. -1, doi. 10.1142/S0218126617500682
- Khinda, Jaspal Singh;
- Tripathy, Malay Ranjan;
- Gambhir, Deepak
- Article
45
- International Review of Electrical Engineering, 2012, v. 7, n. 6, p. 6197
- Nejad, Reza Roofegari;
- Tafreshi, Seyed Masoud Moghaddas
- Article
46
- Revista de Ingeniería, 2009, n. 30, p. 49, doi. 10.16924/revinge.30.6
- Zapata, Carlos J.;
- Ríos, Mario;
- Gómez, Oscar
- Article
47
- Electric Power Components & Systems, 2006, v. 34, n. 2, p. 191, doi. 10.1080/15325000500244708
- SELVAN, M. P.;
- SWARUP, K. S.
- Article
48
- Journal of Communications Technology & Electronics, 2016, v. 61, n. 2, p. 138, doi. 10.1134/S1064226916020054
- Yadav, R.;
- Kishor, J.;
- Yadava, R.
- Article
49
- Concurrency & Computation: Practice & Experience, 2006, v. 18, n. 15, p. 1975, doi. 10.1002/cpe.1040
- Feng, Xizhou;
- Ge, Rong;
- Cameron, Kirk W.
- Article
50
- Journal of Electromagnetic Waves & Applications, 2016, v. 30, n. 5, p. 589, doi. 10.1080/09205071.2016.1138898
- Puthukodan, Sujitha;
- Dadrasnia, Ehsan;
- Thalakkatukalathil, Vinod V. K.;
- Rivera, Horacio Lamela;
- Ducournau, Guillaume;
- Lampin, Jean-Francois
- Article