Works matching DE "ELECTRIC field strength"
1
- Radiation Protection Dosimetry, 2025, v. 201, n. 8, p. 552, doi. 10.1093/rpd/ncaf017
- Article
2
- Journal of Chemical & Petroleum Engineering, 2021, v. 55, n. 1, p. 99, doi. 10.22059/jchpe.2020.255987.1229
- Bagheri, Hamidreza;
- Ghader, Sattar;
- Hosseinpour, Forough
- Article
3
- Przegląd Elektrotechniczny, 2025, v. 2025, n. 5, p. 140, doi. 10.15199/48.2025.05.32
- OLESZ, Marek;
- NOWAK, Mikołaj;
- LITZBARSKI, Leszek;
- SZWARCZEWSKI, Paweł
- Article
4
- Frontiers in Oncology, 2025, p. 1, doi. 10.3389/fonc.2025.1520504
- Liu, Kaida;
- Dai, Ping;
- Liu, Zirong;
- Fang, Haohan;
- Li, Xing;
- Gao, Wei
- Article
5
- Electronics (2079-9292), 2025, v. 14, n. 11, p. 2096, doi. 10.3390/electronics14112096
- Jovanović, Dejan;
- Krasić, Dragan;
- Cvetković, Nenad;
- Stanković, Vladimir;
- Živaljević, Dragana;
- Petković, Bojana
- Article
6
- Foods, 2025, v. 14, n. 11, p. 1891, doi. 10.3390/foods14111891
- Zhang, Ning;
- Shi, Zihang;
- Hu, Yangyang;
- Sun, Yangying;
- Zhou, Changyu;
- Xia, Qiang;
- He, Jun;
- Yan, Hongbing;
- Yu, Hui;
- Pan, Daodong
- Article
7
- Polymers (20734360), 2025, v. 17, n. 11, p. 1429, doi. 10.3390/polym17111429
- Du, Dongyuan;
- Hao, Yanpeng;
- He, Yunhua
- Article
8
- Energies (19961073), 2025, v. 18, n. 11, p. 2872, doi. 10.3390/en18112872
- Djeumen, Jules Simplice;
- Langa, Hendrick Musawenkosi;
- Sutherland, Trudy
- Article
9
- Journal of Southeast University / Dongnan Daxue Xuebao, 2025, v. 55, n. 3, p. 759, doi. 10.3969/j.issn.1001-0505.2025.03.016
- Article
10
- Atomic Energy Science & Technology, 2025, v. 59, n. 4, p. 920, doi. 10.7538/yzk.2024.youxian.0595
- Article
11
- Acta Prataculturae Sinica, 2025, v. 34, n. 7, p. 69, doi. 10.11686/cyxb2024307
- Article
12
- Foods, 2025, v. 14, n. 10, p. 1752, doi. 10.3390/foods14101752
- Zhang, Liye;
- Ding, Changjiang;
- Xiong, Huina;
- Tian, Tian;
- Zhu, Lifeng;
- Dou, Yufan
- Article
13
- Sensors (14248220), 2025, v. 25, n. 10, p. 3235, doi. 10.3390/s25103235
- Vatamanu, David;
- Miclaus, Simona
- Article
14
- Journal of Korean Institute of Electromagnetic Engineering & Science / Han-Guk Jeonjapa Hakoe Nonmunji, 2025, v. 36, n. 4, p. 321, doi. 10.5515/KJKIEES.2025.36.4.321
- Article
15
- Micromachines, 2025, v. 16, n. 5, p. 596, doi. 10.3390/mi16050596
- Huang, Zhiwei;
- Zhang, Tong;
- Feng, Jing;
- Wang, Yage
- Article
16
- Micromachines, 2025, v. 16, n. 5, p. 491, doi. 10.3390/mi16050491
- Liang, Liwen;
- Miao, Jiatong;
- Feng, Xiyuan;
- Zhong, Yunlei;
- Wang, Wei
- Article
17
- Materials (1996-1944), 2025, v. 18, n. 10, p. 2353, doi. 10.3390/ma18102353
- Guo, Jianzeng;
- Yin, Chao;
- Zhang, Xue;
- Chi, Qingguo
- Article
18
- Journal of Chinese Mass Spectrometry Society, 2025, v. 46, n. 3, p. 277, doi. 10.7538/zpxb.2024.0135
- 姜 雪;
- 杨黄丽;
- 刘晓燕;
- 肖 伟;
- 邱 萌;
- 程志刚;
- 周 振;
- 涂其冬;
- 高校飞
- Article
19
- Journal of Fluid Mechanics, 2025, v. 1011, p. 1, doi. 10.1017/jfm.2025.372
- Zhang, Tingting;
- Song, Fenhong;
- Li, Ben Q.;
- Xu, Feng;
- Yang, Qingzhen
- Article
20
- Coatings (2079-6412), 2025, v. 15, n. 5, p. 549, doi. 10.3390/coatings15050549
- Chen, Jiaqiang;
- Zhang, Junxi;
- Fan, Zhiyang;
- Yu, Ping
- Article
21
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4874, doi. 10.1007/s11664-024-11692-8
- Zheng, Weigang;
- Ma, Yiling;
- Geng, Lina;
- Zhang, Zhongrui;
- Tang, Hong;
- Fan, Qirui
- Article
22
- Angewandte Chemie, 2015, v. 127, n. 48, p. 14635, doi. 10.1002/anie.201507807
- Wang, Jiale;
- Alves, Tiago V.;
- Trindade, Fabiane J.;
- de Aquino, Caroline B.;
- Pieretti, Joana C.;
- Domingues, Sergio H.;
- Ando, Romulo A.;
- Ornellas, Fernando R.;
- Camargo, Pedro H. C.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 11, p. 10233, doi. 10.1007/s10854-019-01360-7
- Yu, Zifeng;
- Wei, Song;
- Guo, Jingdong
- Article
24
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1463, doi. 10.1007/s10854-015-3912-4
- Bahrami, Mohsen;
- Mohajerani, Ezeddin
- Article
25
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2726, doi. 10.1007/s10854-015-2749-1
- Zhang, Gui-Fang;
- Liu, Hanxing;
- Yao, Zhonghua;
- Cao, Minghe;
- Hao, Hua
- Article
26
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 5041, doi. 10.1007/s10854-014-2269-4
- Navidirad, Mahsa;
- Raissi, Babak;
- Riahifar, Reza;
- Yaghmaee, Maziar;
- Kazemzadeh, Asghar
- Article
27
- Journal of Solid State Electrochemistry, 2016, v. 20, n. 11, p. 3165, doi. 10.1007/s10008-016-3294-4
- Vesztergom, Soma;
- Barankai, Norbert;
- Kovács, Noémi;
- Ujvári, Mária;
- Siegenthaler, Hans;
- Broekmann, Peter;
- Láng, Győző
- Article
28
- Journal of Solid State Electrochemistry, 2014, v. 18, n. 5, p. 1485, doi. 10.1007/s10008-013-2334-6
- Ellerbrock, David;
- Macdonald, Digby
- Article
29
- Space Science Reviews, 2022, v. 218, n. 8, p. 1, doi. 10.1007/s11214-022-00934-y
- Breneman, A. W.;
- Wygant, J. R.;
- Tian, S.;
- Cattell, C. A.;
- Thaller, S. A.;
- Goetz, K.;
- Tyler, E.;
- Colpitts, C.;
- Dai, L.;
- Kersten, K.;
- Bonnell, J. W.;
- Bale, S. D.;
- Mozer, F. S.;
- Harvey, P. R.;
- Dalton, G.;
- Ergun, R. E.;
- Malaspina, D. M.;
- Kletzing, C. A.;
- Kurth, W. S.;
- Hospodarsky, G. B.
- Article
30
- Space Science Reviews, 2021, v. 217, n. 8, p. 1, doi. 10.1007/s11214-021-00859-y
- Pfaff, R.;
- Uribe, P.;
- Fourre, R.;
- Kujawski, J.;
- Maynard, N.;
- Acuña, M.;
- Rowland, D.;
- Freudenreich, H.;
- Bromund, K.;
- Martin, S.;
- Liebrecht, C.;
- Kramer, R.;
- Hunsaker, F.;
- Holzworth, R.;
- McCarthy, M.;
- Farrell, W.;
- Klenzing, J.;
- Le, G.;
- Jacobson, A.;
- Houser, J.
- Article
31
- Space Science Reviews, 2020, v. 216, n. 4, p. 1, doi. 10.1007/s11214-020-00692-9
- Kasaba, Yasumasa;
- Kojima, Hirotsugu;
- Moncuquet, Michel;
- Wahlund, Jan-Erik;
- Yagitani, Satoshi;
- Sahraoui, Fouad;
- Henri, Pierre;
- Karlsson, Tomas;
- Kasahara, Yoshiya;
- Kumamoto, Atsushi;
- Ishisaka, Keigo;
- Issautier, Karine;
- Wattieaux, Gaëtan;
- Imachi, Tomohiko;
- Matsuda, Shoya;
- Lichtenberger, Janos;
- Usui, Hideyuki
- Article
32
- Space Science Reviews, 2016, v. 199, n. 1-4, p. 515, doi. 10.1007/s11214-014-0049-3
- Torkar, K.;
- Nakamura, R.;
- Tajmar, M.;
- Scharlemann, C.;
- Jeszenszky, H.;
- Laky, G.;
- Fremuth, G.;
- Escoubet, C.;
- Svenes, K.
- Article
33
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 11, p. 653, doi. 10.1134/S1061830916110061
- Migachev, S.;
- Kurkin, M.;
- Smorodinskii, Ya.
- Article
34
- Measurement Techniques, 2019, v. 62, n. 1, p. 71, doi. 10.1007/s11018-019-01588-z
- Article
35
- Measurement Techniques, 2018, v. 60, n. 11, p. 1154, doi. 10.1007/s11018-018-1333-5
- Sakharov, K. Yu.;
- Mikheev, O. V.;
- Turkin, V. A.;
- Dobrotvorskii, M. I.;
- Sukhov, A. V.
- Article
36
- Measurement Techniques, 2017, v. 59, n. 11, p. 1175, doi. 10.1007/s11018-017-1111-9
- Kal'chikhin, V.;
- Kobzev, A.;
- Korol'kov, V.;
- Tikhomirov, A.
- Article
37
- Measurement Techniques, 2015, v. 58, n. 1, p. 109, doi. 10.1007/s11018-015-0671-9
- Kolotygin, S.;
- Neustroev, S.
- Article
38
- Measurement Techniques, 2015, v. 57, n. 10, p. 1213, doi. 10.1007/s11018-015-0605-6
- Article
39
- Measurement Techniques, 2015, v. 57, n. 10, p. 1179, doi. 10.1007/s11018-015-0599-0
- Dolmatov, T.;
- Bukin, V.;
- Sakharov, K.;
- Sukhov, A.;
- Garnov, S.;
- Terekhin, V.
- Article
40
- Measurement Techniques, 2014, v. 57, n. 2, p. 201, doi. 10.1007/s11018-014-0431-2
- Sakharov, K.;
- Turkin, V.;
- Mikheev, O.;
- Dobrotvorskii, M.;
- Sukhov, A.
- Article
41
- Fluid Dynamics, 2021, v. 56, n. 2, p. 178, doi. 10.1134/S001546282102004X
- Grigor'ev, A. I.;
- Shiryaeva, S. O.
- Article
42
- Micro & Nano Letters (Wiley-Blackwell), 2020, v. 15, n. 6, p. 374, doi. 10.1049/mnl.2019.0348
- Shinyong Shim;
- Jeong Hoan Park;
- Sung June Kim
- Article
43
- LPI Contribution, 2021, p. 1
- Collinson, G. A.;
- Fowler, C.;
- Ramstad, R.;
- Curry, S.;
- Chaffin, M.;
- Xu, S.;
- Boucher, S.;
- DiBraccio, G.;
- Dong, C.;
- Futaana, Y.;
- Fillingin, M.;
- Jarvinen, R.;
- Ledvina, S.;
- Luhmann, J.;
- O'Rourke, Joe;
- Russell, Chris;
- Persson, Moa;
- Way, Michael
- Article
44
- International Journal of Advances in Intelligent Informatics, 2018, v. 4, n. 2, p. 132, doi. 10.26555/ijain.v4i2.221
- Kausarian, Husnul;
- Josaphat Tetuko Sri Sumantyo;
- Putra, Dewandra Bagus Eka;
- Suryadi, Adi;
- Suryadi
- Article
45
- Advanced Electronic Materials, 2017, v. 3, n. 10, p. n/a, doi. 10.1002/aelm.201700245
- Song, Yan;
- Wang, Xiaocha;
- Mi, Wenbo
- Article
46
- Lighting Research & Technology, 2016, v. 48, n. 3, p. 384, doi. 10.1177/1477153515593579
- Duff, J.;
- Antonutto, G.;
- Torres, S.
- Article
47
- Building Services Engineering Research & Technology, 2014, v. 35, n. 2, p. 139, doi. 10.1177/0143624412474941
- Li, ZR;
- Ai, ZT;
- Wang, WJ;
- Xu, ZR;
- Gao, XZ;
- Wang, HS
- Article
48
- Instrumentation, Mesures, Métrologies, 2020, v. 19, n. 4, p. 263, doi. 10.18280/i2m.190403
- Arunachalam, Muthiah;
- Mondal, Chirapriya;
- Karmakar, Sougata
- Article
49
- Doklady Mathematics, 2014, v. 90, n. 2, p. 635, doi. 10.1134/S1064562414060271
- Kovalenko, A.;
- Khromykh, A.;
- Urtenov, M.
- Article
50
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 25, doi. 10.1002/j.2168-0159.2012.tb05699.x
- Wittek, Michael;
- Tanaka, Norihiko;
- Wilkes, David;
- Bremer, Matthias;
- Pauluth, Detlef;
- Canisius, Johannes;
- Yeh, Aska;
- Yan, Ray;
- Skjonnemand, Karl;
- Klasen-Memmer, Melanie
- Article