Works matching DE "ELECTRIC circuit analysis"
1
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 12, p. 735, doi. 10.1134/S106183091312005X
- Mel'kanovich, A.;
- Konovalov, S.
- Article
2
- Measurement Techniques, 2015, v. 57, n. 12, p. 1457, doi. 10.1007/s11018-015-0649-7
- Savin, A.;
- Guba, V.;
- Bykova, O.
- Article
3
- Measurement Techniques, 2013, v. 56, n. 6, p. 691, doi. 10.1007/s11018-013-0266-2
- Melent'ev, V.;
- Gubanov, N.;
- Latukhova, O.;
- Smolina, A.
- Article
4
- Measurement Techniques, 2013, v. 56, n. 3, p. 309, doi. 10.1007/s11018-013-0201-6
- Amelichev, V.;
- Tikhonov, R.;
- Cheremisinov, A.
- Article
5
- Measurement Techniques, 2009, v. 52, n. 11, p. 1135, doi. 10.1007/s11018-010-9408-y
- Mamonov, A. A.;
- Abrosimov, E. A.
- Article
6
- Journal of the National Academy of Forensic Engineers, 2009, v. 26, n. 1, p. 139
- Article
7
- Ferroelectrics, 2002, v. 278, n. 1, p. 203, doi. 10.1080/00150190214475
- Saishu, Tatsuo;
- Yamaguchi, Hajime;
- Hasegawa, Ray;
- Fukushima, Rieko;
- Takatoh, Kohki
- Article
8
- Sensors & Materials, 2017, v. 29, n. 12, p. 1689, doi. 10.18494/SAM.2017.1635
- Mariko Kuwabara;
- Hiroyuki Tashiro;
- Yasuo Terasawa;
- Yukari Nakano;
- Yurina Yoshimura;
- Koji Osawa;
- Toshihiko Noda;
- Takashi Tokuda;
- Jun Ohta
- Article
9
- Analytical Letters, 2018, v. 51, n. 9, p. 1384, doi. 10.1080/00032719.2017.1378228
- Man, Cheng;
- Dong, Chaofang;
- Cui, Zhongyu;
- Xiao, Kui;
- Yu, Qiang;
- Li, Xiaogang
- Article
10
- Mathematics for Applications, 2023, v. 12, n. 1, p. 115, doi. 10.13164/ma.2023.08
- SUNDRIYAL, NITIN;
- RAMIREZ, JUAN MANUEL;
- CORROCHANO, EDUARDO BAYRO
- Article
11
- Electronics (2079-9292), 2021, v. 10, n. 4, p. 475, doi. 10.3390/electronics10040475
- Piotrowska, Ewa;
- Rogowski, Krzysztof;
- Sierociuk, Dominik
- Article
12
- Eastern-European Journal of Enterprise Technologies, 2018, v. 91, n. 8, p. 4, doi. 10.15587/1729-4061.2018.121874
- Article
13
- i-Manager's Journal on Electronics Engineering, 2013, v. 3, n. 3, p. 20, doi. 10.26634/jele.3.3.2255
- Article
14
- Pravara Medical Review, 2012, v. 4, n. 1, p. 4
- Badwe, N.;
- Patil, K. B.;
- Yelam, S. B.;
- Vikhe, B. B.;
- Vatve, M. S.
- Article
15
- Bulletin of the Polish Academy of Sciences: Technical Sciences, 2018, v. 66, n. 4, p. 475, doi. 10.24425/124264
- Article
16
- Journal of Advanced Computational Intelligence & Intelligent Informatics, 2021, v. 25, n. 3, p. 291, doi. 10.20965/jaciii.2021.p0291
- Ran, Manjie;
- Liao, Xiaozhong;
- Lin, Da;
- Yang, Ruocen
- Article
17
- International Journal of High Speed Electronics & Systems, 2002, v. 12, n. 2, p. 563, doi. 10.1142/S0129156402001460
- Article
18
- Quality & Reliability Engineering International, 1989, v. 5, n. 4, p. 333
- Article
19
- Journal of Plasma Physics, 2007, v. 73, n. 4, p. 613, doi. 10.1017/S0022377806006179
- Article
20
- Computer Music Journal, 2009, v. 33, n. 2, p. 85, doi. 10.1162/comj.2009.33.2.85
- Pakarinen, Jyri;
- Yeh, David T.
- Article
21
- International Journal of Distributed Sensor Networks, 2019, v. 15, n. 9, p. N.PAG, doi. 10.1177/1550147719878094
- Vestenický, Peter;
- Vestenický, Martin
- Article
22
- EE: Evaluation Engineering, 2012, v. 51, n. 12, p. 18
- Article
23
- EE: Evaluation Engineering, 2009, v. 48, n. 1, p. 33
- Article
24
- Journal of Active & Passive Electronic Devices, 2009, v. 4, n. 3, p. 259
- Tangsrirat, Worapong;
- Surakampontorn, Wanlop
- Article
25
- Journal of Active & Passive Electronic Devices, 2009, v. 4, n. 1/2, p. 147
- Loan, Sajad A.;
- Ahmad, S. N.;
- Abbasi, M. Usaid;
- and Humyra shabir
- Article
26
- Journal of Active & Passive Electronic Devices, 2009, v. 4, n. 1/2, p. 91
- Galadi, A.;
- Morancho, F.;
- Hassani, M. M.
- Article
27
- Journal of Active & Passive Electronic Devices, 2009, v. 4, n. 1/2, p. 63
- Yellampalli, S.;
- Srivastava, A.
- Article
28
- Electronics & Electrical Engineering, 2017, v. 23, n. 5, p. 41, doi. 10.5755/j01.eie.23.5.19268
- Idzkowski, Adam;
- Walendziuk, Wojciech;
- Swietochowski, Pawel;
- Warsza, Zygmunt
- Article
29
- Electronics & Electrical Engineering, 2014, v. 20, n. 10, p. 40, doi. 10.5755/j01.eee.20.10.8877
- Pranevicius, H.;
- Naujokaitis, D.;
- Pilkauskas, V.;
- Pranevicius, O.;
- Pranevicius, M.
- Article
30
- Electronics & Electrical Engineering, 2013, v. 19, n. 9, p. 97, doi. 10.5755/j01.eee.19.9.2516
- Article
31
- Electronics & Electrical Engineering, 2013, v. 19, n. 6, p. 31, doi. 10.5755/j01.eee.19.6.1896
- Dahai You;
- Lei Ye;
- Xianggen Yin;
- Qiguo Yao;
- Ke Wang;
- Junchun Wu
- Article
32
- Electronics & Electrical Engineering, 2009, n. 90, p. 81
- Article
33
- International Journal of Emerging Technologies in Learning, 2008, v. 3, n. 3, p. 27
- Article
34
- International Journal of Computers, Communications & Control, 2008, v. 3, n. 4, p. 324, doi. 10.15837/ijccc.2008.4.2400
- Atani, Reza Ebrahimi;
- Mirzakuchaki, Sattar;
- Atani, Shahabaddin Ebrahimi;
- Meier, Willi
- Article
35
- Journal of Electronic Materials, 2009, v. 38, n. 7, p. 1293, doi. 10.1007/s11664-009-0764-9
- Boniche, Israel;
- Masilamani, Sivaraman;
- Durscher, Ryan J.;
- Morgan, Brian C.;
- Arnold, David P.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1536, doi. 10.1007/s10854-011-0457-z
- Tao-Chi Liu;
- Chih Chen;
- Shih-Ting Liu;
- Ming-Lun Chang;
- Jandel Lin
- Article
37
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 511, doi. 10.1007/s10836-012-5312-5
- Viilukas, Taavi;
- Karputkin, Anton;
- Raik, Jaan;
- Jenihhin, Maksim;
- Ubar, Raimund;
- Fujiwara, Hideo
- Article
38
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 393
- Article
39
- Microwave & Optical Technology Letters, 2009, v. 51, n. 6, p. 1464, doi. 10.1002/mop.24387
- Yong-Sub Lee;
- Mun-Woo Lee;
- Yoon-Ha Jeong
- Article
40
- Microwave & Optical Technology Letters, 2009, v. 51, n. 5, p. 1167, doi. 10.1002/mop.24288
- Ahmad, Mahmoud Al;
- Papaioannou, George;
- Plana, Robert;
- Russer, Peter
- Article
41
- Microwave & Optical Technology Letters, 2009, v. 51, n. 2, p. 315, doi. 10.1002/mop.24035
- Wincza, Krzysztof;
- Gruszczynski, Slawomir
- Article
42
- Microwave & Optical Technology Letters, 2009, v. 51, n. 2, p. 445, doi. 10.1002/mop.24058
- Draskovic, Drasko;
- Koulouzis, H.;
- Budimir, D.
- Article
43
- Microwave & Optical Technology Letters, 2005, v. 47, n. 1, p. 97, doi. 10.1002/mop.21092
- Article
44
- Microwave & Optical Technology Letters, 2004, v. 42, n. 1, p. 50, doi. 10.1002/mop.20204
- Song, J. M.;
- Ling, F.;
- Blood, W.;
- Demircan, E.;
- Sriram, K.;
- Flynn, G.;
- To, K.-H.;
- Tsai, R.;
- Li, Q.;
- Myers, T.;
- Petras, M.;
- Dengi, A.
- Article
45
- Microwave & Optical Technology Letters, 2003, v. 39, n. 2, p. 155, doi. 10.1002/mop.11155
- Peñaranda-Foix, Felipe L.;
- Ferrando-Bataller, Miguel
- Article
46
- Microwave & Optical Technology Letters, 2002, v. 34, n. 2, p. 107, doi. 10.1002/mop.10387
- Hong, J. S.;
- Wang, B. Z.;
- Hu, B. J.;
- Liu, Y. W.
- Article
47
- Microwave & Optical Technology Letters, 2002, v. 34, n. 2, p. 100, doi. 10.1002/mop.10385
- Lafond, O.;
- Himdi, M.;
- Daniel, J. P.;
- Haese-Rolland, N.
- Article
48
- Microwave & Optical Technology Letters, 2002, v. 32, n. 4, p. 310, doi. 10.1002/mop.10163
- Hsiao, Fu-Ren;
- Chen, Hong-Twu;
- Chiou, Tzung-Wern;
- Lee, Gwo-Yun;
- Wong, Kin-Lu
- Article
49
- Microwave & Optical Technology Letters, 2002, v. 32, n. 3, p. 174, doi. 10.1002/mop.10122
- Cetiner, B. A.;
- Coccioli, R.;
- Housmand, B.;
- De Flaviis, Franco;
- Itoh, T.
- Article
50
- Microwave & Optical Technology Letters, 1999, v. 20, n. 1, p. 40, doi. 10.1002/(SICI)1098-2760(19990105)20:1<40::AID-MOP11>3.0.CO;2-2
- Balbastre, J. V.;
- Nuño, L.;
- Díaz, A.
- Article