Works matching DE "EFFECT of radiation on semiconductors"
1
- Optics & Spectroscopy, 2016, v. 120, n. 2, p. 250, doi. 10.1134/S0030400X16020144
- Konshina, E.;
- Gavrish, E.;
- Vangonen, A.
- Article
2
- Advances in Physics, 1991, v. 40, n. 5, p. 535, doi. 10.1080/00018739100101522
- Cingolani, Roberto;
- Ploog, Klaus
- Article
3
- Armenian Journal of Physics, 2013, v. 6, n. 3, p. 132
- Article
4
- Semiconductors, 2018, v. 52, n. 3, p. 324, doi. 10.1134/S1063782618030156
- Article
5
- Semiconductors, 2018, v. 52, n. 3, p. 331, doi. 10.1134/S1063782618030077
- Bilenko, D. I.;
- Belobrovaya, O. Ya.;
- Terin, D. V.;
- Galushka, V. V.;
- Galushka, I. V.;
- Zharkova, E. A.;
- Polyanskaya, V. P.;
- Sidorov, V. I.;
- Yagudin, I. T.
- Article
6
- Semiconductors, 2014, v. 48, n. 10, p. 1293, doi. 10.1134/S1063782614100170
- Lebedev, A.;
- Kozlovski, V.
- Article
7
- Semiconductors, 2011, v. 45, n. 5, p. 582, doi. 10.1134/S1063782611050034
- Antonova, I.;
- Smagulova, S.;
- Neustroev, E.;
- Skuratov, V.;
- Jedrzejewski, J.;
- Savir, E.;
- Balberg, I.
- Article
8
- Semiconductors, 2011, v. 45, n. 5, p. 572, doi. 10.1134/S106378261105023X
- Pagava, T.;
- Maisuradze, N.;
- Beridze, M.
- Article
9
- Semiconductors, 2011, v. 45, n. 5, p. 703, doi. 10.1134/S1063782611050149
- Article
10
- Semiconductors, 2008, v. 42, n. 6, p. 714, doi. 10.1134/S1063782608060134
- Savelyev, A. V.;
- Karachinsky, L. Ya.;
- Novikov, I. I.;
- Gordeev, N. Yu.;
- Seisyan, R. P.;
- Zegrya, G. G.
- Article
11
- Semiconductors, 2008, v. 42, n. 6, p. 689, doi. 10.1134/S1063782608060092
- Belyaev, A. E.;
- Boltovets, N. S.;
- Ivanov, V. N.;
- Klad'ko, V. P.;
- Konakova, R. V.;
- Kudrik, Ya. Ya.;
- Kuchuk, A. V.;
- Milenin, V. V.;
- Sveshnikov, Yu. N.;
- Sheremet, V. N.
- Article
12
- Semiconductors, 2008, v. 42, n. 6, p. 720, doi. 10.1134/S1063782608060146
- Usov, S.;
- Tsatsul’nikov, A.;
- Lundin, V.;
- Sakharov, A.;
- Zavarin, E.;
- Sinitsyn, M.;
- Ledentsov, N.
- Article
13
- Semiconductors, 2007, v. 41, n. 6, p. 732, doi. 10.1134/S1063782607060231
- Andreev, V.;
- Evstropov, V.;
- Kalinovskiĭ, V.;
- Lantratov, V.;
- Khvostikov, V.
- Article
14
- Semiconductors, 2003, v. 37, n. 1, p. 20, doi. 10.1134/1.1538533
- Brudnyi, V.N.;
- Peshev, V.V.
- Article
15
- Journal of Electronic Materials, 2011, v. 40, n. 4, p. 433, doi. 10.1007/s11664-010-1411-1
- Catalfamo, Frank;
- Yen, Tingfang;
- Yun, Juhyung;
- Anderson, Wayne
- Article
16
- Technical Physics, 2018, v. 63, n. 6, p. 838, doi. 10.1134/S1063784218060117
- Dyuryagina, N. S.;
- Yalovets, A. P.
- Article
17
- Advances in Materials Science & Engineering, 2017, p. 1, doi. 10.1155/2017/1750517
- dos Santos, Robinson Alves;
- de Mesquita, Carlos Henrique;
- da Silva, Júlio Batista Rodrigues;
- Ferraz, Caue de Melo;
- da Costa, Fabio Eduardo;
- Martins, João Francisco Trencher;
- Gennari, Roseli Fernandes;
- Hamada, Margarida Mizue
- Article
18
- Journal of Radioanalytical & Nuclear Chemistry, 2008, v. 277, n. 1, p. 125, doi. 10.1007/s10967-008-0719-2
- Espinosa, G.;
- Bogard, J. S.
- Article
20
- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2015, v. 170, n. 5, p. 377, doi. 10.1080/10420150.2015.1010170
- Yadav, Anupama;
- Flitsiyan, Elena;
- Chernyak, Leonid;
- Hwang, Ya-Hsi;
- Hsieh, Yueh-Ling;
- Lei, Lei;
- Ren, Fan;
- Pearton, Stephen J.;
- Lubomirsky, Igor
- Article
21
- International Journal of High Speed Electronics & Systems, 2006, v. 16, n. 3, p. 779, doi. 10.1142/S0129156406004028
- Article
22
- Angewandte Chemie International Edition, 2015, v. 54, n. 12, p. 3758, doi. 10.1002/anie.201409877
- Perera, Ishanie Rangeeka;
- Ohlin, C. André;
- Spiccia, Leone;
- Daeneke, Torben;
- Bach, Udo;
- Makuta, Satoshi;
- Tachibana, Yasuhiro;
- Yu, Ze;
- Mishra, Amaresh;
- Bäuerle, Peter
- Article