Toxicological Effects of Generated Radiations on the Eye among Computer Users.
- Published in:
- Egyptian Journal of Hospital Medicine, 2015, v. 61, p. 631, doi. 10.12816/0018766
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- Publication type:
- Article
Works matching DE "EFFECT of radiation on electronic apparatus %26 appliances"
Results: 10
1
2
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 377, doi. 10.1007/s10836-014-5448-6
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- Publication type:
- Article
3
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 777, doi. 10.1007/s10836-012-5321-4
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- Publication type:
- Article
4
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 877, doi. 10.1007/s10836-012-5338-8
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- Publication type:
- Article
5
Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications.
- Published in:
- EAI Endorsed Transactions on the Energy Web, 2024, v. 11, n. 1, p. 1, doi. 10.4108/ew.5006
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- Publication type:
- Article
6
Radiation Damage Effects on Detectors and Electronic Devices in Harsh Radiation Environment.
- Published in:
- Acta Physica Polonica: A, 2015, v. 127, n. 5, p. 1560, doi. 10.12693/APhysPolA.127.1560
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- Publication type:
- Article
7
Advances in radiative transfer.
- Published in:
- Astronomy & Astrophysics Review, 2006, v. 13, n. 1/2, p. 3, doi. 10.1007/s00159-006-0029-z
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- Publication type:
- Article
8
A low power and soft error resilience guard‐gated Quartro‐based flip‐flop in 45 nm CMOS technology.
- Published in:
- IET Circuits, Devices & Systems (Wiley-Blackwell), 2021, v. 15, n. 6, p. 571, doi. 10.1049/cds2.12052
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- Publication type:
- Article
9
Caracterización de emisiones y susceptibilidad radiada de un computador personal.
- Published in:
- Revista de Ingeniería, 2011, n. 33, p. 25, doi. 10.16924/revinge.33.3
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- Publication type:
- Article
10
Multiple Upsets Induced by Protons in 90-nm SRAMs.
- Published in:
- Technical Physics Letters, 2018, v. 44, n. 12, p. 1205, doi. 10.1134/S1063785019010097
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- Publication type:
- Article