Works about DOPED semiconductors
1
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-60335-x
- Tay, Fuyang;
- Sanders, Stephen;
- Baydin, Andrey;
- Song, Zhigang;
- Welakuh, Davis M.;
- Alabastri, Alessandro;
- Rokaj, Vasil;
- Dag, Ceren B.;
- Kono, Junichiro
- Article
2
- European Physical Journal: Special Topics, 2025, v. 234, n. 2, p. 385, doi. 10.1140/epjs/s11734-024-01458-y
- Wang, Zhen;
- Jin, Peng;
- Qu, Pengfei;
- Cao, Fanqiu;
- Han, Xu;
- Wang, Zhanguo
- Article
3
- Coatings (2079-6412), 2025, v. 15, n. 5, p. 587, doi. 10.3390/coatings15050587
- Dziedzic, Andrzej;
- Augustowski, Dariusz;
- Kwaśnicki, Paweł;
- Adamiak, Stanisław;
- Bochnowski, Wojciech;
- Żaczek, Anna;
- Skała, Patrycja;
- Cieniek, Bogumił;
- Potera, Piotr;
- Dziedzic, Jakub;
- Kus-Liskiewicz, Małgorzata;
- Płoch, Dariusz
- Article
4
- Revista Cubana de Física, 2010, v. 27, n. 1, p. 70
- Camas, J.;
- Anzueto, G.;
- Mendoza, S.;
- Hernández, H.;
- García, C.;
- Vázquez, R.;
- Juárez, N.;
- Torres, W.
- Article
5
- Revista Cubana de Física, 2009, v. 26, n. 2A, p. 179
- Abreu Alfonso, Yamiel;
- Cruz Inclán, Carlos M.;
- Piñera Hernández, Ibrahin;
- Leyva Fabelo, Antonio
- Article
6
- Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2798, doi. 10.1007/s11664-024-10966-5
- Spencer, Joseph A.;
- Jacobs, Alan G.;
- Hobart, Karl D.;
- Koehler, Andrew D.;
- Anderson, Travis J.;
- Zhang, Yuhao;
- Tadjer, Marko J.
- Article
7
- Surface Engineering, 2017, v. 33, n. 10, p. 779, doi. 10.1080/02670844.2016.1259090
- Sridhar, S.;
- Arunnellaiappan, T.;
- Rameshbabu, N.;
- Mika, S.;
- Viswanathan, A.
- Article
8
- Surface Engineering, 2017, v. 33, n. 10, p. 739, doi. 10.1080/02670844.2016.1188498
- Yang, W.;
- Xu, D. P.;
- Wang, J. L.;
- Jiang, B. L.
- Article
9
- Surface Engineering, 2016, v. 32, n. 8, p. 596, doi. 10.1080/02670844.2016.1161948
- Sivaraman, T.;
- Nagarethinam, V. S.;
- Balu, A. R.
- Article
10
- Surface Engineering, 2016, v. 32, n. 7, p. 535, doi. 10.1080/02670844.2015.1108047
- Dinari, M.;
- Momeni, M. M.;
- Goudarzirad, M.
- Article
11
- Surface Engineering, 2015, v. 31, n. 5, p. 386, doi. 10.1179/1743294414Y.0000000418
- Berger, O.;
- Boucher, R.;
- Ruhnow, M.
- Article
12
- Surface Engineering, 2013, v. 29, n. 5, p. 356, doi. 10.1179/1743294413Y.0000000117
- Ji, X;
- Wang, L J;
- Teng, J Y;
- Mi, Y M;
- Zhang, C M
- Article
13
- Surface Engineering, 2013, v. 29, n. 5, p. 373, doi. 10.1179/1743294412Y.0000000110
- Thirumurugan, K;
- Ravichandran, K;
- Mohan, R;
- Snega, S;
- Jothiramalingam, S;
- Chandramohan, R
- Article
14
- Surface Engineering, 2013, v. 29, n. 1, p. 70, doi. 10.1179/1743294412Y.0000000072
- Qin, H;
- Liu, H F;
- Yuan, Y Z
- Article
15
- Surface Engineering, 2011, v. 27, n. 5, p. 389, doi. 10.1179/1743294410Y.0000000024
- Article
16
- Chemistry - A European Journal, 2020, v. 26, n. 18, p. 4097, doi. 10.1002/chem.201904238
- Ying Wang;
- Wenming Sun;
- Xiaofei Ling;
- Xiangkai Shi;
- Lanlan Li;
- Yida Deng;
- Cuihua An;
- Xiaopeng Han
- Article
17
- Angewandte Chemie, 2016, v. 128, n. 24, p. 6956, doi. 10.1002/ange.201601727
- Vo Doan, Tat Thang;
- Wang, Jingbo;
- Poon, Kee Chun;
- Tan, Desmond C. L.;
- Khezri, Bahareh;
- Webster, Richard D.;
- Su, Haibin;
- Sato, Hirotaka
- Article
18
- Angewandte Chemie, 2016, v. 128, n. 23, p. 6828, doi. 10.1002/ange.201602543
- Yang, Wenlong;
- Zhang, Lei;
- Xie, Junfeng;
- Zhang, Xiaodong;
- Liu, Qinghua;
- Yao, Tao;
- Wei, Shiqiang;
- Zhang, Qun;
- Xie, Yi
- Article
19
- Angewandte Chemie, 2016, v. 128, n. 7, p. 2510, doi. 10.1002/ange.201510609
- Li, Xiaomin;
- Guo, Zhenzhen;
- Zhao, Tiancong;
- Lu, Yang;
- Zhou, Lei;
- Zhao, Dongyuan;
- Zhang, Fan
- Article
20
- Angewandte Chemie, 2016, v. 128, n. 5, p. 1862, doi. 10.1002/ange.201508505
- Guo, Shien;
- Deng, Zhaopeng;
- Li, Mingxia;
- Jiang, Baojiang;
- Tian, Chungui;
- Pan, Qingjiang;
- Fu, Honggang
- Article
21
- Angewandte Chemie, 2015, v. 127, n. 32, p. 9389, doi. 10.1002/ange.201503004
- Chen, Mao;
- Zhang, Yapeng;
- Jia, Siyu;
- Zhou, Lin;
- Guan, Ying;
- Zhang, Yongjun
- Article
22
- Angewandte Chemie, 2015, v. 127, n. 6, p. 1908, doi. 10.1002/ange.201410258
- Ma, Zhaoling;
- Dou, Shuo;
- Shen, Anli;
- Tao, Li;
- Dai, Liming;
- Wang, Shuangyin
- Article
23
- Angewandte Chemie, 2014, v. 126, n. 7, p. 1965, doi. 10.1002/ange.201307721
- Lv, Yaokang;
- Cheng, Jun;
- Steiner, Alexander;
- Gan, Lihua;
- Wright, Dominic S.
- Article
24
- Angewandte Chemie, 2013, v. 125, n. 45, p. 12029, doi. 10.1002/ange.201304505
- Latorre ‐ Sánchez, Marcos;
- Primo, Ana;
- García, Hermenegildo
- Article
25
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 18, p. 16718, doi. 10.1007/s10854-019-00979-w
- Legnani, Cristiano;
- Barud, Hernane S.;
- Caiut, José M. A.;
- Calil, Vanessa L.;
- Maciel, Indhira O.;
- Quirino, Welber G.;
- Ribeiro, Sidney J. L.;
- Cremona, Marco
- Article
26
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 20, p. 17670, doi. 10.1007/s10854-018-9872-8
- Govindan, V.;
- Imran, H.;
- Dharuman, V.;
- Sankaranarayanan, K.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 20, p. 17093, doi. 10.1007/s10854-018-9815-4
- Sangeetha, S.;
- Rajendran, V.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 19, p. 16836, doi. 10.1007/s10854-018-9778-5
- Zhang, Bo;
- Zima, Vitezslav;
- Mikysek, Tomas;
- Podzemna, Veronika;
- Rozsival, Pavel;
- Wagner, Tomas
- Article
29
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15770, doi. 10.1007/s10854-018-9241-7
- Merupo, V. I.;
- Velumani, S.;
- Abramova, A.;
- Ordon, K.;
- Makowska-Janusik, M.;
- Kassiba, A.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 2, p. 1098, doi. 10.1007/s10854-017-8011-2
- Bhat, Shreesha;
- Sandeep, K. M.;
- Kumar, Prasad;
- Dharmaprakash, S. M.;
- Byrappa, K.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 14, p. 10166, doi. 10.1007/s10854-017-6780-2
- Sun, Wei-Jie;
- Yang, Rong;
- Qu, Xiao;
- Wang, Mao-Hua;
- Zhang, Han-Ping
- Article
32
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7376, doi. 10.1007/s10854-017-6426-4
- Akin, N.;
- Kinaci, B.;
- Ozen, Y.;
- Ozcelik, S.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5207, doi. 10.1007/s10854-016-6177-7
- Londhe, Priyanka;
- Rohom, Ashwini;
- Bhand, Ganesh;
- Jadhav, Sujata;
- Lakhe, Manorama;
- Chaure, Nandu
- Article
34
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5281, doi. 10.1007/s10854-016-6185-7
- Maragatha, J.;
- Rajendran, S.;
- Endo, T.;
- Karuppuchamy, S.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5288, doi. 10.1007/s10854-016-6186-6
- Du, Juan;
- Xu, Zhijun;
- Chu, Ruiqing;
- Hao, Jigong;
- Li, Wei;
- Jiang, Guicheng;
- Zheng, Peng
- Article
36
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5329, doi. 10.1007/s10854-016-6191-9
- Sabarilakshmi, M.;
- Janaki, K.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5336, doi. 10.1007/s10854-016-6192-8
- Article
38
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5472, doi. 10.1007/s10854-016-6209-3
- Hedayati, Kambiz;
- Azarakhsh, Sara;
- Saffari, Jilla;
- Ghanbari, Davood
- Article
39
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5344, doi. 10.1007/s10854-016-6193-7
- Suganya, M.;
- Prabha, D.;
- Balamurugan, S.;
- Balu, A.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5415, doi. 10.1007/s10854-016-6202-x
- Machado, Diego;
- Scalvi, Luis;
- Tabata, Américo;
- Silva, José
- Article
41
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5498, doi. 10.1007/s10854-016-6211-9
- Chen, Yichuan;
- Hu, Yuehui;
- Zhang, Xiaohua;
- Hu, Keyan;
- Tong, Fan;
- Lao, Zixuan;
- Shuai, Weiqiang
- Article
42
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5512, doi. 10.1007/s10854-016-6213-7
- Tang, Jialin;
- Niu, Dongwei;
- Tai, Zhiwei;
- Hu, Xianwei
- Article
43
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5645, doi. 10.1007/s10854-016-6235-1
- Cai, Qi;
- Liu, Yongchang;
- Ma, Zongqing;
- Yu, Liming;
- Li, Huijun
- Article
44
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5592, doi. 10.1007/s10854-016-6226-2
- Chen, Yong;
- Liu, Xiangyu;
- Chen, Guohua;
- Yang, Tao;
- Yuan, Changlai
- Article
45
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5609, doi. 10.1007/s10854-016-6229-z
- Liu, K.;
- Li, J.;
- Xu, J.;
- Xu, F.;
- Wang, L.;
- Bian, L.
- Article
46
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 11726, doi. 10.1007/s10854-016-5310-y
- Sonker, Rakesh;
- Sabhajeet, S.;
- Yadav, B.
- Article
47
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 11762, doi. 10.1007/s10854-016-5315-6
- Wang, Xin;
- Ren, Pengrong;
- Wang, Qian;
- Fan, Huiqing;
- Zhao, Gaoyang
- Article
48
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 11770, doi. 10.1007/s10854-016-5316-5
- Zhang, Chen;
- Ling, Zhixin;
- Jian, Gang
- Article
49
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 11777, doi. 10.1007/s10854-016-5317-4
- Wei, Ling;
- Lu, Yi;
- Fang, Zhenggang;
- Zhang, Rong;
- Ma, Delin;
- Lu, Chunhua;
- Xu, Zhongzi;
- Tao, Shunyan
- Article
50
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 11825, doi. 10.1007/s10854-016-5323-6
- Sivaji, K.;
- Viswanathan, E.;
- Sellaiyan, S.;
- Murugaraj, R.;
- Kanjilal, D.
- Article