Works about DIRECT energy conversion
1
- Advanced Functional Materials, 2025, v. 35, n. 27, p. 1, doi. 10.1002/adfm.202425176
- Huang, Xin;
- Kong, Taoyi;
- Li, Zhi;
- Yu, Xiaomeng;
- Liu, Chang;
- Wang, Zhaoqi;
- Wang, Yonggang
- Article
2
- Journal of Microwave Power & Electromagnetic Energy, 2005, v. 40, n. 1, p. 49, doi. 10.1080/08327823.2005.11688524
- Stephan, Karl D.;
- Pearce, John A.
- Article
3
- International Journal of Nanoscience, 2009, v. 8, n. 1/2, p. 227, doi. 10.1142/S0219581X09005670
- ZHANG, WEI;
- ZHU, RUI;
- LIU, XI-ZHE;
- LIU, BIN;
- RAMAKRISHNA, SEERAM
- Article
4
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 785, doi. 10.1142/S0219581X05003395
- MENZIES, D. B.;
- HART, J. N.;
- CHENG, Y.-B.;
- SIMON, G. P.;
- DAI, Q.;
- SPICCIA, L.
- Article
5
- Innovation, 2007, v. 7, n. 3, p. 34
- Article
6
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4768, doi. 10.1002/adfm.201505538
- Zhong, Sihua;
- Wang, Wenjie;
- Zhuang, Yufeng;
- Huang, Zengguang;
- Shen, Wenzhong
- Article
7
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4643, doi. 10.1002/adfm.201504734
- Wang, Zhenguo;
- Li, Zuojia;
- Xu, Xiaopeng;
- Li, Ying;
- Li, Kai;
- Peng, Qiang
- Article
8
- Advanced Functional Materials, 2016, v. 26, n. 6, p. 895, doi. 10.1002/adfm.201503839
- Niezgoda, J. Scott;
- Ng, Amy;
- Poplawsky, Jonathan D.;
- McBride, James R.;
- Pennycook, Stephen J.;
- Rosenthal, Sandra J.
- Article
9
- Advanced Functional Materials, 2013, v. 23, n. 31, p. 3901, doi. 10.1002/adfm.201203851
- Ahn, Sung Hoon;
- Chi, Won Seok;
- Kim, Dong Jun;
- Heo, Sung Yeon;
- Kim, Jong Hak
- Article
10
- Advanced Functional Materials, 2013, v. 23, n. 28, p. 3584, doi. 10.1002/adfm.201202643
- Proctor, Christopher M.;
- Kim, Chunki;
- Neher, Dieter;
- Nguyen, Thuc‐Quyen
- Article
11
- Advanced Functional Materials, 2013, v. 23, n. 28, p. 3539, doi. 10.1002/adfm.201203348
- Cai, Ning;
- Zhang, Jing;
- Xu, Mingfei;
- Zhang, Min;
- Wang, Peng
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 7, p. 682, doi. 10.1007/s10854-009-9977-1
- Shengli Lu;
- Sam-Shajing Sun;
- Xiaoxia Jiang;
- Jianwei Mao;
- Tiehu Li;
- Kexi Wan
- Article
13
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 163, doi. 10.1007/s10854-008-9675-4
- Almeida, A. F. L.;
- Fechine, P. B. A.;
- Graça, M. P.F.;
- Valente, M. A.;
- Sombra, A. S. B.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 487, doi. 10.1007/s10854-008-9687-0
- Borchert, Dietmar;
- Rinio, Markus
- Article
15
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 446, doi. 10.1007/s10854-008-9665-6
- Jin-Kook Lee;
- Bo-Hwa Jeong;
- Sung-Il Jang;
- Yun-Seon Yeo;
- Sung-Hae Park;
- Ji-Un Kim;
- Young-Guen Kim;
- Yong-Wook Jang;
- Kim, Mi-Ra
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1252, doi. 10.1007/s10854-008-9585-5
- Hankare, P. P.;
- Asabe, M. R.;
- Chate, P. A.;
- Rathod, K. C.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 371, doi. 10.1007/s10854-008-9593-5
- Saad, A.;
- Odrinski, A.;
- Tivanov, M.;
- Drozdov, N.;
- Fedotov, A.;
- Gremenok, V.;
- Mazanik, A.;
- Patryn, A.;
- Zalesski, V.;
- Zaretskaya, E.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 7, p. 594, doi. 10.1007/s10854-007-9395-1
- Article
19
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 11, p. 1099, doi. 10.1007/s10854-007-9317-2
- Kosyachenko, L.;
- Motushchuk, V.;
- Sklyarchuk, O.;
- Mathew, X.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 593, doi. 10.1007/s10854-006-9100-9
- Jiu, Jinting;
- Isoda, Seiji;
- Adachi, Motonari;
- Wang, Hao
- Article
21
- Journal of Materials Science Letters, 2003, v. 22, n. 24, p. 1801, doi. 10.1023/B:JMSL.0000005425.53545.34
- Yan, Y. L.;
- Qian, X. F.;
- Yin, J.;
- Zhu, Z. K.
- Article
22
- Journal of Materials Science Letters, 2003, v. 22, n. 17, p. 1185, doi. 10.1023/A:1025384114047
- Article
23
- Microscopy & Microanalysis, 2009, v. 15, n. 3, p. 251, doi. 10.1017/S1431927609090278
- Sourty, Erwan;
- van Bavel, Svetlana;
- Kangbo Lu;
- Guerra, Ralph;
- Bar, Georg;
- Loos, Joachim
- Article
24
- Microscopy & Microanalysis, 2009, v. 15, n. 2, p. 125, doi. 10.1017/S1431927609090205
- Grunbaum, Enrique;
- Barkay, Zahava;
- Shapira, Yoram;
- Barnham, Keith W. J.;
- Bushnell, David B.;
- Ekins-Daukes, Nicholas J.;
- Mazzer, Massimo;
- Wilshaw, Peter
- Article
25
- Applied Microbiology & Biotechnology, 2011, v. 89, n. 2, p. 259, doi. 10.1007/s00253-010-2881-z
- Lefebvre, Olivier;
- Uzabiaga, Arnaud;
- In Chang;
- Byung-Hong Kim;
- How Ng
- Article
26
- Applied Microbiology & Biotechnology, 2010, v. 87, n. 6, p. 2365, doi. 10.1007/s00253-010-2746-5
- Shao-Xiang Teng;
- Zhong-Hua Tong;
- Wen-Wei Li;
- Shu-Guang Wang;
- Guo-Ping Sheng;
- Xian-Yang Shi;
- Xian-Wei Liu;
- Han-Qing Yu
- Article
27
- Applied Microbiology & Biotechnology, 2008, v. 79, n. 3, p. 379, doi. 10.1007/s00253-008-1451-0
- Chen, Guo-Wei;
- Choi, Soo-Jung;
- Lee, Tae-Ho;
- Lee, Gil-Young;
- Cha, Jae-Hwan;
- Kim, Chang-Won
- Article
28
- Adsorption Science & Technology, 2007, v. 25, n. 3/4, p. 129, doi. 10.1260/026361707782398254
- Celzard, A.;
- Fierro, V.;
- Marêché, J. F.;
- Furdin, G.
- Article
29
- Ferroelectrics, 2007, v. 358, n. 1, p. 22, doi. 10.1080/00150190701533629
- Yan Cui;
- Weijie Dong;
- Mengwei Liu;
- Minriu Wang;
- Jing Wang;
- Xiaodong Wang;
- Liding Wang
- Article
30
- Ferroelectrics, 2006, v. 342, n. 1, p. 107, doi. 10.1080/00150190600946278
- Imran, Muhammad;
- Bhattacharyya, A.
- Article
31
- Chemical Engineering Communications, 2007, v. 194, n. 6, p. 780, doi. 10.1080/00986440701193795
- Pingali, KalyanaC.;
- Deng, Shuguang;
- Rockstraw, DavidA.
- Article
32
- Plasma Physics Reports, 2010, v. 36, n. 6, p. 473, doi. 10.1134/S1063780X10060048
- Gus’kov, S.;
- Il’in, D.;
- Limpouch, J.;
- Klimo, O.;
- Sherman, V.
- Article
33
- Plasma Physics Reports, 2009, v. 35, n. 10, p. 890, doi. 10.1134/S1063780X09100122
- Grishina, I.;
- Ivanov, V.;
- Kovrizhnykh, L.
- Article
34
- Plasma Physics Reports, 2005, v. 31, n. 1, p. 1, doi. 10.1134/1.1856703
- Article
35
- Sensors & Materials, 2018, v. 30, n. 10, Part 2, p. 2343, doi. 10.18494/SAM.2018.1945
- Takashi Tokuda;
- Takaaki Ishizu;
- Nattakarn, Wuthibenjaphonchai;
- Makito Haruta;
- Toshihiko Noda;
- Kiyotaka Sasagawa;
- Mohamad Sawan;
- Jun Ohta
- Article
36
- Sensors & Materials, 2018, v. 30, n. 7, Part 2, p. 1611, doi. 10.18494/SAM.2018.1925
- Katsuyuki Takagi;
- Tsuyoshi Terao;
- Akifumi Koike;
- Toru Aoki
- Article
37
- Sensors & Materials, 2017, v. 29, n. 7, Part 1, p. 875, doi. 10.18494/SAM.2017.1544
- Shun-Yu Chan;
- Yong-Nong Chang;
- Hung-Liang Cheng;
- Yih-Her Yan
- Article
38
- Sensors & Materials, 2016, v. 28, n. 9, p. 933, doi. 10.18494/sam.2016.1381
- Chung-Neng Huang;
- Yui-Sung Chen
- Article
39
- Electronics (2079-9292), 2024, v. 13, n. 18, p. 3685, doi. 10.3390/electronics13183685
- Yang, Zhaorui;
- He, Yu;
- Zhang, Jing;
- Zhang, Zijian;
- Luo, Jie;
- Gan, Guomin;
- Xiang, Jie;
- Zou, Yang
- Article
40
- Electronics (2079-9292), 2022, v. 11, n. 18, p. N.PAG, doi. 10.3390/electronics11182871
- Reyes-Severiano, Yesenia;
- Aldaco, Susana Estefany De León;
- Aguayo Alquicira, Jesus;
- Carrillo-Santos, Luis Mauricio;
- Lozoya-Ponce, Ricardo Eliú;
- Hermosillo, Jesús Alfonso Medrano
- Article
41
- Electronics (2079-9292), 2020, v. 9, n. 9, p. 1480, doi. 10.3390/electronics9091480
- Loranca-Coutiño, Javier;
- Villarreal-Hernandez, Carlos A.;
- Mayo-Maldonado, Jonathan C.;
- Valdez-Resendiz, Jesús E.;
- Lopez-Nuñez, Adolfo R.;
- Ruiz-Martinez, Omar F.;
- Rosas-Caro, Julio C.
- Article
42
- Israel Journal of Chemistry, 2008, v. 48, n. 3/4, p. 215, doi. 10.1560/IJC.48.3-4.215
- Sung-Jai Lee;
- Su-Il Pyun;
- Sang-Kwon Lee;
- Kang, Suk-Joong L.
- Article
43
- Eastern-European Journal of Enterprise Technologies, 2018, v. 94, n. 5, p. 29, doi. 10.15587/1729-4061.2018.139867
- Deуneko, N.;
- Semkiv, O.;
- Soshinsky, O.;
- Streletc, V.;
- Shevchenko, R.
- Article
44
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06169
- Jia Fang;
- Bofei Liu;
- Ying Zhao;
- Xiaodan Zhang
- Article
45
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05205
- Xiao, B. B.;
- Zhu, Y. F.;
- Lang, X. Y.;
- Wen, Z.;
- Jiang, Q.
- Article
46
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05179
- Yan Chen;
- Ling Yang;
- Fei Ren;
- Ke An
- Article
47
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04107
- Yiling Yu;
- Lujun Huang;
- Linyou Cao
- Article
48
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04033
- Joly, Damien;
- Pellejà, Laia;
- Narbey, Stéphanie;
- Oswald, Frédéric;
- Chiron, Julien;
- Clifford, John N.;
- Palomares, Emilio;
- Demadrille, Renaud
- Article
49
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04028
- Jihuai Wu;
- Yan Li;
- Qunwei Tang;
- Gentian Yue;
- Jianming Lin;
- Miaoliang Huang;
- Lijian Meng
- Article
50
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep03356
- Yongsheng Liu;
- Chun-Chao Chen;
- Ziruo Hong;
- Jing Gao;
- Yang Michael Yang;
- Huanping Zhou;
- Letian Dou;
- Gang Li;
- Yang Yang
- Article