Works about DIGITAL electronics
1
- Performance Improvement, 2012, v. 51, n. 8, p. 34, doi. 10.1002/pfi.21296
- Article
2
- ABI Technik, 2006, v. 26, n. 4, p. 245
- Michel, Em Beitrag Von Volker
- Article
3
- International Journal of Speech, Language & the Law, 2008, v. 15, n. 1, p. 67, doi. 10.1558/ijsll.v15i1.67
- Article
4
- Sampling Theory in Signal & Image Processing, 2012, v. 11, n. 1, p. 43, doi. 10.1007/bf03549548
- Article
5
- School Science & Mathematics, 2005, v. 105, n. 2, p. 106, doi. 10.1111/j.1949-8594.2005.tb18042.x
- Bell, Randy;
- Garofalo, Joe
- Article
6
- Tudományos és Műszaki Tájékoztatás, 2006, v. 53, n. 10, p. 467
- Article
7
- Tudományos és Műszaki Tájékoztatás, 2006, v. 53, n. 10, p. 447
- Article
8
- Tudományos és Műszaki Tájékoztatás, 2006, v. 53, n. 4, p. 159
- Article
10
- Journal of Research of the National Institute of Standards & Technology, 2013, v. 118, p. 125, doi. 10.6028/jres.118.006
- Kos, Anthony B.;
- Gerecht, Eyal
- Article
11
- Revista de Derecho (15105172), 2011, v. 10, n. 20, p. 121
- Article
12
- Media Development, 2021, v. 67, n. 3, p. 6
- Article
13
- Media Development, 2017, v. 64, n. 1, p. 14
- Article
14
- International Journal of Wavelets, Multiresolution & Information Processing, 2009, v. 7, n. 1, p. 115, doi. 10.1142/S0219691309002817
- LOU, OU-JUN;
- WANG, XIANG-HAI;
- WANG, ZHENG-XUAN
- Article
15
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 753, doi. 10.1142/S0219581X05003498
- SIM KIT WANG;
- BUTLER, DAVID LEE;
- DONG SENG LIU;
- FENG CHEN
- Article
17
- Innovation, 2008, v. 8, n. 3, p. 14
- Article
18
- Innovation, 2008, v. 8, n. 3, p. 1
- Lawrence WONG Wai Choong;
- BROWN, Michael S.;
- CHEOK, Adrian David
- Article
19
- Advanced Functional Materials, 2016, v. 26, n. 8, p. 1286, doi. 10.1002/adfm.201503606
- Lai, Ying‐Chih;
- Ye, Bo‐Wei;
- Lu, Chun‐Fu;
- Chen, Chien‐Tung;
- Jao, Meng‐Huan;
- Su, Wei‐Fang;
- Hung, Wen‐Yi;
- Lin, Tai‐Yuan;
- Chen, Yang‐Fang
- Article
20
- Advanced Functional Materials, 2014, v. 24, n. 10, p. 1430, doi. 10.1002/adfm.201302246
- Lai, Ying‐Chih;
- Wang, Yi‐Xiang;
- Huang, Yi‐Chuan;
- Lin, Tai‐Yuan;
- Hsieh, Ya‐Ping;
- Yang, Ying‐Jay;
- Chen, Yang‐Fang
- Article
21
- Natural Computing, 2021, v. 20, n. 1, p. 127, doi. 10.1007/s11047-019-09772-4
- Atkinson, Timothy;
- Plump, Detlef;
- Stepney, Susan
- Article
22
- Natural Computing, 2013, v. 12, n. 2, p. 235, doi. 10.1007/s11047-012-9356-3
- Article
23
- Journal of Supercomputing, 2024, v. 80, n. 16, p. 24379, doi. 10.1007/s11227-024-06257-9
- Zhang, Jie;
- Wang, Pengyuan;
- Cheng, Nana;
- Bi, Jingshun
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 87, doi. 10.1007/s10854-007-9455-6
- Faramarzpour, Naser;
- El-Desouki, Munir M.;
- Deen, M. Jamal;
- Shirani, Shahram;
- Qiyin Fang
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 64, doi. 10.1007/s10854-008-9589-1
- Gnanapragasam, Sonia;
- Richter, Eberhard;
- Brunner, Frank;
- Denker, Andrea;
- Lossy, Richard;
- Mai, Michael;
- Lenk, Friedrich;
- Opitz-Coutureau, Jörg;
- Pensl, Gerhard;
- Schmidt, Jens;
- Zeimer, Ute;
- Wang, Liun;
- Krishnan, Baskar;
- Weyers, Markus;
- Würfl, Jaochim;
- Tränkle, Günther
- Article
26
- Russian Journal of Nondestructive Testing, 2011, v. 47, n. 2, p. 130, doi. 10.1134/S1061830911020124
- Udod, V.;
- Lebedev, M.;
- Klimenov, V.;
- Solodushkin, V.;
- Temnik, A.
- Article
27
- Measurement Techniques, 2018, v. 61, n. 8, p. 812, doi. 10.1007/s11018-018-1507-1
- Andreev, А. N.;
- Kolesnichenko, D. А.;
- Kolesnichenko, N. М.
- Article
28
- Measurement Techniques, 2018, v. 60, n. 11, p. 1142, doi. 10.1007/s11018-018-1331-7
- Article
29
- Measurement Techniques, 2016, v. 59, n. 9, p. 979, doi. 10.1007/s11018-016-1079-x
- Akop'yan, V.;
- Karapet'yan, G.
- Article
30
- Measurement Techniques, 2016, v. 59, n. 2, p. 133, doi. 10.1007/s11018-016-0930-4
- Chekirda, K.;
- Shur, V.;
- Lukin, A.;
- Kos'mina, M.;
- Leibengardt, G.
- Article
31
- Measurement Techniques, 2016, v. 59, n. 2, p. 164, doi. 10.1007/s11018-016-0936-y
- Article
32
- Measurement Techniques, 2012, v. 55, n. 6, p. 676, doi. 10.1007/s11018-012-0020-1
- Zalutskaya, T.;
- Likhnovsky, I.;
- Lutsyk, Ya.
- Article
33
- Measurement Techniques, 2011, v. 54, n. 6, p. 681, doi. 10.1007/s11018-011-9785-x
- Gudkov, A.;
- Ionov, D.;
- Shendrik, A.
- Article
34
- Measurement Techniques, 2009, v. 52, n. 12, p. 1351, doi. 10.1007/s11018-010-9444-7
- Bobreshov, A. M.;
- Dyboi, A. V.;
- Razuvaev, Yu. Yu.;
- Uskov, G. K.
- Article
35
- Measurement Techniques, 2009, v. 52, n. 3, p. 307, doi. 10.1007/s11018-009-9271-x
- A. Esman;
- V. Kuleshov;
- G. Zykov
- Article
36
- Measurement Techniques, 2009, v. 52, n. 1, p. 26, doi. 10.1007/s11018-009-9218-2
- Article
37
- Metrology, 2024, v. 4, n. 4, p. 736, doi. 10.3390/metrology4040043
- Li, Jiaqi;
- Fernandez, Rodrigo;
- Gutierrez, Bernardo;
- Pedersen, Jan;
- Zhou, Yan
- Article
38
- IET Control Theory & Applications (Wiley-Blackwell), 2014, v. 8, n. 8, p. 554, doi. 10.1049/iet-cta.2013.0104
- Zhenbin Liu;
- YuzhenWang;
- Haitao Li
- Article
39
- IET Computers & Digital Techniques (Wiley-Blackwell), 2023, v. 17, n. 3/4, p. 180, doi. 10.1049/cdt2.12062
- Cao, Linan;
- Bale, Simon J.;
- Trefzer, Martin A.
- Article
40
- IET Computers & Digital Techniques (Wiley-Blackwell), 2023, v. 17, n. 1, p. 1, doi. 10.1049/cdt2.12049
- Sadeghi, Ayoub;
- Shiri, Nabiollah;
- Rafiee, Mahmood;
- Darabi, Abdolreza;
- Abiri, Ebrahim
- Article
41
- IET Computers & Digital Techniques (Wiley-Blackwell), 2022, v. 16, n. 5, p. 172, doi. 10.1049/cdt2.12047
- Ponugoti, Kushal K.;
- Srinivasan, Sudarshan K.;
- Smith, Scott C.;
- Mathure, Nimish
- Article
42
- IET Computers & Digital Techniques (Wiley-Blackwell), 2021, v. 15, n. 5, p. 335, doi. 10.1049/cdt2.12024
- Merniz, Salah;
- Harous, Saad
- Article
43
- International Journal of Educational Researchers (IJERs), 2025, v. 16, n. 1, p. 30, doi. 10.29329/ijer.2025.1295.3
- Bello, Abdulaziz;
- Deba, Ahmad Aliyu;
- Yaduma, Paul Shehu;
- Mohammed, Sa'adatu Abubakar
- Article
44
- Instruments (2410-390X), 2022, v. 6, n. 4, p. 60, doi. 10.3390/instruments6040060
- Atanov, Nikolay;
- Baranov, Vladimir;
- Borrel, Leo;
- Bloise, Caterina;
- Budagov, Julian;
- Ceravolo, Sergio;
- Cervelli, Franco;
- Colao, Francesco;
- Cordelli, Marco;
- Corradi, Giovanni;
- Davydov, Yuri;
- Falco, Stefano Di;
- Diociaiuti, Eleonora;
- Donati, Simone;
- Echenard, Bertrand;
- Ferrari, Carlo;
- Gioiosa, Antonio;
- Giovannella, Simona;
- Giusti, Valerio;
- Glagolev, Vladimir
- Article
45
- Multi-Knowledge Electronic Comprehensive Journal For Education & Science Publications (MECSJ), 2022, n. 55, p. 1
- Ahmed, Wael Saad;
- Yaseen, Nabeel Abdulrazaq;
- Khudhur, Khaleel Ali
- Article
46
- Èlektronnoe Modelirovanie, 2023, v. 45, n. 1, p. 3, doi. 10.15407/emodel.45.01.003
- Gharibi, W.;
- Hahanova, A.;
- Hahanov, V.;
- Chumachenko, S.;
- Litvinova, E.;
- Hahanov, I.
- Article
47
- Advanced Sustainable Systems, 2024, v. 8, n. 6, p. 1, doi. 10.1002/adsu.202400049
- Rafiee, Zahra;
- Elhadad, Anwar;
- Choi, Seokheun
- Article
48
- Journal of Zhejiang University (Science Edition), 2023, v. 50, n. 3, p. 316, doi. 10.3785/j.issn.1008-9497.2023.03.009
- Article
49
- Journal of Zhejiang University (Science Edition), 2023, v. 50, n. 2, p. 167, doi. 10.3785/j.issn.1008-9497.2023.02.006
- Article