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Works matching DE "DIELECTRIC film testing"

Results: 2

1

Analysis of crystallization property of LDPE/FeO nano-dielectrics based on AFM measurements.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3495, doi. 10.1007/s10854-016-5948-5

By:

Zhang, Dong;
Wang, Xuan;
Song, Wei;
Sun, Zhi;
He, Li-Juan;
Han, Bai;
Lei, Qing-Quan

Publication type:

Article

2

Annealing temperature dependence on the structural and optical properties of sputtering-grown high-k HfO gate dielectrics.

Published in:

Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 4163, doi. 10.1007/s10854-014-2144-3

By:

Deng, B.;
He, G.;
Chen, X.;
Zhang, J.;
Liu, M.;
Lv, J.;
Sun, Z.

Publication type:

Article