Works matching DE "DEPLETION layers (Electronics)"
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 18935, doi. 10.1007/s10854-018-0016-y
- Yin, Xi-Tao;
- Lv, Pin;
- Li, Jing
- Article
2
- IUP Journal of Electrical & Electronics Engineering, 2014, v. 7, n. 4, p. 19
- Das, Debarati;
- De, Swapnadip;
- Chanda, Manash;
- Kumar Sarkar, Chandan
- Article
3
- IUP Journal of Electrical & Electronics Engineering, 2012, v. 5, n. 3, p. 67
- Swapnadip De;
- Sarkar, Angsuman
- Article
4
- Semiconductors, 2015, v. 49, n. 9, p. 1187, doi. 10.1134/S1063782615090080
- Bondarenko, V.;
- Filimonov, A.
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 6, p. 3796, doi. 10.1007/s11664-016-5243-5
- Phan, Bach;
- Eom, Ki;
- Lee, Jaichan
- Article
6
- Journal of Electronic Materials, 2013, v. 42, n. 4, p. 716, doi. 10.1007/s11664-012-2427-5
- Park, Jinsub;
- Yao, Takafumi
- Article
7
- Technical Physics, 2015, v. 60, n. 10, p. 1494, doi. 10.1134/S1063784215100254
- Peisakhovich, Yu.;
- Shtygashev, A.;
- Borynyak, L.;
- Petrov, N.
- Article
8
- Applied Physics A: Materials Science & Processing, 2016, v. 122, n. 3, p. 1, doi. 10.1007/s00339-016-9675-9
- Liu, Jianqiao;
- Lu, Yiting;
- Cui, Xiao;
- Jin, Guohua;
- Zhai, Zhaoxia
- Article
9
- European Physical Journal - Applied Physics, 2014, v. 66, n. 2, p. 00, doi. 10.1051/epjap/2014130470
- Muhsin Nayef, Uday;
- Waleed Muayad, Mohammed;
- Amer Khalaf, Haider
- Article
10
- Modern Physics Letters B, 2013, v. 27, n. 1, p. 1, doi. 10.1142/S021798491350005X
- ZHANG, Y.;
- WANG, G. F.;
- LI, W. L.;
- SHEN, J. Q.;
- LI, P. G.;
- LEI, M.;
- TANG, W. H.
- Article
11
- NANO (1793-2920), 2015, v. 10, n. 7, p. 1550093-1, doi. 10.1142/S1793292015500939
- Karsenty, Avi;
- Chelly, Avraham
- Article
12
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 12, doi. 10.31399/asm.edfa.2017-4.p012
- Amster, Oskar;
- Friedman, Stuart;
- Yongliang Yang;
- Stanke, Fred
- Article
13
- Advanced Functional Materials, 2016, p. 219, doi. 10.1002/adfm.201503692
- Mingzhao Liu;
- Lyons, John L.;
- Danhua Yan;
- Hybertsen, Mark S.
- Article
14
- Journal of Thermal Analysis & Calorimetry, 2015, v. 121, n. 3, p. 1365, doi. 10.1007/s10973-015-4566-4
- Pandey, A.;
- Tyagi, V.;
- Rahim, N.;
- Kaushik, S.;
- Tyagi, S.
- Article
15
- Microwave Journal, 2018, v. 61, n. 10, p. 90
- Article
16
- Cellulose, 2018, v. 25, n. 2, p. 961, doi. 10.1007/s10570-017-1642-x
- Schenker, Michel;
- Schoelkopf, Joachim;
- Gane, Patrick;
- Mangin, Patrice
- Article
17
- Advanced Energy Materials, 2015, v. 5, n. 16, p. n/a, doi. 10.1002/aenm.201402273
- Cao, Ruiguo;
- Xu, Wu;
- Lv, Dongping;
- Xiao, Jie;
- Zhang, Ji‐Guang
- Article
18
- Physica Status Solidi (B), 2015, v. 252, n. 1, p. 19, doi. 10.1002/pssb.201350410
- Article
19
- International Journal of High Speed Electronics & Systems, 2012, v. 21, n. 1, p. -1, doi. 10.1142/S0129156412500127
- LEPKOWSKI, WILLIAM;
- WILK, SETH J.;
- GHAJAR, M. REZA;
- PARSI, ANURADHA;
- THORNTON, TREVOR J.
- Article