Optimization of a Compression Filter for Super-Rayleigh Resolution of Multiple Coherent Signals with Respect to Delay Time.
- Published in:
- Measurement Techniques, 2016, v. 59, n. 4, p. 410, doi. 10.1007/s11018-016-0981-6
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- Publication type:
- Article
Works matching DE "DELAY faults (Semiconductors)"
Results: 19
1
2
Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits.
- Published in:
- Automation & Remote Control, 2015, v. 76, n. 4, p. 658, doi. 10.1134/S0005117915040104
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- Publication type:
- Article
3
Robust Coupling Delay Test Sets.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 375, doi. 10.1007/s10836-012-5292-5
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- Publication type:
- Article
4
Editorial.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 681, doi. 10.1007/s10836-011-5267-y
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- Publication type:
- Article
5
Controllability of Static CMOS Circuits for Timing Characterization.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 481, doi. 10.1007/s10836-007-5059-6
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- Publication type:
- Article
6
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 1-3, p. 203, doi. 10.1007/s10836-007-5020-8
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- Publication type:
- Article
7
Laser Ignition of Various Pyrotechnic Mixtures - an Experimental Study.
- Published in:
- Propellants, Explosives, Pyrotechnics, 2015, v. 40, n. 5, p. 755, doi. 10.1002/prep.201500080
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- Publication type:
- Article
8
Delay based noise cancelling sturdy MASH delta-sigma modulator.
- Published in:
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4072
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- Publication type:
- Article
9
Recovering cyclic schedules from delay.
- Published in:
- Annals of Operations Research, 1999, v. 92, n. 1-4, p. 143, doi. 10.1023/A:1018978529821
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- Publication type:
- Article
10
Early Detection of Clustered Trojan Attacks on Integrated Circuits Using Transition Delay Fault Model.
- Published in:
- Cryptography (2410-387X), 2023, v. 7, n. 1, p. 4, doi. 10.3390/cryptography7010004
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- Publication type:
- Article
11
COMPRESSED SKEWED-LOAD DELAY TEST GENERATION BASED ON EVOLUTION AND DETERMINISTIC INITIALIZATION OF POPULATIONS.
- Published in:
- Computing & Informatics, 2013, v. 32, n. 2, p. 251
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- Publication type:
- Article
12
Researchers Develop Method to Improve Testing for Small Delay Defects.
- Published in:
- Electronic Device Failure Analysis, 2011, v. 13, n. 2, p. 45
- Publication type:
- Article
13
Providing Reliability of Physical Systems: Fully Delay Testable Logical Circuit Design with Compact Representation of all PDF Test Pairs.
- Published in:
- Russian Physics Journal, 2016, v. 58, n. 9, p. 1321, doi. 10.1007/s11182-016-0650-x
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- Publication type:
- Article
14
Delay testable logical circuit design.
- Published in:
- Russian Physics Journal, 2013, v. 55, n. 11, p. 1370, doi. 10.1007/s11182-013-9969-8
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- Publication type:
- Article
15
An Overview of Data Routing Approaches for Wireless Sensor Networks.
- Published in:
- Sensors (14248220), 2012, v. 12, n. 4, p. 3964, doi. 10.3390/s120403964
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- Publication type:
- Article
16
Methods of Critical Paths Delay Faults Testing in Digital Systems.
- Published in:
- Information Sciences & Technologies: Bulletin of the ACM Slovakia, 2016, v. 8, n. 1, p. 1
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- Publication type:
- Article
17
Modeling and Design of Low-PMD Spun Fibers.
- Published in:
- Fiber & Integrated Optics, 2008, v. 27, n. 4, p. 216, doi. 10.1080/01468030802191841
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- Publication type:
- Article
18
An efficient small-delay faults simulator based on critical path tracing.
- Published in:
- International Journal of Circuit Theory & Applications, 2015, v. 43, n. 8, p. 1015, doi. 10.1002/cta.1990
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- Publication type:
- Article
19
Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm.
- Published in:
- VLSI Design, 2012, p. 1, doi. 10.1155/2012/745861
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- Publication type:
- Article