Works matching DE "DARK currents (Electric)"
1
- Revista Cubana de Física, 2014, v. 31, n. 2, p. 66
- ALMORA-RODRÍGUEZ, O.;
- VAILLANT, L.;
- BOSIO, A.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 7, p. 7693, doi. 10.1007/s10854-016-4755-3
- Li, Pengan;
- Meng, Xianquan
- Article
3
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4566, doi. 10.1007/s10854-016-4332-9
- Peng, Ruiqin;
- Jiao, Shujie;
- Jiang, Dongwei;
- Li, Hongtao;
- Zhao, Liancheng
- Article
4
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4659, doi. 10.1007/s10854-015-2675-2
- Article
5
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1542, doi. 10.1007/s10854-014-1765-x
- Wang, Chao;
- Jiang, Jing;
- Zhang, Chengui;
- Jiang, Yadong;
- Li, Shibin;
- Wu, Zhiming
- Article
6
- Photonics, 2024, v. 11, n. 1, p. 1, doi. 10.3390/photonics11010001
- Guo, Guangtong;
- Chen, Weishuai;
- Zheng, Kaifeng;
- Lv, Jinguang;
- Qin, Yuxin;
- Zhao, Baixuan;
- Zhao, Yingze;
- Chen, Yupeng;
- Gao, Dan;
- Liang, Jingqiu;
- Wang, Weibiao
- Article
8
- Modern Physics Letters B, 2018, v. 32, n. 8, p. 1, doi. 10.1142/S0217984917503584
- Wei Wang;
- Ting Chen;
- Linshu Yan;
- Xiaoyuan Bao;
- Yuanyuan Xu;
- Guang Wang;
- Guanyu Wang;
- Jun Yuan;
- Junfeng Li
- Article
9
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144552
- Bataillon, Clara;
- Perez, Jean-Phillipe;
- Alchaar, Rodolphe;
- Michez, Alain;
- Gilard, Olivier;
- Saint-Pé, Olivier;
- Christol, Philippe
- Article
10
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144566
- Griot, René;
- Vasse, Christophe;
- Arts, Roel;
- Ivanov, Ruslan;
- Höglund, Linda;
- Costard, Eric
- Article
11
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144562
- Braga, Osvaldo M.;
- Delfino, Cristian A.;
- Kawabata, Rudy M. S.;
- Pinto, Luciana D.;
- Vieira, Gustavo S.;
- Pires, Mauricio P.;
- Souza, Patricia L.;
- Marega, Euclydes;
- Carlin, John A.;
- Krishna, Sanjay
- Article
12
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144570
- James, Jonathan Ch.;
- Haran, Terence L.;
- Lane, Sarah E.
- Article
13
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144560
- Hyun-Jin Lee;
- Jun Ho Eom;
- Hyun Chul Jung;
- Ko-Ku Kang;
- Seong Min Ryu;
- Ahreum Jang;
- Jong Gi Kim;
- Young Ho Kim;
- Han Jung;
- Sun Ho Kim;
- Jong Hwa Choi
- Article
14
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144571
- Fraser, Everett D.;
- Jiayi Shao;
- Frensley, Paul W.;
- Barnes, Beau D.;
- Clark, Kevin P.;
- Yung-Chung Kao;
- Pinsukanjana, Paul R.
- Article
15
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144553
- Müller, Raphael;
- Daumer, Volker;
- Hugger, Tsvetelina;
- Kirste, Lutz;
- Luppold, Wolfgang;
- Niemasz, Jasmin;
- Rehm, Robert;
- Stadelmann, Tim;
- Wobrock, Mark;
- Quankui Yang
- Article
16
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144548
- Article
17
- Opto-Electronics Review, 2022, v. 30, n. 2, p. 1, doi. 10.24425/opelre.2022.141596
- Manyk, Tetiana;
- Rutkowski, Jarosław;
- Madejczyk, Paweł;
- Gawron, Waldemar;
- Martyniuk, Piotr
- Article
18
- Optical & Quantum Electronics, 2017, v. 49, n. 4, p. 1, doi. 10.1007/s11082-017-0992-9
- El_Tokhy, Mohamed;
- Mahmoud, Imbaby
- Article
19
- Optical & Quantum Electronics, 2017, v. 49, n. 2, p. 1, doi. 10.1007/s11082-016-0869-3
- Article
20
- Optical & Quantum Electronics, 2017, v. 49, n. 1, p. 1, doi. 10.1007/s11082-016-0829-y
- Martyniuk, P.;
- Gawron, W.;
- Madejczyk, P.;
- Kopytko, M.;
- Grodecki, K.;
- Gomułka, E.
- Article
21
- Instruments & Experimental Techniques, 2017, v. 60, n. 1, p. 149, doi. 10.1134/S0020441216060075
- Semkin, N.;
- Piyakov, A.;
- Vidmanov, A.;
- Telegin, A.
- Article
22
- Instruments & Experimental Techniques, 2014, v. 57, n. 5, p. 564, doi. 10.1134/S0020441214040083
- Muminov, R.;
- Radzhapov, S.;
- Toshmuradov, Yo.;
- Risalieva, Sh.;
- Bekbaev, S.;
- Kurmantaev, A.
- Article
23
- Instruments & Experimental Techniques, 2013, v. 56, n. 5, p. 497, doi. 10.1134/S002044121304012X
- Aleinik, V.;
- Ivanov, A.;
- Kuznetsov, A.;
- Sorokin, I.;
- Taskaev, S.
- Article
24
- PLoS ONE, 2011, v. 6, n. 2, p. 1, doi. 10.1371/journal.pone.0017411
- Vieira, Ana Carolina;
- Reid, Brian;
- Lin Cao;
- Mannis, Mark J.;
- Schwab, Ivan R.;
- Min Zhao
- Article
25
- Semiconductors, 2018, v. 52, n. 12, p. 1564, doi. 10.1134/S1063782618120205
- Samartsev, I. V.;
- Nekorkin, S. M.;
- Zvonkov, B. N.;
- Aleshkin, V. Ya.;
- Dubinov, A. A.;
- Pashenkin, I. J.;
- Dikareva, N. V.;
- Chigineva, A. B.
- Article
26
- Semiconductors, 2014, v. 48, n. 12, p. 1664, doi. 10.1134/S1063782614120070
- Article
27
- Semiconductors, 2014, v. 48, n. 10, p. 1363, doi. 10.1134/S1063782614100212
- Mirsagatov, Sh.;
- Sapayev, I.
- Article
28
- Semiconductors, 2013, v. 47, n. 8, p. 1103, doi. 10.1134/S1063782613080046
- Andreev, I.;
- Serebrennikova, O.;
- Sokolovskii, G.;
- Dudelev, V.;
- Ilynskaya, N.;
- Konovalov, G.;
- Kunitsyna, E.;
- Yakovlev, Yu.
- Article
29
- Semiconductors, 2013, v. 47, n. 5, p. 593, doi. 10.1134/S1063782613050205
- Tagiev, O.;
- Asadullayeva, S.;
- Bachtiyarly, I.;
- Tagiev, K.
- Article
30
- Semiconductors, 2012, v. 46, n. 9, p. 1158, doi. 10.1134/S106378261209014X
- Article
31
- Semiconductors, 2012, v. 46, n. 7, p. 929, doi. 10.1134/S1063782612070044
- Andreev, A.;
- Andreev, V.;
- Kalinovsky, V.;
- Pokrovsky, P.;
- Terukov, E.
- Article
32
- Journal of Electronic Materials, 2019, v. 48, n. 5, p. 2986, doi. 10.1007/s11664-019-07060-6
- Li, Mo;
- Lyu, Yanqiu;
- He, Yingjie;
- Zhu, Xubo;
- Cao, Xiancun
- Article
33
- Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5680, doi. 10.1007/s11664-018-6557-2
- Gravrand, O.;
- Rothman, J.;
- Delacourt, B.;
- Boulard, F.;
- Lobre, C.;
- Ballet, Ph.;
- Santailler, J. L.;
- Cervera, C.;
- Brellier, D.;
- Péré-Laperne, N.;
- Destefanis, V.;
- Kerlain, A.
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5725, doi. 10.1007/s11664-018-6527-8
- Klipstein, P. C.;
- Avnon, E.;
- Benny, Y.;
- Cohen, Y.;
- Fraenkel, R.;
- Gliksman, S.;
- Glozman, A.;
- Hojman, E.;
- Klin, O.;
- Krasovitsky, L.;
- Langof, L.;
- Lukomsky, I.;
- Marderfeld, I.;
- Yaron, N.;
- Nitzani, M.;
- Rappaport, N.;
- Shtrichman, I.;
- Snapi, N.;
- Weiss, E.
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5657, doi. 10.1007/s11664-018-6475-3
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4653, doi. 10.1007/s11664-018-6342-2
- Singh, Anand;
- Pal, Ravinder
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 12, p. 6817, doi. 10.1007/s11664-017-5728-x
- Delacourt, B.;
- Ballet, P.;
- Boulard, F.;
- Ferron, A.;
- Bonnefond, L.;
- Pellerin, T.;
- Kerlain, A.;
- Destefanis, V.;
- Rothman, J.
- Article
38
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3144, doi. 10.1007/s11664-015-3851-0
- Baier, N.;
- Cervera, C.;
- Gravrand, O.;
- Mollard, L.;
- Lobre, C.;
- Destefanis, G.;
- Bourgeois, G.;
- Zanatta, J.P.;
- Boulade, O.;
- Moreau, V.
- Article
39
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 2981, doi. 10.1007/s11664-015-3701-0
- Pinkie, Benjamin;
- Wichman, Adam;
- Bellotti, Enrico
- Article
40
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3303, doi. 10.1007/s11664-013-2733-6
- Ferron, A.;
- Rothman, J.;
- Gravrand, O.
- Article
41
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3288, doi. 10.1007/s11664-013-2728-3
- Hassis, W.;
- Gravrand, O.;
- Rothman, J.;
- Benahmed, S.
- Article
42
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3103, doi. 10.1007/s11664-013-2658-0
- Strong, Roger;
- Kinch, Michael;
- Armstrong, John
- Article
43
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3243, doi. 10.1007/s11664-013-2636-6
- Kinch, M.A.;
- Strong, R.L.;
- Schaake, C.A.
- Article
44
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3309, doi. 10.1007/s11664-013-2737-2
- Martyniuk, P.;
- Gawron, W.;
- Rogalski, A.
- Article
45
- Polymers for Advanced Technologies, 2018, v. 29, n. 8, p. 2230, doi. 10.1002/pat.4332
- Agrawal, Nikhil;
- Ansari, Mohd Zubair;
- Khare, Neeraj;
- Majumdar, Amitava
- Article
46
- Technical Physics, 2014, v. 59, n. 6, p. 879, doi. 10.1134/S1063784214060152
- Lebedeva, N.;
- Usikova, A.;
- Evstropov, V.;
- Lebedev, M.;
- Ulin, V.;
- Lantratov, V.;
- Andreev, V.
- Article
47
- Majlesi Journal of Telecommunication Devices, 2014, v. 3, n. 2, p. 77
- Yousefli, Amir;
- Zavvari, Mahdi;
- Abedi, Kambiz
- Article
48
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 12, p. 1, doi. 10.1007/s00339-017-1344-0
- Gou, Guangyang;
- Dai, Guozhang;
- Wang, Xiaowu;
- Chen, Yang;
- Qian, Chuan;
- Kong, Lingan;
- Sun, Jia;
- Yang, Junliang
- Article
49
- Energies (19961073), 2016, v. 9, n. 6, p. 412, doi. 10.3390/en9060412
- Saleheen, Mesbahus;
- Arnab, Salman M.;
- Kabir, M. Z.
- Article
50
- Environmental Science & Pollution Research, 2023, v. 30, n. 10, p. 25863, doi. 10.1007/s11356-022-23864-2
- Zheng, Chaoqun;
- Gao, Yan;
- Zhu, Jinling;
- Gan, Lin;
- Wang, Mengmeng;
- Zhang, Wen;
- Yang, Shunqing;
- Yang, Liuyan
- Article