Accelerated failure identification sampling for probability analysis of rare events.
- Published in:
- Structural & Multidisciplinary Optimization, 2016, v. 54, n. 1, p. 137, doi. 10.1007/s00158-016-1405-6
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- Publication type:
- Article
Works matching DE "COMPUTERS in failure analysis (Engineering)"
Results: 3
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Review of Defect Localization Techniques for DRAMs.
- Published in:
- Electronic Device Failure Analysis, 2012, v. 14, n. 4, p. 12, doi. 10.31399/asm.edfa.2012-4.p012
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- Publication type:
- Article
3
Failure Analysis: Why Mistakes Are Made and How to Avoid Making One.
- Published in:
- Journal of Failure Analysis & Prevention, 2014, v. 14, n. 6, p. 697, doi. 10.1007/s11668-014-9891-6
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- Publication type:
- Article