Works matching DE "COMPARATOR circuits"
1
- Electronics (2079-9292), 2025, v. 14, n. 11, p. 2144, doi. 10.3390/electronics14112144
- Article
2
- i-Manager's Journal on Electronics Engineering, 2025, v. 15, n. 3, p. 12, doi. 10.26634/jele.15.3.21765
- S., REENU JANE;
- SARANIYA O.
- Article
3
- Quantum Information Processing, 2025, v. 24, n. 5, p. 1, doi. 10.1007/s11128-025-04741-6
- Yuan, Suzhen;
- Li, Xianli;
- Yinxia, Shu;
- Qing, Xianrong;
- Deng, Jermiah D.
- Article
4
- Journal of Circuits, Systems & Computers, 2025, v. 34, n. 10, p. 1, doi. 10.1142/S0218126625502172
- Shah, Payal;
- Mandalapu, Saradadevi;
- Thakker, Rajesh;
- Naik, Amisha
- Article
5
- Applied Sciences (2076-3417), 2025, v. 15, n. 10, p. 5494, doi. 10.3390/app15105494
- Yang, Hongyuan;
- Cheong, Jiahao;
- Liu, Cheng
- Article
6
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 1, p. 15, doi. 10.1134/S1061830919010108
- Shul'gina, Yu. V.;
- Kostina, M. A.;
- Soldatov, A. I.;
- Soldatov, A. A.;
- Sorokin, P. V.
- Article
7
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 7, p. 413, doi. 10.1134/S1061830914070055
- Klikushin, Yu.;
- Koshekov, K.;
- Kobenko, V.;
- Trunin, E.
- Article
8
- Measurement Techniques, 2024, v. 67, n. 3, p. 187, doi. 10.1007/s11018-024-02334-w
- Article
9
- Measurement Techniques, 2018, v. 61, n. 4, p. 373, doi. 10.1007/s11018-018-1436-z
- Belyakov, D. I.;
- Kalabin, V. N.;
- Shifrin, V. Ya.
- Article
10
- Measurement Techniques, 2017, v. 59, n. 10, p. 1125, doi. 10.1007/s11018-017-1103-9
- Snegov, V.;
- Kamenskikh, Yu.;
- Viktorov, I.
- Article
11
- Measurement Techniques, 2016, v. 59, n. 9, p. 929, doi. 10.1007/s11018-016-1069-z
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
12
- Measurement Techniques, 2016, v. 59, n. 9, p. 985, doi. 10.1007/s11018-016-1080-4
- Bubnov, A.;
- Gokova, M.;
- Chetverik, A.
- Article
13
- Measurement Techniques, 2016, v. 59, n. 9, p. 975, doi. 10.1007/s11018-016-1078-y
- Shifrin, V.;
- Kalabin, V.;
- Belyakov, D.
- Article
14
- Measurement Techniques, 2015, v. 57, n. 10, p. 1149, doi. 10.1007/s11018-015-0594-5
- Article
15
- Measurement Techniques, 2014, v. 57, n. 8, p. 860, doi. 10.1007/s11018-014-0549-2
- Bubnov, A.;
- Emashov, V.;
- Chudinov, A.;
- Alpysova, A.
- Article
16
- Measurement Techniques, 2013, v. 56, n. 3, p. 334, doi. 10.1007/s11018-013-0205-2
- Zakharenko, Yu.;
- Kononova, N.;
- Chekirda, K.
- Article
17
- Measurement Techniques, 2013, v. 55, n. 10, p. 1193, doi. 10.1007/s11018-012-0107-8
- Surdu, M.;
- Lameko, A.;
- Surdu, D.;
- Kursin, S.
- Article
18
- Measurement Techniques, 2012, v. 55, n. 7, p. 792, doi. 10.1007/s11018-012-0041-9
- Chernyshev, I.;
- Belyaev, A.;
- Mishagin, K.
- Article
19
- Measurement Techniques, 2012, v. 55, n. 7, p. 816, doi. 10.1007/s11018-012-0045-5
- Surdu, M.;
- Lameko, A.;
- Surdu, D.;
- Kursin, S.
- Article
20
- Measurement Techniques, 2012, v. 55, n. 6, p. 595, doi. 10.1007/s11018-012-0007-y
- Alexandrov, V.;
- Zakharenko, Yu.;
- Kononova, N.;
- Leibengardt, G.;
- Fedorin, V.;
- Chekirda, K.
- Article
21
- Measurement Techniques, 2012, v. 55, n. 5, p. 519, doi. 10.1007/s11018-012-9992-0
- Zakharenko, Yu.;
- Kononova, N.;
- Leibengardt, G.;
- Chekirda, K.
- Article
22
- Measurement Techniques, 2010, v. 53, n. 3, p. 257, doi. 10.1007/s11018-010-9492-z
- Danelyan, A.;
- Machekhin, Yu.
- Article
23
- Measurement Techniques, 2009, v. 52, n. 11, p. 1236, doi. 10.1007/s11018-010-9427-8
- Article
24
- Measurement Techniques, 2009, v. 52, n. 11, p. 1189, doi. 10.1007/s11018-010-9418-9
- Article
25
- Chips, 2024, v. 3, n. 2, p. 153, doi. 10.3390/chips3020007
- Arzate-Palma, Victor H.;
- Rivera-Orozco, David G.;
- Molina Salgado, Gerardo;
- Sandoval-Ibarra, Federico
- Article
26
- Chips, 2024, v. 3, n. 2, p. 182, doi. 10.3390/chips3020008
- Shang, Liuting;
- Lu, Sheng;
- Zhang, Yichen;
- Jung, Sungyong;
- Pan, Chenyun
- Article
27
- Chips, 2023, v. 2, n. 3, p. 173, doi. 10.3390/chips2030011
- Della Sala, Riccardo;
- Centurelli, Francesco;
- Scotti, Giuseppe;
- Palumbo, Gaetano
- Article
28
- Micro & Nano Letters (Wiley-Blackwell), 2019, v. 14, n. 9, p. 947, doi. 10.1049/mnl.2018.5450
- Karmakar, Supriya;
- Gogna, Mukesh;
- Jain, Faquir
- Article
29
- Electronic Science & Technology, 2024, v. 37, n. 9, p. 79, doi. 10.16180/j.cnki.issn1007-7820.2024.09.012
- Article
30
- Advanced Electronic Materials, 2021, v. 7, n. 5, p. 1, doi. 10.1002/aelm.202100117
- Han, Joon‐Kyu;
- Lee, Mun‐Woo;
- Yu, Ji‐Man;
- Choi, Yang‐Kyu
- Article
31
- Journal of Cognitive Neuroscience, 2016, v. 28, n. 7, p. 1052, doi. 10.1162/jocn_a_00950
- Bolognini, Nadia;
- Zigiotto, Luca;
- Souza Carneiro, Maíra Izzadora;
- Vallar, Giuseppe
- Article
32
- Electric Power Components & Systems, 2007, v. 35, n. 12, p. 1331, doi. 10.1080/15325000701426062
- Chaoui, Abdelmadjid;
- Gaubert, Jean Paul;
- Krim, Fateh;
- Champenois, Gérard
- Article
33
- Photonics, 2024, v. 11, n. 7, p. 621, doi. 10.3390/photonics11070621
- Wang, Ju;
- Gao, Ye;
- Yu, Jinlong;
- Cai, Ziheng;
- Luo, Hao;
- Ma, Chuang
- Article
34
- Traitement du Signal, 2024, v. 41, n. 5, p. 2403, doi. 10.18280/ts.410515
- Kantharimuthu, Mahendrakan;
- Selvaraj, Prema;
- Sankar, Harish;
- Brindavanam, Gokulavasan
- Article
35
- International Journal of STEM Education, 2023, v. 10, n. 1, p. 1, doi. 10.1186/s40594-023-00421-y
- Padwick, Annie;
- Dele-Ajayi, Opeyemi;
- Davenport, Carol;
- Strachan, Rebecca
- Article
36
- Theory & Practice of Logic Programming, 2020, v. 20, n. 4, p. 512, doi. 10.1017/S147106842000006X
- BOMANSON, JORI;
- JANHUNEN, TOMI
- Article
37
- SID Symposium Digest of Technical Papers, 2016, v. 47, n. 1, p. 1261, doi. 10.1002/sdtp.10878
- Fan, Jia;
- Wang, Cuicui;
- Lam, Hing-Mo;
- Liao, Congwei;
- Yang, Fangfang;
- Zhang, Min;
- Zhang, Shengdong
- Article
38
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1164, doi. 10.1002/j.2168-0159.2014.tb00303.x
- Kim, Kichan;
- Choi, Keun‐Yeong;
- Choi, Dong‐Hyuk;
- Lee, Hojin
- Article
39
- International Journal of Electronics Letters, 2023, v. 11, n. 4, p. 426, doi. 10.1080/21681724.2022.2117848
- Bodasingi, Nalini;
- Varasala, Krishnateja;
- Saladi, Srinivasu;
- Chalumuri, Appala Naidu;
- Jammu, Bhaskara Rao;
- Veeramachaneni, Sreehari
- Article
40
- International Journal of Electronics Letters, 2018, v. 6, n. 3, p. 272, doi. 10.1080/21681724.2017.1357761
- Sarada, Musala;
- Srinivasulu, Avireni;
- Pal, Dipankar
- Article
41
- Frontiers in Psychology, 2018, p. N.PAG, doi. 10.3389/fpsyg.2018.02102
- Khaw, Mel W.;
- Li, Ziang;
- Woodford, Michael
- Article
42
- Bone Marrow Transplantation, 2014, v. 49, n. 2, p. 168, doi. 10.1038/bmt.2013.107
- Ruutu, T;
- Gratwohl, A;
- de Witte, T;
- Afanasyev, B;
- Apperley, J;
- Bacigalupo, A;
- Dazzi, F;
- Dreger, P;
- Duarte, R;
- Finke, J;
- Garderet, L;
- Greinix, H;
- Holler, E;
- Kröger, N;
- Lawitschka, A;
- Mohty, M;
- Nagler, A;
- Passweg, J;
- Ringdén, O;
- Socié, G
- Article
43
- Journal of Medical Internet Research, 2023, v. 25, n. 1, p. 1, doi. 10.2196/45821
- Persky, Susan;
- Colloca, Luana
- Article
44
- Modern Law Review, 2020, v. 83, n. 3, p. 539, doi. 10.1111/1468-2230.12507
- Article
45
- Journal of Graduate Medical Education, 2021, v. 13, n. 5, p. 654, doi. 10.4300/JGME-D-20-01484.1
- Ong, En Ye;
- Bower, Kelly J.;
- Ng, Louisa
- Article
46
- Advances in Power Electronics, 2014, p. 1, doi. 10.1155/2014/317523
- Lapshev, Stepan;
- Hasan, S. M. Rezaul
- Article
47
- International Review of Automatic Control, 2011, v. 4, n. 5, p. 669
- Article
48
- Journal of Cheminformatics, 2021, v. 13, n. 1, p. 1, doi. 10.1186/s13321-021-00485-4
- Rajan, Kohulan;
- Hein, Jan-Mathis;
- Steinbeck, Christoph;
- Zielesny, Achim
- Article
49
- Journal of Electrical & Computer Engineering, 2024, v. 2024, p. 1, doi. 10.1155/jece/5040240
- Singh, Tejender;
- Tripathi, Suman Lata;
- Bianchi, Domenico
- Article
50
- Australian Journal of Electrical & Electronic Engineering, 2013, v. 10, n. 1, p. 117, doi. 10.7158/E11-069.2013.10.1
- Alagarasan, I.;
- Chandrasekar, S.
- Article