Works matching DE "COMBINATIONAL circuits testing"

Test Vector Optimization Using Pocofan-Poframe Partitioning.

Published in:

Computers, Materials & Continua, 2018, v. 54, n. 3, p. 251, doi. 10.3970/cmc.2018.054.251

By:

• PattunnaRajam, P.;
• korah, Reeba;
• Kalavathy, G. Maria

Publication type:

Article