Works matching DE "CMOS integrated circuits"
1
- Electronics (2079-9292), 2025, v. 14, n. 10, p. 2023, doi. 10.3390/electronics14102023
- Wang, Fangkai;
- Zhang, Xinyi;
- Wang, Xudong;
- Yang, Chenxuan
- Article
2
- Artificial Intelligence Review, 2024, v. 57, n. 12, p. 1, doi. 10.1007/s10462-024-10948-3
- Raikar, Amisha S.;
- Andrew, J;
- Dessai, Pranjali Prabhu;
- Prabhu, Sweta M.;
- Jathar, Shounak;
- Prabhu, Aishwarya;
- Naik, Mayuri B.;
- Raikar, Gokuldas Vedant S.
- Article
3
- Advanced Electronic Materials, 2019, v. 5, n. 9, p. N.PAG, doi. 10.1002/aelm.201800876
- Sheng, Xia;
- Graves, Catherine E.;
- Kumar, Suhas;
- Li, Xuema;
- Buchanan, Brent;
- Zheng, Le;
- Lam, Sity;
- Li, Can;
- Strachan, John Paul
- Article
4
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 540, doi. 10.1002/j.2168-0159.2014.tb00141.x
- Kim, Hyeon‐June;
- Jo, Dong‐Shin;
- Yang, Jun‐Hyeok;
- Ryu, Seung‐Tak
- Article
5
- International Journal of Electronics Letters, 2018, v. 6, n. 4, p. 481, doi. 10.1080/21681724.2017.1387936
- Al-Absi, Munir A.;
- Abuelma'atti, Muhammad Taher;
- Elhassan, Mohanad;
- Dhar, Sagar
- Article
6
- Journal of Nanotechnology, 2018, p. 1, doi. 10.1155/2018/2934268
- Singar, Sumitra;
- Joshi, N. K.;
- Ghosh, P. K.
- Article
7
- Modern Physics Letters B, 2017, v. 31, n. 32, p. -1, doi. 10.1142/S021798491750302X
- Yin, Liang;
- Qin, Yao;
- Liu, Xiao-Wei
- Article
8
- International Journal of Simulation: Systems, Science & Technology, 2015, v. 16, n. 6, p. 13.1, doi. 10.5013/IJSSST.a.16.06.13
- Bhatnagar, Vipul;
- Kumar, Pradeep;
- Pandey, Sujata
- Article
9
- International Journal of Simulation: Systems, Science & Technology, 2013, v. 14, n. 3, p. 18
- Farhadian, Marjan;
- Rastgari, Zahra;
- Nabovati, Hooman
- Article
10
- Journal of Electronic Testing, 2018, v. 34, n. 1, p. 27, doi. 10.1007/s10836-018-5707-z
- Yu, Yang;
- Liang, Jie;
- Yang, Zhiming;
- Peng, Xiyuan
- Article
11
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 125, doi. 10.1007/s10836-016-5634-9
- Jothin, R;
- Vasanthanayaki, C.
- Article
12
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 37, doi. 10.1007/s10836-016-5635-8
- Petrosyants, Konstantin;
- Sambursky, Lev;
- Kharitonov, Igor;
- Lvov, Boris
- Article
13
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 275, doi. 10.1007/s10836-015-5529-1
- Andjelković, Marko;
- Petrović, Vladimir;
- Stamenković, Zoran;
- Ristić, Goran;
- Jovanović, Goran
- Article
14
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 329, doi. 10.1007/s10836-015-5526-4
- Yu, Xiao;
- Tian, Rong;
- Xu, Wen;
- Shi, Zheng
- Article
15
- Journal of Microwaves, Optoelectronics & Electromagnetic Applications, 2018, v. 17, n. 3, p. 403, doi. 10.1590/2179-10742018v17i31215
- Neto, José Fontebasso;
- Moreira, Luiz Carlos;
- Correra, Fatima Salete
- Article
16
- Journal of Electrical & Computer Engineering, 2017, p. 1, doi. 10.1155/2017/8207104
- Bajpai, Pratibha;
- Pandey, Neeta;
- Gupta, Kirti;
- Bagga, Shrey;
- Panda, Jeebananda
- Article
17
- Journal of Electrical & Computer Engineering, 2017, p. 1, doi. 10.1155/2017/8245181
- Bhatia, Veepsa;
- Pandey, Neeta
- Article
18
- Journal of Electrical & Computer Engineering, 2014, p. 1, doi. 10.1155/2014/410758
- Article
19
- Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/897631
- Pandey, Neeta;
- Paul, Sajal K.
- Article
20
- Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/670508
- Gupta, Kirti;
- Sridhar, Ranjana;
- Chaudhary, Jaya;
- Pandey, Neeta;
- Gupta, Maneesha
- Article
21
- Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/361910
- Yusaku Ito;
- Kenichi Okada;
- Kazuya Masu
- Article
22
- Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/361384
- Pandey, Neeta;
- Paul, Sajal K.
- Article
23
- EE: Evaluation Engineering, 2020, v. 59, n. 2, p. 17
- Article
24
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2679, doi. 10.1007/s11664-015-3777-6
- Selvaraj, S.;
- Kamath, A.;
- Wang, W.;
- Chen, Z.;
- Win, K.;
- Phua, T.;
- Lo, G.
- Article
25
- Astronomische Nachrichten, 2023, v. 344, n. 10, p. 1, doi. 10.1002/asna.20230102
- Pichon, Thibault;
- Boucher, Luc
- Article
26
- IETE Technical Review, 2019, v. 36, n. 5, p. 484, doi. 10.1080/02564602.2018.1507766
- Bai, Chunfeng;
- Wu, Jianhui;
- Deng, Xiaoying
- Article
27
- Majlesi Journal of Telecommunication Devices, 2016, v. 5, n. 2, p. 51
- Khodabakhshi, S.;
- Ostovarzadeh, M. H.;
- Hakimi, A.
- Article
28
- Majlesi Journal of Telecommunication Devices, 2016, v. 5, n. 2, p. 57
- Pourgholam, Masoud;
- Ganji, Bahram A.
- Article
29
- Radioengineering, 2018, v. 27, n. 2, p. 532, doi. 10.13164/re.2018.0532
- REBELLI, Shashank;
- NISTALA, Bheema Rao
- Article
30
- Radioengineering, 2017, p. 263, doi. 10.13164/re.2017.0263
- BAUTISTA-CASTILLO, Alejandro Israel;
- ROCHA-PEREZ, Jose Miguel;
- DIAZ-SANCHEZ, Alejandro;
- LEMUS-LOPEZ, Javier;
- SANCHEZ-GASPARIANO, Luis Abraham
- Article
31
- Electronics & Electrical Engineering, 2022, v. 28, n. 5, p. 45, doi. 10.5755/j02.eie.31345
- Article
32
- Electronics & Electrical Engineering, 2017, v. 23, n. 5, p. 46, doi. 10.5755/j01.eie.23.5.19242
- Krunic, Momcilo V.;
- Povazan, Ivan;
- Kovacevic, Jelena V.;
- Krunic, Vlado M.
- Article
33
- Electronics & Electrical Engineering, 2015, v. 21, n. 1, p. 37, doi. 10.5755/j01.eee.21.1.4548
- Charlamov, Jevgenij;
- Navickas, Romualdas
- Article
34
- EURASIP Journal on Wireless Communications & Networking, 2020, v. 2020, n. 1, p. 1, doi. 10.1186/s13638-020-01741-1
- Gonzalez-Jimenez, José Luis;
- Dehos, Cédric;
- Cassiau, Nicolas;
- Siligaris, Alexandre;
- Clemente, Antonio;
- D'Errico, Rafaelle;
- Savin, Valentin;
- Durand, Yves;
- De Domenico, Antonio;
- Noguet, Dominique
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 226, doi. 10.1049/el.2016.4348
- Wu, Y.-L.;
- Yang, C.-H.;
- Wu, C.-H.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1660, doi. 10.1049/el.2016.2622
- Hanjun Jiang;
- Zheyao Wang;
- Shujie Yang;
- Heng Liu;
- Zhihua Wang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1181, doi. 10.1049/el.2016.0532
- Zengqi Wang;
- Zhiqun Li;
- Guoxiao Cheng;
- Lei Luo;
- Yuwenyuan Gao
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1175, doi. 10.1049/el.2016.0880
- Chiou, H.-K.;
- Chien, K.-H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1155, doi. 10.1049/el.2015.4001
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 11, p. 908, doi. 10.1049/el.2016.0084
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1758, doi. 10.1049/el.2015.1559
- Xiao Zhao;
- Huajun Fang;
- Tong Ling;
- Jun Xu
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1754, doi. 10.1049/el.2015.2235
- D'Angelo, R.;
- Sonkusale, S.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1736, doi. 10.1049/el.2015.1933
- Kmon, P.;
- Grybos, P.;
- Zoladz, M.;
- Lisicka, A.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 8, p. 619, doi. 10.1049/el.2014.4472
- Young-Kyun Cho;
- Bong Hyuk Park
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 8, p. 595, doi. 10.1049/el.2015.0092
- Quang Nguyen;
- Myungryeol Park;
- Youngsu Kim;
- Bien, Franklin
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 14, p. 15, doi. 10.1049/el.2014.0528
- Trung-Sinh Dang;
- Bomson Lee;
- Sang-Woong Yoon
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 13, p. 921, doi. 10.1049/el.2014.0920
- Junjie Lu;
- Tan Yang;
- Jahan, M. S.;
- Holleman, J.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 8, p. 585, doi. 10.1049/el.2014.0372
- Jabeur, K.;
- Di Pendina, G.;
- Prenat, G.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 6, p. 432, doi. 10.1049/el.2013.4181
- Article