Works matching DE "CMOS image sensors"
1
- Electronics (2079-9292), 2025, v. 14, n. 10, p. 1971, doi. 10.3390/electronics14101971
- Rogi, Yuki;
- Hagizaki, Manami;
- Oyama, Tatsuya;
- Ogawa, Hiroaki;
- Yoshida, Kota;
- Fujino, Takeshi;
- Okura, Shunsuke
- Article
2
- Sensors (14248220), 2025, v. 25, n. 10, p. 3219, doi. 10.3390/s25103219
- Lee, Suhyeon;
- Yun, Yu Chan;
- Heu, Seung Min;
- Lee, Kyu Hyun;
- Lee, Seung Joon;
- Lee, Kyungmin;
- Moon, Jiin;
- Lim, Hyuna;
- Jang, Taeun;
- Song, Minkyu;
- Kim, Soo Youn
- Article
3
- Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4421, doi. 10.1007/s11664-024-11138-1
- Lhostis, S.;
- Ayoub, B.;
- Sart, C.;
- Moreau, S.;
- Souchier, E.;
- Gusmao Cacho, M. G.;
- Deloffre, E.;
- Mermoz, S.;
- Rey, C.;
- Le Roux, F.;
- Aybeke, E.;
- Gallois-Garreignot, S.;
- Frémont, H.;
- Tournier, A.
- Article
4
- Wireless Personal Communications, 2024, v. 137, n. 2, p. 893, doi. 10.1007/s11277-024-11403-w
- Singh, Preeti;
- Gupta, Maneesha;
- Aggarwal, Bhawna
- Article
5
- Measurement Techniques, 2023, v. 65, n. 12, p. 909, doi. 10.1007/s11018-023-02177-x
- Nebavskii, V. A.;
- Starikov, R. S.
- Article
6
- Chips, 2025, v. 4, n. 1, p. 8, doi. 10.3390/chips4010008
- Chen, Jingyang;
- Chen, Nanbo;
- Wang, Zhe;
- Dou, Runjiang;
- Liu, Jian;
- Wu, Nanjian;
- Liu, Liyuan;
- Feng, Peng;
- Wang, Gang
- Article
7
- Journal of Signal Processing (1342-6230), 2024, v. 28, n. 6, p. 301, doi. 10.2299/jsp.28.301
- Yu Osuka;
- Kota Yoshida;
- Shunsuke Okura
- Article
8
- Bioengineering (Basel), 2024, v. 11, n. 9, p. 912, doi. 10.3390/bioengineering11090912
- Abbasi, Reza;
- Hu, Xinyue;
- Zhang, Alain;
- Dummer, Isabelle;
- Wachsmann-Hogiu, Sebastian
- Article
9
- Photonics, 2024, v. 11, n. 4, p. 293, doi. 10.3390/photonics11040293
- Nguyen, Quan Dinh;
- Nguyen, Nam Hoang
- Article
10
- Photonics, 2023, v. 10, n. 7, p. 819, doi. 10.3390/photonics10070819
- Lu, Changzheng;
- Liu, Changhua;
- Shao, Meng;
- Wu, Zhiyong;
- Jiang, Chun;
- Cao, Jingtai;
- Chen, Tao
- Article
11
- Traitement du Signal, 2023, v. 40, n. 3, p. 1163, doi. 10.18280/ts.400332
- Palani, Vinayagam;
- Thanarajan, Tamilvizhi;
- Krishnamurthy, Anand;
- Rajendran, Surendran
- Article
12
- Traitement du Signal, 2023, v. 40, n. 2, p. 693, doi. 10.18280/ts.400228
- Palani, Vinayagam;
- Alharbi, Meshal;
- Alshahrani, Mohammed;
- Rajendran, Surendran
- Article
13
- Acta Technica Corviniensis - Bulletin of Engineering, 2012, v. 5, n. 3, p. 61
- VAKILIAN, Keyvan Asefpour;
- MASSAH, Jafar
- Article
14
- Journal of Medical Engineering & Technology, 2023, v. 47, n. 4, p. 262, doi. 10.1080/03091902.2023.2198436
- Article
15
- Earth Science Informatics, 2014, v. 7, n. 2, p. 83, doi. 10.1007/s12145-014-0152-8
- Scaioni, M.;
- Barazzetti, L.;
- Giussani, A.;
- Previtali, M.;
- Roncoroni, F.;
- Alba, M.
- Article
16
- American Entomologist, 2024, v. 70, n. 1, p. 4, doi. 10.1093/ae/tmae020
- Article
17
- Optical & Quantum Electronics, 2023, v. 55, n. 7, p. 1, doi. 10.1007/s11082-023-04860-3
- Suharwerdi, Mohsin;
- Qazi, Gausia
- Article
18
- Optical & Quantum Electronics, 2019, v. 51, n. 10, p. N.PAG, doi. 10.1007/s11082-019-2037-z
- Mu, Yusong;
- Jiang, Jiaqi;
- Ding, Ning;
- Ni, Qiliang;
- Chang, Yuchun
- Article
19
- Optical & Quantum Electronics, 2017, v. 49, n. 5, p. 1, doi. 10.1007/s11082-017-1028-1
- Jamshidifar, Mehran;
- Bolívar, Peter
- Article
20
- Photonics, 2022, v. 9, n. 5, p. 307, doi. 10.3390/photonics9050307
- Wang, Ke;
- Peng, Chengxiang;
- Hou, Zuoxun
- Article
21
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-09594-y
- Mennel, Lukas;
- Polyushkin, Dmitry K.;
- Kwak, Dohyun;
- Mueller, Thomas
- Article
22
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-08037-y
- Kim, Cheolsun;
- Ni, Pavel;
- Lee, Kang Ryeol;
- Lee, Heung-No
- Article
23
- PLoS ONE, 2014, v. 9, n. 1, p. 1, doi. 10.1371/journal.pone.0084614
- Beier, Hope T.;
- Ibey, Bennett L.
- Article
24
- Journal of Sensors, 2021, p. 1, doi. 10.1155/2021/6651642
- Zhang, Xiaowei;
- Fan, Wei;
- Xi, Jianxiong;
- He, Lenian
- Article
25
- EE: Evaluation Engineering, 2018, v. 57, n. 4, p. 32
- Article
26
- Welding International, 2015, v. 29, n. 3, p. 197, doi. 10.1080/09507116.2014.932976
- Ramos, Esdras Godinho;
- de Carvalho, Guilherme Caribé;
- Absi Alfaro, Sadek Crisóstomo
- Article
27
- Analytical & Bioanalytical Chemistry, 2023, v. 415, n. 28, p. 6975, doi. 10.1007/s00216-023-04824-2
- Boottanun, Patcharaporn;
- Nagai-Okatani, Chiaki;
- Nagai, Misugi;
- Ungkulpasvich, Umbhorn;
- Yamane, Shinjiro;
- Yamada, Masao;
- Kuno, Atsushi
- Article
28
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2019, v. 41, n. 2, p. 263, doi. 10.15407/mfint.41.02.0263
- Cherepanska, I.;
- Bezvesilna, O.;
- Koval, Yu.;
- Sazonov, A.
- Article
29
- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-56224-w
- Article
30
- Radioengineering, 2018, v. 27, n. 2, p. 519, doi. 10.13164/re.2018.0519
- BASHIR, Mudasir;
- PATRI, Sreehari RAO;
- KRISHNAPRASAD, K. S. R.
- Article
31
- Frontiers in Neuroscience, 2021, p. 1, doi. 10.3389/fnins.2021.667932
- Pakpuwadon, Thanet;
- Sasagawa, Kiyotaka;
- Guinto, Mark Christian;
- Ohta, Yasumi;
- Haruta, Makito;
- Takehara, Hironari;
- Tashiro, Hiroyuki;
- Ohta, Jun
- Article
32
- Materials & Corrosion / Werkstoffe und Korrosion, 2025, v. 76, n. 1, p. 188, doi. 10.1002/maco.202414564
- Maxa, Jacob;
- Nowottnick, Mathias
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 8, p. 492, doi. 10.1049/el.2017.3834
- Leñero-Bardallo, J. A.;
- García-Pacheco, F. J.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 16, doi. 10.1049/el.2016.3706
- Kim, M.-K.;
- Hong, S.-K.;
- Gou, J.;
- Kwon, O.-K.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1778, doi. 10.1049/el.2015.1924
- Liu, Z.;
- Park, T.;
- Park, H. S.;
- Kim, N. S.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1375, doi. 10.1049/el.2014.2272
- Davidovic, M.;
- Seiter, J.;
- Hofbauer, M.;
- Gaberl, W.;
- Schidl, S.;
- Zimmermann, H.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 851, doi. 10.1049/el.2014.0765
- Hayami, H.;
- Ishii, Y.;
- Sasagawa, K.;
- Noda, T.;
- Tokuda, T.;
- Ohta, J.
- Article
38
- Batteries, 2019, v. 5, n. 4, p. 1, doi. 10.3390/batteries5040066
- Meyer, Jan;
- Nedjalkov, Antonio;
- Pichler, Elke;
- Kelb, Christian;
- Schade, Wolfgang
- Article
39
- Chinese Journal of Liquid Crystal & Displays, 2021, v. 36, n. 2, p. 1, doi. 10.37188/CJLCD.2020-0176
- Article
40
- Scientific Reports, 2015, p. 7708, doi. 10.1038/srep07708
- Lee, Kwang-Hee;
- Bulliard, Xavier;
- Satoh, Ryu-Ichi;
- Ro, Takkyun;
- Lim, Seon-Jeong;
- Jin, Yong Wan;
- Im, Dongmo;
- Jung, Jungkyu;
- Lee, Myungwon;
- Leem, Dong-Seok;
- Kim, Kyu-Sik;
- Heo, Chul-Joon;
- Yagi, Tadao;
- Lee, Sangyoon;
- Sul, Sangchul;
- Na, Kyoungwon;
- Lee, Tae-Yon;
- Park, Kyung-Bae;
- Lee, Gae Hwang;
- Han, Moon Gyu
- Article
41
- Nanomaterials (2079-4991), 2024, v. 14, n. 23, p. 1973, doi. 10.3390/nano14231973
- Mu, Hua;
- Zhang, Yu;
- Liang, Zhenyu;
- Gao, Haoqi;
- Xu, Haoli;
- Wang, Bingwen;
- Wang, Yangyang;
- Yang, Xing
- Article
42
- Nanomaterials (2079-4991), 2024, v. 14, n. 13, p. 1066, doi. 10.3390/nano14131066
- Jeong, Ui-Hyun;
- Park, Joo-Hyeong;
- Choi, Ji-Ho;
- Lee, Woo-Guk;
- Park, Jea-Gun
- Article
43
- Nanomaterials (2079-4991), 2023, v. 13, n. 4, p. 731, doi. 10.3390/nano13040731
- An, Jehyun;
- Choi, Kyeongkeun;
- Park, Jongseo;
- Kang, Bohyeon;
- You, Hyunseo;
- Ahn, Sungmin;
- Baek, Rockhyun
- Article
44
- IETE Journal of Research, 2019, v. 65, n. 2, p. 139, doi. 10.1080/03772063.2019.1587882
- Article
45
- IETE Journal of Research, 2019, v. 65, n. 2, p. 172, doi. 10.1080/03772063.2017.1417750
- Tiwari, Ashish;
- Talwekar, R. H.
- Article
46
- Journal of Circuits, Systems & Computers, 2022, v. 31, n. 1, p. 1, doi. 10.1142/S0218126622500050
- Naghieh, Pedram;
- Rahiminejad, Ehsan
- Article
47
- Journal of Circuits, Systems & Computers, 2018, v. 27, n. 2, p. -1, doi. 10.1142/S0218126618500275
- Habibi, Mehdi;
- Akbari, Khatereh;
- Mokhtari, Marzieh;
- Moallem, Peyman
- Article
48
- Journal of Circuits, Systems & Computers, 2015, v. 24, n. 4, p. -1, doi. 10.1142/S0218126615500541
- Xu, Jiangtao;
- Yu, Jing;
- Huang, Fujun;
- Nie, Kaiming
- Article
49
- Journal of Integrated Circuits & Systems, 2017, v. 12, n. 1, p. 47, doi. 10.29292/jics.v12i1.450
- Souza, R. A.;
- Ventura, L. G. M.;
- Martins, A. R. S.;
- de Lima Monteiro, D. W.;
- Salles, L. P.
- Article
50
- Multimedia Tools & Applications, 2015, v. 74, n. 5, p. 1577, doi. 10.1007/s11042-013-1442-8
- Park, Jongsu;
- Oh, Seung-Ho;
- Lee, Yong-Surk
- Article