ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 305, doi. 10.1007/s10836-017-5642-4
- By:
- Publication type:
- Article
Works matching DE "CIRCUIT reliability"
Results: 12
1
2
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 37, doi. 10.1007/s10836-016-5635-8
- By:
- Publication type:
- Article
3
Fast and Automated Electromigration Analysis for CMOS RF PA Design.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 133, doi. 10.1007/s10836-016-5639-4
- By:
- Publication type:
- Article
4
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 25, doi. 10.1007/s10836-017-5640-6
- By:
- Publication type:
- Article
5
DEVELOPMENT OF THE METHOD OF PREDICTION PARAMETER OF RELIABILITY CHEMICAL CURRENT SOURCES OPERATING IN A "SESSION" MODE.
- Published in:
- Reliability: Theory & Applications, 2012, v. 7, n. 4, p. 90
- By:
- Publication type:
- Article
6
Experimental Study on Strain Reliability of Embroidered Passive UHF RFID Textile Tag Antennas and Interconnections.
- Published in:
- Journal of Engineering (2314-4912), 2017, p. 1, doi. 10.1155/2017/8493405
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- Publication type:
- Article
7
Evaluation of Inverter Reliability Performance Due to Negative Bias Temperature Instability (NBTI) Effects in Advance CMOS Technology Nodes.
- Published in:
- Pertanika Journal of Science & Technology, 2017, v. 25, n. S, p. 295
- By:
- Publication type:
- Article
8
A New High-Speed Multi-Layer Three-Bits Counter Design in Quantum-Dot Cellular Automata Technology.
- Published in:
- Journal of Electrical & Computer Engineering Innovations (JECEI), 2024, v. 12, n. 1, p. 235, doi. 10.22061/jecei.2023.9955.667
- By:
- Publication type:
- Article
9
Design of Precision Dimming System Controller with Low Harmonic Controlled by the Mobile Phone.
- Published in:
- Research & Exploration in Laboratory, 2013, v. 32, n. 12, p. 87
- By:
- Publication type:
- Article
10
PROBABILISTIC TRANSFER MATRIX WITH MIXED BINARY-DECIMAL CODING FOR LOGIC CIRCUIT RELIABILITY ANALYSIS.
- Published in:
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 8, p. -1, doi. 10.1142/S0218126613500643
- By:
- Publication type:
- Article
11
A Novel Mechanical Fault Feature Selection and Diagnosis Approach for High-Voltage Circuit Breakers Using Features Extracted without Signal Processing.
- Published in:
- Sensors (14248220), 2019, v. 19, n. 2, p. 288, doi. 10.3390/s19020288
- By:
- Publication type:
- Article
12
A 5.25-V-tolerant bidirectional I/O circuit in a 28-nm CMOS process.
- Published in:
- International Journal of Circuit Theory & Applications, 2015, v. 43, n. 6, p. 822, doi. 10.1002/cta.1981
- By:
- Publication type:
- Article