Works matching DE "CERAMIC metals"
1
- Water (20734441), 2025, v. 17, n. 11, p. 1671, doi. 10.3390/w17111671
- Hu, Yangyang;
- Zhang, Lijie;
- Liu, Xiaobing;
- Zeng, Yongzhong;
- Pang, Jiayang;
- Li, Tianlin;
- Ma, Yuanjiang;
- Wang, Zhongquan;
- Gan, Longchao;
- Huang, Dong
- Article
2
- Kinetics & Catalysis, 2025, v. 66, n. 1, p. 76, doi. 10.1134/S0023158424601864
- Dokuchits, E. V.;
- Tikhov, S. F.;
- Valeev, K. R.;
- Kardash, T. Yu.;
- Salanov, A. N.;
- Lisitsyn, A. S.;
- Yakovlev, I. V.;
- Lapina, O. B.;
- Minyukova, T. P.
- Article
3
- Proceedings of the Estonian Academy of Sciences, 2025, v. 74, n. 2, p. 170, doi. 10.3176/proc.2025.2.16
- Pampori, Tabeen Halawat;
- Kolnes, Märt;
- Juhani, Kristjan;
- Tarraste, Marek;
- Kübarsepp, Jakob
- Article
4
- Crystals (2073-4352), 2025, v. 15, n. 5, p. 479, doi. 10.3390/cryst15050479
- Zhang, Yunhao;
- Zhang, Houan;
- Qiao, Dongxu;
- Tao, Xin;
- Xia, Peng;
- Gu, Siyong
- Article
5
- Revista Cubana de Física, 2022, v. 39, n. 2, p. 70
- ROSALES, J.;
- FRANQOIS, J. L.;
- GARCÍA, C.
- Article
6
- Surface Engineering, 2021, v. 37, n. 6, p. 722, doi. 10.1080/02670844.2020.1787021
- Wang, Qianzhi;
- Jin, Xuxin;
- Ding, Yunshi;
- Zhou, Fei
- Article
7
- Surface Engineering, 2017, v. 33, n. 10, p. 767, doi. 10.1080/02670844.2016.1214407
- Article
8
- Surface Engineering, 2016, v. 32, n. 10, p. 713, doi. 10.1179/1743294415Y.0000000031
- Ang, A. S. M.;
- Howse, H.;
- Wade, S. A.;
- Berndt, C. C.
- Article
9
- Surface Engineering, 2016, v. 32, n. 8, p. 624, doi. 10.1080/02670844.2016.1145377
- Surzhenkov, A.;
- Antonov, M.;
- Goljandin, D.;
- Kulu, P.;
- Viljus, M.;
- Traksmaa, R.;
- Mere, A.
- Article
10
- Surface Engineering, 2016, v. 32, n. 3, p. 229, doi. 10.1179/1743294415Y.0000000015
- Kumarasamy, M.;
- Natarajan, S.
- Article
11
- Surface Engineering, 2014, v. 30, n. 12, p. 893, doi. 10.1179/1743294414Y.0000000328
- Shao, Z.;
- Kong, B.;
- Zhao, Y.;
- Cai, Z.
- Article
12
- Surface Engineering, 2013, v. 29, n. 4, p. 296, doi. 10.1179/1743294412Y.0000000094
- Li, F Q;
- Li, L Q;
- Chen, Y B
- Article
13
- Surface Engineering, 2009, v. 25, n. 4, p. 295, doi. 10.1179/026708408X370258
- Wang, H. T.;
- Zhang, S. Q.;
- Huang, J. H.;
- Zhu, J. L.;
- Zhang, H.
- Article
14
- Surface Engineering, 2005, v. 21, n. 5/6, p. 352, doi. 10.1179/174329305X64312
- Darque-Ceretti, E.;
- Hélary, D.;
- Bouquillon, A.;
- Aucouturier, M.
- Article
15
- Surface Engineering, 2004, v. 20, n. 5, p. 360, doi. 10.1179/026708404225014997
- Jagdheesh, R.;
- Sastikumar, D.;
- Mudali, U. Kamachi;
- Nath, A.K.
- Article
16
- Ingeniería y Desarrollo, 2011, v. 1, n. 29, p. 61
- Hernández González, Luis W.;
- Pérez Rodríguez, Roberto;
- Dumitrescu, Luminita;
- Zambrano Robledo, Patricia C.;
- Guerrero Mata, Martha P.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 43, doi. 10.1007/s10854-016-5490-5
- Lin, Kaifan;
- Kuo, Dong-Hau
- Article
18
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5422, doi. 10.1007/s10854-016-4444-2
- Zhang, Hao;
- Wang, Xiuyu;
- Cheng, Qiang;
- Ma, Xiaopin;
- Li, Mingxiu;
- Zhang, Ping;
- Zhao, Yonggui
- Article
19
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 113, doi. 10.1007/s10854-014-2371-7
- Mahmood, Asad;
- Iqbal, Yaseen;
- Ullah, Asad
- Article
20
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 128, doi. 10.1007/s10854-014-2373-5
- Liu, Fei;
- Yuan, Changlai;
- Liu, Xinyu;
- Chen, Guohua;
- Zhou, Changrong;
- Qu, Jingjing
- Article
21
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 134, doi. 10.1007/s10854-014-2374-4
- Wang, Zhuo;
- Li, Hai;
- Zhang, Liang;
- Wen, Yong;
- Pu, Yong
- Article
22
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 217, doi. 10.1007/s10854-014-2386-0
- Cao, Gang;
- Wu, Shihua;
- Shi, Feng
- Article
23
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 162, doi. 10.1007/s10854-014-2378-0
- Wang, Min-Jia;
- Yang, Hui;
- Zhang, Qi-Long;
- Yu, Dan;
- Hu, Liang;
- Lin, Zhi-Sheng;
- Zhang, Zi-Shan
- Article
24
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 168, doi. 10.1007/s10854-014-2379-z
- Park, Jong-H.;
- Nahm, Choon-W.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 300, doi. 10.1007/s10854-014-2399-8
- Tang, Bin;
- Fang, Zi-xuan;
- Li, Hao;
- Liu, Lin;
- Zhang, Shu-ren
- Article
26
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 322, doi. 10.1007/s10854-014-2403-3
- Cai, Wei;
- Fu, Chunlin;
- Chen, Gang;
- Gao, Rongli;
- Deng, Xiaoling
- Article
27
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 398, doi. 10.1007/s10854-014-2413-1
- Ma, Yan;
- Wang, Xitang;
- Wang, Zhoufu;
- Liu, Hao;
- Wang, Zhuo;
- Yang, Chengyan;
- Zou, Qian;
- Zeng, Wenwu
- Article
28
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 405, doi. 10.1007/s10854-014-2414-0
- Chen, Hetuo;
- Tang, Bin;
- Gao, Anqi;
- Duan, Shuxin;
- Yang, Han;
- Li, Yingxiang;
- Li, Hao;
- Zhang, Shuren
- Article
29
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 424, doi. 10.1007/s10854-014-2416-y
- Zhou, Lan;
- Tang, Bin;
- Zhang, Shuren
- Article
30
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 515, doi. 10.1007/s10854-014-2429-6
- Hu, Changzheng;
- Sun, Zhen;
- Zhu, Qihua;
- Fang, Liang;
- Liu, Laijun
- Article
31
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 530, doi. 10.1007/s10854-014-2431-z
- Sati, Prakash;
- Kumar, Manoj;
- Chhoker, Sandeep
- Article
32
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 571, doi. 10.1007/s10854-014-2436-7
- Li, Hao;
- Tang, Bin;
- Li, Yingxiang;
- Qing, Zhenjun;
- Chen, Hetuo;
- Zhang, Shuren
- Article
33
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3318, doi. 10.1007/s10854-014-2020-1
- Li, Hao;
- Tang, Bin;
- Zhang, Shuren;
- Li, Yingxiang;
- Qing, Zhenjun;
- Yang, Han;
- Chen, Hetuo;
- Wang, Chang
- Article
34
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3504, doi. 10.1007/s10854-014-2046-4
- Zhang, Yonggang;
- Zhang, Baolin
- Article
35
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3358, doi. 10.1007/s10854-014-2026-8
- Lu, Xuepeng;
- Zheng, Yong;
- Dong, Zuowei;
- Zhang, Wenyu;
- Huang, Qi
- Article
36
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3601, doi. 10.1007/s10854-014-2062-4
- Wang, Wei;
- Tang, Linjiang;
- Bai, Wangfeng;
- Shen, Bo;
- Zhai, Jiwei
- Article
37
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3427, doi. 10.1007/s10854-014-2035-7
- Badapanda, T.;
- Sarangi, S.;
- Behera, B.;
- Anwar, S.;
- Sinha, T.;
- Ranjan, R.;
- Luz, G.;
- Longo, E.;
- Cavalcante, L.
- Article
38
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3301, doi. 10.1007/s10854-014-2018-8
- Wang, Jingjing;
- Zhu, Jianfeng;
- Zhou, Yong;
- Wang, Fen
- Article
39
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3532, doi. 10.1007/s10854-014-2051-7
- Yadav, Avadhesh;
- Gautam, C.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3396, doi. 10.1007/s10854-014-2031-y
- He, Xinhua;
- Wang, Bin;
- Fu, Xiaoyi;
- Chen, Zhiwu
- Article
41
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3403, doi. 10.1007/s10854-014-2032-x
- Wang, Li;
- Zhang, Han;
- Leng, Yan;
- Shi, Feng;
- Jing, Xiping
- Article
42
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3295, doi. 10.1007/s10854-014-2017-9
- Article
43
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1505, doi. 10.1007/s10854-014-1760-2
- Chen, Weina;
- Fan, Huiqing;
- Long, Changbai;
- Lei, Shenhui
- Article
44
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1480, doi. 10.1007/s10854-014-1755-z
- Zhou, Huanfu;
- He, Fen;
- Chen, Xiuli;
- Chen, Jie;
- Fang, Liang
- Article
45
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1547, doi. 10.1007/s10854-014-1766-9
- Liu, Yang;
- Chen, Qingrun;
- Zhao, Xuguang
- Article
46
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1534, doi. 10.1007/s10854-014-1764-y
- Wan, Yang;
- Li, Ying;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Xu, Chenggang;
- Lin, Dunmin
- Article
47
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1280, doi. 10.1007/s10854-014-1722-8
- Liu, Wenfeng;
- Tsukada, Shinya;
- Akishige, Yukikuni
- Article
48
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1348, doi. 10.1007/s10854-014-1733-5
- Mohapatra, Aparajita;
- Das, Piyush;
- Choudhary, R.
- Article
49
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1400, doi. 10.1007/s10854-014-1741-5
- Zhang, Bo;
- Zhao, Qing;
- Chang, Aimin;
- Liu, Yin;
- Li, Yiyu;
- Wu, Yiquan
- Article
50
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1162, doi. 10.1007/s10854-013-1703-3
- Ning, Haixia;
- Lin, Yang;
- Hou, Xianbo;
- Zhang, Linlin
- Article