Works matching DE "CAPACITANCE-voltage characteristics"
1
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 22, p. 26588, doi. 10.1007/s10854-021-07035-6
- Gaur, Muddsar L.;
- Bhuse, Vijaykumar M.;
- Sanadi, Kallappa R.;
- Rathod, Kishan C.;
- Barache, Umesh B.;
- Gaikwad, Shashikant H.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 4, p. 4448, doi. 10.1007/s10854-020-05186-6
- Lapa, Havva Elif;
- Kökce, Ali;
- Aldemir, Durmuş Ali;
- Özdemir, Ahmet Faruk
- Article
3
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 1, p. 1161, doi. 10.1007/s10854-020-04889-0
- Lee, Seung Il;
- Liang, Kunyu;
- Hui, Lok Shu;
- Arbi, Ramis;
- Munir, Muhammad;
- Lee, Seok Je;
- Kim, Jin Wook;
- Kim, Ki Ju;
- Kim, Woo Young;
- Turak, Ayse
- Article
4
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 24, p. 22107, doi. 10.1007/s10854-020-04713-9
- Tripathi, Pramod Narayan;
- Ojha, Sanjeev Kumar;
- Nazarov, Alexey
- Article
5
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12065, doi. 10.1007/s10854-019-01564-x
- Yang, Sipan;
- Hu, Meiling;
- Yin, Huan
- Article
6
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 2, p. 1148, doi. 10.1007/s10854-018-0383-4
- Chen, Zhe;
- Dong, Peng;
- Xie, Meng;
- Li, Yun;
- Yu, Xuegong;
- Ma, Yao
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15349, doi. 10.1007/s10854-018-8909-3
- Molina-Reyes, Joel;
- Tiznado, Hugo;
- Soto, Gerardo;
- Vargas-Bautista, Monica;
- Dominguez, David;
- Murillo, Eduardo;
- Sweeney, Dan;
- Read, John
- Article
8
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 12, p. 8733, doi. 10.1007/s10854-017-6598-y
- Nefzi, K.;
- Rabhi, A.;
- Kanzari, M.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 12, p. 8844, doi. 10.1007/s10854-017-6613-3
- Tanrıkulu, E.;
- Demirezen, S.;
- Altındal, Ş.;
- Uslu, İ.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 11, p. 7819, doi. 10.1007/s10854-017-6478-5
- Yerişkin, S.;
- Balbaşı, M.;
- Orak, İ.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 4951, doi. 10.1007/s10854-016-6147-0
- Tan, S.;
- Tecimer, H.;
- Çiçek, O.;
- Altındal, Ş
- Article
12
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3186, doi. 10.1007/s10854-015-2816-7
- Çetinkaya, H.;
- Alialy, Sahar;
- Altındal, Ş.;
- Kaya, A.;
- Uslu, İ.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 7, p. 3096, doi. 10.1007/s10854-014-1989-9
- Article
14
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 1, p. 196, doi. 10.1007/s10854-012-0710-0
- Chen, Guo-hua;
- Yang, Yun;
- Kang, Xiao-ling;
- Yuan, Chang-lai;
- Zhou, Chang-rong
- Article
15
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 11, p. 1971, doi. 10.1007/s10854-012-0690-0
- Gokcen, M.;
- Bal, S.;
- Yildirim, G.;
- Gulen, M.;
- Varilci, A.
- Article
16
- Polymers for Advanced Technologies, 2008, v. 19, n. 12, p. 1882, doi. 10.1002/pat.1223
- Yakuphanoglu, Fahrettin;
- Şenkal, B. Filiz
- Article
17
- Turkish Journal of Physics, 2020, v. 44, n. 4, p. 302, doi. 10.3906/fiz-2007-11
- Article
18
- Cogent Engineering, 2020, v. 7, n. 1, p. 1, doi. 10.1080/23311916.2020.1810880
- Khaniyev, B.A.;
- Sagidolda, Y.;
- Dikhanbayev, K.K.;
- Tileu, A.O.;
- Ibraimov, M.K.;
- Rashad, Mohamed M.
- Article
19
- Integrated Ferroelectrics, 2017, v. 182, n. 1, p. 39, doi. 10.1080/10584587.2017.1352381
- Wang, M. J.;
- Liang, K. K.;
- Zhang, X. J.;
- Feng, Y. P.
- Article
20
- Integrated Ferroelectrics, 2013, v. 140, n. 1, p. 23, doi. 10.1080/10584587.2012.741383
- John, Caroline S.;
- Macleod, Todd C.;
- Evans, Joe;
- HO, Fat D.
- Article
21
- Physica Status Solidi (B), 2016, v. 253, n. 10, p. 1965, doi. 10.1002/pssb.201600288
- Kafi, F. S. B.;
- Jayathileka, K. M. D. C.;
- Wijesundera, R. P.;
- Siripala, W.
- Article
22
- Physica Status Solidi (B), 2015, v. 252, n. 6, p. 1306, doi. 10.1002/pssb.201451559
- Nilsson, D.;
- Trinh, X. T.;
- Janzén, E.;
- Son, N. T.;
- Kakanakova‐Georgieva, A.
- Article
23
- Physica Status Solidi (B), 2015, v. 252, n. 1, p. 153, doi. 10.1002/pssb.201400196
- Siahlo, Andrei I.;
- Poklonski, Nikolai A.;
- Lastovski, Stanislav B.;
- Presting, Hartmut;
- Sobolev, Nikolai A.
- Article
24
- Physica Status Solidi (B), 2014, v. 251, n. 1, p. 211, doi. 10.1002/pssb.201349191
- Schmidt, Matthias;
- de Meyer, Hannes;
- Johan Janse van Rensburg, Pieter;
- Ernst Meyer, Walter;
- Danie Auret, Francois
- Article
25
- Symmetry (20738994), 2017, v. 9, n. 1, p. 18, doi. 10.3390/sym9010018
- Heungjun Jeon;
- Kyung Ki Kim;
- Yong-Bin Kim
- Article
26
- Progress in Electromagnetics Research, 2012, v. 125, p. 97, doi. 10.2528/pier12010804
- Article
27
- Circuits, Systems & Signal Processing, 2012, v. 31, n. 2, p. 489, doi. 10.1007/s00034-011-9345-2
- Gupta, Ashish;
- Senani, Raj;
- Bhaskar, D.;
- Singh, A.
- Article
28
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 3, p. 1039, doi. 10.1007/s10008-020-04889-4
- Ismail, Raid A.;
- Abdul Majeed, Aseel M.
- Article
29
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 3, p. 797, doi. 10.1007/s10008-020-04855-0
- Yakovlev, George;
- Zubkov, Vasily
- Article
30
- Journal of Solid State Electrochemistry, 2012, v. 16, n. 8, p. 2783, doi. 10.1007/s10008-012-1675-x
- Blomquist, Maija;
- Bobacka, Johan;
- Ivaska, Ari;
- Levon, Kalle
- Article
31
- Journal of Applied Spectroscopy, 2024, v. 91, n. 2, p. 378, doi. 10.1007/s10812-024-01730-y
- Gogorishvili, I.;
- Tutunjyan, A.;
- Sakharova, T.;
- Melikyan, M.;
- Khuchua, N.;
- Kuparashvili, D.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 589, doi. 10.1049/el.2018.0571
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1270, doi. 10.1049/el.2017.1413
- John, J. D.;
- Saito, I.;
- Toyama, R.;
- Ochiai, J.;
- Yamada, T.;
- Masuzawa, T.;
- Chua, D. H. C.;
- Okano, K.
- Article
34
- Journal of Polytechnic, 2017, v. 20, n. 2, p. 313, doi. 10.2339/2017.20.2.313-318
- Article
35
- Iraqi Journal of Science, 2020, v. 61, n. 12, p. 3235, doi. 10.24996/ijs.2020.61.12.12
- Rasheed, Hussein Kh.;
- Kareem, Aseel A.
- Article
36
- Journal of Information & Communication Convergence Engineering, 2021, v. 19, n. 4, p. 263, doi. 10.6109/jicce.2021.19.4.263
- Article
37
- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-92021-5
- Bonkerud, Julie;
- Zimmermann, Christian;
- Weiser, Philip Michael;
- Vines, Lasse;
- Monakhov, Eduard V.
- Article
38
- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-66339-5
- Heo, Kwan-Jun;
- Kim, Han-Sang;
- Lee, Jae-Yun;
- Kim, Sung-Jin
- Article
39
- Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 13, p. 1, doi. 10.1002/pssa.202200194
- Li, Ang;
- Wang, Chong;
- Zheng, Xuefeng;
- Ma, Xiaohua;
- He, Yunlong;
- Liu, Kai;
- Zhao, Yaopeng;
- Hao, Yue
- Article
40
- Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 3, p. 1, doi. 10.1002/pssa.202100208
- Knyazev, Maxim;
- Sedlovets, Daria;
- Soltanovich, Oleg;
- Khodos, Igor;
- Koveshnikov, Sergei
- Article
41
- Journal of the Society for Information Display, 2013, v. 21, n. 1, p. 2, doi. 10.1002/jsid.143
- Kim, Jong‐Man;
- Cho, Youngmin;
- Kim, Jongbin;
- Lee, Seung‐Hyuck;
- Kim, Kwangjoon;
- Lee, Seung‐Woo
- Article
42
- 2012
- Baek, Gwanghyeon;
- Kanicki, Jerzy
- Other
43
- Semiconductors, 2024, v. 58, n. 4, p. 354, doi. 10.1134/S1063782624040146
- Sobolev, M. M.;
- Soldatenkov, F. Yu.
- Article
44
- Semiconductors, 2023, v. 57, n. 1, p. 81, doi. 10.1134/S1063782623010050
- Article
45
- Semiconductors, 2021, v. 55, n. 2, p. 262, doi. 10.1134/S1063782621020214
- Yan, F.;
- Wang, Y.;
- Jin, X. L.;
- Peng, Y.;
- Luo, J.;
- Yang, J.
- Article
46
- Semiconductors, 2020, v. 54, n. 10, p. 1360, doi. 10.1134/S1063782620100073
- Dyukov, D. I.;
- Fefelov, A. G.;
- Korotkov, A. V.;
- Pavelyev, D. G.;
- Kozlov, V. A.;
- Obolenskaya, E. S.;
- Ivanov, A. S.;
- Obolensky, S. V.
- Article
47
- Semiconductors, 2020, v. 54, n. 6, p. 658, doi. 10.1134/S1063782620060160
- Shutaev, V. A.;
- Grebenshchikova, E. A.;
- Sidorov, V. G.;
- Kompan, M. E.;
- Yakovlev, Yu. P.
- Article
48
- Semiconductors, 2019, v. 53, n. 10, p. 1393, doi. 10.1134/S1063782619100208
- Sobolev, M. M.;
- Yavsin, D. A.;
- Gurevich, S. A.
- Article
49
- Chalcogenide Letters, 2021, v. 18, n. 3, p. 113, doi. 10.15251/cl.2021.183.113
- ALFHAID, L. H. K.;
- QASRAWI, A. F.;
- ALGARNI, S. E.
- Article
50
- Bulletin of Materials Science, 2017, v. 40, n. 1, p. 67, doi. 10.1007/s12034-016-1341-5
- HLALI, SLAH;
- HIZEM, NEILA;
- KALBOUSSI, ADEL
- Article