Works matching DE "CAPACITANCE meters"
1
- Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 5, p. 1, doi. 10.1007/s10854-022-09512-y
- Xu, Zhijun;
- Wei, Yanliang;
- Ma, Shuai;
- Guo, Xianjun;
- Li, Guorong;
- Chu, Ruiqing;
- Qiu, Jianxun
- Article
2
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 25, p. 20293, doi. 10.1007/s10854-022-08845-y
- Palaniappan, P.;
- Lenin, N.;
- Uvarani, R.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9624, doi. 10.1007/s10854-016-5019-y
- Ye, Shu;
- Kim, Ick-Jun;
- Yang, Sun-hye;
- Roh, Kwang;
- Oh, Won-Chun
- Article
4
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2741, doi. 10.1007/s10854-015-4085-x
- Lan, Wei;
- Tang, Guomei;
- Sun, Yaru;
- Wei, Yupeng;
- La, Peiqing;
- Su, Qing;
- Xie, Erqing
- Article
5
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4638, doi. 10.1007/s10854-015-2926-2
- Qin, Xiaoye;
- Cheng, Lanxia;
- McDonnell, Stephen;
- Azcatl, Angelica;
- Zhu, Hui;
- Kim, Jiyoung;
- Wallace, Robert
- Article
6
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 618, doi. 10.1007/s10854-012-0877-4
- Article
7
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 667, doi. 10.1007/s10854-012-0789-3
- Jing, Hongjun;
- Jiang, Yadong;
- Du, Xiaosong
- Article
8
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 1, p. 185, doi. 10.1007/s10854-011-0380-3
- Mishra, Amodini;
- Choudhary, S.;
- Choudhary, R.;
- Murthy, V.;
- Prasad, Kamal
- Article
9
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 854, doi. 10.1007/s10854-010-0225-5
- Ashok Kumar, A.;
- Janardhanam, V.;
- Rajagopal Reddy, V.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 123, doi. 10.1007/s10854-008-9645-x
- da Silva, Wilson J.;
- Hümmelgen, Ivo A.;
- Mello, Regina M. Q.
- Article
11
- Fluctuation & Noise Letters, 2012, v. 11, n. 1, p. 1240005-1, doi. 10.1142/S0219477512400056
- GRAFOV, BORIS M.;
- Goychuk, Igor
- Article
12
- Fluctuation & Noise Letters, 2011, v. 10, n. 1, p. 121, doi. 10.1142/S0219477511000442
- MAHI, F. Z.;
- HELMAOUI, A. R.;
- VARANI, L.;
- PALERMO, C.;
- SHIKTOROV, P.;
- STARIKOV, E.;
- GRUŽINSKIS, V.;
- Macucci, Massimo
- Article
13
- Instrumentation Science & Technology, 2016, v. 44, n. 4, p. 386, doi. 10.1080/10739149.2016.1141784
- Song, Le;
- Zheng, Yelong;
- Hu, Gang;
- Ma, Jinyu;
- Werner, Teresa;
- Zhao, Meirong;
- Fang, Fengzhou
- Article
14
- Instrumentation Science & Technology, 2007, v. 35, n. 6, p. 681, doi. 10.1080/10739140701653892
- Madhavasarma, P.;
- Sundaram, S.
- Article
15
- Instrumentation Science & Technology, 2005, v. 33, n. 6, p. 727, doi. 10.1080/10739140500311338
- Hu, Hongli;
- Xu, Tongmo;
- Hui, Shien
- Article
16
- Instrumentation Science & Technology, 2005, v. 33, n. 3, p. 271, doi. 10.1081/CI-200056088
- Quiroz, A.Garcia;
- Remedios, ClaudioM. R.;
- Moreira, S.G. C.
- Article
17
- Instrumentation Science & Technology, 2004, v. 32, n. 4, p. 413, doi. 10.1081/CI-120037673
- Rajendran, A.;
- Neelamegam, P.
- Article
18
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2014, v. 12, n. ists 29, p. 1
- Souichi MASUI;
- Takeshi TACHIBANA;
- Akira KAKAMI
- Article
19
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2014, v. 12, n. ists 29, p. 101
- Norihide MAENO;
- Wataru OKADA;
- Satoshi KITAKOGA;
- Yuki SUMI;
- Tetsuya SATO;
- Hiroaki KOBAYASHI
- Article
20
- Integrated Ferroelectrics, 2017, v. 185, n. 1, p. 93, doi. 10.1080/10584587.2017.1370345
- Rasool, Raheela;
- Rather, G. M.;
- ud-Din, Najeeb
- Article
21
- Integrated Ferroelectrics, 2012, v. 139, n. 1, p. 106, doi. 10.1080/10584587.2012.737257
- Hunt, Mitchell;
- Sayyah, Rana;
- Macleod, Todd C.;
- Ho, Fat D.
- Article
22
- Integrated Ferroelectrics, 2011, v. 129, n. 1, p. 65, doi. 10.1080/10584587.2011.576912
- Eng, Yi-Chuen;
- Lin, Jyi-Tsong;
- Fan, Yi-Hsuan;
- Lin, Po-Hsieh;
- Kuo, Chih-Hao;
- Chang, Yu-Che;
- Lu, Kuan-Yu;
- Chen, Cheng-Hsien;
- Tai, Chih-Hsuan
- Article
23
- Integrated Ferroelectrics, 2011, v. 129, n. 1, p. 52, doi. 10.1080/10584587.2011.576900
- Lin, Po-Hsieh;
- Lin, Jyi-Tsong;
- Eng, Yi-Chuen
- Article
24
- Integrated Ferroelectrics, 2011, v. 125, n. 1, p. 20, doi. 10.1080/10584587.2011.574035
- Rao, G. Lakshmi Narayana;
- Saravanan, K. Venkata;
- Raju, K. James
- Article
25
- Integrated Ferroelectrics, 2008, v. 101, n. 1, p. 182, doi. 10.1080/10584580802470991
- COLE, M. W.;
- HIRSCH, S.;
- NGO, E.;
- HUBBARD, C.
- Article
26
- Integrated Ferroelectrics, 2008, v. 98, n. 1, p. 46, doi. 10.1080/10584580802092183
- Daolin Cai;
- Ping Li;
- Yahong Zhai;
- Jingsong Liu;
- Shuren Zhang;
- Yangfan Ou;
- Yanyu Chen;
- Dongshen Wu
- Article
27
- Integrated Ferroelectrics, 2006, v. 80, n. 1, p. 437, doi. 10.1080/10584580600663235
- Pervez, Nadia K.;
- Park, Jaehoon;
- Lu, Jiwei;
- Stemmer, Susanne;
- York, Robert
- Article
28
- Journal of Macromolecular Science: Physics, 2012, v. 51, n. 5, p. 897, doi. 10.1080/00222348.2011.610251
- Jiang, Zunqun;
- Cheng, Qilin;
- Yan, Yanfang;
- Zhang, Ling;
- Li, Chunzhong
- Article
29
- Physica Status Solidi (B), 2016, v. 253, n. 12, p. 2451, doi. 10.1002/pssb.201600366
- Koroteev, V. O.;
- Kuznetsova, I. V.;
- Kurenya, A. G.;
- Kanygin, M. A.;
- Fedorovskaya, E. O.;
- Mikhlin, Y. L.;
- Chuvilin, A. L.;
- Bulusheva, L. G.;
- Okotrub, A. V.
- Article
30
- European Physical Journal D (EPJ D), 2003, v. 24, n. 1-3, p. 397, doi. 10.1140/epjd/e2003-00161-2
- Article
31
- International Journal of Circuit Theory & Applications, 2014, v. 42, n. 9, p. 967, doi. 10.1002/cta.1898
- Magnelli, Luca;
- Amoroso, Francesco A.;
- Crupi, Felice;
- Cappuccino, Gregorio;
- Iannaccone, Giuseppe
- Article
32
- Medical Devices: Evidence & Research, 2014, v. 7, p. 219, doi. 10.2147/MDER.S63449
- Richards, Guy A.;
- Brink, Adrian J.;
- McIntosh, Ross;
- Steel, Helen C.;
- Cockeran, Riana
- Article
33
- International Journal of High Speed Electronics & Systems, 2009, v. 19, n. 1, p. 15, doi. 10.1142/S0129156409006059
- WANG, LINGQUAN (DENNIS);
- YU, BO;
- ASBECK, PETER M.;
- TAUR, YUAN;
- RODWELL, MARK
- Article
34
- International Journal of High Speed Electronics & Systems, 2009, v. 19, n. 1, p. 23, doi. 10.1142/S0129156409006060
- DIDUCK, QUENTIN;
- IRIE, HIROSHI;
- MARGALA, MARTIN
- Article
35
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 3, p. 192, doi. 10.1142/S0129156404002880
- Wu, Y.-F.;
- Moore, M.;
- Wisleder, T.;
- Chavarkar, P. M.;
- Parikh, P.;
- Saxler, A.
- Article
36
- ChemSusChem, 2018, v. 11, n. 22, p. 3882, doi. 10.1002/cssc.201801908
- Jung, Su‐Kyo;
- Lee, David S.;
- Ann, Myung Hyun;
- Im, Sang Hyuk;
- Kim, Jong H.;
- Kwon, O‐Pil
- Article
37
- ChemSusChem, 2018, v. 11, n. 22, p. 3932, doi. 10.1002/cssc.201801892
- Wang, De‐Gao;
- Wang, Huan;
- Lin, Yi;
- Yu, Guipeng;
- Song, Min;
- Zhong, Wenbin;
- Kuang, Gui‐Chao
- Article
38
- ChemSusChem, 2014, v. 7, n. 7, p. 1881, doi. 10.1002/cssc.201400148
- Qian, Zhongyu;
- Peng, Tao;
- Wang, Jun;
- Qu, Liangti
- Article
39
- NANO (1793-2920), 2009, v. 4, n. 3, p. 171, doi. 10.1142/S1793292009001629
- FATHI, DAVOOD;
- FOROUZANDEH, BEHJAT
- Article
40
- Electronics & Electrical Engineering, 2008, n. 86, p. 73
- Sakalauskas, S.;
- Vaitonis, Z.;
- Puras, R.;
- Bulbenkiene, V.
- Article
41
- Forest Products Journal, 1999, v. 49, n. 9, p. 29
- Article
42
- Microwave & Optical Technology Letters, 2002, v. 33, n. 1, p. 16, doi. 10.1002/mop.10217
- Article
43
- Microwave & Optical Technology Letters, 2002, v. 33, n. 1, p. 61, doi. 10.1002/mop.10232
- Hsueh-Yung Chao;
- Weng Cho Chew
- Article
44
- Microwave & Optical Technology Letters, 2000, v. 27, n. 6, p. 444, doi. 10.1002/1098-2760(20001220)27:6<444::AID-MOP21>3.0.CO;2-Q
- Das, Utpal;
- Joshi, Ravi K.;
- Biswas, Dilip;
- Biswas, Animesh
- Article
45
- Microwave & Optical Technology Letters, 1999, v. 23, n. 5, p. 312, doi. 10.1002/(SICI)1098-2760(19991205)23:5<312::AID-MOP16>3.0.CO;2-S
- Agrawal, Anju;
- Goswami, Anisha;
- Sen, Sujata;
- Gupta, R. S.
- Article
46
- Microwave & Optical Technology Letters, 1998, v. 19, n. 4, p. 267, doi. 10.1002/(SICI)1098-2760(199811)19:4<267::AID-MOP7>3.0.CO;2-I
- Du, Zhengwei;
- Gong, Ke;
- Fu, Jeffrey;
- Ruan, Chengli
- Article
47
- Microwave & Optical Technology Letters, 1997, v. 15, n. 1, p. 26, doi. 10.1002/(SICI)1098-2760(199705)15:1<26::AID-MOP8>3.0.CO;2-N
- Dillner, Lars;
- Stake, Jan;
- Kollberg, Erik L.
- Article
48
- Microwave & Optical Technology Letters, 1997, v. 14, n. 4, p. 217, doi. 10.1002/(SICI)1098-2760(199703)14:4<217::AID-MOP8>3.0.CO;2-M
- Verma, A. K.;
- Kumar, Raj;
- Sharma, Manu
- Article
49
- Microwave & Optical Technology Letters, 1996, v. 13, n. 6, p. 329, doi. 10.1002/(SICI)1098-2760(19961220)13:6<329::AID-MOP7>3.0.CO;2-N
- Naidenko, Victor;
- Guseva, Elena
- Article
50
- Microwave & Optical Technology Letters, 1995, v. 8, n. 2, p. 59, doi. 10.1002/mop.4650080202
- Costamagna, Eugenio;
- Fanni, Alessandra
- Article