Works matching DE "CADMIUM-zinc alloys"
1
- Surface Engineering, 2012, v. 28, n. 8, p. 590, doi. 10.1179/1743294412Y.0000000023
- Gao, Y S;
- Hu, W C;
- Gao, X Q;
- Duan, B X
- Article
2
- Applied Physics A: Materials Science & Processing, 2006, v. 86, n. 2, p. 257, doi. 10.1007/s00339-006-3765-z
- Zeng, D.;
- Jie, W.;
- Wang, T.;
- Zha, G.
- Article
3
- Semiconductors, 2016, v. 50, n. 13, p. 1716, doi. 10.1134/S1063782616130030
- Golubyatnikov, V.;
- Lysenko, A.;
- Belov, A.;
- Kanevskii, V.
- Article
4
- Semiconductors, 2007, v. 41, n. 6, p. 689, doi. 10.1134/S1063782607060140
- Komar’, V.;
- Puzikov, V.;
- Chugai, O.;
- Nalivaiko, D.;
- Sulima, S.;
- Abashin, S.
- Article
5
- Semiconductors, 2001, v. 35, n. 7, p. 773, doi. 10.1134/1.1385711
- Belogorokhov, A. I.;
- Lakeenkov, V. M.;
- Belogorokhova, L. I.
- Article
6
- Energy Sources Part A: Recovery, Utilization & Environmental Effects, 2012, v. 34, n. 4, p. 332, doi. 10.1080/15567036.2010.490824
- Article
7
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1690, doi. 10.1007/s11664-009-0801-8
- Fulk, C.;
- Parodos, T.;
- Lamarre, P.;
- Tobin, S.;
- LoVecchio, P.;
- Markunas, J.
- Article
8
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1528, doi. 10.1007/s11664-009-0693-7
- Egan, C. K.;
- Dabrowski, P.;
- Klusek, Z.;
- Brinkman, A. W.
- Article
9
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1438, doi. 10.1007/s11664-008-0448-x
- HAWKINS, SAMANTHA A.;
- VILLA-ALEMAN, ELIEL;
- DUFF, MARTINE C.;
- HUNTER, DOUG B.;
- BURGER, ARNOLD;
- GROZA, MICHAEL;
- BULIGA, VLADIMIR;
- BLACK, DAVID R.
- Article
10
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1460, doi. 10.1007/s11664-008-0442-3
- MULLINS, J. T.;
- CANTWELL, B. J.;
- BASU, A.;
- JIANG, Q.;
- CHOUBEY, A.;
- BRINKMAN, A. W.;
- TANNER, B. K.
- Article
11
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1356, doi. 10.1007/s11664-008-0431-6
- HOSSAIN, A.;
- BOLOTNIKOV, A. E.;
- CAMARDA, G. S.;
- CUI, Y.;
- BABALOLA, S.;
- BURGER, A.;
- JAMES, R. B.
- Article
12
- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 719, doi. 10.1007/s11664-004-0072-3
- Greenberg, J. H.;
- Guskov, V. N.;
- Fiederle, M.;
- Benz, K.- W.
- Article
13
- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 640, doi. 10.1007/s11664-004-0059-0
- Terterian, S.;
- Chu, M.;
- Ting, D.
- Article
14
- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 498, doi. 10.1007/s11664-004-0037-6
- Chen, Y. P.;
- Brill, G.;
- Campo, E. M.;
- Hierl, T.;
- Hwang, J. C. M.;
- Dhar, N. K.
- Article
15
- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 488, doi. 10.1007/s11664-004-0036-7
- Yeckel, Andrew;
- Derby, Jeffrey J.
- Article
16
- Optical & Quantum Electronics, 2015, v. 47, n. 10, p. 3237, doi. 10.1007/s11082-015-0204-4
- Rezaie, Neda;
- Kosarian, Abdolnabi
- Article
17
- European Journal of Nuclear Medicine & Molecular Imaging, 2018, v. 45, n. 12, p. 2173, doi. 10.1007/s00259-018-4057-5
- Han, Sangwon;
- Kim, Young-Hak;
- Ahn, Jung-Min;
- Kang, Soo-Jin;
- Oh, Jungsu S.;
- Shin, Eonwoo;
- Sung, Changhwan;
- Chae, Sun Young;
- Park, Seung-Jung;
- Grimberg, Gillan;
- Kovalski, Gil;
- Moon, Dae Hyuk
- Article
18
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 3, p. 39
- Glinchuk, K. D.;
- Litovchenko, N. M.;
- Prokhorovich, A. V.;
- Strilchuk, O. N.
- Article
19
- Asian Pacific Journal of Tropical Biomedicine, 2017, v. 7, n. 3, p. 245, doi. 10.1016/j.apjtb.2016.12.012
- Berroukche, Abdelkrim;
- Terras, Mohamed;
- Labani, Abdelrahmane;
- Dellaoui, Hafsa;
- Lansari, Wassila
- Article
20
- Environmental Toxicology & Chemistry, 2015, v. 34, n. 4, p. 754, doi. 10.1002/etc.2780
- Iwasaki, Yuichi;
- Kamo, Masashi;
- Naito, Wataru
- Article
21
- Environmental Toxicology & Chemistry, 2015, v. 34, n. 4, p. 799, doi. 10.1002/etc.2787
- Meyer, Joseph S.;
- Ranville, James F.;
- Pontasch, Mandee;
- Gorsuch, Joseph W.;
- Adams, William J.
- Article
22
- Environmental Toxicology & Chemistry, 2015, v. 34, n. 4, p. 761, doi. 10.1002/etc.2824
- Balistrieri, Laurie S.;
- Mebane, Christopher A.;
- Schmidt, Travis S.;
- Keller, Wendel (Bill)
- Article
23
- Environmental Toxicology & Chemistry, 2015, v. 34, n. 4, p. 788, doi. 10.1002/etc.2773
- Tipping, Edward;
- Lofts, Stephen
- Article
24
- Journal of Materials Science, 2014, v. 49, n. 20, p. 6917, doi. 10.1007/s10853-014-8396-8
- Verma, Shruti;
- Pandey, Sushil;
- Gupta, Mukul;
- Mukherjee, Shaibal
- Article
25
- Communications in Soil Science & Plant Analysis, 2009, v. 40, n. 19/20, p. 3158, doi. 10.1080/00103620903261676
- Watanabe, Toshihiro;
- Murata, Yasutoshi;
- Osaki, Mitsuru
- Article
26
- EJNMMI Physics, 2016, v. 3, n. 1, p. 1, doi. 10.1186/s40658-016-0163-2
- Blaire, Tanguy;
- Bailliez, Alban;
- Bouallegue, Fayçal;
- Bellevre, Dimitri;
- Agostini, Denis;
- Manrique, Alain
- Article