Works matching DE "BIPOLAR integrated circuits"
1
- Measurement Techniques, 2007, v. 50, n. 7, p. 763, doi. 10.1007/s11018-007-0146-8
- Article
2
- Quality & Reliability Engineering International, 1986, v. 2, n. 4, p. 247, doi. 10.1002/qre.4680020407
- Article
3
- Symmetry (20738994), 2019, v. 11, n. 2, p. 154, doi. 10.3390/sym11020154
- Zhang, Jizuo;
- Chen, Jianjun;
- Huang, Pengcheng;
- Li, Shouping;
- Fang, Liang
- Article
4
- EE: Evaluation Engineering, 2019, v. 58, n. 5, p. 18
- Article
5
- Mathematical Methods in the Applied Sciences, 2018, v. 41, n. 16, p. 6170, doi. 10.1002/mma.5127
- Article
6
- Journal of Active & Passive Electronic Devices, 2012, v. 7, n. 1/2, p. 61
- Herencsar, Norbert;
- Koton, Jaroslav;
- Vrba, Kamil;
- Lattenberg, Ivo
- Article
7
- Journal of Active & Passive Electronic Devices, 2011, v. 6, n. 3/4, p. 239
- KUMNGERN, MONTREE;
- DEJHAN, KOBCHAI
- Article
8
- Measurements, 2007, v. 39, n. 1, p. 9
- Zajankauskas, S.;
- Ibenskis, E.
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 4, p. 2147, doi. 10.1007/s11664-016-5148-3
- Chen, Kai-Huang;
- Cheng, Chien-Min;
- Kao, Ming-Cheng;
- Chang, Kuan-Chang;
- Chang, Ting-Chang;
- Tsai, Tsung-Ming;
- Wu, Sean;
- Su, Feng-Yi
- Article
10
- Journal of Electronic Materials, 2006, v. 35, n. 9, p. 1712, doi. 10.1007/s11664-006-0223-9
- Changhyun Yi;
- Tong-Ho Kim;
- Brown, April S.
- Article
11
- Microwave & Optical Technology Letters, 2007, v. 49, n. 1, p. 215, doi. 10.1002/mop.22067
- Meng, C. C.;
- Tseng, S. C.;
- Chang, Y. W.;
- Su, J. Y.;
- Huang, G. W.
- Article
12
- Microwave & Optical Technology Letters, 2006, v. 48, n. 10, p. 2126, doi. 10.1002/mop.21867
- Article
13
- Microwave & Optical Technology Letters, 2006, v. 48, n. 8, p. 1645, doi. 10.1002/mop.21713
- Vergne, B.;
- Couderc, V.;
- Barthélémy, A.;
- Lalande, M.;
- Bertrand, V.;
- Gontier, D.
- Article
14
- Microwave & Optical Technology Letters, 2005, v. 47, n. 3, p. 247, doi. 10.1002/mop.21138
- Das, Mukul K.;
- Das, N. R.;
- Basu, P. K.
- Article
15
- Microwave & Optical Technology Letters, 2003, v. 38, n. 5, p. 384, doi. 10.1002/mop.11067
- Article
16
- Microwave & Optical Technology Letters, 1996, v. 11, n. 3, p. 150, doi. 10.1002/(SICI)1098-2760(19960220)11:3<150::AID-MOP11>3.0.CO;2-F
- Ohkubo, Michio;
- Ikeda, Nariaki;
- Ninomiya, Takao
- Article
17
- Microwave & Optical Technology Letters, 1994, v. 7, n. 16, p. 767, doi. 10.1002/mop.4650071614
- Youngseok Seo;
- Kim, Bumman
- Article
19
- Annals of DAAAM & Proceedings, 2011, p. 945
- Caruntu, George;
- Panait, Cornel;
- Dumitrascu, Ana
- Article
20
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 7, p. -1, doi. 10.1142/S0218126613500552
- SHI, LING-FENG;
- ZENG, AI-QIN;
- LI, QIN-QIN;
- CHENG, LI-YE;
- LAI, XIN-QUAN
- Article
21
- Journal of Circuits, Systems & Computers, 2011, v. 20, n. 4, p. 781, doi. 10.1142/S0218126611007608
- SAPONARA, SERGIO;
- BALDETTI, TOMMASO;
- FANUCCI, LUCA;
- VOLPI, EMILIO;
- D'ASCOLI, FRANCESCO
- Article
22
- Journal of Circuits, Systems & Computers, 2010, v. 19, n. 6, p. 1333, doi. 10.1142/S0218126610006700
- RAUT, RABIN;
- DEVABHAKTUNI, VIJAY;
- ROY, NILADRI
- Article
23
- Journal of Circuits, Systems & Computers, 2010, v. 19, n. 3, p. 719, doi. 10.1142/S0218126610006396
- Article
24
- Journal of Circuits, Systems & Computers, 2009, v. 18, n. 3, p. 519, doi. 10.1142/S0218126609005253
- Article
25
- Neurocase (Taylor & Francis Ltd), 2014, v. 20, n. 1/2, p. 10, doi. 10.1080/13554794.2012.713495
- Yousif, Nada;
- Pavese, Nicola;
- Naushahi, Mohammad J.;
- Nandi, Dipankar;
- Bain, Peter G.
- Article
26
- Advanced Functional Materials, 2017, v. 27, n. 10, p. n/a, doi. 10.1002/adfm.201604604
- Rani, Adila;
- Velusamy, Dhinesh Babu;
- Marques Mota, Filipe;
- Jang, Yoon Hee;
- Kim, Richard Hahnkee;
- Park, Cheolmin;
- Kim, Dong Ha
- Article
27
- Astrophysics & Space Science, 2014, v. 351, n. 1, p. 159, doi. 10.1007/s10509-014-1813-2
- Article
28
- International Journal of Numerical Modelling, 2004, v. 17, n. 4, p. 397, doi. 10.1002/jnm.535
- Igic, P. M.;
- Towers, M. S.;
- Mawby, P. A.
- Article
29
- International Journal of Numerical Modelling, 2003, v. 16, n. 4, p. 319, doi. 10.1002/jnm.501
- Garcias-Salvà, Pau;
- Lóopez-Gonzáalez, Juan M.;
- Prat, Lluis
- Article
30
- International Journal of Numerical Modelling, 2003, v. 16, n. 4, p. 345, doi. 10.1002/jnm.503
- Hyoung-Woo Kim;
- Jin-Woo Moon;
- Sang-Koo Chung
- Article
31
- International Journal of Numerical Modelling, 2003, v. 16, n. 4, p. 353, doi. 10.1002/jnm.504
- Hyungkeun Ahn;
- El-Nokali, M.;
- Deuk-Young Han
- Article
32
- Optical Engineering, 2015, v. 54, n. 9, p. 1, doi. 10.1117/1.OE.54.9.096101
- Kaiqiang Gao;
- Chongqing Wu;
- Xinzhi Sheng;
- Chao Shang;
- Lanlan Liu;
- Jian Wang
- Article
33
- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.087103
- Swoboda, Robert;
- Schneider-Hornstein, Kerstin;
- Wille, Holger;
- Langguth, Gernot;
- Zimmermann, Horst
- Article
34
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 5, p. 1, doi. 10.1007/s00339-017-0936-z
- Choi, Sang-Jun;
- Kim, Ki-Hong;
- Yang, Woo-Young;
- Kim, Sohyeon;
- Oh, Semi;
- Kim, Kyoung-Kook;
- Kim, Yunkyung;
- Hong, Minki;
- Nam, Kiyoung;
- Cho, Soohaeng
- Article
35
- Applied Physics A: Materials Science & Processing, 2010, v. 100, n. 4, p. 987, doi. 10.1007/s00339-010-5910-y
- Xinman Chen;
- Guangheng Wu;
- Hailei Zhang;
- Ni Qin;
- Tao Wang;
- Feifei Wang;
- Wangzhou Shi;
- Dinghua Bao
- Article
36
- Journal of Experimental & Theoretical Artificial Intelligence, 2010, v. 22, n. 2, p. 135, doi. 10.1080/09528130903010212
- Bistarelli, Stefano;
- Pini, Maria Silvia;
- Rossi, Francesca;
- Venable, K. Brent
- Article
37
- Telkomnika, 2014, v. 12, n. 2, p. 283, doi. 10.12928/telkomnika.v12i2.52
- Pan Luwei;
- Zhou Li;
- Sun Tao
- Article
38
- Journal of Low Temperature Physics, 2008, v. 151, n. 3/4, p. 952, doi. 10.1007/s10909-008-9765-y
- Article
39
- Semiconductors, 2007, v. 41, n. 10, p. 1185, doi. 10.1134/S1063782607100119
- Article
40
- Journal of Neuroscience, 2012, v. 32, n. 30, p. 10306, doi. 10.1523/JNEUROSCI.1581-12.2012
- Dunn, Felice A.;
- Wong, Rachel O. L.
- Article
41
- Journal of Applied Electrochemistry, 2008, v. 38, n. 9, p. 1259, doi. 10.1007/s10800-008-9550-2
- Article
42
- Journal of Applied Electrochemistry, 2007, v. 37, n. 11, p. 1303, doi. 10.1007/s10800-007-9410-5
- Kodým, R.;
- Bouzek, K.;
- Šnita, D.;
- Thonstad, J.
- Article
43
- Journal of Applied Electrochemistry, 2007, v. 37, n. 8, p. 921, doi. 10.1007/s10800-007-9330-4
- Jupudi, Ravichandra;
- Zappi, Guillermo;
- Bourgeois, Richard
- Article
44
- Journal of Applied Spectroscopy, 2013, v. 80, n. 3, p. 473, doi. 10.1007/s10812-013-9790-8
- Blynski, V.;
- Holub, E.;
- Lemeshevskaya, A.
- Article
45
- Journal of Applied Spectroscopy, 2010, v. 77, n. 3, p. 445, doi. 10.1007/s10812-010-9353-1
- Blynskii, V. I.;
- Bozhatkin, O. A.;
- Golub, E. S.;
- Lemeshevskaya, A. M.;
- Shvedov, S. V.
- Article
46
- Journal of Applied Spectroscopy, 2008, v. 75, n. 4, p. 608, doi. 10.1007/s10812-008-9089-3
- Blynskii, V. I.;
- Emel'yanov, V. A.;
- Golub, E. S.;
- Lemeshevskaya, A. M.;
- Shvedov, S. V.
- Article
47
- Technical Journal of University of Engineering & Technology Taxila, 2016, v. 21, n. 1, p. 32
- Article
48
- Journal of Circuits, Systems & Computers, 2005, v. 14, n. 2, p. 179, doi. 10.1142/S0218126605002234
- Zhou, K.;
- Guo, J.-R.;
- You, C.;
- Mayega, J.;
- Kraft, R. P.;
- Zhang, T.;
- McDonald, J. F.;
- Goda, B. S.
- Article
49
- ETRI Journal, 2009, v. 31, n. 6, p. 749, doi. 10.4218/etrij.09.1209.0038
- Jong-Min Lee;
- Byoung-Gue Min;
- Seong-Il Kim;
- Kyung Ho Lee;
- Hae Cheon Kim
- Article
50
- Advances in Radio Science, 2006, v. 4, p. 247, doi. 10.5194/ars-4-247-2006
- Fan, X.;
- Fischer, G.;
- Dietrich, B.
- Article