Works about BARKHAUSEN effect
1
- Nondestructive Testing & Evaluation, 2018, v. 33, n. 2, p. 154, doi. 10.1080/10589759.2017.1397144
- Falahat, S.;
- Ghanei, S.;
- Kashefi, M.
- Article
2
- Nondestructive Testing & Evaluation, 2014, v. 29, n. 3, p. 219, doi. 10.1080/10589759.2014.914208
- Pal'a, Jozef;
- Bydžovský, Jan
- Article
3
- Nondestructive Testing & Evaluation, 2014, v. 29, n. 3, p. 208, doi. 10.1080/10589759.2014.914207
- Sahebalam, Alireza;
- Kashefi, Mehrdad;
- Kahrobaee, Saeed
- Article
4
- Nondestructive Testing & Evaluation, 2008, v. 23, n. 4, p. 317, doi. 10.1080/10589750802275980
- Article
5
- Nondestructive Testing & Evaluation, 2008, v. 23, n. 2, p. 99, doi. 10.1080/10589750701775734
- Article
6
- International Journal of Circuit Theory & Applications, 2016, v. 44, n. 10, p. 1859, doi. 10.1002/cta.2200
- Hasan, Masood‐ul;
- Zhu, Yanqing;
- Sun, Yichuang
- Article
7
- Advances in Mechanical Engineering (Sage Publications Inc.), 2016, v. 8, n. 7, p. 1, doi. 10.1177/1687814016656536
- Article
8
- Insight: Non-Destructive Testing & Condition Monitoring, 2019, v. 61, n. 2, p. 95, doi. 10.1784/insi.2019.61.2.95
- Yanyan Zhang;
- Wenbo Liu;
- Kaiyu Li;
- Ping Wang;
- Cheng Hang;
- Yang Chen;
- Xiao Han;
- Wenjuan Gao
- Article
9
- Insight: Non-Destructive Testing & Condition Monitoring, 2016, v. 58, n. 9, p. 480, doi. 10.1784/insi.2016.58.9.480
- Lindgren, M;
- Santa-aho, S;
- Vippola, M
- Article
10
- Insight: Non-Destructive Testing & Condition Monitoring, 2016, v. 58, n. 6, p. 297, doi. 10.1784/insi.2016.58.6.297
- Ahmadzade-Beiraki, E;
- Mazinani, M;
- Kashefi, M
- Article
11
- Insight: Non-Destructive Testing & Condition Monitoring, 2014, v. 56, n. 12, p. 657, doi. 10.1784/insi.2014.56.12.657
- Santa-aho, S;
- Sorsa, A;
- Nurmikolu, A;
- Vippola, M
- Article
12
- Insight: Non-Destructive Testing & Condition Monitoring, 2013, v. 55, n. 3, p. 123, doi. 10.1784/insi.2012.55.3.123
- Martins, C O D;
- Altenhofen, A;
- Clarke, T G R;
- Reguly, A
- Article
13
- Insight: Non-Destructive Testing & Condition Monitoring, 2012, v. 54, n. 5, p. 278, doi. 10.1784/insi.2012.54.5.278
- Sorsa, A;
- Leiviskä, K;
- Santa-Aho, S;
- Lepistö, T
- Article
14
- Insight: Non-Destructive Testing & Condition Monitoring, 2012, v. 54, n. 5, p. 262, doi. 10.1784/insi.2012.54.5.262
- Sahai, M K;
- Sasi, B;
- Rao, C Babu;
- Jayakumar, T
- Article
15
- Insight: Non-Destructive Testing & Condition Monitoring, 2010, v. 52, n. 12, p. 672, doi. 10.1784/insi.2010.52.12.672
- Article
16
- Insight: Non-Destructive Testing & Condition Monitoring, 2009, v. 51, n. 4, p. 212, doi. 10.1784/insi.2009.51.4.212
- Santa-aho, S.;
- Vippola, M.;
- Lepist, T.;
- Lindgren, M.
- Article
17
- Indian Journal of Engineering & Materials Sciences, 2020, v. 27, n. 3, p. 670, doi. 10.56042/ijems.v27i3.45069
- Yusufzai, Mohd Zaheer Khan;
- Raja, Avinash Ravi;
- Gupta, Sanjay Kumar;
- Vashista, Meghanshu
- Article
18
- Revista Cubana de Física, 2009, v. 26, n. 2B, p. 251
- Torres Pupo, Carlos;
- Perez Benítez, Jose Alberto
- Article
19
- Philosophical Magazine, 2004, v. 84, n. 18, p. 1821, doi. 10.1080/14786430410001663196
- Lo, C.C.H.;
- Scruby, C.B.;
- Smith, G.D.W.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1578, doi. 10.1049/el.2017.2990
- Yunfei Ye;
- Ping Wang;
- Ning Wu;
- Fen Ge;
- Fang Zhou
- Article
21
- Telkomnika, 2014, v. 12, n. 3, p. 623, doi. 10.12928/TELKOMNIKA.v12i3.96
- Yuan Huijuan;
- Zhang Enjing;
- Li Hongmei;
- Fu Jian;
- Yang Ying;
- Zou Ying;
- Hu Dandan
- Article
22
- Journal of Mechanical Engineering / Strojniški Vestnik, 2014, v. 60, n. 1, p. 21, doi. 10.5545/sv-jme.2012.906
- Žerovnik, Pavel;
- Fefer, Dušan;
- Grum, Janez
- Article
23
- INGENIARE - Revista Chilena de Ingeniería, 2015, v. 23, n. 3, p. 413
- Serna-Giraldo, Claudia P.;
- Padovese, Linilson R.
- Article
24
- Journal of Vibroengineering, 2012, v. 14, n. 1, p. 45
- Article
25
- Journal of Materials Science, 2002, v. 37, n. 17, p. 3599, doi. 10.1023/A:1016592704808
- Takács, N.;
- Posgay, GY.;
- Harasztosi, L.;
- Beke, D. L.
- Article
26
- Journal of Materials Science, 2002, v. 37, n. 12, p. 2441, doi. 10.1023/A:1015419018741
- Dhar, A.;
- Clapham, L.;
- Atherton, D.
- Article
27
- Journal of Materials Science, 2001, v. 36, n. 17, p. 4125, doi. 10.1023/A:1017944216543
- Article
28
- Journal of Materials Science, 2001, v. 36, n. 11, p. 2795, doi. 10.1023/A:1017981317255
- Stefanita, C.-G.;
- Clapham, L.;
- Yi, J.-K.;
- Atherton, D. L.
- Article
29
- Journal of Materials Science, 2000, v. 35, n. 11, p. 2675, doi. 10.1023/A:1004741606713
- Stefanita, C.;
- Clapham, L.;
- Atherton, D.
- Article
30
- International Journal of RF & Microwave Computer-Aided Engineering, 2005, v. 15, n. 6, p. 536, doi. 10.1002/mmce.20097
- Jardón-Aguilar, H.;
- Galván-Tejada, G. M.;
- Tirado-Méndez, J. A.
- Article
31
- International Journal of Advanced Manufacturing Technology, 2017, v. 88, n. 1-4, p. 789, doi. 10.1007/s00170-016-8815-x
- Jin, Tan;
- Yi, Jun;
- Peng, Siwei
- Article
32
- International Journal of Advanced Manufacturing Technology, 2014, v. 71, n. 1-4, p. 101, doi. 10.1007/s00170-013-5395-x
- Alonso, Unai;
- Ortega, Naiara;
- Sanchez, Jose;
- Pombo, Iñigo;
- Plaza, Soraya;
- Izquierdo, Borja
- Article
33
- International Journal of Advanced Manufacturing Technology, 2012, v. 63, n. 5-8, p. 771, doi. 10.1007/s00170-012-3918-5
- Vashista, M.;
- Gaddam, A.;
- Paul, S.
- Article
34
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2024, v. 46, n. 2, p. 111, doi. 10.15407/mfint.46.02.0111
- Trypilska TPP;
- Volokitin, A. V.;
- Fedorova, T. D.;
- Denissova, A. I.
- Article
35
- Doklady Physics, 2002, v. 47, n. 10, p. 728, doi. 10.1134/1.1519316
- Gorkunov, É. S.;
- Shulika, V. V.;
- Lavrent’ev, A. G.;
- Potapov, A. P.;
- Korzunin, G. S.
- Article
36
- Journal of Circuits, Systems & Computers, 2007, v. 16, n. 1, p. 105, doi. 10.1142/S0218126607003460
- HOU, CHUN-LI;
- HUANG, CHEN-CHUAN;
- HORNG, JIUN-WEI
- Article
37
- Journal of Active & Passive Electronic Devices, 2017, v. 12, n. 3/4/2017, p. 267
- ABUELMA’ ATTI, MUHAMMAD TAHER;
- ALSUHAIBANI, EYAS SALEH
- Article
38
- Journal of Active & Passive Electronic Devices, 2017, v. 12, n. 3/4, p. 267
- ABUELMA'ATTI, MUHAMMAD TAHER;
- ALSUHAIBANI, EYAS SALEH
- Article
39
- Metallurgical & Materials Transactions. Part A, 2015, v. 46, n. 3, p. 1262, doi. 10.1007/s11661-014-2728-9
- Gallaugher, Matthew;
- Samimi, Arash;
- Krause, Thomas;
- Clapham, Lynann;
- Chromik, Richard
- Article
40
- Crystals (2073-4352), 2023, v. 13, n. 3, p. 537, doi. 10.3390/cryst13030537
- Pastukh, Oleksandr;
- Kac, Malgorzata;
- Pastukh, Svitlana;
- Kuźma, Dominika;
- Zelent, Mateusz;
- Krawczyk, Maciej;
- Laskowski, Łukasz
- Article
41
- Hyperfine Interactions, 2009, v. 191, n. 1-3, p. 95, doi. 10.1007/s10751-009-9958-z
- Talut, G.;
- Reuther, H.;
- Grenzer, J.;
- Zhou, S.
- Article
42
- Metallurgical & Materials Transactions. Part A, 2010, v. 41, n. 4, p. 900, doi. 10.1007/s11661-009-0137-2
- Mohapatra, J. N.;
- Swaminathan, J.;
- Ghosh, M. K.;
- Mitra, A.
- Article
43
- Metallurgical & Materials Transactions. Part A, 2004, v. 35, n. 2, p. 599, doi. 10.1007/s11661-004-0371-6
- Mitra, Amitava;
- Srivastava, P. K.;
- De, P. K.;
- Bhattacharya, D. K.;
- Jiles, D. C.
- Article
44
- Journal of Materials Science, 2005, v. 40, n. 21, p. 5573, doi. 10.1007/s10853-005-1462-5
- Han, M.;
- Liang, D. F.;
- Deng, L. J.
- Article
45
- Journal of Materials Science, 2005, v. 40, n. 20, p. 5517, doi. 10.1007/s10853-005-4240-5
- Blaow, M.;
- Evans, J. T.;
- Shaw, B. A.
- Article
46
- Metals (2075-4701), 2018, v. 8, n. 12, p. 1029, doi. 10.3390/met8121029
- Neslušan, Miroslav;
- Trško, Libor;
- Minárik, Peter;
- Čapek, Jiří;
- Bronček, Jozef;
- Pastorek, Filip;
- Čížek, Jakub;
- Moravec, Ján
- Article
47
- Advances in Physics, 2008, v. 57, n. 4, p. 287, doi. 10.1080/00018730802420614
- Article
48
- Nature Physics, 2011, v. 7, n. 4, p. 316, doi. 10.1038/nphys1884
- Papanikolaou, Stefanos;
- Bohn, Felipe;
- Sommer, Rubem Luis;
- Durin, Gianfranco;
- Zapperi, Stefano;
- Sethna, James P.
- Article
49
- Nature Physics, 2007, v. 3, n. 8, p. 547, doi. 10.1038/nphys659
- Kwang-Su Ryu;
- Akinaga, Hiro;
- Sung-Chul Shin
- Article
50
- 2005
- Zapperi, Stefano;
- Castellano, Claudio;
- Colaiori, Francesca;
- Durin, Gianfranco
- Letter