Works matching DE "BARKER codes"
1
- Nondestructive Testing & Evaluation, 2014, v. 29, n. 4, p. 297, doi. 10.1080/10589759.2014.941840
- Zhou, Zhenggan;
- Ma, Baoquan;
- Jiang, Jingtao;
- Yu, Guang;
- Liu, Kui;
- Zhang, Dongmei;
- Liu, Weiping
- Article
2
- Insight: Non-Destructive Testing & Condition Monitoring, 2011, v. 53, n. 11, p. 621, doi. 10.1784/insi.2011.53.11.621
- Ghali, V S;
- Panda, S S B;
- Mulaveesala, R
- Article
3
- Acta Scientiarum: Technology, 2013, v. 35, n. 2, p. 247, doi. 10.4025/actascitechnol.v35i2.15202
- Amin, Syedul;
- Mamun, Md.;
- Jalil, Jubayer;
- Rahman, Labonnah
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1661
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 14, p. 1, doi. 10.1049/el.2013.0418
- Article
6
- Sensors (14248220), 2016, v. 16, n. 10, p. 1682, doi. 10.3390/s16101682
- Ming Zhang;
- Lutao Liu;
- Ming Diao
- Article
7
- IET Communications (Wiley-Blackwell), 2014, v. 8, n. 9, p. 1578, doi. 10.1049/iet-com.2013.0616
- Vlok, Jacobus David;
- Olivier, Jan Corné
- Article
8
- Applied Computational Electromagnetics Society Journal, 2013, v. 28, n. 5, p. 374
- Ojaroudi, Mohammad;
- Mehrshahi, Esfandiar
- Article
9
- 2017
- Xianfen Diao;
- Jing Zhu;
- Xiaonian He;
- Xin Chen;
- Xinyu Zhang;
- Siping Chen;
- Weixiang Liu;
- Diao, Xianfen;
- Zhu, Jing;
- He, Xiaonian;
- Chen, Xin;
- Zhang, Xinyu;
- Chen, Siping;
- Liu, Weixiang
- journal article
